Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2007
08/29/2007CN100334688C Method for eliminating grid etching lateral notch
08/29/2007CN100334687C Method of manufacturing integrated circuit
08/29/2007CN100334686C Method for increasing CoSi2 film heat stability
08/29/2007CN100334685C Equipment for processing chip
08/29/2007CN100334678C Multi directional mechanical scanning in an ion implanter
08/29/2007CN100334652C Stable semiconductor storage device with pseudo storage unit
08/29/2007CN100334607C Method for driving electroluminescent display device
08/29/2007CN100334592C Visual contraposition method of not corresponding basis material
08/29/2007CN100334507C Substrate processing system for performing exposure process in gas atmosphere
08/29/2007CN100334443C Ion induced field effect transistor and producing method thereof
08/29/2007CN100334441C Method and device for inspecting an array of electronic components
08/29/2007CN100334253C Wiring repair apparatus
08/28/2007USRE39799 Memory cell array and method for manufacturing it
08/28/2007US7263681 Semiconductor integrated circuit device and layout method of patterns for semiconductor integrated circuit device
08/28/2007US7263679 Semiconductor integrated circuit device with boundary scan test and design automation apparatus, boundary scan test method and program
08/28/2007US7263463 Prediction apparatus and method for a plasma processing apparatus
08/28/2007US7263447 Method and apparatus for electron density measurement and verifying process status
08/28/2007US7263216 Pattern inspecting method and apparatus thereof, and pattern inspecting method on basis of electron beam images and apparatus thereof
08/28/2007US7263120 Semiconductor device to reduce power individually to each circuit
08/28/2007US7263118 Interference canceling device and method in mobile communication system
08/28/2007US7263000 NAND type memory with dummy cells adjacent to select transistors being biased at different voltage during data erase
08/28/2007US7262992 Hearing aid
08/28/2007US7262920 Optical element and manufacturing method therefor
08/28/2007US7262865 Method and apparatus for controlling a calibration cycle or a metrology tool
08/28/2007US7262864 Method and apparatus for determining grid dimensions using scatterometry
08/28/2007US7262852 Wafer-level testing of optical and optoelectronic chips
08/28/2007US7262849 Method of polishing thin film formed on substrate
08/28/2007US7262828 Near-field photomask and near-field exposure apparatus including the photomask
08/28/2007US7262825 Liquid crystal cell process for circular electrode in-plane switching mode liquid crystal display device and said device
08/28/2007US7262821 LCD with first and second circuit regions each with separately optimized transistor properties
08/28/2007US7262643 Semiconductor integrated circuit controlling output impedance and slew rate
08/28/2007US7262618 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
08/28/2007US7262613 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
08/28/2007US7262524 Bearing assembly, stage device using same, and exposure apparatus using same
08/28/2007US7262514 Epoxy resin composition for semiconductor encapsulation, semiconductor device using the same, and process for producing semiconductor device
08/28/2007US7262512 Surface mount chip package
08/28/2007US7262511 Conductive adhesive agent with ultrafine particles
08/28/2007US7262510 Chip package structure
08/28/2007US7262509 Microelectronic assembly having a perimeter around a MEMS device
08/28/2007US7262507 Semiconductor-mounted device and method for producing same
08/28/2007US7262506 Stacked mass storage flash memory package
08/28/2007US7262504 Multiple stage electroless deposition of a metal layer
08/28/2007US7262503 Semiconductor constructions
08/28/2007US7262502 Phase-change random access memory device and method for manufacturing the same
08/28/2007US7262501 Large-area nanoenabled macroelectronic substrates and uses therefor
08/28/2007US7262500 Interconnection structure
08/28/2007US7262499 Semiconductor packages
08/28/2007US7262498 Assembly with a ring and bonding pads formed of a same material on a substrate
08/28/2007US7262497 Bumpless assembly package
08/28/2007US7262496 Wiring base with wiring extending inside and outside of a mounting region
08/28/2007US7262490 Semiconductor chip with external connecting terminal
08/28/2007US7262489 Three-dimensionally formed circuit sheet, component and method for manufacturing the same
08/28/2007US7262488 Substrate with enhanced properties for planarization
08/28/2007US7262487 Semiconductor devices and other electronic components including porous insulators created from “void” creating materials
08/28/2007US7262486 SOI substrate and method for manufacturing the same
08/28/2007US7262483 Semiconductor device and method for manufacturing the same
08/28/2007US7262482 Open pattern inductor
08/28/2007US7262477 Semiconductor device
08/28/2007US7262474 Magnetic memory device and method of manufacturing the same
08/28/2007US7262473 Metal to polysilicon contact in oxygen environment
08/28/2007US7262472 Semiconductor device having stress and its manufacture method
08/28/2007US7262470 Semiconductor device
08/28/2007US7262469 Semiconductor device and method for manufacturing the same
08/28/2007US7262464 Semiconductor device with single crystal semiconductor layer(s) bonded to insulating surface of substrate
08/28/2007US7262463 Transistor including a deposited channel region having a doped portion
08/28/2007US7262462 Vertical double-channel silicon-on-insulator transistor and method of manufacturing the same
08/28/2007US7262460 Vertical insulated gate transistor and manufacturing method
08/28/2007US7262459 Semiconductor device and method of manufacturing the semiconductor device
08/28/2007US7262458 Semiconductor memory device and portable electronic apparatus
08/28/2007US7262457 Non-volatile memory cell
08/28/2007US7262456 Bit line structure and production method thereof
08/28/2007US7262455 Nonvolatile semiconductor memory device and nonvolatile semiconductor memory system
08/28/2007US7262453 Multiple stacked capacitors formed within an opening with thick capacitor dielectric
08/28/2007US7262451 High performance embedded DRAM technology with strained silicon
08/28/2007US7262450 MFS type field effect transistor, its manufacturing method, ferroelectric memory and semiconductor device
08/28/2007US7262449 MTJ element for magnetic random access memory
08/28/2007US7262447 Metal oxide silicon transistor and semiconductor apparatus having high λ and β performances
08/28/2007US7262446 Semiconductor device and process for production thereof
08/28/2007US7262445 Charge transfer device and solid-state image pickup device
08/28/2007US7262444 Power semiconductor packaging method and structure
08/28/2007US7262441 Laminates for encapsulating devices
08/28/2007US7262440 Light emitting diode package and fabrication method thereof
08/28/2007US7262434 Semiconductor device with a silicon carbide substrate and ohmic metal layer
08/28/2007US7262433 Semiconductor device
08/28/2007US7262432 Semiconductor device and fabrication method thereof
08/28/2007US7262431 Semiconductor thin film forming method and semiconductor device
08/28/2007US7262428 Strained Si/SiGe/SOI islands and processes of making same
08/28/2007US7262409 Chemical etch solution and technique for imaging a device's shallow junction profile
08/28/2007US7262405 Prefabricated housings for microelectronic imagers
08/28/2007US7262396 Solid-state imaging device
08/28/2007US7262243 Coating composition, antireflection film, photoresist and pattern formation method using it
08/28/2007US7262142 Semiconductor device fabrication method
08/28/2007US7262141 Methods for cleaning a semiconductor substrate having a recess channel region
08/28/2007US7262140 Method of smoothing waveguide structures
08/28/2007US7262139 Method suitable for batch ion etching of copper
08/28/2007US7262138 Organic BARC with adjustable etch rate
08/28/2007US7262137 Dry etching process for compound semiconductors
08/28/2007US7262136 Modified facet etch to prevent blown gate oxide and increase etch chamber life
08/28/2007US7262135 Methods of forming layers
08/28/2007US7262134 Microfeature workpieces and methods for forming interconnects in microfeature workpieces