Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2010
03/03/2010EP1273042B1 Semiconductor device and method of manufacturing same
03/03/2010EP1205280B1 Wafer polishing method and wafer polishing device
03/03/2010EP1118121B1 Semiconductor device arrangement having configuration via adjacent bond pad coding
03/03/2010EP1110237B1 Device and method for the high-frequency etching of a substrate using a plasma etching installation and device and method for igniting a plasma and for pulsing the plasma output or adjusting the same upwards
03/03/2010EP1062849B1 Circuit board features with reduced parasitic capacitance and method therefor
03/03/2010CN201417789Y Aluminum ship baking mechanism of LED full-automatic glue filling device
03/03/2010CN201417759Y Aluminum ship conveyor of LED glue filling device
03/03/2010CN201417758Y System using nano-mist chemical agent to dispose substrate
03/03/2010CN201417757Y Substrate processor
03/03/2010CN101663747A Ultra-thin chip packaging
03/03/2010CN101663746A Semiconductor integrated circuit
03/03/2010CN101663745A Apparatus for transferring a wafer
03/03/2010CN101663744A Supporting member, carrier and supporting method
03/03/2010CN101663743A Highly reliable gold alloy bonding wire and semiconductor device
03/03/2010CN101663742A front-end processed wafer having through-chip connections
03/03/2010CN101663741A Semiconductor device and method for manufacturing semiconductor device
03/03/2010CN101663740A Method of low-k dielectric film repair
03/03/2010CN101663739A Polishing apparatus and program for the same
03/03/2010CN101663738A Polishing agent composition and method for manufacturing semiconductor integrated circuit device
03/03/2010CN101663737A Method and apparatus for wafer electroless plating
03/03/2010CN101663736A Fluid handling system for wafer electroless plating and associated methods
03/03/2010CN101663735A Real time chamber monitoring method using intelligence algorithm
03/03/2010CN101663734A Apparatus and method for atomic layer deposition
03/03/2010CN101663733A Method for manufacturing soi substrate and semiconductor device
03/03/2010CN101663732A Mems package having at least one port and manufacturing method thereof
03/03/2010CN101663132A Process for manufacturing polishing pad
03/03/2010CN101661946A Solid-state imaging device and method for manufacturing the same
03/03/2010CN101661945A Optical device
03/03/2010CN101661910A Gallium nitride semiconductor substrate and blue luminescent device
03/03/2010CN101661908A Method for manufacturing array substrate of horizontal electric field type semi-permeable liquid crystal display device
03/03/2010CN101661907A Method for manufacturing array substrate of liquid crystal display device
03/03/2010CN101661906A Manufacturing method of nonvolatile storage cell
03/03/2010CN101661905A Method for manufacturing semiconductor device
03/03/2010CN101661904A Semiconductor device and method for fabricating same
03/03/2010CN101661903A Semiconductor device and method for fabricating same
03/03/2010CN101661902A Semiconductor device and its fabricating method
03/03/2010CN101661901A Method for fabricating semiconductor device and semiconductor device
03/03/2010CN101661900A Semiconductor device, and manufacturing method thereof
03/03/2010CN101661899A Method for producing contact holes in metal gates by adopting Damascus process
03/03/2010CN101661898A Interlayer dielectric layer, semiconductor device and formation method thereof
03/03/2010CN101661897A Interconnector structure and manufacturing method thereof
03/03/2010CN101661896A Overflow glue removing mechanism and method thereof
03/03/2010CN101661895A Z-direction lamination encapsulating method
03/03/2010CN101661894A Resin sealing type semiconductor device and method of manufacturing the same, and resin sealing type electronic device
03/03/2010CN101661893A Resin sealing type semiconductor device and method of manufacturing the same, and lead frame
03/03/2010CN101661892A Resin molded semiconductor device and manufacturing method thereof
03/03/2010CN101661891A Chip packaging method of resin core column
03/03/2010CN101661890A Flip-chip packaging method and structure
03/03/2010CN101661889A Manufacturing method of silicon MOS transistor on partially consumed insulating layer
03/03/2010CN101661888A Method for preparing source-drain injection structures in semiconductor devices
03/03/2010CN101661887A Method for preparing source-drain injection structures
03/03/2010CN101661886A Method for preparing source-drain injection structures in preparation of semiconductors
03/03/2010CN101661885A Annealing treatment method for thinned or scribed gallium nitride base field-effect tube
03/03/2010CN101661884A Method for manufacturing transistor by using silicon single crystal slices
03/03/2010CN101661883A Manufacturing method for semiconductor element
03/03/2010CN101661882A Semiconductor element and its manufacturing method
03/03/2010CN101661881A Method for producing metal gates and contact holes by adopting Damascus process
03/03/2010CN101661880A Method for producing metal gates and contact holes by adopting Damascus process
03/03/2010CN101661879A Method for preparing tunneling oxide layers in preparation of memory devices with tunneling oxide layers
03/03/2010CN101661878A Method of double-element delta doped growth P-type GaN base material
03/03/2010CN101661877A Method for increasing GaN HEMT annealing success rate
03/03/2010CN101661876A Method for preparing nitride self-supported substrate
03/03/2010CN101661875A Equipment for de-encapsulation of BGA encapsulation
03/03/2010CN101661874A Thermal processing apparatus and thermal processing method
03/03/2010CN101661873A Substrate processing system, carrying device and coating device
03/03/2010CN101661872A Method for manufacturing a semiconductor device
03/03/2010CN101661871A Plasma processing device, feedback control method of plasma processing device, and supplying method of high frequency power
03/03/2010CN101661870A Method for determining the performance of implanting apparatus
03/03/2010CN101661869A Method for cleaning polished gallium arsenide chip and laundry drier
03/03/2010CN101659036A Polishing pad and manufacturing method thereof
03/03/2010CN101659035A Polishing pad and manufacturing method thereof
03/03/2010CN100593271C Optoelectronic device packaging with hermetically sealed cavity and integrated optical element
03/03/2010CN100593244C Pattern formation method, thin film transistor, display device and manufacturing method thereof
03/03/2010CN100593241C Solid state imaging apparatus and method for fabricating the same
03/03/2010CN100593237C Volatile memory and manufacturing method thereof
03/03/2010CN100593236C Low-temperature chemical vapor deposition of low-resistivity ruthenium layers
03/03/2010CN100593235C Integration of ALD tantalum nitride for copper metallization
03/03/2010CN100593234C Stage for plasma processing apparatus, and plasma processing apparatus
03/03/2010CN100593233C A test structure and method for detecting charge effects using a delayed inversion point technique
03/03/2010CN100593232C Structure and method for fabricating flip chip devices
03/03/2010CN100593231C 多芯片堆栈封装方法 Multi-chip stack package method
03/03/2010CN100593230C O-ringless tandem throttle valve for a plasma reactor chamber
03/03/2010CN100593229C Electrochemical device, and method for generating 0H free radical on the TiO layer surface of the electrochemical device
03/03/2010CN100593228C Vacuum processing device and method
03/03/2010CN100593227C Placement device of anisotropy conducting bond and manufacturing method of electric equipment
03/03/2010CN100593226C Alumina sintered body
03/03/2010CN100593113C Wafer defect detection system with traveling lens multi-beam scanner
03/03/2010CN100593040C System and method for forming compound capable of promoting electric conduction, and storage location
03/02/2010US7673323 System and method for maintaining security in a distributed computer network
03/02/2010US7673281 Pattern evaluation method and evaluation apparatus and pattern evaluation program
03/02/2010US7673262 System and method for product yield prediction
03/02/2010US7673258 Design data creating method, design data creating program product, and manufacturing method of semiconductor device
03/02/2010US7672799 Defect inspection apparatus and defect inspection method
03/02/2010US7672750 Method and apparatus for monitoring a microstructure etching process
03/02/2010US7672547 Printed circuit board including optical waveguide and method of manufacturing the same
03/02/2010US7672168 Non-volatile semiconductor memory device adapted to store a multi-valued data in a single memory cell
03/02/2010US7672164 Semiconductor integrated circuit device with a stacked gate including a floating gate and a control gate
03/02/2010US7672132 Electronic packaging apparatus and method
03/02/2010US7672110 Electrostatic chuck having textured contact surface
03/02/2010US7672044 Lens made of a crystalline material