| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 06/25/2008 | CN101206996A Method for improving and monitoring crystal round utilization ratio |
| 06/25/2008 | CN101206995A Method for monitoring crystal round pallet obliteration performance |
| 06/25/2008 | CN101206994A Method for preparing groove |
| 06/25/2008 | CN101206993A Method for reutilization of BD control retaining plate |
| 06/25/2008 | CN101206992A Even glue developing process process capable of economizing time and equipment improved structure |
| 06/25/2008 | CN101206990A Method for detecting plasma distribution density in responses chamber |
| 06/25/2008 | CN101206412A Decompression drying device |
| 06/25/2008 | CN101206407A Method of photolithographic exposure |
| 06/25/2008 | CN101206401A Radiation sensitive resin composition, interlayer dielectric and microlens, and method for producing thereof |
| 06/25/2008 | CN101206394A Exposure mask and method for fabricating semiconductor device using the same |
| 06/25/2008 | CN101206393A Optical mask employed for manufacturing array substrate, array substrate and method for manufacturing the same |
| 06/25/2008 | CN101206364A Display apparatus including signal lines arranged for curing a seal line |
| 06/25/2008 | CN101206361A Liquid crystal display device and method of fabricating the same |
| 06/25/2008 | CN101206331A Liquid crystal display device and method for manufacturing the same |
| 06/25/2008 | CN101206325A Liquid crystal display device with photosensor and method of fabricating the same |
| 06/25/2008 | CN101206243A Method for measuring intrinsic capacity of metal oxide semiconductor component |
| 06/25/2008 | CN101206238A Error covering analysis method |
| 06/25/2008 | CN101206181A Device and method for testing edge-washing effect of crystal round fringes |
| 06/25/2008 | CN101206179A Light emission microscope sample |
| 06/25/2008 | CN101206158A System for supplying a thermal agent to a testing machine for testing objects under thermally hard circumstances |
| 06/25/2008 | CN101206157A System for testing the durability of objects under thermally hard circumstances |
| 06/25/2008 | CN101205606A Lift pin, apparatus for processing a substrate and method of processing a substrate |
| 06/25/2008 | CN101205442A Ruthenium-barrier layer polishing slurry |
| 06/25/2008 | CN101205291A Hard mask composition, process for forming material layer, and semiconductor integrated circuit device |
| 06/25/2008 | CN101204795A Chemical mechanical polishing pad |
| 06/25/2008 | CN101204792A Washing liquid distribution device |
| 06/25/2008 | CN101204708A Recovery cup cleaning method and substrate treatment apparatus |
| 06/25/2008 | CN101204706A Cleaning method of quartz material parts |
| 06/25/2008 | CN101204705A Method of cleaning chamber with silicon chip erosion |
| 06/25/2008 | CN101204704A Method of cleaning hangover on wafer surface |
| 06/25/2008 | CN100397963C Electronic circuit device and its manufacturing method |
| 06/25/2008 | CN100397742C Voltage limiting protection for high frequency power device |
| 06/25/2008 | CN100397674C Magnetic controlled resistance storage device with magnetic field attenuation layer |
| 06/25/2008 | CN100397670C Gallium nitride-based iii-v group compound semiconductor device |
| 06/25/2008 | CN100397669C LED light source packaging structure for low-temperature coburning ceramic by thermoelectric separating design |
| 06/25/2008 | CN100397661C Metal inducement single direction transverse crystallization thin film transistor device and its preparing method |
| 06/25/2008 | CN100397660C A method for manufacturing a thin film transistor using poly silicon |
| 06/25/2008 | CN100397659C Strained transistor with hybrid-strain inducing layer and method of forming the same |
| 06/25/2008 | CN100397657C Semiconductor device |
| 06/25/2008 | CN100397656C Thin film transistor of multi-grid structure and manufacturing method thereof |
| 06/25/2008 | CN100397655C Structure of improving gallium nitride base high electronic mobility transistor property and producing method |
| 06/25/2008 | CN100397649C Method for manufacturing single transistor dram cell with reduced current leakage |
| 06/25/2008 | CN100397648C MOS type semiconductor device having electrostatic discharge protection arrangement |
| 06/25/2008 | CN100397647C Semiconductor structure and method for ESD protection circuit |
| 06/25/2008 | CN100397646C Integrated circuit structure having multi-version circuit selection |
| 06/25/2008 | CN100397644C Capacitor of a semiconductor device and memory device using the same |
| 06/25/2008 | CN100397643C Semiconductor device with partial SOI structure and its manufacturing method |
| 06/25/2008 | CN100397642C Semiconductor equipment and its manufacturing method |
| 06/25/2008 | CN100397641C 电路装置及其制造方法 Circuit device and manufacturing method thereof |
| 06/25/2008 | CN100397640C Circuit component built-in module and method for manufacturing the same |
| 06/25/2008 | CN100397639C Structure and method for forming multiple lead line frame semiconductor device |
| 06/25/2008 | CN100397637C Semiconductor device |
| 06/25/2008 | CN100397636C Semiconductor device and its making method |
| 06/25/2008 | CN100397635C Wiring pad with edge reinforcing structure for integrated circuit |
| 06/25/2008 | CN100397634C Semiconductor package including redistribution pattern and method of manufacturing the same |
| 06/25/2008 | CN100397633C Wiring structure for a pad section in a semiconductor device |
| 06/25/2008 | CN100397629C Semiconductor device and method of manufacturing the same |
| 06/25/2008 | CN100397628C Electrical or electronic component and method of producing same |
| 06/25/2008 | CN100397627C 电路装置及其制造方法 Circuit device and manufacturing method thereof |
| 06/25/2008 | CN100397626C Resin encapsulated electronic component unit and method of manufacturing the same |
| 06/25/2008 | CN100397625C 半导体装置 Semiconductor device |
| 06/25/2008 | CN100397624C Wiring circuit board |
| 06/25/2008 | CN100397623C 半导体芯片侧接触方法 The semiconductor chip side contact method |
| 06/25/2008 | CN100397622C Manufacturing method of driving components array substrate |
| 06/25/2008 | CN100397621C Operation method of silion nitride read-only memory element |
| 06/25/2008 | CN100397620C Production of memory |
| 06/25/2008 | CN100397619C Integrated circuit structure and its producing method and integrated circuit memory element |
| 06/25/2008 | CN100397618C Method for forming semiconductor assembly and semiconductor storage element |
| 06/25/2008 | CN100397617C Method for producing high-density capacitors |
| 06/25/2008 | CN100397616C Body silicon MEMS and CMOS circuit integrating method capable of removing residual silicon |
| 06/25/2008 | CN100397615C Memory cell and producing method thereof, semiconductor elements and memory cell |
| 06/25/2008 | CN100397614C Method for fabricating metal line in semiconductor device |
| 06/25/2008 | CN100397613C Multiple thickness semiconductor interconnect and method for manufacturing the same |
| 06/25/2008 | CN100397612C Use of conductive electrolessly deposited etch stop layers, liner layers, and via plugs in interconnect structures |
| 06/25/2008 | CN100397611C Method for forming conductive structure in low dielectric material layer |
| 06/25/2008 | CN100397610C Semiconductor device and method of manufacturing the same |
| 06/25/2008 | CN100397609C Focusing ion beam modifying integrated circuit method and integrated circuit |
| 06/25/2008 | CN100397608C Transfer device and semiconductor processing system |
| 06/25/2008 | CN100397607C Overhead transferring flange for hanging substrate carrier and supporting piece |
| 06/25/2008 | CN100397606C Method for detecting IC on-line defect and making process monitor circuit structure |
| 06/25/2008 | CN100397605C Manufacturing method for semiconductor device |
| 06/25/2008 | CN100397604C Method and apparatus for connecting the conductor convex to the corresponding cushion of the chip |
| 06/25/2008 | CN100397603C Method for mounting electronic element, method for producing electronic device, circuit board, and electronic instrument |
| 06/25/2008 | CN100397602C Semiconductor copper bond pad surface protection |
| 06/25/2008 | CN100397601C Method for manufacturing semiconductor device and semiconductor device |
| 06/25/2008 | CN100397600C Transistor modular assembling method and its equipment |
| 06/25/2008 | CN100397599C Lead frame making method, semiconductor device making method and semiconductor device |
| 06/25/2008 | CN100397598C Method for manufacturing power MOSFET |
| 06/25/2008 | CN100397597C Method for producing metal-oxide semiconductor electric crystal and memory body elements |
| 06/25/2008 | CN100397596C Method for preparing lateral channel of field effect transistor, and field effect transistor |
| 06/25/2008 | CN100397595C Method for manufacturing silicon wafer |
| 06/25/2008 | CN100397594C Semiconductor device and manufacturing method thereof |
| 06/25/2008 | CN100397593C Method for the production of structured layers on substrates |
| 06/25/2008 | CN100397592C Semiconductor making process and inner layer dielectric layer manufacturing method |
| 06/25/2008 | CN100397591C Method for producing low dielectric constant material layer |
| 06/25/2008 | CN100397590C Gate etching process |
| 06/25/2008 | CN100397589C Plasma etching chamber and plasma etching system using same |
| 06/25/2008 | CN100397588C Plasma processing device |
| 06/25/2008 | CN100397587C Silicon gate etching process capable of avoiding microtrench phenomenon |
| 06/25/2008 | CN100397586C Polycrystalline silicon pulse etching process for improving anisotropy |