Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2005
12/07/2005CN1705100A Semiconductor integrated circuit, method for designing semiconductor integrated circuit and system for designing semiconductor integrated circuit
12/07/2005CN1705099A 半导体器件 Semiconductor devices
12/07/2005CN1705098A Method and structure for low K intermediate dielectric layer
12/07/2005CN1705097A Substrate conveying device and method
12/07/2005CN1705096A Short detection circuit and short detection method
12/07/2005CN1705095A Semiconductor inspection apparatus and tray for inspection parts used thereof
12/07/2005CN1705094A Lug detection device and method of IC parts, and lug forming method
12/07/2005CN1705093A Semiconductor device
12/07/2005CN1705092A Method of fabricating a built-in chip type substrate
12/07/2005CN1705091A IC packaging process
12/07/2005CN1705090A Sticking and positioning technology based system and method for chip substrate packaging
12/07/2005CN1705089A Method for back-repairing pin packaging free device
12/07/2005CN1705088A Tunnel oxynitride in flash memories
12/07/2005CN1705087A Method for forming oxide layer in ONO structure
12/07/2005CN1705086A Method of manufacturing semiconductor device having multiple gate oxide films
12/07/2005CN1705085A Method of manufacturing circuit device
12/07/2005CN1705084A Method of forming field-effect-transistor metallic silicon grid electrode
12/07/2005CN1705083A Semiconductor stack gate and manufacturing method thereof
12/07/2005CN1705082A Structure and making method of gallium nitride high electron mobility transistor
12/07/2005CN1705081A Semiconductor device
12/07/2005CN1705080A 半导体器件 Semiconductor devices
12/07/2005CN1705079A Plasma processing device and impedance adjusting method
12/07/2005CN1705078A Semiconductor structure and its forming method
12/07/2005CN1705077A Semiconductor materials and method of forming semiconductor materials
12/07/2005CN1705076A Method of forming semiconductor parts and semiconductor parts
12/07/2005CN1705075A Semiconductor wafer with a test circuit and making method thereof
12/07/2005CN1704846A Positive resist composition and compound used therein
12/07/2005CN1704845A Photosensitive polymer and chemically amplified photoresist composition including the same
12/07/2005CN1704827A Liquid crystal display device and method of making same
12/07/2005CN1704809A Process for making smoothing lens of liquid crystal on silicon (LCOS) and structure thereof
12/07/2005CN1704797A Projection optical system and pattern drawing device
12/07/2005CN1704455A Coating compositions for use with an overcoated photoresist
12/07/2005CN1704321A Integrated circuit wafer packaging system and method
12/07/2005CN1231100C Method and device for transmitting flexible printed circuit board
12/07/2005CN1231097C Inductance coupling plasma processing apparatus
12/07/2005CN1230954C Ion producer and static charge removing apparatus
12/07/2005CN1230920C Method for producing contacts and solar cells and solar cells
12/07/2005CN1230916C Integrated circuit with at least one capacitor and method for producing same
12/07/2005CN1230915C MIM capacitor
12/07/2005CN1230914C Schottky diode prototyping element and preparation thereof
12/07/2005CN1230913C Method for producing Schottky semiconductor component
12/07/2005CN1230911C Thin-film transistor
12/07/2005CN1230910C Semiconductor device
12/07/2005CN1230909C Semiconductor device and its manufacture
12/07/2005CN1230907C Compensating device, circuit, method and application
12/07/2005CN1230906C Electrooptic device, manufacturing method thereof, liquid crystal device and projective display device
12/07/2005CN1230905C Semiconductor device
12/07/2005CN1230904C Non--volatile semiconductor memory
12/07/2005CN1230903C CMOS device
12/07/2005CN1230902C Protection circuit set in semiconductor circuit
12/07/2005CN1230901C Semiconductor device
12/07/2005CN1230899C Semiconductor module and its manufacture
12/07/2005CN1230898C Improved interconnection of devices
12/07/2005CN1230897C Semiconductor capsulation structure and its mfg. method
12/07/2005CN1230896C Method for producing portable electronic device with integrated circuit protected by photosensitive resin
12/07/2005CN1230895C Semiconductor package assembly with central lead and its packaging method
12/07/2005CN1230892C Method of manufacturing a display device
12/07/2005CN1230891C Manufacture method of CMOS film transistor module
12/07/2005CN1230890C Semiconductor device and its making method
12/07/2005CN1230889C Semiconductor memory with same property storage units and making method thereof
12/07/2005CN1230888C Semiconductor element and producing method thereof
12/07/2005CN1230887C Method of manufacturing a semi conductor device having a porous dielectric layer and air gaps
12/07/2005CN1230886C Method for realizing high speed cell transmission
12/07/2005CN1230885C Fault-tolerance method and system of testing chip for boundary scanning
12/07/2005CN1230884C lead key closing method and salient point forming method and salient
12/07/2005CN1230883C Forming method for resin diaphragm and resin diaphragm forming device using said method
12/07/2005CN1230882C Method of mfg. semiconductor device, and semiconductor device
12/07/2005CN1230881C Method for making platfond-shape film transistor with low-temp. polysilicon
12/07/2005CN1230880C Method of making power MOSFET
12/07/2005CN1230879C Method for improving uniformity and reducing etch rate variation of etching polysilicon
12/07/2005CN1230878C Semiconductor device and its preparing method
12/07/2005CN1230877C Plasma apparatus and production method thereof
12/07/2005CN1230876C Method for removing stop-layer
12/07/2005CN1230875C Wafer cleaning device and its brush-cleaning assembly
12/07/2005CN1230874C Method for producing wafer with strain channel layer
12/07/2005CN1230873C Regulating device and method of position deviation optical detecting device
12/07/2005CN1230872C Manufacture of wafers and binding bands
12/07/2005CN1230871C Heat treatment device and heat treatment method
12/07/2005CN1230870C Pad pasting object and process for separation with the rubber film thereof
12/07/2005CN1230869C Device for predicting service life of rotation machine and method for predicting and determining maintenance period
12/07/2005CN1230856C Method for precise molding and alignment of structures on substrate using stretchable mold
12/07/2005CN1230830C RAM high speed test control circuit and its testing method
12/07/2005CN1230802C System and method for controlling passive bipolar electric arc
12/07/2005CN1230719C Nonaqueous protective film stripping liquid handling apparatus and nonaqueous protective film stripping liquid handling method
12/07/2005CN1230718C Method and composition for removing sodium-containing material from microcircuit substrates
12/07/2005CN1230717C Photographic corrosion mfg method for mixing chromium-free film and phase transition mixed type photo mask, and photographic corrosion manufacturing method employing the mask
12/07/2005CN1230716C Mask-free nano pattern making method and equipment
12/07/2005CN1230715C Photoresist composition for deep UV and process thereof
12/07/2005CN1230674C Whole set testing equipment employing X-rays
12/07/2005CN1230486C Cerium oxide slurry, and method of mfg. substrate
12/07/2005CN1230483C Adhesive for bonding circuit members, circuit board, and method of producing same
12/07/2005CN1230455C Copolymer resin, preparation thereof, and photoresist using the same
12/07/2005CN1230376C Manufacture of membrane
12/07/2005CN1230366C Method and apparatus for hot separating adhered articles
12/07/2005CN1230286C Cutter
12/07/2005CN1230279C Integrated endpoint detection system with optical and eddy current monitoring
12/07/2005CN1230278C Device for controlling homogeneity of edge polishing
12/06/2005USRE38914 Dual damascene patterned conductor layer formation method without etch stop layer
12/06/2005US6973397 Alignment method and parameter selection method
12/06/2005US6973390 Method and system for analyzing wafer yield against uses of a semiconductor tool
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