Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2005
05/24/2005US6897508 Integrated capacitor with enhanced capacitance density and method of fabricating same
05/24/2005US6897507 Capacitor for high performance system-on-chip using post passivation device
05/24/2005US6897506 Systems and methods using non-volatile memory cells
05/24/2005US6897505 On-chip capacitor
05/24/2005US6897504 Salicided MOS device and one-sided salicided MOS device, and simultaneous fabrication method thereof
05/24/2005US6897503 Semiconductor memory device and manufacturing process for the same
05/24/2005US6897502 Semiconductor memory device and its manufacturing method
05/24/2005US6897501 Avoiding shorting in capacitors
05/24/2005US6897499 Semiconductor integrated circuit device including MISFETs each with a gate electrode extended over a boundary region between an active region and an element isolation trench
05/24/2005US6897498 Polycrystalline germanium-based waveguide detector integrated on a thin silicon-on-insulator (SOI) platform
05/24/2005US6897496 Semiconductor device, a method of manufacturing the same and storage media
05/24/2005US6897495 Field effect transistor and manufacturing method therefor
05/24/2005US6897493 Semiconductor device
05/24/2005US6897483 Second gallium nitride layers that extend into trenches in first gallium nitride layers
05/24/2005US6897481 Semiconductor devices and manufacturing methods thereof
05/24/2005US6897479 ITO film contact structure, TFT substrate and manufacture thereof
05/24/2005US6897477 Semiconductor device, manufacturing method thereof, and display device
05/24/2005US6897476 Test structure for determining electromigration and interlayer dielectric failure
05/24/2005US6897472 Semiconductor device including MOSFET having band-engineered superlattice
05/24/2005US6897463 Wafer carrier mapping sensor assembly
05/24/2005US6897462 Surface position detection device and exposure apparatus and exposure method achieved by utilizing detection device
05/24/2005US6897457 Apparatus and method for monitoring and tuning an ion beam in ion implantation apparatus
05/24/2005US6897456 Differential pumping system and exposure apparatus
05/24/2005US6897454 Energy beam exposure method and exposure apparatus
05/24/2005US6897430 Semiconductor device, optoelectronic board, and production methods therefor
05/24/2005US6897422 Measuring configuration and method for measuring a critical dimension of at least one feature on a semiconductor wafer
05/24/2005US6897415 Workpiece stage of a resist curing device
05/24/2005US6897414 Ceramic heater for semiconductor manufacturing/testing apparatus
05/24/2005US6897411 Heated substrate support
05/24/2005US6897403 Plasma processing method and plasma processing apparatus
05/24/2005US6897385 Semiconductor test board for fine ball pitch ball grid array package
05/24/2005US6897383 Electrical cable moisture barrier
05/24/2005US6897267 Multilayer ink jet print heads; crosslinked polymer
05/24/2005US6897174 Composite metal oxide compound; ferroelectricity, piezoelectricity, thermoelectricity
05/24/2005US6897166 Method of fabricating semiconductor device and system of fabricating semiconductor device
05/24/2005US6897164 Aperture masks for circuit fabrication
05/24/2005US6897163 Method for depositing a low dielectric constant film
05/24/2005US6897162 Integrated ashing and implant annealing method
05/24/2005US6897161 Removing deposits from silicon electrode plates includes radiating ultrasonic waves toward a surface of the plate having openings of the plurality of gas nozzles from a horn connected to an ultrasonic vibrator
05/24/2005US6897160 Methods for forming rough ruthenium-containing layers and structures/methods using same
05/24/2005US6897159 Method for fabricating semiconductor device
05/24/2005US6897158 Process for making angled features for nanolithography and nanoimprinting
05/24/2005US6897157 Method of repairing an opaque defect on a mask with electron beam-induced chemical etching
05/24/2005US6897156 Vacuum plasma processor method
05/24/2005US6897155 Method for etching high-aspect-ratio features
05/24/2005US6897154 Selective etching of low-k dielectrics
05/24/2005US6897153 Etching gas composition for silicon oxide and method of etching silicon oxide using the same
05/24/2005US6897152 Copper bath composition for electroless and/or electrolytic filling of vias and trenches for integrated circuit fabrication
05/24/2005US6897151 Methods of filling a feature on a substrate with copper nanocrystals
05/24/2005US6897150 Semiconductor wafer surface and method of treating a semiconductor wafer surface
05/24/2005US6897149 Method of producing electronic device material
05/24/2005US6897148 Electroplating and electroless plating of conductive materials into openings, and structures obtained thereby
05/24/2005US6897147 Solution for copper hillock induced by thermal strain with buffer zone for strain relaxation
05/24/2005US6897146 System architecture of semiconductor manufacturing equipment
05/24/2005US6897145 Method for fabricating semiconductor device by forming damascene interconnections
05/24/2005US6897144 Cu capping layer deposition with improved integrated circuit reliability
05/24/2005US6897143 Method of manufacturing semiconductor device including two-step polishing operation for cap metal
05/24/2005US6897142 Formation of solder balls having resin member as reinforcement
05/24/2005US6897141 Solder terminal and fabricating method thereof
05/24/2005US6897140 Fabrication of structures of metal/semiconductor compound by X-ray/EUV projection lithography
05/24/2005US6897139 Group III nitride compound semiconductor device
05/24/2005US6897138 Method and apparatus for producing group III nitride compound semiconductor
05/24/2005US6897137 Process for fabricating ultra-low contact resistances in GaN-based devices
05/24/2005US6897136 Method for forming fuse in semiconductor device
05/24/2005US6897135 Method for fabricating metal interconnections
05/24/2005US6897134 Method for making a semiconductor device having a high-k gate dielectric
05/24/2005US6897133 Method for producing a schottky diode in silicon carbide
05/24/2005US6897132 Method of reducing the conductivity of a semiconductor and devices made thereby
05/24/2005US6897131 Advances in spike anneal processes for ultra shallow junctions
05/24/2005US6897130 Method for thermal processing semiconductor wafer with a flash discharge lamp after preheating to a predetermined temperature
05/24/2005US6897129 Fabrication method of semiconductor device and semiconductor device
05/24/2005US6897128 Method of manufacturing semiconductor device, plasma processing apparatus and plasma processing method
05/24/2005US6897127 Semiconductor device, method of manufacturing the same, circuit board, and electronic instrument
05/24/2005US6897126 Semiconductor device manufacturing method using mask slanting from orientation flat
05/24/2005US6897125 Methods of forming backside connections on a wafer stack
05/24/2005US6897124 Method of manufacturing a bonded wafers using a Bernoulli chuck
05/24/2005US6897123 Bonding of parts with dissimilar thermal expansion coefficients
05/24/2005US6897122 Wide neck shallow trench isolation region to prevent strain relaxation at shallow trench isolation region edges
05/24/2005US6897121 Method of removing HDP oxide deposition
05/24/2005US6897120 Method of forming integrated circuitry and method of forming shallow trench isolation in a semiconductor substrate
05/24/2005US6897118 Method of multiple pulse laser annealing to activate ultra-shallow junctions
05/24/2005US6897117 Method of manufacturing semiconductor device
05/24/2005US6897116 Method and structure to improve the gate coupling ratio (GCR) for manufacturing a flash memory device
05/24/2005US6897115 Method of fabricating non-volatile memory device
05/24/2005US6897114 Methods of forming a transistor having a recessed gate electrode structure
05/24/2005US6897113 Single poly EEPROM with improved coupling ratio
05/24/2005US6897112 Method for fabricating an integrated semiconductor configuration with the aid of thermal oxidation, related semiconductor configuration, and related memory unit
05/24/2005US6897111 Method using quasi-planar double gated fin field effect transistor process for the fabrication of a thyristor-based static read/write random-access memory
05/24/2005US6897110 Method of protecting a memory array from charge damage during fabrication
05/24/2005US6897109 Methods of manufacturing integrated circuit devices having contact holes using multiple insulating layers
05/24/2005US6897108 Process for planarizing array top oxide in vertical MOSFET DRAM arrays
05/24/2005US6897107 Method for forming TTO nitride liner for improved collar protection and TTO reliability
05/24/2005US6897106 Capacitor of semiconductor memory device that has composite Al2O3/HfO2 dielectric layer and method of manufacturing the same
05/24/2005US6897105 Method of forming metal oxide gate structures and capacitor electrodes
05/24/2005US6897104 Semiconductor device and method for manufacturing thereof
05/24/2005US6897102 Process to minimize polysilicon gate depletion and dopant penetration and to increase conductivity
05/24/2005US6897101 Method for writing to the magnetoresistive memory cells of an integrated magnetoresistive semiconductor memory
05/24/2005US6897100 Method for processing semiconductor device apparatus for processing a semiconductor and apparatus for processing semiconductor device
05/24/2005US6897098 Method of fabricating an ultra-narrow channel semiconductor device
05/24/2005US6897097 Semiconductor device and a method of manufacturing the same