Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2008
06/10/2008US7385260 Semiconductor device having silicide thin film and method of forming the same
06/10/2008US7385259 Method of manufacturing a multilayered doped conductor for a contact in an integrated circuit device
06/10/2008US7385256 Transistor arrangement in monocrystalline substrate having stress exerting insulators
06/10/2008US7385255 Field effect transistor and application device thereof
06/10/2008US7385250 Semiconductor device
06/10/2008US7385249 Transistor structure and integrated circuit
06/10/2008US7385247 At least penta-sided-channel type of FinFET transistor
06/10/2008US7385244 Flash memory devices with box shaped polygate structures
06/10/2008US7385243 Floating gate memory cell with a metallic source/drain and gate, and method for manufacturing such a floating gate memory gate cell
06/10/2008US7385242 Semiconductor device having landing pad and fabrication method thereof
06/10/2008US7385240 Storage cell capacitor compatible with high dielectric constant materials
06/10/2008US7385239 Semiconductor device and manufacturing method therefor
06/10/2008US7385237 Fin field effect transistors with low resistance contact structures
06/10/2008US7385232 CMOS imager with enhanced transfer of charge and low voltage operation and method of formation
06/10/2008US7385223 Flat panel display with thin film transistor
06/10/2008US7385222 Thin film transistors and semiconductor constructions
06/10/2008US7385220 Fiber having dielectric polymeric layer on electrically conductive surface
06/10/2008US7385212 Collector optical system, light source unit, illumination optical apparatus, and exposure apparatus
06/10/2008US7385211 Method of generating extreme ultraviolet radiation
06/10/2008US7385198 Method and apparatus for measuring the physical properties of micro region
06/10/2008US7385196 Method and scanning electron microscope for measuring width of material on sample
06/10/2008US7385195 Semiconductor device tester
06/10/2008US7385194 Charged particle beam application system
06/10/2008US7384900 Composition and method for removing copper-compatible resist
06/10/2008US7384880 Method for making a semiconductor device having a high-k gate dielectric
06/10/2008US7384879 Selection and deposition of nanoparticles using CO2-expanded liquids
06/10/2008US7384878 Method for applying a layer to a hydrophobic surface
06/10/2008US7384877 Technique for reducing silicide defects by reducing deleterious effects of particle bombardment prior to silicidation
06/10/2008US7384876 Method and apparatus for determining consumable lifetime
06/10/2008US7384875 Method of manufacturing semiconductor device using flexible tube
06/10/2008US7384874 Method of forming hardmask pattern of semiconductor device
06/10/2008US7384873 Manufacturing process of semiconductor device
06/10/2008US7384872 Method of producing substrate having patterned organosilane layer and method of using the substrate having the patterned organosilane layer
06/10/2008US7384871 Chemical mechanical polishing compositions and methods relating thereto
06/10/2008US7384870 Method for manufacturing glass substrate
06/10/2008US7384869 Protection of silicon from phosphoric acid using thick chemical oxide
06/10/2008US7384868 Reduction of silicide formation temperature on SiGe containing substrates
06/10/2008US7384867 Formation of composite tungsten films
06/10/2008US7384866 Methods of forming metal interconnections of semiconductor devices by treating a barrier metal layer
06/10/2008US7384865 Semiconductor device with a metal line and method of forming the same
06/10/2008US7384864 Top layers of metal for high performance IC's
06/10/2008US7384863 Semiconductor device and method for manufacturing the same
06/10/2008US7384862 Method for fabricating semiconductor device and display device
06/10/2008US7384861 Strain modulation employing process techniques for CMOS technologies
06/10/2008US7384860 Method of manufacturing a semiconductor device
06/10/2008US7384859 Cutting method for substrate and cutting apparatus therefor
06/10/2008US7384858 Wafer dividing method
06/10/2008US7384857 Method to fabricate completely isolated silicon regions
06/10/2008US7384856 Method of making an internal capacitive substrate for use in a circuitized substrate and method of making said circuitized substrate
06/10/2008US7384855 Resistor integration structure and technique for noise elimination
06/10/2008US7384854 Method of forming low capacitance ESD robust diodes
06/10/2008US7384853 Method of performing salicide processes on MOS transistors
06/10/2008US7384852 Sub-lithographic gate length transistor using self-assembling polymers
06/10/2008US7384851 Buried stress isolation for high-performance CMOS technology
06/10/2008US7384850 Methods of forming complementary metal oxide semiconductor (CMOS) transistors having three-dimensional channel regions therein
06/10/2008US7384849 Methods of forming recessed access devices associated with semiconductor constructions
06/10/2008US7384848 Method for forming non-volatile memory with inlaid floating gate
06/10/2008US7384847 Methods of forming DRAM arrays
06/10/2008US7384846 Method of fabricating semiconductor device
06/10/2008US7384845 Methods of fabricating flash memory devices including word lines with parallel sidewalls
06/10/2008US7384844 Method of fabricating flash memory device
06/10/2008US7384843 Method of fabricating flash memory device including control gate extensions
06/10/2008US7384842 Methods involving silicon-on-insulator trench memory with implanted plate
06/10/2008US7384841 DRAM device and method of manufacturing the same
06/10/2008US7384840 Bulk-isolated PN diode and method of forming a bulk-isolated PN diode
06/10/2008US7384839 SRAM cell with asymmetrical transistors for reduced leakage
06/10/2008US7384838 Semiconductor FinFET structures with encapsulated gate electrodes and methods for forming such semiconductor FinFET structures
06/10/2008US7384837 Method for isolating silicon germanium dislocation regions in strained-silicon CMOS applications
06/10/2008US7384836 Integrated circuit transistor insulating region fabrication method
06/10/2008US7384835 Metal oxide field effect transistor with a sharp halo and a method of forming the transistor
06/10/2008US7384834 Semiconductor device and a method of manufacturing the same
06/10/2008US7384833 Stress liner for integrated circuits
06/10/2008US7384832 Method of manufacturing a semiconductor device
06/10/2008US7384831 Thin film transistor and manufacturing method thereof
06/10/2008US7384830 Strained-channel Fin field effect transistor (FET) with a uniform channel thickness and separate gates
06/10/2008US7384829 Patterned strained semiconductor substrate and device
06/10/2008US7384828 Semiconductor film, semiconductor device and method of their production
06/10/2008US7384827 Method of manufacturing semiconductor device using liquid phase deposition of an interlayer dielectric
06/10/2008US7384826 Method of forming ohmic contact to a semiconductor body
06/10/2008US7384825 Methods of fabricating phase change memory elements having a confined portion of phase change material on a recessed contact
06/10/2008US7384824 Structure and programming of laser fuse
06/10/2008US7384823 Method for manufacturing a semiconductor device having a stabilized contact resistance
06/10/2008US7384822 Package for semiconductor components and method for producing the same
06/10/2008US7384820 Method of manufacturing a semiconductor device
06/10/2008US7384819 Method of forming stackable package
06/10/2008US7384818 Electronic package for image sensor, and the packaging method thereof
06/10/2008US7384817 Method of assembling semiconductor devices with LEDs
06/10/2008US7384816 Apparatus and method for forming vias
06/10/2008US7384814 Field effect transistor including an organic semiconductor and a dielectric layer having a substantially same pattern
06/10/2008US7384813 Method for fabricating CMOS image sensor
06/10/2008US7384812 Method of manufacturing a semiconductor device with light shading means
06/10/2008US7384811 Method of separating semiconductor wafer, and separating apparatus using the same
06/10/2008US7384810 Image display device and method for manufacturing the same
06/10/2008US7384809 Method of forming three-dimensional features on light emitting diodes for improved light extraction
06/10/2008US7384808 Fabrication method of high-brightness light emitting diode having reflective layer
06/10/2008US7384807 Method of fabricating vertical structure compound semiconductor devices
06/10/2008US7384806 Method for characterizing defects on semiconductor wafers
06/10/2008US7384805 Transfer mold semiconductor packaging processes
06/10/2008US7384804 Method and apparatus for electronically aligning capacitively coupled mini-bars
06/10/2008US7384803 Method of manufacturing nitride semiconductor device including SiC substrate and apparatus for manufacturing nitride semiconductor device