| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
|---|
| 12/12/2007 | CN101085902A Compositions for chemical mechanical polishing silica and silicon nitride having improved endpoint detection |
| 12/12/2007 | CN101085901A Passivative chemical mechanical polishing composition for copper film planarization |
| 12/12/2007 | CN101085708A Durable graphite connector and method for manufacturing thereof |
| 12/12/2007 | CN101085699A Crystallized glass and method for producing crystallized glass |
| 12/12/2007 | CN101085698A Crystallized glass and method for producing crystallized glass |
| 12/12/2007 | CN101085653A Wafer storage container |
| 12/12/2007 | CN101085543A Light emitting unit, apparatus and method for manufacturing the same, apparatus for moulding lens thereof, and light emitting device package thereof |
| 12/12/2007 | CN100355325C Gas distribution electrode for plasma etching machine |
| 12/12/2007 | CN100355193C 半导体集成电路器件 The semiconductor integrated circuit device |
| 12/12/2007 | CN100355105C Organic electroluminescence device and its manufacturing method |
| 12/12/2007 | CN100355103C Method of producing organic semiconductor device |
| 12/12/2007 | CN100355096C Mfg method of light-emitting component having heat absorbing layer |
| 12/12/2007 | CN100355091C Method for fabricating tandem thin film photoelectric converter |
| 12/12/2007 | CN100355087C Semiconductor device and method of manufacturing the same |
| 12/12/2007 | CN100355086C High voltage power MOSFET having a voltage sustaining region that includes doped columns formed by trench etching and diffusion from regions of oppositely doped polysilicon |
| 12/12/2007 | CN100355085C Semiconductor element with tungsten oxide layer and method for its production |
| 12/12/2007 | CN100355079C Image sensor and sealing method thereof |
| 12/12/2007 | CN100355077C Semiconductor device with built-in optical receiving component, its mfg. method and optical pick-up device |
| 12/12/2007 | CN100355076C Semiconductor substrate manufacturing method and semiconductor device manufacturing method, and semiconductor substrate and semiconductor device manufactured by the methods |
| 12/12/2007 | CN100355074C Process for producing semiconductor device |
| 12/12/2007 | CN100355073C Semiconductor device and method for fabricating the same |
| 12/12/2007 | CN100355072C Electrostatic discharge protection circuitry and method of operation |
| 12/12/2007 | CN100355069C Semiconductor device and method for manufacturing thereof |
| 12/12/2007 | CN100355068C Semiconductor device, and production method for manufacturing such semiconductor device |
| 12/12/2007 | CN100355067C Semiconductor device and its mfg. method |
| 12/12/2007 | CN100355066C Leadless type semiconductor package, and production process for manufacturing such leadless type semiconductor package |
| 12/12/2007 | CN100355065C Semi-conductor device and its manufacturing method |
| 12/12/2007 | CN100355063C Chip dimention packaging and method for preparing wafer-class chip dimention packing |
| 12/12/2007 | CN100355061C In-print method and in-print device |
| 12/12/2007 | CN100355060C Non-volatile memory manufacturing method |
| 12/12/2007 | CN100355059C Semiconductor device, method of generating semiconductor device pattern, method of manufacturing semiconductor device and pattern generator for semiconductor device |
| 12/12/2007 | CN100355058C Ionized PVD with sequential deposition and etching |
| 12/12/2007 | CN100355057C Electrode structure, and method for manufacturing thin-film structure |
| 12/12/2007 | CN100355056C Method for detecting silicon chip state in chip case and repositioning its circle center |
| 12/12/2007 | CN100355055C Method for controlling pre-aligning of silicon wafer |
| 12/12/2007 | CN100355054C Reliability screening method of infrared focus planardetector |
| 12/12/2007 | CN100355053C Probability constrained optimization for electrical fabrication control |
| 12/12/2007 | CN100355052C Testing mode control device using nonvolatile ferroeletric storage |
| 12/12/2007 | CN100355051C Back-flow pulling face down welding method of infrared focus planar detector |
| 12/12/2007 | CN100355050C RFID tag and method of manufacturing the same |
| 12/12/2007 | CN100355049C Film carrier tape for mounting of electronic part |
| 12/12/2007 | CN100355048C Adhesive sheet stamping device, adhesive sheet stamping method, part mounter, and display panel manufacturing method |
| 12/12/2007 | CN100355047C Method for manufacturing semiconductor device and protective resin coating device of semiconductor chip assembly |
| 12/12/2007 | CN100355046C Ion implantation of silicon oxide liner to prevent dopant out-diffusion from source/drain extensions |
| 12/12/2007 | CN100355045C Support with integrated deposit of gas absorbing material for manufacturing microelectronic, microoptoelectronic or micromechanical devices |
| 12/12/2007 | CN100355044C Semiconductor thin film, Semiconductor device and mfg. method thereof |
| 12/12/2007 | CN100355043C Method for forming an oxynitride spacer for a metal gate electrode using a PECVD process with a silicon-starving atmosphere |
| 12/12/2007 | CN100355042C Method of making layered superlattice material with ultra-thin top layer |
| 12/12/2007 | CN100355041C Method for manufacturing semiconductor device |
| 12/12/2007 | CN100355040C Plasma processing method, detecting method of completion of seasoning, plasma processing apparatus |
| 12/12/2007 | CN100355039C Plasma processing apparatus |
| 12/12/2007 | CN100355038C Plasma processor and variable impedance apparatus correcting method |
| 12/12/2007 | CN100355037C 晶片的加工方法 Wafer processing method |
| 12/12/2007 | CN100355036C Manufacturing method of semiconductor device |
| 12/12/2007 | CN100355035C Semiconductor wafer, method of manufacturing the same, and method of manufacturing a semiconductor device |
| 12/12/2007 | CN100355034C Wafer bonding surface processing agent and wafer bonding method |
| 12/12/2007 | CN100355033C Method of etching high aspect ratio features |
| 12/12/2007 | CN100355032C Substrate dividing method |
| 12/12/2007 | CN100355031C Method for deviding substrate |
| 12/12/2007 | CN100355030C Semiconductor chip and manufacturing method thereof |
| 12/12/2007 | CN100355029C Surface treating method for substrate |
| 12/12/2007 | CN100355028C Vapor phase epitaxy device |
| 12/12/2007 | CN100355027C Method for growing aluminum nitride with high quality on silicon substrate |
| 12/12/2007 | CN100355026C Method and apparatus for producing polysilicon film, semiconductor device, and manufacture thereof |
| 12/12/2007 | CN100355025C Detachable substrate or detachable structure and method for the production thereof |
| 12/12/2007 | CN100355024C Method for forming resist pattern and method for manufacturing semiconductor device |
| 12/12/2007 | CN100355023C Semiconductor fabrication apparatus and pattern formation method using the same |
| 12/12/2007 | CN100355022C Illuminating method, exposing method, and device for therefor |
| 12/12/2007 | CN100355021C 衬底处理设备和衬底处理方法 The substrate processing apparatus and a substrate processing method |
| 12/12/2007 | CN100355020C Wafer holder and semiconductor manufacturing apparatus |
| 12/12/2007 | CN100355019C Substrate processing apparatus, pressure control method for substrate processing apparatus |
| 12/12/2007 | CN100355018C Method for crystallizing semiconductor with laser beams |
| 12/12/2007 | CN100355017C Growth process capable of increasing zb-CrSb thickness |
| 12/12/2007 | CN100355016C Process for producing a movable structure and etchant for silicon oxide film |
| 12/12/2007 | CN100355015C Reaction room treating method |
| 12/12/2007 | CN100355014C Topside active optical device apparatus and method |
| 12/12/2007 | CN100355013C Semiconductor device and mfg. method therefor |
| 12/12/2007 | CN100354979C Semiconductor storing device |
| 12/12/2007 | CN100354978C 半导体集成电路器件 The semiconductor integrated circuit device |
| 12/12/2007 | CN100354977C Semiconductor memory device and erase method for memory array |
| 12/12/2007 | CN100354976C Non volatile storage device for high speed high efficiency changing in-site programmable door array function |
| 12/12/2007 | CN100354975C Semiconductor memory circuit |
| 12/12/2007 | CN100354973C Magnetic random access storage |
| 12/12/2007 | CN100354972C Thin film magnetic storage device with storage unit contg. magnetic tunnel node |
| 12/12/2007 | CN100354971C Semiconductor method |
| 12/12/2007 | CN100354908C Organic luminous displaying device and manufacturing method thereof |
| 12/12/2007 | CN100354776C Semiconductor run-to-run control system with state and model parameter estimation |
| 12/12/2007 | CN100354757C Charged particle beam exposure method and apparatus and device manufacturing method using the apparatus |
| 12/12/2007 | CN100354756C 正型感光性树脂组合物 The positive photosensitive resin composition |
| 12/12/2007 | CN100354755C External coating composition for photoresist agent and method for forming photoresist agent pattern using said composition |
| 12/12/2007 | CN100354741C Semiconductor device, reflective liquid crystal display device and reflective liquid crystal projector |
| 12/12/2007 | CN100354737C In plane switching mode liquid crystal display device and fabrication method thereof |
| 12/12/2007 | CN100354736C Liquid crystal display panel device and method of fabricating the same |
| 12/12/2007 | CN100354734C Automatic controller of liquid-crystal panel for panel crade of automatic detector and method thereof |
| 12/12/2007 | CN100354733C Electrode wiring substrate and display device |
| 12/12/2007 | CN100354729C Array substrate of in-plane switching type liquid crystal display and its manufacturing method |
| 12/12/2007 | CN100354708C Method of manufacturing substrate for liquid crystal display device and method of manufacturing liquid crystal display device using same |
| 12/12/2007 | CN100354640C Apparatus and method for handling and testing of wafers |
| 12/12/2007 | CN100354639C Method for detecting gallium nitride base LED quality good or not |
| 12/12/2007 | CN100354638C Measuring device of deep energy level transient state spectrum having external magnetic field and measuring method |