Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2004
04/14/2004CN1146034C Method for making buried microfine metal conductive wire
04/14/2004CN1146033C Improvement of SAC process flow method using isolating spacer
04/14/2004CN1146032C Method of die bonding electronic component and die bonding apparatus therefor
04/14/2004CN1146031C In situ measuring method and device for processing semiconductor
04/14/2004CN1146030C Semiconductor device and manufacturling method thereof, semiconductor module, circuit board and electrnic equipment
04/14/2004CN1146029C Electronic component and mobile communication device comprising same
04/14/2004CN1146028C Method for mfg. lightly mixed leakage polar/bias structure of thin film transistor
04/14/2004CN1146027C Optical system and apparatus and method for making semiconductor device using same
04/14/2004CN1146026C Method for p[roducing material layer for composition of picture
04/14/2004CN1146025C Method for forming film
04/14/2004CN1146024C Plasma etching method for forming hole in maked silicon dioxide
04/14/2004CN1146023C Structure forming method
04/14/2004CN1146022C Electron-beam cell projection aperture formation method
04/14/2004CN1146021C Method of manufacturing semiconductor device with multilayer wiring
04/14/2004CN1146020C Method of forming singl-crystal silicon layer and method of manufacturing semiconductor device
04/14/2004CN1146019C Phase-shift mask and manufacture thereof
04/14/2004CN1146018C Methods for performing planarization and recess etches and apparatus therefor
04/14/2004CN1146017C Semiconductor device and method for manufacturing the same
04/14/2004CN1146016C Metehod and apparatus for applying protecting film to semiconductor wafer
04/14/2004CN1146015C Method for making semiconductor device
04/14/2004CN1146005C Ion source having wide output current operating range
04/14/2004CN1145969C Interleaved sense amplifier with single-sided precharge device
04/14/2004CN1145846C Process for manufacturing microstructured bodies
04/14/2004CN1145838C Active matrix substrate, electro-optic convertion device, method of manufacturing active matrix substrate, and electric device
04/14/2004CN1145802C Microelectronic spring contact element and electronic element thereof
04/14/2004CN1145682C Small chip adhesion agent for microelectronic device
04/14/2004CN1145651C Water soluble negative-working photoresist composition
04/14/2004CN1145630C Method for producing metal-ligand compositions
04/14/2004CN1145543C Grinding needle for grinding recess, grinder with same and grinding method thereof
04/13/2004US6721940 Exposure processing method and exposure system for the same
04/13/2004US6721938 Optical proximity correction for phase shifting photolithographic masks
04/13/2004US6721935 Coordinate transformation system for semiconductor device, coordinate transformation method and coordinate transformation program
04/13/2004US6721933 Input/output cell placement method and semiconductor device
04/13/2004US6721932 Semiconductor integrated circuit device including circuit block having hierarchical structure and method of designing the same
04/13/2004US6721930 Electronic circuit device and its design method
04/13/2004US6721920 Systems and methods for facilitating testing of pad drivers of integrated circuits
04/13/2004US6721626 Wafer transfer system, wafer transfer method and automatic guided vehicle system
04/13/2004US6721616 Processing workpiece in process tool, measuring output characteristic of workpiece, processing second workpiece in process tool, determining tool health metric corresponding to processing of second workpiece, determining control action
04/13/2004US6721605 Utilizing two or more processors, which may reside in separate computer processor systems, wherein each processor and/or computer processor system is assigned to control, and sample information relating to, one or more designated functions
04/13/2004US6721390 Soft X-ray reduction projection exposure system, soft X-ray reduction projection exposure method and pattern formation method
04/13/2004US6721389 Lithographic apparatus, device manufacturing method, and device manufactured thereby
04/13/2004US6721289 Radio frequency data communications device
04/13/2004US6721231 Semiconductor memory device, memory system and electronic instrument
04/13/2004US6721221 Sense amplifier and architecture for open digit arrays
04/13/2004US6721208 Method of erasing flash memory cells
04/13/2004US6721206 Methods of accessing floating-gate memory cells having underlying source-line connections
04/13/2004US6721205 Nonvolatile semiconductor memory device and methods for operating and producing the same
04/13/2004US6721162 Electrostatic chuck having composite dielectric layer and method of manufacture
04/13/2004US6721137 Magnetoresistance device
04/13/2004US6721047 Method and apparatus for inspecting defects of a specimen
04/13/2004US6721046 Utilizing light reflection analysis
04/13/2004US6721045 Rapidly inspecting semiconductors for anomalies
04/13/2004US6721041 Stage device and exposure apparatus
04/13/2004US6721040 Exposure method and apparatus using near field light
04/13/2004US6721039 Exposure method, exposure apparatus and device producing method
04/13/2004US6721037 Device for exposure of a peripheral area of a wafer
04/13/2004US6721036 Lithographic apparatus, device manufacturing method, and device manufactured thereby
04/13/2004US6721035 Lithographic projection apparatus
04/13/2004US6721033 Accurately superimposing pattern images
04/13/2004US6721032 Exposure apparatus and control method therefor, and device manufacturing method
04/13/2004US6721031 Exposure apparatus
04/13/2004US6720815 Phase adjustor for semiconductor integrated circuit
04/13/2004US6720790 Method and apparatus for evaluating insulating film
04/13/2004US6720786 Lead formation, assembly strip test, and singulation system
04/13/2004US6720785 Integrated circuit with test mode, and test configuration for testing an integrated circuit
04/13/2004US6720782 Wafer probe station for low-current measurements
04/13/2004US6720780 High density probe card apparatus and method of manufacture
04/13/2004US6720728 Devices containing a carbon nanotube
04/13/2004US6720667 Semiconductor device having align key for defining active region and method for manufacturing the same
04/13/2004US6720666 BOC BGA package for die with I-shaped bond pad layout
04/13/2004US6720664 Submount-holder for flip chip package
04/13/2004US6720663 Method for manufacturing an integrated memory circuit and an integrated memory circuit
04/13/2004US6720661 Semiconductor device, method of fabricating the same, stack-type semiconductor device, circuit board and electronic instrument
04/13/2004US6720660 Semiconductor device and method for manufacturing the same
04/13/2004US6720659 Semiconductor device having an adhesion layer
04/13/2004US6720658 Semiconductor device having a plurality of conductive layers
04/13/2004US6720657 Semiconductor device and method of manufacturing the same
04/13/2004US6720656 Semiconductor device with analysis prevention feature
04/13/2004US6720655 Multilevel interconnect structure with low-k dielectric
04/13/2004US6720654 Electronic devices with cesium barrier film and process for making same
04/13/2004US6720653 Metal layer in semiconductor device including a planar stuffed layer and an insulating film with a projection and method for fabricating the same
04/13/2004US6720650 Semiconductor device having heat spreader attached thereto and method of manufacturing the same
04/13/2004US6720647 Semiconductor device and method of manufacturing the same
04/13/2004US6720645 Semiconductor device
04/13/2004US6720644 Semiconductor device using interposer substrate and manufacturing method therefor
04/13/2004US6720642 Flip chip in leaded molded package and method of manufacture thereof
04/13/2004US6720640 Method for reclaiming delaminated wafer and reclaimed delaminated wafer
04/13/2004US6720639 Integrated inductance structure
04/13/2004US6720638 Semiconductor constructions, and methods of forming semiconductor constructions
04/13/2004US6720636 Semiconductor device with a staggered pad arrangement
04/13/2004US6720633 High withstand voltage insulated gate N-channel field effect transistor
04/13/2004US6720632 Semiconductor device having diffusion layer formed using dopant of large mass number
04/13/2004US6720631 Transistor having a deposited dual-layer spacer structure
04/13/2004US6720630 Structure and method for MOSFET with metallic gate electrode
04/13/2004US6720629 Structure of a memory device with buried bit line
04/13/2004US6720628 Semiconductor device, memory system and electronic apparatus
04/13/2004US6720627 Semiconductor device having junction depths for reducing short channel effect
04/13/2004US6720626 Semiconductor device having improved gate structure
04/13/2004US6720625 Preventing electrostatic discharge (esd) damage
04/13/2004US6720622 SCR-ESD structures with shallow trench isolation