Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/2008
10/22/2008CN100428429C Production of manganese-doped zinc oxide thin-film and nano-column by electrochemical deposition
10/22/2008CN100428428C Method of forming flash memory process
10/22/2008CN100428427C Micro-electro-mechanical element and its manufacturing method and P type channel transistor manufacturing method
10/22/2008CN100428426C Structure of metal-oxide-semiconductor transistor and process for forming same
10/22/2008CN100428425C Gate-cathode structure design method for gate pole converting thyristor GCT
10/22/2008CN100428424C Doped nitride film, doped oxide film and other doped films
10/22/2008CN100428423C Sedimentation technique of reducing SiC dielectric constant
10/22/2008CN100428422C Device and methodology for reducing effective dielectric constant in semiconductor devices
10/22/2008CN100428421C Dry process for removing excessive metal in silicide generating procedure
10/22/2008CN100428420C Dry method photoresist removing technology used after Z3 MS etching
10/22/2008CN100428419C Method for cleaning gallium arsenide crystal chip
10/22/2008CN100428418C Method for cutting wafer
10/22/2008CN100428417C High dielectric grid medium Al2O3/BaO/Al2O3 structure and preparing method thereof
10/22/2008CN100428416C Method for producing semiconductor device
10/22/2008CN100428415C Method for preparing nano electrode based on silicon nitride hollowed-out mask
10/22/2008CN100428414C Method for forming low-stress multi-layer metallized structure and leadless solder end electrode
10/22/2008CN100428413C Ion injection simulation method
10/22/2008CN100428412C Substrate processing system
10/22/2008CN100428411C Silicon epitaxial wafer manufacturing method and silicon epitaxial wafer
10/22/2008CN100428410C Homogeneity improving method and device for hydride gaseous epitaxially groven GaN material
10/22/2008CN100428409C Nitride-based semiconductor substrate and semiconductor device
10/22/2008CN100428408C Electrostatic discharge protection method and structure for photomask
10/22/2008CN100428407C Making method for pliable array base plate
10/22/2008CN100428406C Processing method for the semiconductor pipe core assembly crystal surface
10/22/2008CN100428405C The cleaning method for removing the impure ion from the semiconductor pipe core assembly
10/22/2008CN100428404C Enclosed infrared heating device for semiconductor chip
10/22/2008CN100428403C Optimization method of the experimental parameters in the direct key bonding process of the wafer
10/22/2008CN100428402C Method for detaching a semiconductor chip from a foil and apparatus for mounting semiconductor chips
10/22/2008CN100428401C Method and system for treating similarity of semiconductor device finished product ratio
10/22/2008CN100428400C Apparatus and method for thermally isolating a heat chamber
10/22/2008CN100428367C Aluminum alloy wiring material having high resistance to heat and target material
10/22/2008CN100428319C Liquid crystal display device
10/22/2008CN100428092C Method and system for thermal process control
10/22/2008CN100428057C Air float support base for regulating air diaphragm two-way rigidity
10/22/2008CN100428055C Photolithographic process, photomask and manufacturing thereof
10/22/2008CN100428038C Liquid crystal display device and method for fabricating the same
10/22/2008CN100428035C Liquid crystal display device and method of manufacturing the same
10/22/2008CN100428034C Liquid crystal display device and fabricating method thereof
10/22/2008CN100428032C Liquid crystal display device and method for fabricating the same and display device
10/22/2008CN100428014C Substrate for a display apparatus, display device, colour filter substrate and liquid crystal display device and producing method thereof
10/22/2008CN100428010C Fabricating method of flexible display
10/22/2008CN100427994C Optical element, optical system, laser device, exposure device, mask testing device and high polymer crystal processing device
10/22/2008CN100427963C Semiconductor test management system and method
10/22/2008CN100427881C High seeparation sharpness gasometer-type approach sensor
10/22/2008CN100427879C Corrugation flaw inspection mask, corrugation flaw inspection device and method and method for manufacturing photo mask
10/22/2008CN100427519C Resin for resist, positive resist composition, and method of forming resist pattern
10/22/2008CN100427266C Method and structure for aluminium chemical mechanical polishing and protective layer
10/22/2008CN100427258C Wire bonder
10/22/2008CN100427225C Universal alternation kit for testing classifier of ball grade package
10/21/2008US7441168 Fault detecting method and layout method for semiconductor integrated circuit
10/21/2008US7440881 Adaptive correlation of pattern resist structures using optical metrology
10/21/2008US7440860 Sequential unique marking
10/21/2008US7440605 Defect inspection apparatus, defect inspection method and program
10/21/2008US7440350 Semiconductor integrated circuit device
10/21/2008US7440334 Multi-transistor memory cells
10/21/2008US7440255 Capacitor constructions and methods of forming
10/21/2008US7440182 Multilayer mirror, method for manufacturing the same, and exposure equipment
10/21/2008US7440105 Continuously varying offset mark and methods of determining overlay
10/21/2008US7440104 Exposure system, test mask for monitoring polarization, and method for monitoring polarization
10/21/2008US7440083 Printing a mask with maximum possible process window through adjustment of the source distribution
10/21/2008US7440082 Method of predicting and minimizing model OPC deviation due to mix/match of exposure tools using a calibrated eigen decomposition model
10/21/2008US7439654 Transmission of ultrasonic energy into pressurized fluids
10/21/2008US7439627 Post passivation interconnection schemes on top of the IC chips
10/21/2008US7439626 Post passivation interconnection schemes on top of IC chip
10/21/2008US7439623 Semiconductor device having via connecting between interconnects
10/21/2008US7439622 Semiconductor device
10/21/2008US7439619 Electronic package structure and the packaging process thereof
10/21/2008US7439616 Miniature silicon condenser microphone
10/21/2008US7439614 Circuit device with dummy elements
10/21/2008US7439613 Substrate based unmolded package
10/21/2008US7439612 Integrated circuit package structure with gap through lead bar between a die edge and an attachment point corresponding to a conductive connector
10/21/2008US7439609 Doping of gallium nitride by solid source diffusion and resulting gallium nitride structures
10/21/2008US7439607 Beta control using a rapid thermal oxidation
10/21/2008US7439604 Method of forming dual gate dielectric layer
10/21/2008US7439603 Non-volatile memory device and fabricating method thereof
10/21/2008US7439602 Semiconductor device and its manufacturing method
10/21/2008US7439596 Transistors for semiconductor device and methods of fabricating the same
10/21/2008US7439593 Semiconductor device having silicide formed with blocking insulation layer
10/21/2008US7439587 Semiconductor device and method of manufacturing the same
10/21/2008US7439586 Liquid crystal display device and fabricating method thereof
10/21/2008US7439575 Protection against in-process charging in silicon-oxide-nitride-oxide-silicon (SONOS) memories
10/21/2008US7439574 Silicon/oxide/nitride/silicon nonvolatile memory with vertical channels
10/21/2008US7439573 Semiconductor device including transistor with composite gate structure and transistor with single gate structure, and method for manufacturing the same
10/21/2008US7439572 Stacked gate memory cell with erase to gate, array, and method of manufacturing
10/21/2008US7439571 Method for fabricating metal gate structures
10/21/2008US7439569 Semiconductor device manufacturing method and semiconductor device
10/21/2008US7439567 Contactless nonvolatile memory array
10/21/2008US7439564 Methods of forming capacitor constructions
10/21/2008US7439555 III-nitride semiconductor device with trench structure
10/21/2008US7439554 Semiconductor device and method for fabricating the same
10/21/2008US7439546 Semiconductor light emitting device, its manufacturing method, semiconductor device and its manufacturing method
10/21/2008US7439543 Semiconductor device comprising thin film transistor comprising conductive film having tapered edge
10/21/2008US7439531 Alignment systems and methods for lithographic systems
10/21/2008US7439525 Demagnification measurement method for charged particle beam exposure apparatus, stage phase measurement method for charged particle beam exposure apparatus, control method for charged particle beam exposure apparatus, and charged particle beam exposure apparatus
10/21/2008US7439506 Method and an apparatus of an inspection system using an electron beam
10/21/2008US7439505 Scanning electron microscope
10/21/2008US7439503 Charged particle beam irradiation method, method of manufacturing semiconductor device and charged particle beam apparatus
10/21/2008US7439451 Tape carrier
10/21/2008US7439334 controll by modifying the N-terminal part of ferritin with a peptide which recognizes and binds to portion of the substrate consisting of titanium, heating to decompose the titanium-binding ferritin, arranging inorganic fe2o3 particles on substrate with high accuracy; biosensors or biochips
10/21/2008US7439198 Method for fabricating a buried metallic layer in a semiconductor body and semiconductor component having a buried metallic layer
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