Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2008
01/30/2008CN100365797C Method for reducing contact defects in semiconductor cells
01/30/2008CN100365796C Semiconductor device and production method thereof
01/30/2008CN100365795C Dipolar electrostatic chuck
01/30/2008CN100365794C Substrate processing device
01/30/2008CN100365793C Adhesive sheet for processing semiconductor and semiconductor processing method
01/30/2008CN100365792C Electronic device and method of manufacturing same
01/30/2008CN100365791C Method and device for machining a wafer, in addition to a wafer comprising a separation layer and a support layer
01/30/2008CN100365790C Semiconductor fault signal detecting and statistic system and its method
01/30/2008CN100365789C Method and apparatus for testing defective portion of semiconductor device
01/30/2008CN100365788C Method and apparatus for detecting polysilicon gate etching terminal
01/30/2008CN100365787C Writing buffer-supporting FLASH internal unit testing metod
01/30/2008CN100365786C Detecting method of silicon material quality in dielectrode integrated circuit
01/30/2008CN100365785C Wire bonding apparatus and method for clamping a wire
01/30/2008CN100365784C Electronic circuit device and its manufacturing method and device
01/30/2008CN100365783C Designing method for improving breakdown potential of electronic element with epoxy powder pack
01/30/2008CN100365782C Open-window type ball grid array semiconductor packaging elements and its producing method and used chip bearing elements
01/30/2008CN100365781C Spheric grid array semiconductor chip package procedure
01/30/2008CN100365780C Mask layer for reacting ion etching mercury-cadmium-tellurium micro-mesa array and producing process thereof
01/30/2008CN100365779C Preparation of silver nanometer electrodes
01/30/2008CN100365778C Method of fabricating polysilicon thin film and thin film transistor using polysilicon fabricated by the same method
01/30/2008CN100365777C Process for etching dielectric films with improved resist and/or etch profile characteristics
01/30/2008CN100365776C Production of thin-film ferroelectric materials with lead zirconate-titanate with reading circuit integration
01/30/2008CN100365775C Etching process for micromachining crystalline materials and devices fabricated thereby
01/30/2008CN100365774C 半导体晶片的制造方法及晶片 The semiconductor wafer manufacturing method and a wafer
01/30/2008CN100365773C Polishing pad, polishing device, and polishing method
01/30/2008CN100365772C Method for manufacturing a semiconductor device
01/30/2008CN100365771C Method for forming smaller contact hole using T-type pattern
01/30/2008CN100365770C Method of manufacture semiconductor component
01/30/2008CN100365769C Semiconductor device and its manufacturing method
01/30/2008CN100365768C Flash memory with ultra thin vertical body transistors
01/30/2008CN100365767C Substrate processing method for improving gallium nitride base material epitaxial layer quality
01/30/2008CN100365766C Method of forming a thick strained silicon layer and semiconductor structures incorporating a thick strained silicon layer
01/30/2008CN100365765C MIM capacitor structures and fabrication methods in dual-damascene structures
01/30/2008CN100365764C Method for mfg. semiconductor apparatus and method for forming pattern
01/30/2008CN100365763C Method and apparatus for forming crystallized semiconductor layer, and method for manufacturing semiconductor apparatus
01/30/2008CN100365762C Method for fabricating capacitor of semiconductor device
01/30/2008CN100365761C Semiconductor wafer dividing method utilizing laser beam
01/30/2008CN100365760C Method for manufacturing semiconductor device, semeconductor device and electronic product
01/30/2008CN100365759C Smoothing and barrier layers on tg substrates
01/30/2008CN100365737C Wiring material and wiring board using the same
01/30/2008CN100365734C MRAM arrangement
01/30/2008CN100365674C Flat panel display and method of fabricating the same
01/30/2008CN100365507C Template for room temperature, low pressure micro-and nano-imprint lithography
01/30/2008CN100365497C Display device and method for fabricating the same
01/30/2008CN100365495C In-plane switching mode liquid crystal display device
01/30/2008CN100365492C Multi-domain liquid crystal display and a thin film transistor substrate of the same
01/30/2008CN100365443C Production line system and automated warehouse used in the system
01/30/2008CN100365422C Insertosome and electronic parts processing device with the same
01/30/2008CN100365421C Method for measuring carrier mobility of organic semiconductor in frequency domain
01/30/2008CN100365405C Scanner linearity tester
01/30/2008CN100365320C Opening and closing apparatus for cover
01/30/2008CN100364910C Surface treating solution for fine processing of glass base plate having a plurality of components
01/30/2008CN100364868C Transporting roller, holding-down means and transporting system for flat articles
01/30/2008CN100364744C Semiconductor-sealing-purpose epoxy resin compound producing method
01/30/2008CN100364721C 流体混合装置及切削装置 Fluid mixing device and cutting device
01/30/2008CN100364720C Partial-membrane carrier head
01/29/2008US7325224 Method and system for increasing product yield by controlling lithography on the basis of electrical speed data
01/29/2008US7325217 Automatic wiring method for the crosstalk reduction
01/29/2008US7325213 Nested design approach
01/29/2008US7325206 Electronic design for integrated circuits based process related variations
01/29/2008US7324866 Method for manufacturing semiconductor device
01/29/2008US7324865 Run-to-run control method for automated control of metal deposition processes
01/29/2008US7324684 Bonding apparatus
01/29/2008US7324683 Bonding pattern discrimination device
01/29/2008US7324367 Memory cell and method for forming the same
01/29/2008US7324315 Protection device
01/29/2008US7324198 Edge bead removal inspection by reflectometry
01/29/2008US7324187 Illumination system and exposure apparatus
01/29/2008US7324186 Lithographic apparatus and device manufacturing method
01/29/2008US7323895 Low-current pogo probe card
01/29/2008US7323893 Probe device capable of being used for plural kinds of testers
01/29/2008US7323890 Multi-point probe
01/29/2008US7323861 Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate
01/29/2008US7323788 Semiconductor device and manufacturing method of them
01/29/2008US7323783 Electrode, method for producing same and semiconductor device using same
01/29/2008US7323781 Semiconductor device and manufacturing method thereof
01/29/2008US7323778 Semiconductor device with improved design freedom of external terminal
01/29/2008US7323777 Semiconductor device, method of manufacturing the same, circuit board, and electronic instrument
01/29/2008US7323773 Semiconductor device
01/29/2008US7323767 Standoffs for centralizing internals in packaging process
01/29/2008US7323764 Buffer structure for modifying a silicon substrate
01/29/2008US7323762 Semiconductor package substrate with embedded resistors and method for fabricating the same
01/29/2008US7323760 Fuse structure for semiconductor integrated circuit with improved insulation film thickness uniformity and moisture resistance
01/29/2008US7323757 System for field assisted statistical assembly of wafers
01/29/2008US7323756 Method of composite gate formation
01/29/2008US7323755 Method of composite gate formation
01/29/2008US7323754 Semiconductor device and its manufacture method
01/29/2008US7323753 MOS transistor circuit and voltage-boosting booster circuit
01/29/2008US7323750 Bipolar transistor and semiconductor device using same
01/29/2008US7323748 Semiconductor device having epitaxial layer
01/29/2008US7323743 Floating gate
01/29/2008US7323742 Non-volatile memory integrated circuit
01/29/2008US7323741 Semiconductor nonvolatile memory device
01/29/2008US7323740 Single chip data processing device with embedded nonvolatile memory and method thereof
01/29/2008US7323739 Semiconductor device having recess and planarized layers
01/29/2008US7323738 MIS capacitor and method of formation
01/29/2008US7323737 DRAM constructions and electronic systems
01/29/2008US7323736 Method to form both high and low-k materials over the same dielectric region, and their application in mixed mode circuits
01/29/2008US7323735 Method of manufacturing semiconductor integrated circuit device having capacitor element
01/29/2008US7323733 Nonvolatile memory and fabrication method thereof