Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2008
06/18/2008CN100395868C Method and apparatus for aiming at wafer direction using laser
06/18/2008CN100395867C Topology simulation system, topology simulation method
06/18/2008CN100395866C Crystallizing apparatus and crystallizing method
06/18/2008CN100395792C Checking marker and electronic machine
06/18/2008CN100395661C Sucker, photoetching projective apparatus, method for producing sucker and component producing method
06/18/2008CN100395644C Thin film transistor array panel and liquid crystal display including the panel
06/18/2008CN100395643C Liquid crystal display device and black matrix for liquid crystal display device
06/18/2008CN100395640C Liquid crystal display and method of manufacturing the same
06/18/2008CN100395596C Liquid crystal panel and its producing method
06/18/2008CN100395592C Photoelectric device and its manufacture method, substrate cutting method and substrates for photoelectric devices
06/18/2008CN100395591C Electro-optic panel and manufacturing method for electronic equipment
06/18/2008CN100395582C Projection optical system and pattern drawing device
06/18/2008CN100395273C Positive photoresist composition and method of forming resist pattern
06/17/2008USRE40383 Stud and rider for use on matrix trays
06/17/2008US7389203 Method and apparatus for deciding cause of abnormality in plasma processing apparatus
06/17/2008US7389155 Method and system for improved trajectory planning and execution
06/17/2008US7389014 Integrated semiconductor circuits and methods of making integrated semiconductor circuits
06/17/2008US7388979 Method and apparatus for inspecting pattern defects
06/17/2008US7388943 Method for adjusting gap between two objects and exposure method using the same, gap adjusting apparatus, and exposure apparatus
06/17/2008US7388783 Nonvolatile semiconductor memory
06/17/2008US7388659 Particle inspection apparatus and method, exposure apparatus, and device manufacturing method
06/17/2008US7388653 Exposure mask and method for divisional exposure
06/17/2008US7388650 Lithographic apparatus and device manufacturing method
06/17/2008US7388648 Lithographic projection apparatus
06/17/2008US7388646 Use in optical applications such as immersion lithography; lower absorbance at wavelengths lower than 250 nm; free of chlorine atoms, even in end groups; made by oxidation of tetrafluoroethylene (TFE) in presence of dilute fluorine gas
06/17/2008US7388644 Liquid crystal display device and method of fabricating the same
06/17/2008US7388641 Liquid crystal display and method for manufacturing the same having particular pad unit
06/17/2008US7388389 Electronic probe apparatus
06/17/2008US7388385 Wafer dicing system
06/17/2008US7388316 Micro-electro-mechanical system (MEMS) variable capacitor apparatuses, systems and related methods
06/17/2008US7388307 Stage apparatus, plane motor, and device manufacturing method
06/17/2008US7388292 Top layers of metal for high performance IC's
06/17/2008US7388291 Semiconductor device and method of fabricating the same
06/17/2008US7388290 Spacer patterned, high dielectric constant capacitor and methods for fabricating the same
06/17/2008US7388289 Local multilayered metallization
06/17/2008US7388277 Chip and wafer integration process using vertical connections
06/17/2008US7388265 Thin film transistor and fabrication method thereof
06/17/2008US7388264 Semiconductor device having LDD-type source/drain regions and fabrication method thereof
06/17/2008US7388263 Shallow trench isolation dummy pattern and layout method using the same
06/17/2008US7388262 Nitrogen implementation to minimize device variation
06/17/2008US7388258 Sectional field effect devices
06/17/2008US7388256 Semiconductor device and a method of manufacturing the same
06/17/2008US7388254 MOS-gated device having a buried gate and process for forming same
06/17/2008US7388249 Semiconductor device having self-aligned gate pattern
06/17/2008US7388246 Lanthanide doped TiOx dielectric films
06/17/2008US7388245 Semiconductor device, method for manufacturing the semiconductor device and portable electronic device provided with the semiconductor device
06/17/2008US7388244 Trench metal-insulator-metal (MIM) capacitors and method of fabricating same
06/17/2008US7388243 Self-Aligned buried contact pair
06/17/2008US7388242 Image sensor having integrated thin film infrared filter
06/17/2008US7388239 Frame shutter pixel with an isolated storage node
06/17/2008US7388238 Semiconductor integrated circuit device with reduced leakage current
06/17/2008US7388234 Semiconductor device and method of fabricating the same and method of forming nitride based semiconductor layer
06/17/2008US7388231 Semiconductor light emitting device
06/17/2008US7388230 Selective colored light emitting diode
06/17/2008US7388228 Display device and method of manufacturing the same
06/17/2008US7388227 Method for fabricating liquid crystal display device using two masks
06/17/2008US7388226 Liquid crystal display of horizontal electronic field applying type and fabricated method thereof
06/17/2008US7388224 Structure for determining thermal cycle reliability
06/17/2008US7388217 Particle-optical projection system
06/17/2008US7388149 Coupling for corrugated cable conduits for enclosing cables
06/17/2008US7388113 Volatile copper(II) complexes for deposition of copper films by atomic layer deposition
06/17/2008US7387989 AlxGayInl−x−yN substrate, cleaning method of AlxGayInl−x−yN substrate, AlN substrate, and cleaning method of AlN substrate
06/17/2008US7387988 A thinner composition includes propylene glycol ether acetate, methyl 2-hydroxy-2-methyl propionate, and an ester compound such as ethyl lactate, ethyl 3-ethoxy propionate or a mixture thereof.
06/17/2008US7387974 Methods for providing gate conductors on semiconductors and semiconductors formed thereby
06/17/2008US7387973 Method for improving low-K dielectrics by supercritical fluid treatments
06/17/2008US7387972 Reducing nitrogen concentration with in-situ steam generation
06/17/2008US7387971 Fabricating method for flat panel display device
06/17/2008US7387970 Method of using an aqueous solution and composition thereof
06/17/2008US7387969 Top patterned hardmask and method for patterning
06/17/2008US7387968 Batch photoresist dry strip and ash system and process
06/17/2008US7387967 Columnar structured material and method of manufacturing the same
06/17/2008US7387965 Reference pattern for creating a defect recognition level, method of fabricating the same and method of inspecting defects using the same
06/17/2008US7387964 Copper polishing cleaning solution
06/17/2008US7387963 edge region with no defects larger than or equal to 0.3 .mu.m
06/17/2008US7387962 Physical vapor deposition methods for forming hydrogen-stuffed trench liners for copper-based metallization
06/17/2008US7387961 Dual damascene with via liner
06/17/2008US7387960 Dual depth trench termination method for improving Cu-based interconnect integrity
06/17/2008US7387959 Method of fabricating integrated circuitry
06/17/2008US7387958 MMIC having back-side multi-layer signal routing
06/17/2008US7387957 Fabrication process for a semiconductor integrated circuit device
06/17/2008US7387956 Refractory metal-based electrodes for work function setting in semiconductor devices
06/17/2008US7387955 Field effect transistor and method for manufacturing the same
06/17/2008US7387954 Beam homogenizer, laser irradiation apparatus, and method for manufacturing semiconductor device
06/17/2008US7387953 Laminated layer structure and method for forming the same
06/17/2008US7387952 Semiconductor substrate for solid-state image pickup device and producing method therefor
06/17/2008US7387951 Method of dicing semiconductor wafer into chips, and apparatus using this method
06/17/2008US7387950 Method for forming a metal structure
06/17/2008US7387949 Semiconductor device manufacturing method, semiconductor device, laminated semiconductor device, circuit substrate, and electronic apparatus
06/17/2008US7387948 Structure and method of forming a semiconductor material wafer
06/17/2008US7387947 Method for transferring a thin layer including a controlled disturbance of a crystalline structure
06/17/2008US7387946 Method of fabricating a substrate for a planar, double-gated, transistor process
06/17/2008US7387945 Semiconductor chip, semiconductor device and electronic equipment including warpage control film, and manufacturing method of same
06/17/2008US7387944 Method for low temperature bonding and bonded structure
06/17/2008US7387943 Method for forming layer for trench isolation structure
06/17/2008US7387942 Substrate isolation in integrated circuits
06/17/2008US7387941 Method for fabricating semiconductor device
06/17/2008US7387940 Methods of forming trench isolation in the fabrication of integrated circuitry, methods of fabricating memory circuitry, integrated circuitry and memory integrated circuitry
06/17/2008US7387939 Methods of forming semiconductor structures and capacitor devices
06/17/2008US7387938 Methods of forming phase change storage cells for memory devices
06/17/2008US7387937 Thermal dissipation structures for FinFETs