Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2005
05/26/2005US20050112796 Semiconductor package heat spreaders and fabrication methods therefor
05/26/2005US20050112795 Novel encapsulation method for SBGA
05/26/2005US20050112794 Improved bond pad
05/26/2005US20050112793 Methods of forming a high conductivity diamond film and structures formed thereby
05/26/2005US20050112790 Method of manufacturing liquid crystal display
05/26/2005US20050112789 Well for CMOS imager and method of formation
05/26/2005US20050112788 Evaluating a multi-layered structure for voids
05/26/2005US20050112614 Generating set of tiles with binding segments; labeling
05/26/2005US20050112509 Method of depositing an amrphous carbon layer
05/26/2005US20050112508 Lithographic projection apparatus, device manufacturing method and device manufactured thereby
05/26/2005US20050112507 Apparatus and method of forming a photoresist pattern, and repair nozzle
05/26/2005US20050112506 Graphite like areas etched in situ leaving pattern
05/26/2005US20050112504 Method of producing semiconductor integrated circuit device and method of producing multi-chip module
05/26/2005US20050112503 Potassium hydroxide alkali builder, phosphonic acid and a perfluoroalkyl sulphonate surfactant; forming a relief image of alkali soluble epoxy
05/26/2005US20050112497 Prevent excess acid in exposed resist; phenol derivative light absorber; ether, aldehyde derivative cross linking agent; sulfonate derivative thermal acid generator; cyclohexanone solvent; formanilide photo base generator
05/26/2005US20050112481 Projection optical system scans reticle shape, uses measurement as correction data, repeats multiple measurments and updates before exposing pattern image
05/26/2005US20050112479 Methods of preventing cross-linking between multiple resists and patterning multiple resists
05/26/2005US20050112477 Multilayer light absorption film on quartz substrate; Sputtering in argon, oxygen, nitrogen atmosphere to deposit molybdenum silicon oxynitride film; chromium oxycarbide anti reflective film
05/26/2005US20050112475 Monitoring pattern configured to obtain information required for adjusting optical system; asymmetrical diffraction grating generates positive first order diffracted light and negative first order diffracted light; probing phase shifters
05/26/2005US20050112474 Method involving a mask or a reticle
05/26/2005US20050112386 A polysiloxane in an oxygen-containing organic solvent; the dry silica film has an improved dielectric constant, storage stability, and adhesion to other silica films
05/26/2005US20050112383 A polysiloxane and an organotitanium chelate compound having no alkoxy group; improved storage stability, patterning and burying properties, defect-free
05/26/2005US20050112354 Polishing sheet and manufacturing method of elastic plastic foam sheet
05/26/2005US20050112340 Bonding structure with buffer layer and method of forming the same
05/26/2005US20050112282 Vapor deposition of silicon dioxide nanolaminates
05/26/2005US20050112279 Dynamic release wafer grip and method of use
05/26/2005US20050111956 Methods and systems for reducing the effect of vibration in a vacuum-based semiconductor handling system
05/26/2005US20050111944 Compact wafer handling system with single axis robotic arm and prealigner-cassette elevator
05/26/2005US20050111943 Drive-section-isolated foup opener
05/26/2005US20050111937 Method of manufacturing a semiconductor integrated circuit device which prevents foreign particles from being drawn into a semiconductor container containing semiconductor wafers
05/26/2005US20050111936 Multi-chamber system
05/26/2005US20050111935 Apparatus and method for improved wafer transport ambient
05/26/2005US20050111797 Device package and methods for the fabrication and testing thereof
05/26/2005US20050111726 Parts manipulation and inspection system and method
05/26/2005US20050111497 Laser irradiation apparatus and method for manufacturing semiconductor device
05/26/2005US20050111339 Laser irradiation apparatus, laser irradiation method, and method of manufacturing a semiconductor device
05/26/2005US20050111290 Programmable sub-surface aggregating metallization structure and method of making same
05/26/2005US20050111288 Semiconductor memory device and storage method thereof
05/26/2005US20050111279 Process for making and programming and operating a dual-bit multi-level ballistic MONOS memory
05/26/2005US20050111269 Semiconductor memory with nonvolatile memory cell array and semiconductor device with nonvolatile memory cell array and logic device
05/26/2005US20050111267 Semiconductor integrated circuit device
05/26/2005US20050111262 Non-volatile memory and method of operation
05/26/2005US20050111257 Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping
05/26/2005US20050111254 Magnetic memory device and methods for making same
05/26/2005US20050111253 Apparatus and method of analyzing a magnetic random access memory
05/26/2005US20050111251 Memory cell structure
05/26/2005US20050111250 High density memory array
05/26/2005US20050111248 Semiconductor constructions
05/26/2005US20050111162 Thin film capacitor, high-density packaging substrate incorporating thin film capacitor, and method for manufacturing thin-film capacitor
05/26/2005US20050111161 Compact pinlifter assembly integrated in wafer chuck
05/26/2005US20050111153 Semiconductor integrated circuit having protection elements for preventing MOS transistors from plasma damage
05/26/2005US20050111145 Magnetoresistive effect element, magnetic head, and magnetic reproducing apparatus
05/26/2005US20050111144 Magneto-resistive element and device being provided with magneto-resistive element having magnetic nano-contact
05/26/2005US20050111081 Broad band deep ultraviolet/vacuum ultraviolet catadioptric imaging system
05/26/2005US20050111080 Mirror for use in a lithographic apparatus, lithographic apparatus, device manufacturing method, and device manufactured thereby
05/26/2005US20050111010 Scanner linearity tester
05/26/2005US20050111005 Lithographic interferometer system
05/26/2005US20050111004 Specimen inspection apparatus and reference value setting unit and method of the specimen inspection apparatus
05/26/2005US20050110997 Reticle, reticle inspection method and reticle inspection apparatus
05/26/2005US20050110987 System for detection of wafer defects
05/26/2005US20050110985 Advanced mask cleaning and handling
05/26/2005US20050110974 Edge-holding aligner
05/26/2005US20050110972 Illumination system and exposure apparatus
05/26/2005US20050110971 Lithographic apparatus and device manufacturing method
05/26/2005US20050110970 Lithographic apparatus, device manufacturing method, and device manufactured thereby
05/26/2005US20050110968 Exposure apparatus and device manufacturing method
05/26/2005US20050110967 Cooling system, exposure apparatus having the same, and device manufacturing method
05/26/2005US20050110966 Exposure apparatus, and device manufacturing method using the same
05/26/2005US20050110965 Lithographic alignment system and device manufacturing method
05/26/2005US20050110940 Method of manufacturing panel for liquid crystal display by division exposure
05/26/2005US20050110935 Semiconductor chip, tape carrier package having the same mounted thereon, and liquid crystal display apparatus including the tape carrier package
05/26/2005US20050110932 Thin film transistor substrate of horizontal electric field type liquid crystal display device and fabricating method thereof
05/26/2005US20050110927 Active-matrix addressed reflective LCD and method of fabricating the same
05/26/2005US20050110919 Liquid crystal cell carrying case
05/26/2005US20050110832 Printhead and ink supply arrangement
05/26/2005US20050110720 Image display device
05/26/2005US20050110608 Trimmer impedance component, semiconductor device and trimming method
05/26/2005US20050110543 Digital signal transmission circuit and method of designing it
05/26/2005US20050110516 Semiconductor device
05/26/2005US20050110512 Contact resistance device for improved process control
05/26/2005US20050110511 Integrated circuit with controllable test access to internal analog signal pads of an area array
05/26/2005US20050110509 Contactor having conductive particles in a hole as a contact electrode
05/26/2005US20050110507 Electrical characteristic measuring probe and method of manufacturing the same
05/26/2005US20050110424 Flat panel display
05/26/2005US20050110421 Active matrix type display device
05/26/2005US20050110397 Film forming method, device manufacturing method, and electro-optic device
05/26/2005US20050110292 Ceramic end effector for micro circuit manufacturing
05/26/2005US20050110291 Ultra-thin wafer handling system
05/26/2005US20050110288 Dynamic release wafer grip and method of use
05/26/2005US20050110287 200 MM notched/flatted wafer edge gripping end effector
05/26/2005US20050110169 Semiconductor device and method of making the same
05/26/2005US20050110165 Semiconductor chip, semiconductor device, circuit board, and electronic instrument
05/26/2005US20050110164 Bump-on-lead flip chip interconnection
05/26/2005US20050110163 Flip chip bonding method for enhancing adhesion force in flip chip packaging process and metal layer-built structure of substrate for the same
05/26/2005US20050110162 Electronic component having at least one semiconductor chip and flip-chip contacts, and method for producing the same
05/26/2005US20050110161 Method for mounting semiconductor chip and semiconductor chip-mounted board
05/26/2005US20050110160 Semiconductor module and method for forming the same
05/26/2005US20050110159 Stacked integrated circuit device including multiple substrates and method of manufacturing the same
05/26/2005US20050110157 Device package and method for the fabrication and testing thereof
05/26/2005US20050110156 Wafer level packages for chips with sawn edge protection
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