Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2007
08/23/2007US20070197020 Inline method to detect and evaluate early failure rates of interconnects
08/23/2007US20070197019 Liquid Crystal Display Device and Manufacturing Method Thereof
08/23/2007US20070197018 Wafer-leveled chip packaging structure and method thereof
08/23/2007US20070197017 Manufacturing method of semiconductor module
08/23/2007US20070197016 Semiconductor device and manufacturing method for the same
08/23/2007US20070197015 Methods for forming a metal contact in a semiconductor device in which an ohmic layer is formed while forming a barrier metal layer
08/23/2007US20070197014 Method of fabricating semiconductor device
08/23/2007US20070197013 Processed Wafer Via
08/23/2007US20070197012 Grain growth promotion layer for semiconductor interconnect structures
08/23/2007US20070197011 Method for improving self-aligned silicide extendibility with spacer recess using a stand-alone recess etch integration
08/23/2007US20070197010 Integrated carbon nanotube sensors
08/23/2007US20070197009 Method for improving self-aligned silicide extendibility with spacer recess using an aggregated spacer recess etch (ASRE) integration
08/23/2007US20070197008 Mirror-like input key
08/23/2007US20070197007 Method for forming silicon-containing film and method for decreasing number of particles
08/23/2007US20070197006 Method for making a semiconductor device comprising a lattice matching layer
08/23/2007US20070197005 Delamination resistant semiconductor film and method for forming the same
08/23/2007US20070197004 Nitride semiconductor component and process for its production
08/23/2007US20070197003 Flow method and reactor for manufacturing nanocrystals
08/23/2007US20070197002 Method of and mechanism for peeling adhesive tape bonded to segmented semiconductor wafer
08/23/2007US20070197001 Method of manufacturing chip resistors
08/23/2007US20070197000 Method of manufacturing chip resistors
08/23/2007US20070196999 Method For Manufacturing Semiconductor Device
08/23/2007US20070196998 System and method for forming moveable features on a composite substrate
08/23/2007US20070196997 Method of forming isolation structure of semiconductor device
08/23/2007US20070196996 Semiconductor devices and methods of manufacturing thereof
08/23/2007US20070196995 Method for manufacturing simox wafer
08/23/2007US20070196994 Method of Fabricating Semiconductor Device Including Planarizing Conductive Layer Using Parameters of Pattern Density and Depth of Trenches
08/23/2007US20070196993 Semiconductor element
08/23/2007US20070196992 In-situ doped silicon germanium and silicon carbide source drain region for strained silicon CMOS transistors
08/23/2007US20070196991 Semiconductor device having a strain inducing sidewall spacer and a method of manufacture therefor
08/23/2007US20070196990 Method for fabricating metal-oxide semiconductor transistors
08/23/2007US20070196989 Semiconductor device with strained transistors and its manufacture
08/23/2007US20070196988 Poly pre-doping anneals for improved gate profiles
08/23/2007US20070196987 Pseudomorphic Si/SiGe/Si body device with embedded SiGe source/drain
08/23/2007US20070196986 Method for manufacturing semiconductor device
08/23/2007US20070196985 Semiconductor memory device and method of manufacturing the same
08/23/2007US20070196984 Nonvolatile memory device, layer deposition apparatus and method of fabricating a nonvolatile memory device using the same
08/23/2007US20070196983 Method of manufacturing non-volatile memory device
08/23/2007US20070196982 Nrom non-volatile mode of operation
08/23/2007US20070196981 Active matrix type liquid crystal display device
08/23/2007US20070196980 Line edge roughness reduction
08/23/2007US20070196979 Flip chip in package using flexible and removable leadframe
08/23/2007US20070196978 Integrated circuitry comprising a pair of adjacent capacitors
08/23/2007US20070196977 Capacitance dielectric layer, capacitor and forming method thereof
08/23/2007US20070196976 Semiconductor device
08/23/2007US20070196975 Metal-Polishing Liquid And Polishing Method Using The Same
08/23/2007US20070196974 Semiconductor device including bipolar junction transistor with protected emitter-base junction
08/23/2007US20070196973 Phosphorous doping methods of manufacturing field effect transistors having multiple stacked channels
08/23/2007US20070196972 Semiconductor device having carrier mobility raised by generating strain in channel region and its manufacture method
08/23/2007US20070196971 Scalable embedded EEPROM memory cell
08/23/2007US20070196970 Method for manufacturing a semiconductor device using a nitrogen containing oxide layer
08/23/2007US20070196969 Semiconductor device and method of manufacturing the same
08/23/2007US20070196968 Beam irradiation apparatus, beam irradiation method, and method for manufacturing semiconductor device
08/23/2007US20070196967 Laser beam micro-smoothing
08/23/2007US20070196966 Method of manufacturing insulating film, method of manufacturing transistor, and method of manufacturing electronic device
08/23/2007US20070196965 Manufacturing method of semiconductor device
08/23/2007US20070196964 Thin film transistor array panel and method of manufacturing the same
08/23/2007US20070196963 Poly filled substrate contact on soi structure
08/23/2007US20070196962 Method for manufacturing thin film transistor
08/23/2007US20070196961 Gate CD trimming beyond photolithography
08/23/2007US20070196960 Semiconductor device and method of manufacturing the same
08/23/2007US20070196959 Thin film transistor circuit and display utilizing the same
08/23/2007US20070196958 Method for using partitioned masks to build a chip
08/23/2007US20070196957 Method of resin sealing electronic part
08/23/2007US20070196956 Semiconductor device and method of manufacturing the same
08/23/2007US20070196955 Manufacturing method of semiconductor device
08/23/2007US20070196954 Manufacturing method of semiconductor device
08/23/2007US20070196953 Method and apparatus for forming stacked die and substrate structures for increased packing density
08/23/2007US20070196952 Manufacturing method of semiconductor device
08/23/2007US20070196951 Method of manufacturing high power array type semiconductor laser device
08/23/2007US20070196950 Semiconductor device and manufacturing the same
08/23/2007US20070196948 Stacked chip-based system and method
08/23/2007US20070196947 Methods of fabricating image sensors
08/23/2007US20070196946 Method for forming thin film structure and thin film structure, oscillation sensor, pressure sensor, and acceleration sensor
08/23/2007US20070196945 Process for wafer level treatment to reduce stiction and passivate micromachined surfaces and compounds used therefor
08/23/2007US20070196944 Electrical conditioning of MEMS device and insulating layer thereof
08/23/2007US20070196943 Tightness test for disk bond connections and test structure for carrying out said method
08/23/2007US20070196942 Method for producing group III nitride crystal, group III nitride crystal obtained by such method, and group III nitride substrate using the same
08/23/2007US20070196941 Method for manufacturing a bottom substrate of a liquid crystal display
08/23/2007US20070196940 Mold and manufacturing method for display device
08/23/2007US20070196939 Method of manufacturing light emitting diode package
08/23/2007US20070196938 Nitride semiconductor device and method for fabricating the same
08/23/2007US20070196937 Quantum Dot Manipulating Method And Quantum Dot Production/Manipulation Apparatus
08/23/2007US20070196936 Method of evaluating semiconductor device and method of manufacturing semiconductor device
08/23/2007US20070196935 Prediction of ESL/ILD remaining thickness
08/23/2007US20070196934 Predictions of leakage modes in integrated circuits
08/23/2007US20070196933 Method for production of MRAM elements
08/23/2007US20070196932 Method for forming ferroelectric capacitor and method for fabricating semiconductor device
08/23/2007US20070196745 comprising a slit-shaped main transmission region and three pairs of slit-shaped auxiliary transmission regions; improving resolution, high light intensity contrast, narrow the exposed width of the resist film with a small uniform width
08/23/2007US20070196011 Integrated vacuum metrology for cluster tool
08/23/2007US20070195853 Heat treatment apparatus and method of calibrating the apparatus
08/23/2007US20070195837 Laser apparatus, laser irradiation method, and manufacturing method of semiconductor device
08/23/2007US20070195653 Non-contact support platforms for distance adjustment
08/23/2007US20070195596 Semiconductor integrated circuit device, production and operation method thereof
08/23/2007US20070195592 Magnetic tunnel junction device and method of manufacturing the same
08/23/2007US20070195589 Thin film magnetic memory device for conducting data write operation by application of a magnetic field
08/23/2007US20070195575 Semiconductor integrated circuit
08/23/2007US20070195573 Dynamic ram-and semiconductor device
08/23/2007US20070195569 Thin Film Transistor Array Panel for Liquid Crystal Display and Method for Manufacturing the Same
08/23/2007US20070195326 Image processing alignment method and method of manufacturing semiconductor device
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