Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2005
03/31/2005DE102004035012A1 Thermische Kompensation in der Magnetfeldbeeinflussung eines Elektronenstrahls Thermal compensation in the magnetic influence of an electron beam
03/31/2005DE102004031516A1 Verfahren zur Herstellung von Flasch-Speicher-Bauelementen Hintergrund A process for preparing Flasch memory devices background
03/31/2005DE102004022576A1 Verfahren und Vorrichtung zum Koppeln von Leitern in einem Magnetspeicher Method and apparatus for coupling of conductors in a magnetic memory
03/31/2005DE102004018635A1 Verfahren und System zur Kalibrierung eines spannungsgesteuerten Oszillators (VCO) A method and system for calibrating a voltage controlled oscillator (VCO)
03/31/2005DE10164800B4 Verfahren zur Herstellung eines elektronischen Bauelements mit mehreren übereinander gestapelten und miteinander kontaktierten Chips A method of manufacturing an electronic component having a plurality of stacked and bonded chips contacted
03/31/2005DE10046302B4 Verfahren zum Bilden eines Tiefgrabenkondensators A method of forming a low-capacitor grave
03/31/2005CA2539108A1 Operator independent programmable sample preparation and analysis system
03/31/2005CA2538113A1 A system and method for testing and configuring semiconductor functional circuits
03/30/2005EP1519641A2 Module and method of manufacturing module
03/30/2005EP1519490A1 Control circuit and reconfigurable logic block
03/30/2005EP1519487A1 Method and arrangement for reducing leakage current in semiconductor circuits
03/30/2005EP1519480A1 Radio frequency voltage controlled oscillator
03/30/2005EP1519423A1 Semiconductor light-emitting device
03/30/2005EP1519421A1 Multiple gate semiconductor device and method for forming same
03/30/2005EP1519420A2 Multiple gate semiconductor device and method for forming same
03/30/2005EP1519419A2 Semiconductor device and manufacturing method thereof
03/30/2005EP1519418A1 Semiconductor device and method for manufacturing same
03/30/2005EP1519417A2 Magnetic random access memory comprising MTJ layer and method of manufacturing
03/30/2005EP1519415A2 Electronic parts built-in substrate and method of manufacturing the same
03/30/2005EP1519414A1 Multilayer wiring circuit module and method for fabricating the same
03/30/2005EP1519412A2 Method of mounting wafer on printed wiring substrate
03/30/2005EP1519411A2 Semiconductor device and method for fabricating the same
03/30/2005EP1519410A1 Method for producing electrical through hole interconnects and devices made thereof
03/30/2005EP1519409A1 A method of fabrication of a substrate for an epitaxial growth
03/30/2005EP1519309A1 Radio card with a reinforced chip
03/30/2005EP1519234A2 Stripping and cleaning compositions for microelectronics
03/30/2005EP1519233A1 Lithographic apparatus and device manufacturing method
03/30/2005EP1519231A1 Lithographic apparatus and device manufacturing method
03/30/2005EP1519230A1 Lithographic apparatus and device manufacturing method
03/30/2005EP1519228A2 Positive resist composition and pattern formation method using the same
03/30/2005EP1519226A2 Stencil mask, production method thereof, exposure apparatus, exposure method and electronic device production method
03/30/2005EP1519200A1 Method for optimizing probe card analysis and scrub mark analysis data
03/30/2005EP1519101A2 Purgeable container
03/30/2005EP1518910A1 Polishing composition for semiconductor wafers
03/30/2005EP1518669A2 Method for bonding substrates and method for irradiating particle beam to be utilized therefor
03/30/2005EP1518646A2 Resilient polishing pad for chemical mechanical polishing
03/30/2005EP1518634A1 A method of and a device for separating semiconductor elements formed in a wafer of semiconductor material
03/30/2005EP1518451A1 Magnetic shielding for electronic circuits which include magnetic materials
03/30/2005EP1518281A2 Buffer layers for organic electroluminescent devices and methods of manufacture and use
03/30/2005EP1518280A2 Transistor and sensors made from molecular materials with electric dipoles
03/30/2005EP1518279A2 Device for maintaining an object under vacuum and methods for making same, use in non-cooled infrared sensors
03/30/2005EP1518278A1 Vertical nrom
03/30/2005EP1518277A2 Method for the production of a nrom memory cell field
03/30/2005EP1518276A1 Integrated circuit structure for mixed-signal rf applications and circuits
03/30/2005EP1518275A2 Method for producing a component comprising a conductor structure that is suitable for use at high frequencies and corresponding component
03/30/2005EP1518270A1 Packaging for semiconductor components and method for producing the same
03/30/2005EP1518269A1 Method for contacting parts of a component integrated into a semiconductor substrate
03/30/2005EP1518268A2 Method for dynamic sensor configuration and runtime execution
03/30/2005EP1518267A2 Electronic component with a housing packaging
03/30/2005EP1518266A1 Method for producing a hetero-bipolar transistor and hetero-bipolar-transistor
03/30/2005EP1518265A2 Process for etching dielectric films with improved resist and/or etch profile characteristics
03/30/2005EP1518264A1 Conductive spacers extended floating gates
03/30/2005EP1518263A1 Hafnium-aluminum oxide dielectric films
03/30/2005EP1518262A1 Reflection mirror apparatus, exposure apparatus and device manufacturing method
03/30/2005EP1518261A1 Angled sensors for detecting substrates
03/30/2005EP1518255A2 Thermal sprayed yttria-containing coating for plasma reactor
03/30/2005EP1518247A1 Method of erasing a flash memory using a pre-erasing step
03/30/2005EP1518245A2 Enhanced read-write methods for negative differential resistance (ndr) based memory device
03/30/2005EP1518198A2 Method and apparatus for automatic sensor installation
03/30/2005EP1518150A2 Method of using an amorphous carbon layer for reticle fabrication
03/30/2005EP1518143A1 Connection means for setting up an electric connection between a cell, in particular a crystal liquid cell, and a power or control circuit
03/30/2005EP1517972A1 Metal polish composition, polishing method using the composition and method for producing wafer using the polishing method
03/30/2005EP1461816A4 Mems device having contact and standoff bumps and related methods
03/30/2005EP1449220B1 Magnetoresistive memory cell comprising a dynamic reference layer
03/30/2005EP1425109A4 Electro-optical component including a fluorinated poly (phenylene ether ketone) protective coating and related methods
03/30/2005EP1388166B1 Production method for a semiconductor component
03/30/2005EP1384263B1 Support for electrical circuit elements
03/30/2005EP1334370B1 Method for locating defects in a test structure
03/30/2005EP1294537B1 Wafer carrier with groove for decoupling retainer ring from wafer
03/30/2005EP1226589B1 Infiltrated nanoporous materials and methods of producing same
03/30/2005EP1220071B1 Semiconductor device
03/30/2005EP1218465B1 Polishing system with stopping compound and method of its use
03/30/2005EP1181718A4 Improved trench isolation process to deposit a trench fill oxide prior to sidewall liner oxidation growth
03/30/2005EP1018160A4 Hydrogenated oxidized silicon carbon material
03/30/2005EP0953066B1 Method of filling gaps with INDUCTIVELY COUPLED PLASMA CVD
03/30/2005EP0843894B1 Encapsulant with fluxing properties and method of use
03/30/2005CN2689447Y Chip cutters
03/30/2005CN2689446Y Covering ring and plasma processor
03/30/2005CN2689294Y Fine ultraviolet light beam sources
03/30/2005CN1602563A Plasma production device and method and RF driver circuit
03/30/2005CN1602554A Baking oven for photovoltaic devices
03/30/2005CN1602551A Semiconductor device and method for manufacturing same
03/30/2005CN1602549A Wafer mapping device and load port with the device
03/30/2005CN1602548A Semiconductor package device and method of formation and testing
03/30/2005CN1602547A Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
03/30/2005CN1602546A In situ sensor based control of semiconductor processing procedure
03/30/2005CN1602545A Method of fixing a sealing object to a base object
03/30/2005CN1602544A Method for making high voltage MOS transistor by ion implantation
03/30/2005CN1602543A Plasma processor
03/30/2005CN1602542A 等离子体蚀刻方法 The plasma etching method
03/30/2005CN1602541A Valve unit and heat treatment system
03/30/2005CN1602540A Simultaneous formation of deep trench capacitor and resistor
03/30/2005CN1602539A Method for fabricating semiconductor device
03/30/2005CN1602538A Advanced process control for immersion processing
03/30/2005CN1602531A Matrix-addressable array of integrated transistor/memory structures
03/30/2005CN1602451A Maskless photon-electron spot-grid array printer
03/30/2005CN1602450A Method and apparatus for image formation
03/30/2005CN1602449A Method of enhancing phase shift masks
03/30/2005CN1602421A 点格栅阵列成像系统 Dot grid array imaging system
03/30/2005CN1602343A Dual cure B-stageable adhesive for die attach
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