| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 12/16/2004 | WO2004073893A3 Gas gate for isolating regions of differing gaseous pressure |
| 12/16/2004 | WO2004061863A3 Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same |
| 12/16/2004 | WO2004055607A3 Apparatus for processing an object with high position accurancy |
| 12/16/2004 | WO2004042785A3 Functional bimorph composite nanotapes and methods of fabrication |
| 12/16/2004 | WO2004030012A3 Improved bellows shield in a plasma processing system,and method of manufacture of such bellows shield |
| 12/16/2004 | WO2004008008A3 Control of a gaseous environment in a wafer loading chamber |
| 12/16/2004 | WO2003067629B1 Band gap compensated hbt |
| 12/16/2004 | WO2002103755A9 Semiconductor die including conductive columns |
| 12/16/2004 | US20040255305 Method of forming a pattern of sub-micron broad features |
| 12/16/2004 | US20040255259 Device, design and method for a slot in a conductive area |
| 12/16/2004 | US20040255198 Method for analyzing fail bit maps of wafers and apparatus therefor |
| 12/16/2004 | US20040255024 System and method for electronically collecting data in a fabrication facility |
| 12/16/2004 | US20040254906 Resource board for emulation system |
| 12/16/2004 | US20040254769 Method for testing semiconductor film, semiconductor device and manufacturing method thereof |
| 12/16/2004 | US20040254762 Method for process control of semiconductor manufactiring equipment |
| 12/16/2004 | US20040254761 Operation monitoring method for treatment apparatus |
| 12/16/2004 | US20040254752 System for identification of defects on circuits or other arrayed products |
| 12/16/2004 | US20040254669 Automatic recognition of locator die in partial wafermap process |
| 12/16/2004 | US20040254394 Novel tertiary alcohol compounds having alicyclic structure |
| 12/16/2004 | US20040253910 Polishing pad, platen, method of monitoring, method of manufacturing, and method of detecting |
| 12/16/2004 | US20040253896 Method of manufacturing display device |
| 12/16/2004 | US20040253840 Method of crystallizing silicon |
| 12/16/2004 | US20040253839 Semiconductor manufacturing apparatus and heat treatment method |
| 12/16/2004 | US20040253837 Method for forming a dielectric layer of a semiconductor |
| 12/16/2004 | US20040253836 Low melting point alignment |
| 12/16/2004 | US20040253835 Methods of fabricating patterned layers on a substrate |
| 12/16/2004 | US20040253834 Method for fabricating a trench isolation structure |
| 12/16/2004 | US20040253833 Substrate processing apparatus and substrate processing method |
| 12/16/2004 | US20040253832 Compositions for dissolution of low-k dielectric films, and methods of use |
| 12/16/2004 | US20040253831 Method of forming rounded corner in trench |
| 12/16/2004 | US20040253830 [method for removing silicon nitride film] |
| 12/16/2004 | US20040253829 Methods to planarize semiconductor device and passivation layer |
| 12/16/2004 | US20040253828 Fabrication method of semiconductor integrated circuit device |
| 12/16/2004 | US20040253827 Multilevel poly-si tiling for semiconductor circuit manufacture |
| 12/16/2004 | US20040253826 Methods for making and processing diffusion barrier layers |
| 12/16/2004 | US20040253825 Semiconductor device |
| 12/16/2004 | US20040253823 Dielectric plasma etch with deep uv resist and power modulation |
| 12/16/2004 | US20040253822 Chemical mechanical polishing method of organic film and method of manufacturing semiconductor device |
| 12/16/2004 | US20040253820 Patterned thin film graphite devices and method for making same |
| 12/16/2004 | US20040253819 Method for crystallizing silicon |
| 12/16/2004 | US20040253818 Fabrication method of IC inlet, ID tag, ID tag reader and method of reading data thereof |
| 12/16/2004 | US20040253817 Structure manufacturing method |
| 12/16/2004 | US20040253815 Method for forming a conductive layer |
| 12/16/2004 | US20040253814 Method for improving selectivity of electroless metal deposition |
| 12/16/2004 | US20040253813 Method for filling a hole with a metal |
| 12/16/2004 | US20040253812 Method for BARC over-etch time adjust with real-time process feedback |
| 12/16/2004 | US20040253811 Method for fabricating semiconductor device |
| 12/16/2004 | US20040253810 Dummy structures to reduce metal recess in electropolishing process |
| 12/16/2004 | US20040253809 Forming a semiconductor structure using a combination of planarizing methods and electropolishing |
| 12/16/2004 | US20040253808 Wafer-level quasi-planarization and passivation for multi-height structures |
| 12/16/2004 | US20040253807 Barrier layer stack to prevent Ti diffusion |
| 12/16/2004 | US20040253805 Microcircuit fabrication and interconnection |
| 12/16/2004 | US20040253804 Electroplating compositions and methods |
| 12/16/2004 | US20040253803 Packaging assembly and method of assembling the same |
| 12/16/2004 | US20040253802 Method of plating electrode formation |
| 12/16/2004 | US20040253801 Ultimate low dielectric device and method of making the same |
| 12/16/2004 | US20040253800 Method of fabricating a semiconductor device |
| 12/16/2004 | US20040253799 Method for forming an electronic structure using etch |
| 12/16/2004 | US20040253798 Manufacturing method for SOI semiconductor device, and SOI semiconductor device |
| 12/16/2004 | US20040253797 Heating plate crystallization method |
| 12/16/2004 | US20040253796 Method for manufacturing gallium nitride (GaN) based single crystalline substrate |
| 12/16/2004 | US20040253795 Methods of producing a heterogeneous semiconductor structure |
| 12/16/2004 | US20040253793 SOI substrate, semiconductor substrate, and method for production thereof |
| 12/16/2004 | US20040253792 Strained-silicon-on-insulator single-and double-gate MOSFET and method for forming the same |
| 12/16/2004 | US20040253791 Methods of fabricating a semiconductor device having MOS transistor with strained channel |
| 12/16/2004 | US20040253790 Method for manufacturing semiconductor device |
| 12/16/2004 | US20040253789 Process for forming a trench power MOS device suitable for large diameter wafers |
| 12/16/2004 | US20040253788 Non-volatile semiconductor memory and method of making same, and semiconductor device and method of making device |
| 12/16/2004 | US20040253787 Buried bit line non-volatile floating gate memory cell with independent controllable control gate in a trench, and array thereof, and method of formation |
| 12/16/2004 | US20040253786 Method for forming magnetic tunneling junction layer for magnetic random access memory |
| 12/16/2004 | US20040253785 [method for fabricating memory device having a deep trench capacitor] |
| 12/16/2004 | US20040253784 Dual layer barrier film techniques to prevent resist poisoning |
| 12/16/2004 | US20040253783 Semiconductor device and method for fabricating the same |
| 12/16/2004 | US20040253782 Transistor and electronic device |
| 12/16/2004 | US20040253781 Semiconductor device, and display device and electronic device utilizing the same |
| 12/16/2004 | US20040253780 Method of manufacturing dual gate oxide film |
| 12/16/2004 | US20040253779 Method for manufacturing a bipolar transistor using a CMOS process |
| 12/16/2004 | US20040253777 Method and apparatus for forming film |
| 12/16/2004 | US20040253776 Gate-induced strain for MOS performance improvement |
| 12/16/2004 | US20040253775 Multi-step chemical mechanical polishing of a gate area in a finfet |
| 12/16/2004 | US20040253774 Double-gate transistor with enhanced carrier mobility |
| 12/16/2004 | US20040253773 SOI shaped structure |
| 12/16/2004 | US20040253772 Thin film transistor with multiple gates using metal induced lateral crystalization and method of fabricating the same |
| 12/16/2004 | US20040253771 Semiconductor device having semiconductor circuit formed by semiconductor elements and method for manufacturing the same |
| 12/16/2004 | US20040253770 Semiconductor device and process for fabrication thereof |
| 12/16/2004 | US20040253769 Method of manufacturing semiconductor device |
| 12/16/2004 | US20040253768 Method of manufacturing an electronic component and electronic component obtained by means of said method |
| 12/16/2004 | US20040253764 Bumped chip carrier package using lead frame and method for manufacturing the same |
| 12/16/2004 | US20040253763 Integrated circuit package with leadframe locked encapsulation and method of manufacture therefor |
| 12/16/2004 | US20040253762 Chip stack package, connecting board, and method of connecting chips |
| 12/16/2004 | US20040253761 Well for CMOS imager and method of formation |
| 12/16/2004 | US20040253760 Method to fabricate a highly perforated silicon diaphragm with controlable thickness and low stress |
| 12/16/2004 | US20040253759 Steady-state non-equilibrium distribution of free carriers and photon energy up-conversion using same |
| 12/16/2004 | US20040253753 Method for testing a remnant batch of semiconductor devices |
| 12/16/2004 | US20040253752 Method and system for monitoring implantation of ions into semiconductor substrates |
| 12/16/2004 | US20040253750 Method and apparatus for monitoring a density profile of impurities |
| 12/16/2004 | US20040253749 Method for inspecting a connecting surface of a flip chip |
| 12/16/2004 | US20040253747 Method and apparatus for dynamic thin-layer chemical processing of semiconductor wafers |
| 12/16/2004 | US20040253746 Semiconductor storage device and method of manufacturing the same |
| 12/16/2004 | US20040253553 Measuring masking pattern; calibration; stimulating optical intensity distribution |