Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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12/28/2011 | CN101385129B 微波等离子体源和等离子体处理装置 A microwave plasma source and a plasma processing apparatus |
12/28/2011 | CN101383329B 嵌埋有芯片的封装结构及其制作方法 There embedded chip package structure and method of making |
12/28/2011 | CN101375398B 纳米线隧穿晶体管 Nanowire tunneling transistor |
12/28/2011 | CN101364591B 挤出失效监视器结构及其方法 Failure Monitor extrusion structure and method |
12/28/2011 | CN101364530B 电子部件安装方法及装置 Method and apparatus for mounting electronic components |
12/28/2011 | CN101363127B 电解镀铜方法 Electrolytic copper plating method |
12/28/2011 | CN101345247B 光电动势装置及其制造方法 A photovoltaic device and its manufacturing method |
12/28/2011 | CN101322073B 正型感光性树脂组合物及使用该组合物的半导体器件和显示器 The positive-type photosensitive resin composition and use of the composition of a semiconductor device and a display |
12/28/2011 | CN101315932B 半导体器件及其制造方法 Semiconductor device and manufacturing method thereof |
12/28/2011 | CN101312169B 半导体模块、半导体模块的制造方法以及便携式设备 Semiconductor module, method for manufacturing the semiconductor module and a portable device |
12/28/2011 | CN101309863B 半导体薄膜及其制造方法以及薄膜晶体管、有源矩阵驱动显示面板 A semiconductor thin film and the thin film transistor and its manufacturing method, an active matrix display panel is driven |
12/28/2011 | CN101263429B 使用膜形成组合物的图案形成方法 Film-forming composition using a pattern forming method |
12/28/2011 | CN101255233B 含硅高分子化合物及其制造方法、耐热性树脂组合物及耐热性薄膜 Silicon-containing polymer compound and its manufacturing method, heat-resistant resin composition and a heat-resistant film |
12/28/2011 | CN101232778B 印刷布线板 A printed circuit board |
12/28/2011 | CN101218191B 基材处理腔室的构件的局部表面退火 Localized surface annealing substrate processing chamber member |
12/28/2011 | CN101211891B 连接结构、电光装置及其制造方法 Connection structure, an electro-optical device and manufacturing method thereof |
12/28/2011 | CN101206394B 曝光掩模及使用该曝光掩模制造半导体器件的方法 Exposure mask and method of using the exposure mask manufacturing a semiconductor device |
12/28/2011 | CN101160014B 等离子体处理装置和可变阻抗装置的校正方法 Correction method and apparatus of the variable impedance of plasma processing apparatus |
12/28/2011 | CN101140856B 粘贴带切断方法及采用该方法的粘贴带粘贴装置 Paste adhesive tape cutting method and the use of this method with paste device |
12/28/2011 | CN101097331B 液晶显示器件及其制造方法 The liquid crystal display device and manufacturing method thereof |
12/28/2011 | CN101092049B 晶片的加工结果管理方法 Wafer processing results management |
12/28/2011 | CN101088147B 测量自偏压来监控等离子体处理系统中处理的方法和装置 Measured self-bias voltage to monitor the plasma processing system, processing method and apparatus |
12/28/2011 | CN101051619B 基板检查装置及使用其的基板检查方法 Substrate inspection device and substrate inspection method for use thereof |
12/28/2011 | CN101042988B 基板处理方法 Substrate processing method |
12/28/2011 | CN101032001B Cmp抛光剂以及衬底的抛光方法 Cmp polish polishing method and substrate |
12/27/2011 | USRE43045 Multi-chamber MOCVD growth apparatus for high performance/high throughput |
12/27/2011 | US8086973 Pattern management method and pattern management program |
12/27/2011 | US8086422 Method for analyzing defect data and inspection apparatus and review system |
12/27/2011 | US8085566 Semiconductor circuit device and data processing system |
12/27/2011 | US8085458 Diffusion barrier layer for MEMS devices |
12/27/2011 | US8084866 Microelectronic devices and methods for filling vias in microelectronic devices |
12/27/2011 | US8084865 Anchoring structure and intermeshing structure |
12/27/2011 | US8084855 Integrated circuit tampering protection and reverse engineering prevention coatings and methods |
12/27/2011 | US8084844 Semiconductor device |
12/27/2011 | US8084841 Systems and methods for providing high-density capacitors |
12/27/2011 | US8084834 Semiconductor device and method for manufacturing same |
12/27/2011 | US8084833 Semiconductor device |
12/27/2011 | US8084826 Semiconductor device and manufacturing method thereof |
12/27/2011 | US8084819 Semiconductor memory device having insulation patterns and cell gate patterns |
12/27/2011 | US8084818 High mobility tri-gate devices and methods of fabrication |
12/27/2011 | US8084817 Semiconductor device and method for fabricating the same |
12/27/2011 | US8084812 Bidirectional semiconductor device, method of fabricating the same, and semiconductor device incorporating the same |
12/27/2011 | US8084810 Fabrication method and structure of semiconductor non-volatile memory device |
12/27/2011 | US8084806 Isolation structure for a memory cell using A12O3 dielectric |
12/27/2011 | US8084802 Nonvolatile semiconductor memory |
12/27/2011 | US8084801 Cell structure for a semiconductor memory device and method of fabricating the same |
12/27/2011 | US8084800 Semiconductor device and a method of manufacturing the same |
12/27/2011 | US8084787 PMD liner nitride films and fabrication methods for improved NMOS performance |
12/27/2011 | US8084784 Semiconductor heterostructure and method for forming same |
12/27/2011 | US8084769 Testkey design pattern for gate oxide |
12/27/2011 | US8084706 System and method for laser processing at non-constant velocities |
12/27/2011 | US8084683 Low-cost multi-junction solar cells and methods for their production |
12/27/2011 | US8084375 Hot edge ring with sloped upper surface |
12/27/2011 | US8084374 Tuning of photo-absorption materials through use of magnetic fields |
12/27/2011 | US8084373 Manufacturing method of semiconductor device for enhancing the current drive capability |
12/27/2011 | US8084372 Substrate processing method and computer storage medium |
12/27/2011 | US8084371 Field effect transistors, methods of fabricating a carbon-insulating layer using molecular beam epitaxy and methods of fabricating a field effect transistor |
12/27/2011 | US8084370 Hafnium tantalum oxynitride dielectric |
12/27/2011 | US8084369 Producing method of semiconductor device and substrate processing apparatus |
12/27/2011 | US8084368 Method of forming barrier film |
12/27/2011 | US8084367 Etching, cleaning and drying methods using supercritical fluid and chamber systems using these methods |
12/27/2011 | US8084366 Modified DARC stack for resist patterning |
12/27/2011 | US8084365 Method of manufacturing a nano structure by etching, using a substrate containing silicon |
12/27/2011 | US8084364 Method of fabricating semiconductor device |
12/27/2011 | US8084363 Polishing slurry and polishing method |
12/27/2011 | US8084362 Polishing slurry and polishing method |
12/27/2011 | US8084361 Semiconductor fabrication method suitable for MEMS |
12/27/2011 | US8084360 Method of manufacturing semiconductor device |
12/27/2011 | US8084359 Semiconductor package and methods of manufacturing the same |
12/27/2011 | US8084358 Semiconductor device and manufacturing method thereof |
12/27/2011 | US8084357 Method for manufacturing a dual damascene opening comprising a trench opening and a via opening |
12/27/2011 | US8084356 Methods of low-K dielectric and metal process integration |
12/27/2011 | US8084355 Methods of forming copper-comprising conductive lines in the fabrication of integrated circuitry |
12/27/2011 | US8084354 Method of fabricating a metal cap layer with enhanced etch resistivity for copper-based metal regions in semiconductor devices |
12/27/2011 | US8084353 Methods for pitch reduction formation |
12/27/2011 | US8084352 Method of manufacturing semiconductor device |
12/27/2011 | US8084351 Contact structure of a semiconductor device |
12/27/2011 | US8084350 Method for manufacturing semiconductor device |
12/27/2011 | US8084349 Method for forming post bump |
12/27/2011 | US8084348 Contact pads for silicon chip packages |
12/27/2011 | US8084347 Resist feature and removable spacer pitch doubling patterning method for pillar structures |
12/27/2011 | US8084346 Replacement metal gate method |
12/27/2011 | US8084345 Methods of forming dispersions of nanoparticles, and methods of forming flash memory cells |
12/27/2011 | US8084344 Methods of fabricating a semiconductor device |
12/27/2011 | US8084343 Semiconductor device |
12/27/2011 | US8084342 Method of manufacturing a CMOS device with zero soft error rate |
12/27/2011 | US8084341 Semiconductor device and method for manufacturing the same |
12/27/2011 | US8084340 Method of manufacturing semiconductor device and semiconductor device |
12/27/2011 | US8084339 Remote plasma processing of interface surfaces |
12/27/2011 | US8084338 Semiconductor device and manufacturing method thereof |
12/27/2011 | US8084337 Growth of III-V compound semiconductor nanowires on silicon substrates |
12/27/2011 | US8084336 Oscillator apparatus |
12/27/2011 | US8084335 Method of thinning a semiconductor wafer using a film frame |
12/27/2011 | US8084334 Semiconductor device manufacturing method comprising a metal pattern and laser modified regions in a cutting region |
12/27/2011 | US8084333 Object cutting method |
12/27/2011 | US8084332 Method of fabrication of AI/GE bonding in a wafer packaging environment and a product produced therefrom |
12/27/2011 | US8084331 Method of treating semiconductor element |
12/27/2011 | US8084330 Thin body semiconductor devices having improved contact resistance and methods for the fabrication thereof |
12/27/2011 | US8084329 Transistor devices and methods of making |
12/27/2011 | US8084327 Method for forming trench gate field effect transistor with recessed mesas using spacers |