Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2005
06/23/2005US20050136606 Spacer for a gate electrode having tensile stress and a method of forming the same
06/23/2005US20050136605 MOS transistor gates with thin lower metal silicide and methods for making the same
06/23/2005US20050136603 Manufacturing method of semiconductor device
06/23/2005US20050136602 Dual-trench isolated crosspoint memory array
06/23/2005US20050136601 Non-volatile semiconductor memory devices having self-aligned gate conductive layers and methods of fabricating such devices
06/23/2005US20050136600 Magnetic elements with ballistic magnetoresistance utilizing spin-transfer and an MRAM device using such magnetic elements
06/23/2005US20050136599 Method of making high-voltage bipolar/CMOS/DMOS (BCD) devices
06/23/2005US20050136598 Thin-film transistor used as heating element for microreaction chamber
06/23/2005US20050136597 Method of manufacturing semiconductor device including nonvolatile memory
06/23/2005US20050136596 Semiconductor constructions
06/23/2005US20050136595 Method for manufacturing semiconductor device
06/23/2005US20050136594 Method for forming bit-line of semiconductor device
06/23/2005US20050136593 Method for fabricating semiconductor device with dual gate dielectric structure
06/23/2005US20050136592 Method of manufacturing self-aligned non-volatile memory device
06/23/2005US20050136591 Method of and apparatus for performing sequential processes requiring different amounts of time in the manufacturing of semiconductor devices
06/23/2005US20050136590 Method for forming capacitor of semiconductor device
06/23/2005US20050136589 Method for integrating high-k dielectrics in transistor devices
06/23/2005US20050136588 Method of forming isolation regions
06/23/2005US20050136586 Method of making a non-volatile memory using a plasma oxidized high-k charge-trapping layer
06/23/2005US20050136585 Method of fabricating semiconductor devices with replacement, coaxial gate structure
06/23/2005US20050136584 Strained transistor integration for CMOS
06/23/2005US20050136583 Advanced strained-channel technique to improve CMOS performance
06/23/2005US20050136582 Method and device for automated layer generation for double-gate FinFET designs
06/23/2005US20050136581 Semiconductor memory cell and semiconductor memory device
06/23/2005US20050136580 Hydrogen free formation of gate electrodes
06/23/2005US20050136579 Method for manufacturing a metal oxide transistor having reduced 1/f noise
06/23/2005US20050136578 Method of manufacturing thin film transistor
06/23/2005US20050136577 Microelectronic device fabrication method
06/23/2005US20050136576 Plasma treatment method and plasma treatment apparatus
06/23/2005US20050136575 Method for forming gate of semiconductor device
06/23/2005US20050136574 Thin film transistor and process for making an array panel
06/23/2005US20050136573 Method of making direct contact on gate by using dielectric stop layer
06/23/2005US20050136571 Encapsulating a device
06/23/2005US20050136570 Process for producing optical semiconductor device
06/23/2005US20050136569 Plastic lead frames utilizing reel-to-reel processing
06/23/2005US20050136568 Manufacturing method of semiconductor device, semiconductor device, circuit substrate and electronic equipment
06/23/2005US20050136567 Warpage control of array packaging
06/23/2005US20050136566 Methods of forming a high germanium concentration silicon germanium alloy by epitaxial lateral overgrowth and structures formed thereby
06/23/2005US20050136565 Fabrication of movable micromechanical components employing low-cost, high-resolution replication technology method
06/23/2005US20050136564 Method of laterally growing GaN with indium doping
06/23/2005US20050136563 Backside failure analysis of integrated circuits
06/23/2005US20050136561 Process for fabricating films of uniform properties on semiconductor devices
06/23/2005US20050136560 Process control apparatus, systems, and methods
06/23/2005US20050136559 Quality improvement system
06/23/2005US20050136558 Stacked semiconductor device assembly and method for forming
06/23/2005US20050136556 Manufacturing method of semiconductor device
06/23/2005US20050136555 Method of manufacturing semiconductor device
06/23/2005US20050136554 Method for manufacturing semiconductor device
06/23/2005US20050136548 Apparatus for detection and analysis of nucleic acids in blood; gene expression analysis; discriminating between the components of mixtures comprising, toxins, bacteria and food
06/23/2005US20050136483 Preparing receptor-nanofusion for use as targeting tool in monitoring ligand binding interaction; drug targeting and delivery
06/23/2005US20050136419 Method and apparatus for nanogap device and array
06/23/2005US20050136361 Exposure system and pattern formation method using the same
06/23/2005US20050136358 Patterning using wax printing and lift off
06/23/2005US20050136346 Optimized correction of wafer thermal deformations in a lithographic process
06/23/2005US20050136341 Designing and forming the auxiliary pattern according to the density function so as to prevent local or global variations between the desired critical dimension (CD) and actual CD from occurring
06/23/2005US20050136338 Using a photomask that can prevent critical dimension biases of pattern images of different pattern densities while forming a circuit pattern
06/23/2005US20050136337 Method for forming wires of sub-micron-order scale
06/23/2005US20050136335 Sequential linewidth measurement and trimming of a patterned mask layer to form multiply trimmed patterned mask layer; precise linewidth control
06/23/2005US20050136334 Device manufacturing method and mask for use therein
06/23/2005US20050136292 Thin film dielectrics with perovskite structure and preparation thereof
06/23/2005US20050136268 Formed by condensation polymerization; solvent extraction; screen printing; porogens; heat resistance; mechanical properties
06/23/2005US20050136251 Heat-peelable pressure-sensitive adhesive sheet
06/23/2005US20050136240 Very low dielectric constant plasma-enhanced CVD films
06/23/2005US20050136193 Selective self-initiating electroless capping of copper with cobalt-containing alloys
06/23/2005US20050136185 Post rinse to improve selective deposition of electroless cobalt on copper for ULSI application
06/23/2005US20050135906 Extractor/buffer
06/23/2005US20050135905 Glass substrate transporting facility
06/23/2005US20050135903 Wafer loading station that automatically retracts from a moving conveyor in response to an unscheduled event
06/23/2005US20050135166 Memory device capable of stable data writing
06/23/2005US20050135155 Nonvolatile semiconductor memory device
06/23/2005US20050135154 Nonvolatile semiconductor memory adapted to store a multi-valued data in a single memory cell
06/23/2005US20050135150 Magnetic memory storage device
06/23/2005US20050135033 Semiconductor integrated circuit apparatus
06/23/2005US20050135020 Magnetoresistive element and magetoresistive magnetic head, magnetic recording apparatus and magnetoresistive memory device using the same
06/23/2005US20050134973 Method for producing an optical unit
06/23/2005US20050134967 Projection lens and microlithographic projection exposure apparatus
06/23/2005US20050134868 Method of checking a laser processed deteriorated layer
06/23/2005US20050134867 Systems and methods for measuring distance of semiconductor patterns
06/23/2005US20050134866 Pattern-producing method for semiconductor device
06/23/2005US20050134865 Method for determining a map, device manufacturing method, and lithographic apparatus
06/23/2005US20050134835 Methods of determining an etching end point based on compensation for etching distubances
06/23/2005US20050134834 Method and apparatus for performing limited area spectral analysis
06/23/2005US20050134829 Lithographic apparatus, device manufacturing method, and device manufactured thereby
06/23/2005US20050134828 Lithographic apparatus and device manufacturing method
06/23/2005US20050134827 Lithographic apparatus and device manufacturing method
06/23/2005US20050134824 Grating patch arrangement, lithographic apparatus, method of testing, device manufacturing method, and device manufactured thereby
06/23/2005US20050134823 Photolithography system and method of monitoring the same
06/23/2005US20050134822 Optimized polarization illumination
06/23/2005US20050134821 Assembly, a lithographic apparatus, and a device manufacturing method
06/23/2005US20050134819 Lithographic projection apparatus and device manufacturing method
06/23/2005US20050134818 Lithographic apparatus and device manufacturing method
06/23/2005US20050134817 Liquid immersion type exposure apparatus
06/23/2005US20050134814 Lithographic apparatus and method of manufacturing a device
06/23/2005US20050134755 Liquid crystal display device and method of fabricating the same
06/23/2005US20050134753 Electrooptical device, method of manufacturing the same, and electronic equipment
06/23/2005US20050134533 Sustain driver, sustain control system, and plasma display
06/23/2005US20050134507 Ceramic embedded wireless antenna
06/23/2005US20050134419 Semiconductor integrated circuit and fabrication method thereof
06/23/2005US20050134365 CMOS reference voltage circuit
06/23/2005US20050134359 Metal-oxide-semiconductor device having integrated bias circuit
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