Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2007
12/05/2007CN101082592A Uneven checking method and device and recording medium
12/05/2007CN101081967A Pressure-sensitive adhesive sheet for dicing
12/05/2007CN101081692A Method for manufacturing semiconductor package structure having micro electro-mechanical system
12/05/2007CN101081488A Online control method of mixed type chemical mechanical buffing technics
12/05/2007CN101081485A Surface treatment method, nitride crystal substrate, semiconductor device, and method of manufacturing and semiconductor device
12/05/2007CN100353816C Apparatus and method for radio frequency decoupling and bias voltage control in a plasma reactor
12/05/2007CN100353577C Manufacturing method of light-emitting device with crystal coated light emitting diode
12/05/2007CN100353569C Vapor reaction preparation process of continuous ion layer in polyelement sulfide film
12/05/2007CN100353567C Method of manufacturing variable capacitor
12/05/2007CN100353566C Silicon layer structure with transformation particle size and method for forming the same structure by thermal technology
12/05/2007CN100353565C Thin-film transistor element and manufacturing method thereof
12/05/2007CN100353564C Process for ultra-thin body soi devices that incorporate epi silicon tips and article made thereby
12/05/2007CN100353563C High voltage resistant semiconductor device and method for manufacturing said device
12/05/2007CN100353562C Structure for and method of fabricating a high-mobility field-effect transistor
12/05/2007CN100353561C Metal-over-metal devices and the method for manufacturing same
12/05/2007CN100353556C Nonvolatile semiconductor memory device and method of manufacturing the same
12/05/2007CN100353555C Storing device and manufacturing method therefor
12/05/2007CN100353554C Standard cell back bias architecture
12/05/2007CN100353553C 半导体集成装置 The semiconductor integrated device
12/05/2007CN100353552C Device and method for providing shielding in radio frequency integrated circuits to reduce noise coupling
12/05/2007CN100353551C 半导体集成电路器件 The semiconductor integrated circuit device
12/05/2007CN100353549C Variable capacitor and its manufacturing method
12/05/2007CN100353547C Multi-chip circuit module and method for producing the same
12/05/2007CN100353546C Packing semiconductor device
12/05/2007CN100353543C Semiconductor assembly and its mfg.method
12/05/2007CN100353542C Integrated circuit, its forming method, and electronic assembly
12/05/2007CN100353541C Mold type semiconductor device and method for manufacturing the same
12/05/2007CN100353540C Contact structure of semiconductor device and method of manufacturing the same
12/05/2007CN100353539C LSI packaging and assembly method thereof
12/05/2007CN100353538C Non-lead semiconductor packaging structure with inverse bonding chip and producing method
12/05/2007CN100353536C Semicoductor radiating substrate and production method therefor and package
12/05/2007CN100353533C Semiconductor device and its manufacturing method
12/05/2007CN100353531C 半导体器件 Semiconductor devices
12/05/2007CN100353530C Method for producing semiconductor assenbly on SOI wafer
12/05/2007CN100353529C Method of identifying logical information in a programming and erasing cell by on-side reading scheme
12/05/2007CN100353528C Method for fabricating non-volatile memory
12/05/2007CN100353527C Method for producing elements with memory cells and memory cell array
12/05/2007CN100353526C Low power flash memory cell and method
12/05/2007CN100353525C Strained channel cmos device with fully silicided gate electrode and its forming method
12/05/2007CN100353524C Logic processing apparatus, semiconductor device and logic circuit
12/05/2007CN100353523C Titanium silicide realization method in CMOS process by means of titanium deposition at normal temperature
12/05/2007CN100353522C Novel device structure having enhanced surface adhesion and failure mode analysis
12/05/2007CN100353521C Chemical mechanical polishing process for manufacturing interconnection line structure of semiconductor devices
12/05/2007CN100353520C Method for making dual inlay structure and removing its remnant polymer
12/05/2007CN100353519C Method for forming copper teading wires in semiconductor device
12/05/2007CN100353518C Method for determining chemical mechanical milling tech. window in shallow slot isolation tech.
12/05/2007CN100353517C 基片支撑件 Substrate support member
12/05/2007CN100353516C Semiconductor machine
12/05/2007CN100353515C Method for online test of wafer metal interconnection line reliability
12/05/2007CN100353514C Method for stimulating defect chip and defect testing
12/05/2007CN100353513C Method of fixing a sealing object to a base object
12/05/2007CN100353512C Packaging structure of preventing warp and mfg. method thereof
12/05/2007CN100353511C Method for mfg. amorphous silicon film electric crystal of organic electricity excitation light
12/05/2007CN100353510C Insulation grid film transistor and control system thereof
12/05/2007CN100353509C Structure of Schottky diode and method for manufacturing same
12/05/2007CN100353508C Method for exactly controlling width of aluminium wire
12/05/2007CN100353507C Pattern formation substrate and method of pattern formation
12/05/2007CN100353506C Method for manufacturing semiconductor device
12/05/2007CN100353505C Selective etching of carbon-doped low-k dielectrics
12/05/2007CN100353504C Substrate joining method and apparatus
12/05/2007CN100353503C Machining apparatus with rotary cutter
12/05/2007CN100353502C 抛光垫 Polishing pad
12/05/2007CN100353501C Control of contact resistance in quantum well intermixed devices
12/05/2007CN100353500C Thermal processing method in technique for oxidizing grating
12/05/2007CN100353499C Semiconductor element and its producing method, semiconductor
12/05/2007CN100353498C Semiconductor device and method for manufacturing same
12/05/2007CN100353497C Method of fabrication of semiconductor device
12/05/2007CN100353496C High-level silane composition and silicon film forming method utilizing it
12/05/2007CN100353495C Method of forming light resist pattern by using reflect nearby effect
12/05/2007CN100353494C Improvement for ESD transistor source leaked capacitance
12/05/2007CN100353493C Heater module for semiconductor manufacturing device
12/05/2007CN100353492C Method for producing a microelectronic circuit and a microelectronic circuit
12/05/2007CN100353491C Method of fabricating microelectronic device using super critical fluid
12/05/2007CN100353490C Semiconductor device manufacturing method
12/05/2007CN100353489C Optical coupler and electronic equipment using same
12/05/2007CN100353488C Method for producing semiconductor device and cleaning device for resist stripping
12/05/2007CN100353487C Method for preparing capacitance
12/05/2007CN100353484C Method for adjusting voltage on a powered faraday shield
12/05/2007CN100353247C Liquid crystal display device and its manufacturing method
12/05/2007CN100353245C Method of manufacturing electro-optical device and heat treatment device for transparent substrate
12/05/2007CN100353244C Liquid crystal display device, and its manufacturing method anbd transistor array substrate and manufacturing method
12/05/2007CN100353224C Method for manufacturing liquid crystal display device
12/05/2007CN100353174C Positioning method for detecting flip-chip substrate
12/05/2007CN100353140C Method for in-situ monitoring of patterned substrate processing using reflectometry
12/05/2007CN100352877C Thermally peelable double sided adhesive sheet, method for processing adherend and electronic part
12/05/2007CN100352874C Apparatus and method for replacing a media content item
12/05/2007CN100352870C Organic anti-reflective coating polymer, its preparation method and organic anti-reflective coating composition comprising the same
12/05/2007CN100352565C 面板处理系统 Panel Processing System
12/05/2007CN100352557C Nozzle arrangement
12/04/2007USRE39932 Semiconductor interconnect formed over an insulation and having moisture resistant material
12/04/2007USH2207 Additional post-glass-removal processes for enhanced cell efficiency in the production of solar cells
12/04/2007US7305314 Method for inspecting defect and system therefor
12/04/2007US7305275 Material supply system in semiconductor device manufacturing plant
12/04/2007US7305161 Encapsulated photonic crystal structures
12/04/2007US7305116 Extracting method of pattern contour, image processing method, searching method of pattern edge, scanning method of probe, manufacturing method of semiconductor device, pattern inspection apparatus, and program
12/04/2007US7304883 Semiconductor integrated circuit
12/04/2007US7304881 Ferroelectric memory with wide operating voltage and multi-bit storage per cell
12/04/2007US7304799 Tunable optical filter with heater on a CTE-matched transparent substrate
12/04/2007US7304749 Point diffraction interferometer and exposure apparatus and method using the same
12/04/2007US7304744 Apparatus and method for measuring the thickness of a thin film via the intensity of reflected light