Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2005
03/30/2005CN1602229A Semiconductor wafer cleaning systems and methods
03/30/2005CN1602144A Method of mounting wafer on printed wiring substrate
03/30/2005CN1602139A Hybrid integrated circuit device and method of manufacturing the same
03/30/2005CN1602137A 电路装置 Circuit means
03/30/2005CN1601769A Mfg method of light-emitting component having heat absorbing layer
03/30/2005CN1601766A Reduction method of sapphire substrate
03/30/2005CN1601762A Sucker type test platform controller for solar cell and its method
03/30/2005CN1601756A 半导体装置及其制造方法 Semiconductor device and manufacturing method
03/30/2005CN1601754A Semiconductor device and method for fabricating the same
03/30/2005CN1601752A Method for mfg.solid image senser element
03/30/2005CN1601751A Trough insulation voltage durable layer in SOI power element
03/30/2005CN1601750A 静态随机存取存储器 Static random access memory
03/30/2005CN1601749A Semiconductor integrated circuit device contg. nonvolatile semiconductor storage
03/30/2005CN1601748A Semiconductor device provided with overheat protection circuit and electronic circuit using the same
03/30/2005CN1601743A Semiconductor device and method of fabricating semiconductor device
03/30/2005CN1601742A Metal interconnect stucture and method for fabricating the same
03/30/2005CN1601741A Semiconductor device and method for fabricating the same
03/30/2005CN1601738A Mfg method of virtul welding lug structure avoiding generation of capacity
03/30/2005CN1601737A Crystal coated packing structure and its mfg method
03/30/2005CN1601736A Semiconductor integrated circuit and electronic apparatus having the same
03/30/2005CN1601735A Semiconductor device and method for fabricating the same
03/30/2005CN1601734A Elastic lug structure and its mfg method
03/30/2005CN1601732A Temp regulator of semiconductor substrate
03/30/2005CN1601729A Semiconductor device and its manufacturing method
03/30/2005CN1601727A Intermediate chip module, semiconductor element, circuit substrate and electronic equipment
03/30/2005CN1601726A Structure of vertical fast flasher and its mfg method
03/30/2005CN1601725A CMOS and its forming method
03/30/2005CN1601724A Method of mfg complementary thin film transister
03/30/2005CN1601723A Method for improving electrical property of inner connecting line structure
03/30/2005CN1601722A Mfg method of contact hole and mfg method of semiconductor element
03/30/2005CN1601721A Forming method of oblique inlaid inner connection structure of integrated circuit
03/30/2005CN1601720A Side wall doping method of isolating furrow
03/30/2005CN1601719A Structure of shallow ridge isolation area and dynamic DASD and its mfg method
03/30/2005CN1601718A Mounting equipment of electronic parts
03/30/2005CN1601717A Probe card substrate
03/30/2005CN1601716A Method of evaluating solution for coating film of semiconductor
03/30/2005CN1601714A Semiconductor device and its mfg.method
03/30/2005CN1601713A Method of manufacturing semiconductor device
03/30/2005CN1601712A Reinforced solder bump structure and method for forming a reinforced solder bump
03/30/2005CN1601711A Method of manufacturing a semiconductor device
03/30/2005CN1601710A Method of growing N-Al Co-doped p-type ZnO crystal membrane under protection of Ar
03/30/2005CN1601709A Method for fabricating a mosfet and reducing line width of gate structure
03/30/2005CN1601708A Etching device for high precision silicon senser chip
03/30/2005CN1601707A Processing method of SOC silicon substrate
03/30/2005CN1601706A Method and apparatus for joining adhesive tape
03/30/2005CN1601705A Method for dicing semiconductor wafer
03/30/2005CN1601704A 晶片的加工方法 Wafer processing method
03/30/2005CN1601703A Method of cleaning hydrogen-oxygen radical of wafer surface by super-pure water
03/30/2005CN1601702A In-situ metal barrier deposition of sputter etching on interconnect structure
03/30/2005CN1601701A Method for fabricating SIGE substrate materials on metastable insulator and substrate materials
03/30/2005CN1601700A Method of fabricating crystalline silicon and switching device using crystalline silicon
03/30/2005CN1601699A Strained silicon on relaxed SiGe film with uniform misfit dislocation density
03/30/2005CN1601698A Method of forming alignment mark
03/30/2005CN1601697A Method of forming light resist pattern by using reflect nearby effect
03/30/2005CN1601696A Mfg.method for deep trench capacitor structure
03/30/2005CN1601695A Processing method of RF flat spiral integrated inductance
03/30/2005CN1601694A Mfg.method of element and observing method thereof
03/30/2005CN1601693A Material with composite substrate of (Mg, Cd) In2O4/MgAl/204 and its prepn method
03/30/2005CN1601692A Circular splinter device and splinter method
03/30/2005CN1601674A Film capacitor, film capacitor arry and electronic component
03/30/2005CN1601650A Nonvolatile semiconductor memory device and manufacturing method thereof
03/30/2005CN1601579A Display panel and method for manufacturing the same
03/30/2005CN1601513A Integrated circuit and electronic apparatus provided with the same
03/30/2005CN1601387A Self-aligning method for outskirt state phase shifting light shade
03/30/2005CN1601386A Lithographic apparatus, device manufacturing method, and device manufactured thereby
03/30/2005CN1601385A Method of determining range of exposure dose in tech of picture quality detection of aligner
03/30/2005CN1601379A Method of mfg, wafer and method of evaluating overlapping alignment between light shade patterns
03/30/2005CN1601371A Solid luminous element, its mfg.method and projector
03/30/2005CN1601360A Thin film transistor circuit device, production method thereof and liquid crystal display using the thin film transistor circuit device
03/30/2005CN1601345A Method of mfg, LCD device and LCD panel
03/30/2005CN1601343A Electro-optical device, method for making the same, and electronic apparatus
03/30/2005CN1601332A Wavelength conversion apparatus
03/30/2005CN1601274A Method of measuring crystal defects in thin SI/SIGE bilayers
03/30/2005CN1601225A Checking device and method for integrated circuit pattern
03/30/2005CN1600901A Method for etching polysilicon based on inductively coupled plasma and for preparing superfine lines
03/30/2005CN1600780A Hypocrellin in cyclic ethylene diamine group, preparation method and usage
03/30/2005CN1600674A Nano composite inorganic semiconductor hollow ball and preparation method
03/30/2005CN1600658A Substrate delivery in-out device, method and substrate delivery appts. and method
03/30/2005CN1600484A Wire bonder with a downholder
03/30/2005CN1195329C Process for preparing plarization controllable photoelectric device
03/30/2005CN1195324C 半导体集成电路 The semiconductor integrated circuit
03/30/2005CN1195322C Method for forming double-layer low-dielectric barrier-layer using for interconnection and its forming apparatus
03/30/2005CN1195321C Thin film transistor planar display
03/30/2005CN1195320C Chip carrier of chip welding equipment
03/30/2005CN1195319C Process for forming transistor with metallic silicide on source and drain
03/30/2005CN1195318C Match circuit and plasma processing device
03/30/2005CN1195317C Process for making super-thin silicon nitride/silicon oxide grid electrode dielectric layer
03/30/2005CN1195316C Method for improving microspur consistency
03/30/2005CN1195315C Multiple-layer type dielectric antireflection layer and its forming method
03/30/2005CN1195302C Self-refreshing chip voltage generator
03/29/2005US6874137 Design data processing method and recording medium
03/29/2005US6874107 Integrated testing of serializer/deserializer in FPGA
03/29/2005US6873938 Adaptive lithographic critical dimension enhancement
03/29/2005US6873927 Control method of an automatic integrated circuit full testing system
03/29/2005US6873842 Wireless programmable logic devices
03/29/2005US6873828 Compound semiconductor switching device for high frequency switching
03/29/2005US6873563 Semiconductor circuit device adaptable to plurality of types of packages
03/29/2005US6873544 Triple sample sensing for magnetic random access memory (MRAM) with series diodes
03/29/2005US6873539 Semiconductor device
03/29/2005US6873535 Multiple width and/or thickness write line in MRAM