| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 01/24/2008 | US20080020580 Minimizing resist poisoning in the manufacture of semiconductor devices |
| 01/24/2008 | US20080020579 Method For Manufacturing A Membrane In A (111) Surface Of A (100) Silicon Wafer |
| 01/24/2008 | US20080020578 Composition for Chemical-Mechanical Polishing (Cmp) |
| 01/24/2008 | US20080020577 Gallium and chromium ions for oxide rate enhancement |
| 01/24/2008 | US20080020576 Method of forming polysilicon pattern |
| 01/24/2008 | US20080020575 Semiconductor wafer surface protecting sheet and semiconductor wafer protecting method using such protecting sheet |
| 01/24/2008 | US20080020574 Hybrid RF capacitively and inductively coupled plasma source using multifrequency RF powers and methods of use thereof |
| 01/24/2008 | US20080020573 Sacrificial substrate for etching |
| 01/24/2008 | US20080020572 Electrically conductive feature fabrication process |
| 01/24/2008 | US20080020571 Dense Seed Layer and Method of Formation |
| 01/24/2008 | US20080020570 Dual damascene fabrication with low k materials |
| 01/24/2008 | US20080020569 Method for Manufacturing Semiconductor Device |
| 01/24/2008 | US20080020568 Semiconductor device having a silicide layer and method of fabricating the same |
| 01/24/2008 | US20080020567 Method of Manufacturing a Semiconductor Device |
| 01/24/2008 | US20080020566 Method of making an interposer |
| 01/24/2008 | US20080020565 Dual Damascene Copper Process Using a Selected Mask |
| 01/24/2008 | US20080020564 Methods of forming a semiconductor device including a phase change material layer |
| 01/24/2008 | US20080020563 Protective film structure |
| 01/24/2008 | US20080020562 Method of fabricating semiconductor device |
| 01/24/2008 | US20080020561 Ball capturing apparatus, solder ball disposing apparatus, ball capturing method, and solder ball disposing method |
| 01/24/2008 | US20080020560 Method for manufacturing fuse box having vertically formed protective film |
| 01/24/2008 | US20080020559 Pad structure design with reduced density |
| 01/24/2008 | US20080020558 Multi-Step Process for Patterning a Metal Gate Electrode |
| 01/24/2008 | US20080020557 Method for forming transistor of semiconductor device using double patterning technology |
| 01/24/2008 | US20080020556 Semiconductor device and method for fabricating the same |
| 01/24/2008 | US20080020555 Method for manufacturing semiconductor device |
| 01/24/2008 | US20080020554 Method for manufacturing semiconductor device |
| 01/24/2008 | US20080020553 Dielectric vcsel gain guide |
| 01/24/2008 | US20080020552 Semiconductor substrates having low defects and methods of manufacturing the same |
| 01/24/2008 | US20080020551 Methods for preserving strained semiconductor substrate layers during CMOS processing |
| 01/24/2008 | US20080020550 Process for making thin film field effect transistors using zinc oxide |
| 01/24/2008 | US20080020549 Method and apparatus for forming an oxide layer on semiconductors |
| 01/24/2008 | US20080020548 Wafer laser processing method |
| 01/24/2008 | US20080020547 Method Of Transferring At Least One Object Of Micrometric Or Millimetric Size By Means Of A Polymer Handle |
| 01/24/2008 | US20080020546 Process for interfacial adhesion in laminate structures through patterned roughing of a surface |
| 01/24/2008 | US20080020545 Silicon-on-insulator semiconductor wafer |
| 01/24/2008 | US20080020544 Method for Forming Wall Oxide Layer and Isolation Layer in Flash Memory Device |
| 01/24/2008 | US20080020543 Manufacturing Method of Semiconductor Device |
| 01/24/2008 | US20080020542 Semiconductor devices and methods of manufacture thereof |
| 01/24/2008 | US20080020541 Method for manufacturing bonded SOI wafer and bonded SOI wafer manufactured thereby |
| 01/24/2008 | US20080020540 Manufacturing method of semiconductor device |
| 01/24/2008 | US20080020539 Dynamic random access memory and fabrication method thereof |
| 01/24/2008 | US20080020538 One Mask High Density Capacitor for Integrated Circuits |
| 01/24/2008 | US20080020537 Method of fabricating field effect transistor (FET) having wire channels |
| 01/24/2008 | US20080020536 Transistor structure with recessed source/drain and buried etch stop layer and related method |
| 01/24/2008 | US20080020535 Silicide cap structure and process for reduced stress and improved gate sheet resistance |
| 01/24/2008 | US20080020534 Semiconductor device fabrication methods |
| 01/24/2008 | US20080020533 Method and apparatus for semiconductor device with improved source/drain junctions |
| 01/24/2008 | US20080020532 Transistor with a channel comprising germanium |
| 01/24/2008 | US20080020531 Semiconductor devices having torsional stresses |
| 01/24/2008 | US20080020530 Manufacturing method of semiconductor device and semiconductor device |
| 01/24/2008 | US20080020529 Non-volatile memory and fabrication thereof |
| 01/24/2008 | US20080020528 Method of manufacturing semiconductor device and method of manufacturing nonvolatile semiconductor storage device |
| 01/24/2008 | US20080020527 Non-volatile memory cell having a silicon-oxide-nitride-oxide-silicon gate structure and fabrication method of such cell |
| 01/24/2008 | US20080020526 Method and system for determining semiconductor characteristics |
| 01/24/2008 | US20080020525 Method for fabricating semiconductor device |
| 01/24/2008 | US20080020524 Process For Controlling Performance Characteristics Of A Negative Differential Resistance (NDR) Device |
| 01/24/2008 | US20080020523 Method of fabricating complementary metal-oxide-semiconductor transistor and metal-oxide-semiconductor transistor |
| 01/24/2008 | US20080020522 Field effect transistors with dielectric source drain halo regions and reduced miller capacitance |
| 01/24/2008 | US20080020521 Hybrid substrate technology for high-mobility planar and multiple-gate mosfets |
| 01/24/2008 | US20080020520 Method for manufacturing lower substrate of liquid crystal display device |
| 01/24/2008 | US20080020519 LTPS-LCD Structure and Method for Manufacturing the Same |
| 01/24/2008 | US20080020518 Liquid crystal display panel |
| 01/24/2008 | US20080020517 Multi Lead Frame Power Package |
| 01/24/2008 | US20080020515 Twisted Dual-Substrate Orientation (DSO) Substrates |
| 01/24/2008 | US20080020514 Method for producing bonded wafer |
| 01/24/2008 | US20080020513 Method of fabricating semiconductor device having conducting portion of upper and lower conductive layers on a peripheral surface of the semiconductor device |
| 01/24/2008 | US20080020512 Method for making a semiconductor multi-package module having inverted wire bond carrier second package |
| 01/24/2008 | US20080020511 Structure of image sensor module and a method for manufacturing of wafer level package |
| 01/24/2008 | US20080020510 Fabrication method of semiconductor device |
| 01/24/2008 | US20080020509 Thin film materials of amorphous metal oxides |
| 01/24/2008 | US20080020507 Method for manufacturing semiconductor integrated circuit device |
| 01/24/2008 | US20080020506 Method for forming color filter |
| 01/24/2008 | US20080020505 Packaged microelectronic imagers and methods of packaging microelectronic imagers |
| 01/24/2008 | US20080020504 Sensors for detecting NOx in a gas and methods for fabricating the same |
| 01/24/2008 | US20080020503 Series interconnected optoelectronic device module assembly |
| 01/24/2008 | US20080020502 Method for manufacturing semiconductor optical device |
| 01/24/2008 | US20080020501 Liquid crystal display device and a manufacturing method of the same |
| 01/24/2008 | US20080020500 Flat panel display and method of fabricating the same |
| 01/24/2008 | US20080020499 Nanotube assembly including protective layer and method for making the same |
| 01/24/2008 | US20080020498 Fabrication method of semiconductor integrated circuit device |
| 01/24/2008 | US20080020497 Method for evaluating quality of semiconductor substrate and method for manufacturing semiconductor substrate |
| 01/24/2008 | US20080020496 Method of evaluating thermal treatment and method of manufacturing semiconductor wafer |
| 01/24/2008 | US20080020495 Semiconductor fabricating apparatus with function of determining etching processing state |
| 01/24/2008 | US20080020494 Film formation apparatus, precursor introduction method and film formation method |
| 01/24/2008 | US20080020493 Apparatus for supplying chemical, semiconductor manufacturing apparatus having the same, and method for supplying chemical |
| 01/24/2008 | US20080020492 Ferroelectric memory and its manufacturing method |
| 01/24/2008 | US20080020491 Magneticially lined conductors |
| 01/24/2008 | US20080020490 Method for manufacturing ferroelectric memory |
| 01/24/2008 | US20080020489 Methods of fabricating ferroelectric devices |
| 01/24/2008 | US20080020488 Semiconductor integrated circuit devices having high-Q wafer backside inductors and methods of fabricating same |
| 01/24/2008 | US20080020487 Alignment of carbon nanotubes on a substrate via solution deposition |
| 01/24/2008 | US20080020329 Method for fabricating semiconductor device and exposure mask |
| 01/24/2008 | US20080020321 A terpolymer based three monomers of (alpha-lower alkyl) acrylic esters; one having acid-dissociable, dissolution-inhibiting groups, another having lactone-containing monocyclic or polycyclic groups, one having polycyclic and alicyclic hydrocarbon groups which contain polar groups; dry etching re |
| 01/24/2008 | US20080020315 Substrate Collection Method and Substrate Treatment Apparatus |
| 01/24/2008 | US20080020298 Shading area of transmissivity of 0-2% at the center of a clear defect in a wiring pattern of a half tone mask; forming semitransparent areas of transmissivity of 10-25% adjacent to shading extending from inside of the edge of an imaginary pattern with no defect to the outside of the edge; accuracy |
| 01/24/2008 | US20080020294 test photomask includes first mask pattern and second mask pattern formed at center portion of first; first mask pattern is pattern with light condensing effect and nature in which exposure-dose amount to transfer object varies in dependence on focus variation, a two-dimensional Fresnel zone pattern |
| 01/24/2008 | US20080020168 Silicon on insulator structure with a single crystal cz silicon device layer having a region which is free of agglomerated intrinsic point defects |
| 01/24/2008 | US20080020146 Diffuser plate with slit valve compensation |
| 01/24/2008 | US20080020140 Chemical vapor deposition of a silicon nitride film on a substrate surface decomposing and/or activating a raw material gas supplied from the gas supply system by maintaining the heating element at a predetermined temperature; using a gaseous mixture of silane, ammonia and hydrogen; quality; |