Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2015
01/13/2015US8933456 Germanium-containing release layer for transfer of a silicon layer to a substrate
01/13/2015US8933455 Display device comprising pixel
01/13/2015US8933453 Routing for high resolution and large size displays
01/13/2015US8933449 Apparatus having a dielectric containing scandium and gadolinium
01/13/2015US8933429 Using multi-layer MIMCAPs in the tunneling regime as selector element for a cross-bar memory array
01/13/2015US8933424 Method for measuring transverse beam intensity distribution
01/13/2015US8933402 Sample analysis apparatus and sample analysis program
01/13/2015US8933376 Heating device, coating and developing system, heating method and storage medium
01/13/2015US8933368 Laser processing method for cutting planar object
01/13/2015US8933367 Laser processing method
01/13/2015US8932995 Combinatorial process system
01/13/2015US8932964 Method of forming a dielectric layer having an ONO structure using an in-situ process
01/13/2015US8932963 Film deposition method
01/13/2015US8932962 Chemical dispensing system and method
01/13/2015US8932961 Critical dimension and pattern recognition structures for devices manufactured using double patterning techniques
01/13/2015US8932960 Methods for isolating portions of a loop of pitch-multiplied material and related structures
01/13/2015US8932959 Method and system for etching plural layers on a workpiece including a lower layer containing an advanced memory material
01/13/2015US8932958 Device manufacturing and cleaning method
01/13/2015US8932957 Method of fabricating a FinFET device
01/13/2015US8932956 Far back end of the line stack encapsulation
01/13/2015US8932955 Triple patterning NAND flash memory with SOC
01/13/2015US8932954 Impurity analysis device and method
01/13/2015US8932952 Method for polishing silicon wafer and polishing liquid therefor
01/13/2015US8932951 Dishing-free gap-filling with multiple CMPs
01/13/2015US8932950 Electrically conductive device and manufacturing method thereof
01/13/2015US8932949 FinFET structure and method to adjust threshold voltage in a FinFET structure
01/13/2015US8932948 Memory cell floating gate replacement
01/13/2015US8932947 Methods for forming a round bottom silicon trench recess for semiconductor applications
01/13/2015US8932945 Wafer alignment system and method
01/13/2015US8932944 Silicon carbide semiconductor device manufacturing method
01/13/2015US8932943 Nitride semiconductor light emitting device and method of manufacturing the same
01/13/2015US8932942 Method of forming an electrical contact between a support wafer and the surface of a top silicon layer of a silicon-on-insulator wafer and an electrical device including such an electrical contact
01/13/2015US8932941 Graphene device and method of fabricating the same
01/13/2015US8932940 Vertical group III-V nanowires on si, heterostructures, flexible arrays and fabrication
01/13/2015US8932939 Water soluble mask formation by dry film lamination
01/13/2015US8932938 Method of fabricating a multilayer structure with circuit layer transfer
01/13/2015US8932937 Photoresist mask-free oxide define region (ODR)
01/13/2015US8932936 Method of forming a FinFET device
01/13/2015US8932935 Forming three dimensional isolation structures
01/13/2015US8932934 Methods of self-forming barrier integration with pore stuffed ULK material
01/13/2015US8932933 Methods of forming hydrophobic surfaces on semiconductor device structures, methods of forming semiconductor device structures, and semiconductor device structures
01/13/2015US8932932 Highly scalable trench capacitor
01/13/2015US8932931 Self-aligned emitter-base region
01/13/2015US8932930 Enhancing integrity of a high-K gate stack by protecting a liner at the gate bottom during gate head exposure
01/13/2015US8932928 Power MOSFET structure and method
01/13/2015US8932927 Semiconductor structure and method for manufacturing the same
01/13/2015US8932926 Method for forming gate oxide film of sic semiconductor device using two step oxidation process
01/13/2015US8932925 Split-gate non-volatile memory (NVM) cell and device structure integration
01/13/2015US8932924 Trench-based power semiconductor devices with increased breakdown voltage characteristics
01/13/2015US8932923 Semiconductor gate structure for threshold voltage modulation and method of making same
01/13/2015US8932922 Method of fabricating semiconductor device having dual gate
01/13/2015US8932921 N/P metal crystal orientation for high-k metal gate Vt modulation
01/13/2015US8932920 Self-aligned gate electrode diffusion barriers
01/13/2015US8932919 Vertical stacking of graphene in a field-effect transistor
01/13/2015US8932918 FinFET with self-aligned punchthrough stopper
01/13/2015US8932916 Method for fabricating thin-film transistor
01/13/2015US8932915 Semiconductor device and method for manufacturing the same
01/13/2015US8932913 Manufacturing method of semiconductor device
01/13/2015US8932912 One-time programmable device
01/13/2015US8932911 Integrated circuits and methods for fabricating integrated circuits with capping layers between metal contacts and interconnects
01/13/2015US8932910 Method for producing chip stacks, and a carrier for carrying out the method
01/13/2015US8932909 Thermocompression for semiconductor chip assembly
01/13/2015US8932908 Semiconductor device and method of forming partially-etched conductive layer recessed within substrate for bonding to semiconductor die
01/13/2015US8932907 Semiconductor device and method of forming interposer frame electrically connected to embedded semiconductor die
01/13/2015US8932906 Through silicon via bonding structure
01/13/2015US8932905 Semiconductor circuit system for a composite structure
01/13/2015US8932904 Semiconductor device and method of manufacturing the same
01/13/2015US8932903 Method for forming wiring, semiconductor device, and method for manufacturing semiconductor device
01/13/2015US8932902 Thin film transistor substrate having metal oxide semiconductor and method for manufacturing the same
01/13/2015US8932901 Stressed phase change materials
01/13/2015US8932900 Phase change memory and method of fabricating same
01/13/2015US8932897 Phase change memory cell
01/13/2015US8932896 Solar cell manufacturing apparatus and solar cell manufacturing method
01/13/2015US8932895 Cover for image sensor assembly with light absorbing layer and alignment features
01/13/2015US8932894 Methods and systems of curved radiation detector fabrication
01/13/2015US8932893 Method of fabricating MEMS device having release etch stop layer
01/13/2015US8932892 Epitaxiay wafer, method for manufacturing the same and method for manufacturing LED chip
01/13/2015US8932891 Method for manufacturing nitride based single crystal substrate and method for manufacturing nitride based semiconductor device
01/13/2015US8932890 Vertical-structure semiconductor light emitting element and a production method therefor
01/13/2015US8932888 Method of applying a conversion means to an optoelectronic semiconductor chip and an optoelectronic component
01/13/2015US8932887 Method for manufacturing LED with transparent ceramics
01/13/2015US8932886 Power light emitting die package with reflecting lens and the method of making the same
01/13/2015US8932885 Method of making a multilayer structure
01/13/2015US8932884 Process environment variation evaluation
01/13/2015US8932883 Method of measuring surface properties of polishing pad
01/13/2015US8932882 Method of manufacturing semiconductor device
01/13/2015US8932874 Control over ammonium fluoride levels in oxide etchant
01/13/2015US8932799 Photoresist system and method
01/13/2015US8932702 Low k dielectric
01/13/2015US8932699 Crystalline substance, substrate, and method for producing crystalline substance
01/13/2015US8932675 Methods for depositing silicon carbo-nitride film
01/13/2015US8932674 Vapor deposition methods of SiCOH low-k films
01/13/2015US8932672 Substrate processing apparatus
01/13/2015US8932479 Polishing liquid and polishing method
01/13/2015US8932432 Substrate separating apparatus, load lock apparatus, substrate bonding apparatus, substrate separating method, and manufacturing method of a semiconductor apparatus
01/13/2015US8932430 RF coupled plasma abatement system comprising an integrated power oscillator
01/13/2015US8932429 Electronic knob for tuning radial etch non-uniformity at VHF frequencies
01/13/2015US8932408 Method for cleaning a surface
01/13/2015US8932407 Substrate cleaning method
01/13/2015US8932406 In-situ generation of the molecular etcher carbonyl fluoride or any of its variants and its use
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