Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2004
03/17/2004EP1397260A1 Polymeric antireflective coatings deposited by plasma enhanced chemical vapor deposition
03/17/2004EP1290498B1 Method for creating an integrated circuit stage wherein fine and large patterns coexist
03/17/2004EP1257879A4 Radiation sensitive copolymers, photoresist compositions thereof and deep uv bilayer systems thereof
03/17/2004EP1170755A4 Integral lens for high energy particle flow, method for producing such lenses and use thereof in analysis devices and devices for radiation therapy and lithography
03/17/2004EP1169357A4 Hydroxy-epoxide thermally cured undercoat for 193 nm lithography
03/17/2004EP1118051B1 Component heater system for use in manufacturing process
03/17/2004EP1084009B1 Cmp pad conditioner arrangement and method therefor
03/17/2004EP1047807B1 A DEPOSITION METHOD FOR USING A Cu(hfac) PRECURSOR WITH A SUBSTITUTED PHENYLETHYLENE LIGAND
03/17/2004EP1002228B1 Method for applying or removing material
03/17/2004EP0885483A4 Push-pull power amplifier
03/17/2004EP0784868A4 Ccd charge splitter
03/17/2004EP0706582B2 Improved compositions and methods for polishing
03/17/2004EP0685074B1 Device for testing the connection between an output of a means which outputs a fixed logic value and the input of a circuit
03/17/2004CN1483303A Use of metallic treatment on copper foil to produce fine lines and replace oxide process in printed circuit board production
03/17/2004CN1483222A Reluctance storage element
03/17/2004CN1483221A Semiconductor tile structure and forming method thereof
03/17/2004CN1483220A Welding and caulking material for silicon wafer and layered electronic package manufactured using the same
03/17/2004CN1483219A Etching method for insulating film
03/17/2004CN1483218A Chamber for uniformly heating substrate
03/17/2004CN1483158A Projection lithography using a phase shifting aperture
03/17/2004CN1483093A Semiconductor stripping composition containing 1,3-dicarbonyl compounds
03/17/2004CN1482958A Methods for making reinforced wafer polshing pads and apparatuses implementing the same
03/17/2004CN1482943A Process and apparatus for blending and distributing a slurry solution
03/17/2004CN1482850A Method and apparatus for determining fastener fabrication dimension
03/17/2004CN1482730A Integrated circuit driver with stable bootstrap power supply
03/17/2004CN1482690A Gallium nitride group compound semiconductor photogenerator
03/17/2004CN1482689A MgIn*O*/MgO composite underlaying material and preparing process thereof
03/17/2004CN1482688A ª†-LiAIO*/ª‡-AI*O* flexible underlaying material and preparing process thereof
03/17/2004CN1482684A Semiconductor device and a method of producing the same
03/17/2004CN1482682A Memory cell and memory device
03/17/2004CN1482681A 半导体集成电路装置 The semiconductor integrated circuit device
03/17/2004CN1482679A Semiconductor integrated circuit with shortened pad pitch
03/17/2004CN1482676A Integrated circuit plate loading substrate with over-voltage protection function and making method thereof
03/17/2004CN1482674A Coupling and selecting step in bimetal/polysilicon oxide nitride oxide silicon array
03/17/2004CN1482673A CMOS element with strain equilibrium structure and making method thereof
03/17/2004CN1482672A Semiconductor device and method for manufacturing the same
03/17/2004CN1482671A Method of forming ferroelectric memory cell
03/17/2004CN1482670A Method for evaluating inner connecting structure layout and sheet metal resistor thereof
03/17/2004CN1482669A Integrated circuit semiconductor element having uniform silicide junction and method for manufacturing the same
03/17/2004CN1482668A Method for forming clearance wall between grid and capacitor
03/17/2004CN1482667A Method for making metallized capacitor
03/17/2004CN1482666A Method and apparatus for forming damascene structure, and damascene structure
03/17/2004CN1482665A Method for forming barrier layer between low dielectric material layer and inner connecting wire
03/17/2004CN1482664A 半导体器件 Semiconductor devices
03/17/2004CN1482663A Method for monitoring overlaying alignment on wafer
03/17/2004CN1482661A Emulate testing system and testing method for universal digital circuit
03/17/2004CN1482660A Testing during burn-in system
03/17/2004CN1482659A Element and method for testing doping concentration abnormity of buried layer in grooved capacitor
03/17/2004CN1482658A Method of manufacturing semiconductor packaging device
03/17/2004CN1482657A Resin solidifying system
03/17/2004CN1482656A Method for making laminated crystal semiconductor packaging device and structure thereof
03/17/2004CN1482655A Metal film semiconductor device and a method for forming the same
03/17/2004CN1482654A Ono interpoly dielectric for flash memory cells and method for fabricating the same
03/17/2004CN1482653A Precursor containing a nitrogen compound bound to hfcl4 for hafnium oxide layer and method for forming hafnium oxide film using the precursor
03/17/2004CN1482652A Method for making fluorocarbon film
03/17/2004CN1482651A Multi-layer structure with dislocation defect retardation
03/17/2004CN1482618A Double-bit memory and a double-bit selected bit line decoding design and circuit
03/17/2004CN1482616A Thin film magnetic memory device suppressing resistance of transistors present in current path
03/17/2004CN1482578A Graphic identification method and system for process endpoint curve and computer readable media having instructions executing the same method
03/17/2004CN1482473A 光波导装置 Waveguide devices
03/17/2004CN1482274A Aluminum nitride monocrystal film and method of preparing the same
03/17/2004CN1482264A Lead wire framework copper belt for IC and its producing process and method
03/17/2004CN1482192A Coating compositions for use with an overcoated photoresist
03/17/2004CN1482191A Coating compositions for use with an overcoated photoresist
03/17/2004CN1142599C LED and its preparing process
03/17/2004CN1142596C High-voltage P-type MOS transistor and its preparing process
03/17/2004CN1142595C Semiconductor and lanthanium manganate p-n junction
03/17/2004CN1142594C Transistor of composite perovskite structure oxide membrane
03/17/2004CN1142593C Integrated circuit device and process for its manufacture
03/17/2004CN1142592C Method for making semiconductor capacitor
03/17/2004CN1142591C Semiconductor device, memory unit, and processes for forming them
03/17/2004CN1142590C Method and apparatus for retention of fragile conductive lead using protective clamp
03/17/2004CN1142589C Chip carrier
03/17/2004CN1142588C Method for providing double work function doping and protection insulation cap
03/17/2004CN1142586C Semiconductor integrated circuit device and process for manufacturing the same
03/17/2004CN1142585C Method of manufacturing thin film transistor
03/17/2004CN1142584C Gamma-ray radiation method for improving imaging quality of CMOS digital image sensor
03/17/2004CN1142583C Depositing and flattening process for thin film
03/17/2004CN1142582C Treatment method of semiconductor wafer and treatment system thereof
03/17/2004CN1142581C Chemical machine polishing method combined with rotary coating
03/17/2004CN1142580C Method for fabricating multiple device chips using thin thermoelectric sheet
03/17/2004CN1142579C 电子束曝光方法 Electron beam exposure method
03/17/2004CN1142577C Dual-face shower head electrode for magnetron plasma generating apparatus
03/17/2004CN1142059C Low dielectric constant inorganic/organic hybrid films and method of making it
03/16/2004USRE38466 Manufacturing method of active matrix substrate, active matrix substrate and liquid crystal display device
03/16/2004US6708323 Method and apparatus for verifying mask pattern data according to given rules
03/16/2004US6708322 Integrated circuit, integrated circuit design method and hardware description generation method to generate hardware behavior description of integrated circuit
03/16/2004US6708320 Optimization method for element placement
03/16/2004US6708319 Manufacturing method of semiconductor integrated circuit device
03/16/2004US6708318 Wiring resistance correcting method
03/16/2004US6708317 Validating integrated circuits
03/16/2004US6708316 System for and method of designing and manufacturing a semiconductor device
03/16/2004US6708312 Method for multi-threshold voltage CMOS process optimization
03/16/2004US6708129 Method and apparatus for wafer-to-wafer control with partial measurement data
03/16/2004US6708075 Method and apparatus for utilizing integrated metrology data as feed-forward data
03/16/2004US6708073 Lot specific process design methodology
03/16/2004US6708072 Remote maintenance method, industrial device, and semiconductor device
03/16/2004US6707936 Method and apparatus for predicting device yield from a semiconductor wafer
03/16/2004US6707835 Process for producing semiconductor laser element including S-ARROW structure formed by etching through mask having pair of parallel openings
03/16/2004US6707745 Operation control according to temperature variation in integrated circuit