Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2004
03/16/2004US6707742 Nonvolatile semiconductor memory device
03/16/2004US6707737 Memory system capable of switching between a reference voltage for normal operation and a reference voltage for burn-in test
03/16/2004US6707719 Nonvolatile semiconductor memory device with double data storage circuit for writing and write-verifying multi-state memory cells
03/16/2004US6707716 Non-volatile semiconductor memory device
03/16/2004US6707711 Magnetic memory with reduced write current
03/16/2004US6707706 Semiconductor memory device and method for manufacturing the same
03/16/2004US6707703 Negative voltage generating circuit
03/16/2004US6707695 Nonvolatile semiconductor memory device
03/16/2004US6707660 Prismatic capacitor
03/16/2004US6707648 Magnetic device, magnetic head and magnetic adjustment method
03/16/2004US6707614 Laser irradiation stage, laser irradiation optical system, laser irradiation apparatus, laser irradiation method, and method of manufacturing a semiconductor device
03/16/2004US6707562 Method of using scatterometry measurements to control photoresist etch process
03/16/2004US6707545 Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems
03/16/2004US6707544 Particle detection and embedded vision system to enhance substrate yield and throughput
03/16/2004US6707538 Near-field exposure system selectively applying linearly polarized exposure light to exposure mask
03/16/2004US6707535 Device for exposure of a peripheral area
03/16/2004US6707533 Detection apparatus and exposure apparatus using the same
03/16/2004US6707532 Projection exposure apparatus
03/16/2004US6707530 Lithographic apparatus, device manufacturing method, and device manufactured thereby
03/16/2004US6707513 Active matrix substrate and manufacturing method thereof
03/16/2004US6707512 Liquid crystal display units with data line being formed of molybdenum alloy having chromium content
03/16/2004US6707334 Semiconductor integrated circuit
03/16/2004US6707328 Semiconductor integrated circuit related to a circuit operating on the basis of a clock signal
03/16/2004US6707314 Integrated circuit device, electronic equipment, and method of placement of an integrated circuit device
03/16/2004US6707310 Needle load measuring method, needle load setting method and needle load detecting mechanism
03/16/2004US6707255 Multirate processing for metrology of plasma RF source
03/16/2004US6707253 Matching circuit and plasma processing apparatus
03/16/2004US6707240 Electron gun and electron beam exposure device
03/16/2004US6707228 Method for adjusting frequency of electronic component
03/16/2004US6707166 Semiconductor devices and manufacturing method thereof
03/16/2004US6707165 Use of residual organic compounds to facilitate gate break on a carrier substrate for a semiconductor device
03/16/2004US6707164 Package of semiconductor chip with array-type bonding pads
03/16/2004US6707163 Method of eliminating uncontrolled voids in sheet adhesive layer
03/16/2004US6707162 Chip package structure
03/16/2004US6707161 Optical module package of flip chip bonding
03/16/2004US6707160 Semiconductor device using substrate having cubic structure and method of manufacturing the same
03/16/2004US6707158 Semiconductor device and method for producing the same, and anisotropic conductive circuit board
03/16/2004US6707157 Three dimensional semiconductor integrated circuit device having a piercing electrode
03/16/2004US6707156 Semiconductor device with multilevel wiring layers
03/16/2004US6707154 Semiconductor device and production method for the same
03/16/2004US6707153 Semiconductor chip with plural resin layers on a surface thereof and method of manufacturing same
03/16/2004US6707151 Semiconductor device
03/16/2004US6707149 Package having back face of microelectronic element mounted to top surface of first substrate, contacts electrically connected with conductive pads of second substrate by conductive wires, overlying dielectric sheet
03/16/2004US6707141 Multi-chip module substrate for use with leads-over chip type semiconductor devices
03/16/2004US6707139 Semiconductor device with plural unit regions in which one or more MOSFETs are formed
03/16/2004US6707137 Semiconductor package and method for fabricating the same
03/16/2004US6707135 Semiconductor leadframe for staggered board attach
03/16/2004US6707134 Semiconductor structure having an improved pre-metal dielectric stack and method for forming the same
03/16/2004US6707132 High performance Si-Ge device module with CMOS technology
03/16/2004US6707131 Semiconductor device and manufacturing method for the same
03/16/2004US6707130 Bipolar device with polycrystalline film contact and resistance
03/16/2004US6707126 Semiconductor device including a PIN photodiode integrated with a MOS transistor
03/16/2004US6707120 Field effect transistor
03/16/2004US6707119 Polygonal structure semiconductor device
03/16/2004US6707117 Method of providing semiconductor interconnects using silicide exclusion
03/16/2004US6707116 Integrated circuit and manufacturing method therefor
03/16/2004US6707115 Transistor with minimal hot electron injection
03/16/2004US6707114 Semiconductor wafer arrangement of a semiconductor wafer
03/16/2004US6707113 Semiconductor device with crenellated channel
03/16/2004US6707112 MOS transistor with ramped gate oxide thickness
03/16/2004US6707111 Hydrogen implant for buffer zone of punch-through non EPI IGBT
03/16/2004US6707109 Semiconductor integrated circuit
03/16/2004US6707107 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern
03/16/2004US6707106 Semiconductor device with tensile strain silicon introduced by compressive material in a buried oxide layer
03/16/2004US6707105 Semiconductor device for limiting leakage current
03/16/2004US6707103 Low voltage rad hard MOSFET
03/16/2004US6707102 Minimized increase in input and output capacitances, reduced feedback capacitance ascribed to shield conductive film and resistance of gate electrode, improved drain breakdown voltage and current capacitance, suppressed hot electron degradation
03/16/2004US6707101 Integrated series schottky and FET to allow negative drain voltage
03/16/2004US6707100 Trench-gate semiconductor devices, and their manufacture
03/16/2004US6707099 Semiconductor device and manufacturing method thereof
03/16/2004US6707097 Method for forming refractory metal-silicon-nitrogen capacitors and structures formed
03/16/2004US6707096 Fork-like memory structure for ULSI DRAM and method of fabrication
03/16/2004US6707095 Structure and method for improved vertical MOSFET DRAM cell-to-cell isolation
03/16/2004US6707092 Semiconductor memory having longitudinal cell structure
03/16/2004US6707091 Semiconductor device having capacitor
03/16/2004US6707090 DRAM cell constructions
03/16/2004US6707088 Method of forming integrated circuitry, method of forming a capacitor, method of forming DRAM integrated circuitry and DRAM integrated category
03/16/2004US6707086 Method for forming crystalline silicon nitride
03/16/2004US6707085 Magnetic random access memory
03/16/2004US6707084 Antiferromagnetically stabilized pseudo spin valve for memory applications
03/16/2004US6707082 Two source/drain zones with channel region there between, first dielectric intermediate layer containing aluminum oxide disposed on surface of channel region; suppressed tunneling of compensation charges from channel region into dielectric layer
03/16/2004US6707081 Photodetector with built-in circuit
03/16/2004US6707079 Twin MONOS cell fabrication method and array organization
03/16/2004US6707078 Dummy wordline for erase and bitline leakage
03/16/2004US6707076 Semiconductor element
03/16/2004US6707075 Method for fabricating avalanche trench photodetectors
03/16/2004US6707068 Semiconductor device and method of manufacturing the same
03/16/2004US6707067 High aperture LCD with insulating color filters overlapping bus lines on active substrate
03/16/2004US6707064 Test element group structure
03/16/2004US6707063 Passivation layer for molecular electronic device fabrication
03/16/2004US6707062 Transistor in a semiconductor device with an elevated channel and a source drain
03/16/2004US6707060 Column-row addressable electric microswitch arrays and sensor matrices employing them
03/16/2004US6707011 Rapid thermal processing system for integrated circuits
03/16/2004US6706961 Photovoltaic device and process for the production thereof
03/16/2004US6706959 Photovoltaic apparatus and mass-producing apparatus for mass-producing spherical semiconductor particles
03/16/2004US6706850 Aromatic blocks with branches of aliphatic polyether chains that have lower thermal decomposition temperature for formation of porous organic films that allow lowering of dielectric constant as insulation materials in electronics
03/16/2004US6706648 APCVD method of forming silicon oxide using an organic silane, oxidizing agent, and catalyst-formed hydrogen radical
03/16/2004US6706647 Method of and apparatus for manufacturing semiconductors
03/16/2004US6706646 Spin-on glass composition and method of forming silicon oxide layer in semiconductor manufacturing process using the same
03/16/2004US6706645 Method of manufacturing a semiconductor device