Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2005
12/01/2005US20050264778 Lithographic apparatus and device manufacturing method
12/01/2005US20050264775 Lithographic apparatus, device manufacturing method and radiation system
12/01/2005US20050264774 Exposure apparatus and method for producing device
12/01/2005US20050264773 Lithographic apparatus having a gas flushing device
12/01/2005US20050264745 Liquid crystal display device and method of fabricating the same
12/01/2005US20050264742 Liquid crystal display device and method for manufacturing the same
12/01/2005US20050264736 Substrate for display device, manufacturing method for same and display device
12/01/2005US20050264347 Internal voltage generating circuit and semiconductor integrated circuit device
12/01/2005US20050264328 Reset circuitry for an integrated circuit
12/01/2005US20050264315 Test device for electrical testing of a unit under test
12/01/2005US20050264312 Test device for electrical testing of a unit under test, as well as a method for production of a test drive
12/01/2005US20050264308 Test board locking device including stiffener
12/01/2005US20050264307 Anisotropic conductivity connector, conductive paste composition, probe member, and wafer inspection device, and wafer inspecting method
12/01/2005US20050264279 Wafer test equipment and method of aligning test equipment
12/01/2005US20050264278 Device for releasable connecting an interface with a test equipment
12/01/2005US20050264228 Organic electro luminescent display panel and fabricating method thereof
12/01/2005US20050264188 Combinational structures for electro-luminescent displays
12/01/2005US20050264176 Active matrix substrate, method of manufacturing active matrix substrate, and intermediate transfer substrate for manufacturing active matrix substrate
12/01/2005US20050264175 Light emitting device
12/01/2005US20050264134 Adaptive shape substrate support system
12/01/2005US20050264132 Apparatus to control displacement of a body spaced-apart from a surface
12/01/2005US20050263915 Imprinting method, information recording medium-manufacturing method, and imprinting apparatus
12/01/2005US20050263911 Circuit device and manufacturing method thereof
12/01/2005US20050263909 Semiconductor device
12/01/2005US20050263908 Material for forming insulating film with low dielectric constant, low dielectric insulating film, method for forming low dielectric insulating film and semiconductor device
12/01/2005US20050263907 Method of manufacturing semiconductor device and support structure for semiconductor substrate
12/01/2005US20050263906 Electronic system including a semiconductor device with at least one semiconductor die, a carrier, and an encapsulant that fills a space between the die and the carrier and covers intermediate conductive elements that connect the die and the carrier
12/01/2005US20050263905 Method for manufacturing circuit device
12/01/2005US20050263904 Structure of dummy pattern in semiconductor device
12/01/2005US20050263903 forming an adhesion layer in contact with a substrate and electricoconductive surface layers using electrophotoghic imaging masks, to improve lamination, and increase the reliability and quality of electronic circuits
12/01/2005US20050263902 Barrier free copper interconnect by multi-layer copper seed
12/01/2005US20050263901 Semiconductor device formed by in-situ modification of dielectric layer and related methods
12/01/2005US20050263900 Semiconductor device having silicon carbide and conductive pathway interface
12/01/2005US20050263899 Photoresist process to enable sloped passivation bondpad openings for ease of metal step coverings
12/01/2005US20050263897 Reducing the migration of grain boundaries
12/01/2005US20050263896 Air gap formation method for reducing undesired capacitive coupling between interconnects in an integrated circuit device
12/01/2005US20050263895 Circuit device and manufacturing method thereof
12/01/2005US20050263894 Semiconductor chip with metallization levels, and a method for fomation of interconnect structrures
12/01/2005US20050263893 Chip structure and process for forming the same
12/01/2005US20050263892 Method of forming copper interconnection in semiconductor device and semiconductor device using the same
12/01/2005US20050263891 Diffusion barrier for damascene structures
12/01/2005US20050263890 Methods of forming metal-nitride layers in contact holes and layers so formed
12/01/2005US20050263889 Semiconductor device
12/01/2005US20050263888 Integrated circuit assemblies and assembly methods
12/01/2005US20050263887 Circuit carrier and fabrication method thereof
12/01/2005US20050263882 Semiconductor device and method of manufacturing the same
12/01/2005US20050263880 Circuit device and manufacturing method thereof
12/01/2005US20050263878 Cold weld hermetic MEMS package and method of manufacture
12/01/2005US20050263876 Dual damascene structure for the wiring-line structures of multi-level interconnects in integrated circuit
12/01/2005US20050263873 Interposer substrate, semiconductor package and semiconductor device, and their producing methods
12/01/2005US20050263871 Method of fabricating semiconductor device and semiconductor device
12/01/2005US20050263869 Semiconductor device and manufacturing process therefor
12/01/2005US20050263868 Semiconductor device, method for manufacturing the same, circuit board, and electronic equipment
12/01/2005US20050263866 Hermetic pacakging and method of manufacture and use therefore
12/01/2005US20050263864 Partially patterned lead frames and methods of making and using the same in semiconductor packaging
12/01/2005US20050263863 Semiconductor device and a method of manufacturing the same
12/01/2005US20050263862 System and method for forming one or more integrated circuit packages using a flexible leadframe structure
12/01/2005US20050263860 Semiconductor device and method for manufacturing the same
12/01/2005US20050263858 Semiconductor device
12/01/2005US20050263857 Electronic device and method for fabricating the same
12/01/2005US20050263856 Semiconductor device and method of fabricating the same
12/01/2005US20050263854 Thick laser-scribed GaN-on-sapphire optoelectronic devices
12/01/2005US20050263853 Insulated gate semiconductor device
12/01/2005US20050263851 Transistor assembly and method for manufacturing same
12/01/2005US20050263850 Trench type buried on-chip precision programmable resistor
12/01/2005US20050263848 Metal-insulator-metal capacitor having a large capacitance and method of manufacturing the same
12/01/2005US20050263847 Semiconductor device and method for fabricating the same
12/01/2005US20050263846 Circuit device
12/01/2005US20050263844 A Wideband Gap Power Semiconductor Device Having A Low On-Resistance And Having A High Aavalanche Ccapability Used For Power Control
12/01/2005US20050263843 Semiconductor device and fabrication method therefor
12/01/2005US20050263842 Semiconductor device with a short-lifetime region and manufacturing method thereof
12/01/2005US20050263835 Semiconductor device, and method of fabricating the same
12/01/2005US20050263834 Encapsulated spacer with low dielectric constant material to reduce the parasitic capacitance between gate and drain in CMOS technology
12/01/2005US20050263833 Apparatus for evaluating amount of charge, method for fabricating the same, and method for evaluating amount of charge
12/01/2005US20050263832 Multiple-gate MOSFET device with lithography independent silicon body thickness and methods for fabricating the same
12/01/2005US20050263831 Hybrid planar and FinFET CMOS devices
12/01/2005US20050263830 Partial replacement silicide gate
12/01/2005US20050263829 Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same
12/01/2005US20050263828 High performance semiconductor devices fabricated with strain-induced processes and methods for making same
12/01/2005US20050263827 Semiconductor device and method of fabricating the same
12/01/2005US20050263826 Complementary transistors having different source and drain extension spacing controlled by different spacer sizes
12/01/2005US20050263825 Technique for creating different mechanical stress in different channel regions by forming an etch stop layer having differently modified intrinsic stress
12/01/2005US20050263824 Semiconductor device and method of fabricating the same
12/01/2005US20050263822 Semiconductor device and manufacturing method thereof
12/01/2005US20050263821 Multiple-gate MOS transistor and a method of manufacturing the same
12/01/2005US20050263820 Semiconductor device and manufacturing method thereof
12/01/2005US20050263819 Transistor and method for manufacturing the same
12/01/2005US20050263816 Microelectronic device having floating gate protective layer and method of manufacture therefor
12/01/2005US20050263815 Memory device and method of manufacturing the same
12/01/2005US20050263814 Bottom electrode of capacitor of semiconductor device and method of forming the same
12/01/2005US20050263813 Capacitor on the semiconductor wafer
12/01/2005US20050263812 Semiconductor memory device
12/01/2005US20050263811 Semiconductor device
12/01/2005US20050263809 Ferroelectric memory and method of fabricating the same
12/01/2005US20050263807 Semiconductor device and method for forming a ferroelectric capacitor of the semiconductor device
12/01/2005US20050263806 Die for forming an optical element, and production method as well as regeneration method of the same
12/01/2005US20050263803 Semiconductor device includes gate insulating film having a high dielectric constant
12/01/2005US20050263802 Semiconductor device
12/01/2005US20050263801 Phase-change memory device having a barrier layer and manufacturing method
12/01/2005US20050263800 Power semiconductor device for suppressing substrate recirculation current and method of fabricating power semiconductor device
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