Patents for H01J 27 - Ion beam tubes (3,716)
11/2009
11/03/2009US7612346 Non-axisymmetric charged-particle beam system
10/2009
10/29/2009WO2009131693A1 Ion source with adjustable aperture
10/29/2009US20090266997 Ion source with adjustable aperture
10/27/2009US7609009 Linear ion accelerator
10/27/2009US7609003 Ion implantation system and control method
10/27/2009US7608839 Plasma source and applications thereof
10/22/2009US20090262482 Ionizer
10/22/2009US20090261268 Ionic fluid flow accelerator
10/21/2009EP2110843A1 Stable emission gas ion source and method of operation thereof
10/20/2009US7605379 Cold-cathode-based ion source element
10/20/2009US7604881 diamond-like carbon film contains a glass substrate, a semiconductor, an integrated circuit, a machine tool, an optic, a magnetic recording head, or a magnetic recording media; diamond-like protective coatings; high mechanical hardness, low friction, optical transparency, and chemical resistance
10/13/2009US7602111 Plasma accelerating apparatus and plasma processing system including secondary electron amplification coating layer formed at inner wall of channel
10/13/2009US7601970 Alternating current negative ion and silver ion generator
10/13/2009US7601938 Imaging system, methodology, and applications employing reciprocal space optical design
10/08/2009US20090250623 Method for generating a pulsed flux of energetic particles, and a particle source operating accordingly
10/08/2009US20090250608 Ion Sources For Improved Ionization
10/06/2009US7598500 Ion source and metals used in making components thereof and method of making same
10/01/2009WO2009119060A1 Ion source
10/01/2009US20090242793 Flexible ion source
10/01/2009US20090242749 Mass spectrometer
09/2009
09/17/2009WO2009112667A1 Filament electrical discharge ion source
09/17/2009US20090230318 Target design for high-power laser accelerated ions
09/17/2009US20090230299 Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample
09/15/2009US7589328 Gas field ION source for multiple applications
09/11/2009WO2009111149A1 Gas field ion source with coated tip
09/11/2009WO2009110506A1 Ion source
09/11/2009WO2009109534A1 Improvements relating to mass spectrometry
09/09/2009CN100538987C Symmetric beamline and methods for generating a mass-analyzed ribbon ion beam
09/08/2009US7586101 Ion sources for ion implantation apparatus
09/08/2009US7586099 Vacuum plasma generator
09/08/2009US7586098 Ion stripper device made of carbon nanotubes or fullerenes
09/03/2009WO2009106389A1 Particle therapy installation
09/02/2009CN100536062C A source of liquid metal ions and a method for controlling the source
08/2009
08/27/2009US20090212232 Ion source and ion implantation apparatus
08/26/2009EP2092544A2 Closed drift ion source
08/26/2009CN100533650C Ion source control system
08/26/2009CN100533649C Cathode and counter cathode arrangement in an ion source
08/26/2009CN100533642C Ion source with modified gas delivery
08/20/2009US20090206281 Vapor delivery system useful with ion sources and vaporizers for use in such system
08/20/2009US20090206275 Accelerator particle beam apparatus and method for low contaminate processing
08/20/2009US20090206274 Multi-electrode negative ion generator
08/20/2009US20090206270 Ion beam apparatus and method for ion implantation
08/20/2009US20090206248 Ion energy spread reduction for mass spectrometer
08/19/2009EP2091306A1 Spin-polarization ion beam generator, scattering spectroscope using the spin-polarization ion beam, and specimen processing device
08/19/2009CN101512716A Method and apparatus for extracting ions from an ion source for use in ion implantation
08/18/2009US7574974 Device for production of a plasma sheet
08/13/2009US20090203199 Ion beam irradiating apparatus, and method of producing semiconductor device
08/13/2009US20090200485 Method and Apparatus For Generating Ion Beam
08/13/2009CA2712909A1 Method and apparatus for normalizing performance of an electron source
08/12/2009EP2088613A1 Dual mode gas field ion source
08/06/2009US20090194704 Method and device of ion source generation
08/04/2009US7569837 Ion source
07/2009
07/30/2009US20090189083 Ion-beam source
07/22/2009CN101490789A Ion sources
07/16/2009US20090181527 Graphite Member for Beam-Line Internal Member of Ion Implantation Apparatus
07/16/2009US20090179161 Ion sources, systems and methods
07/16/2009US20090179158 In-vacuum protective liners
07/16/2009US20090179157 Vapor delivery to devices under vacuum
07/16/2009US20090179140 Ion generating light assembly
07/15/2009EP2079096A1 Ion source with filament electric discharge
07/14/2009US7560870 Power supply apparatus for ion accelerator
07/09/2009US20090173888 Gas field ion source, charged particle microscope, and apparatus
07/08/2009EP1738388A4 Method and apparatus for improved processing with a gas-cluster ion beam
07/08/2009EP1550144A4 System for and method of gas cluster ion beam processing
07/07/2009US7557361 Ion sources, systems and methods
07/07/2009US7557360 Ion sources, systems and methods
07/07/2009US7557359 Ion sources, systems and methods
07/07/2009US7557358 Ion sources, systems and methods
07/02/2009US20090166555 RF electron source for ionizing gas clusters
07/02/2009US20090166554 Techniques for providing a multimode ion source
06/2009
06/30/2009US7554097 Ion sources, systems and methods
06/30/2009US7554096 Ion sources, systems and methods
06/25/2009US20090162572 Systems and Methods for the Production of Highly Tetrahedral Amorphous Carbon Coatings
06/25/2009DE102008060270A1 Gasfeldionisations-Ionenquelle, Rasterladungsteilchenmikroskop, Einstellverfahren für die optische Achse und Probenbetrachtungsverfahren Gasfeldionisations ion source Rasterladungsteilchenmikroskop, for adjusting the optical axis and sample observation method
06/24/2009CN201262942Y Ion source ball tube for circular accelerator
06/23/2009US7550753 Charged particle generator and accelerator
06/18/2009US20090152473 Photon source comprising an ecr source with pressure gradient
06/18/2009US20090152462 Gas field ionization ion source, scanning charged particle microscope, optical axis adjustment method and specimen observation method
06/17/2009EP1665319A4 Shaped sputter shields for improved ion column operation
06/17/2009CN101461025A Vaporizer
06/17/2009CN100500930C Non-grid ion plating aid
06/16/2009US7547891 Ion sampling apparatuses in fast polarity-switching ion sources
06/11/2009WO2008088971A3 Techniques for providing ion source feed materials
06/11/2009US20090145554 Procedure and device for the production of a plasma
06/10/2009EP2068343A1 Charged particle source with automated tip formation
06/10/2009EP1617440B1 High-speed particle generator
06/09/2009US7544952 Multivalent ion generating source and charged particle beam apparatus using such ion generating source
06/09/2009US7544397 Recording media having protective overcoats of highly tetrahedral amorphous carbon and methods for their production
06/04/2009WO2008150336A3 A portable/mobile fissible material detector and methods for making and using same
06/04/2009WO2008103733A3 Gas ionizer
06/04/2009WO2006086273A3 Apparatus and method for positioning a discharge tube with respect to an orifice
06/04/2009US20090140164 Induction electrode, ion generation element, ion generation apparatus, and electric equipment
06/02/2009US7541597 Automatic cleaning of ion sources
05/2009
05/27/2009CN100492584C Ion beam incident angle detector for ion implant systems
05/21/2009US20090127452 Method and apparatus for self calibrating meter movement for ionization power supplies
05/14/2009WO2009027596A3 Ionic emission micronic source
05/14/2009US20090121148 High Brightness Solid State Ion Beam Generator, its use, and Method for Making such a Generator
05/13/2009EP2057300A2 Ion source with recess in electrode
05/07/2009US20090114841 Double plasma ion source
05/07/2009US20090114838 Focused ion beam field source
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