Patents for G21K 5 - Irradiation devices (9,144)
06/2008
06/05/2008US20080130076 Illumination system particularly for microlithography
06/05/2008US20080128642 Lithographic apparatus and device manufacturing method
06/05/2008US20080128641 Apparatus and method for introducing particles using a radio frequency quadrupole linear accelerator for semiconductor materials
06/05/2008US20080128638 Multi-Beam Modulator For a Particle Beam and Use of the Multi-Beam Modulator for the Maskless Structuring of a Substrate
06/05/2008US20080128637 Method and system for logic design for cell projection particle beam lithography
06/05/2008US20080128634 Method and apparatus for surface potential reflection electron mask lithography
06/04/2008CN100391406C X-ray generating apparatus
06/03/2008US7382859 X-ray imaging apparatus and method
06/03/2008US7381970 Specimen stage for charged-particle scanning microscopy
06/03/2008US7381968 Charged particle beam apparatus and specimen holder
06/03/2008US7381949 Method and apparatus for simultaneously depositing and observing materials on a target
05/2008
05/29/2008WO2008064220A2 Method and system for wide-field multi-photon microscopy having a confocal excitation plane
05/29/2008WO2008064178A2 Method and system for proximity effect and dose correction for a particle beam writing device
05/29/2008WO2008064176A2 Method and system for improving particle beam lithography
05/29/2008WO2008064155A2 Stencil design and method for cell projection particle beam lithography
05/29/2008WO2008062756A1 Imaging device
05/29/2008WO2008062670A1 Electron beam irradiation system
05/29/2008WO2008062669A1 Electron beam irradiation system
05/29/2008WO2008062668A1 Electron beam irradiating device
05/29/2008WO2008062667A1 Electron beam irradiation apparatus
05/29/2008WO2008062666A1 Electron beam irradiation device
05/29/2008US20080123807 Illumination optics for projection microlithography
05/29/2008US20080121822 Ion implantation apparatus
05/29/2008US20080121821 Techniques for low-temperature ion implantation
05/29/2008US20080121813 Method and apparatus of compensating for position shift
05/29/2008US20080121799 Sample analyzing apparatus
05/29/2008CA2670002A1 Device and method for immobilizing patients for breast radiation therapy
05/28/2008EP1925001A2 Method and apparatus for targeting a tumor during radiotherapy using a virtual image
05/28/2008CN101187459A Quasimolecule light irradiator
05/27/2008US7378670 Shielding assembly for a semiconductor manufacturing apparatus and method of using the same
05/27/2008US7378666 Irradiation device for testing objects coated with light-sensitive paint
05/27/2008US7378197 Antireflective coating; making semiconductors at lower wavelengths using reflective masks that can be effectively inspected at multiple wavelengths; wide bandwidth inspection contrast for extreme ultra-violet reticles
05/22/2008WO2007076491A3 Single nanoparticle tracking spectroscopic microscope
05/22/2008US20080117512 Mirror unit, method of producing the same, and exposure apparatus and method using the mirror unit
05/22/2008US20080116399 Method and system for improving particle beam lithography
05/22/2008US20080116398 Method and system for proximity effect and dose correction for a particle beam writing device
05/22/2008US20080116397 Stencil design and method for cell projection particle beam lithography
05/22/2008US20080116396 Exposure apparatus and exposure method
05/22/2008US20080116392 Method and system for wide-field multi-photon microscopy having a confocal excitation plane
05/21/2008CN101183083A X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof
05/21/2008CN101183082A Ship radiation image-forming detecting system
05/15/2008WO2008058248A2 Apparatus and method for introducing particles using a radio frequency quadrupole linear accelerator for semiconductor materials
05/15/2008US20080113303 Multilayer Coatings For EUV Mask Substrates
05/15/2008US20080110852 Medical Containers and Treating Method for Producing Medical Containers
05/15/2008DE10222828B4 Bestrahlungsgerät Irradiation device
05/15/2008DE10211492B4 Lamelle,Lamellenkollimator, Vorrichtung zur Strahlenbegrenzung und Bestrahlungsgerät Lamella, multileaf collimator, apparatus for limiting radiation and irradiation apparatus
05/15/2008DE102006052743A1 Verfahren und Vorrichtung zum Strahlungshärten Method and apparatus for curing radiation
05/14/2008EP1919364A1 Patient positioning device
05/14/2008EP1508152A4 Particle beam processing apparatus and materials treatable using the apparatus
05/14/2008EP1428554A4 Device for x-ray therapy
05/14/2008CN201058045Y Three-dimensional irradiation device of heavy ion beam to tumour target region
05/13/2008US7373254 Disinfestation of medical implants with radiation
05/13/2008US7372945 Method and device for the recording of objects
05/13/2008US7372624 8-mirror microlithography projection objective
05/13/2008US7372047 Charged particle system and a method for measuring image magnification
05/08/2008US20080107976 Hardware and software for directing a beam through a mask onto a wafer surface to outline a circuit pattern; photolithography system including an exposure tool, a mask, array of micromechanical mirrors capable of real time configurable imaging, and addressing circuitry
05/08/2008US20080105879 Process and system for laser annealing and laser-annealed semiconductor film
05/08/2008US20080105834 Ion implanter with function of compensating wafer cut angle and ion implantation method using the same
05/08/2008US20080105825 Laser scanning apparatus and method using diffractive optical elements
05/08/2008DE202008002033U1 Mobile Vorrichtung zum Testen von Photovoltaik-Wafern Mobile apparatus for testing photovoltaic wafers
05/08/2008DE102006051738A1 Packstoff-Entkeimungsanlage Packaging material disinfection
05/06/2008US7368744 Photon sieve for optical systems in micro-lithography
05/06/2008US7368741 Extreme ultraviolet light source
05/06/2008US7368738 Advanced pattern definition for particle-beam exposure
05/06/2008US7368735 Charged beam drawing data creation method, charged beam drawing method, charged beam drawing apparatus and semiconductor device manufacturing method
05/06/2008US7368734 Ion beam measuring method and ion implanting apparatus
05/01/2008US20080099697 Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using same
05/01/2008US20080099693 Charged-particle exposure apparatus
05/01/2008US20080099675 Inspection apparatus and an inspection method
05/01/2008US20080099674 Electron microscope for inspecting and processing of an object with miniaturized structures and method thereof
05/01/2008US20080099673 Electron Beam Apparatus and Electron Beam Inspection Method
04/2008
04/30/2008CN100384376C Thermoelectric controlled x-ray detector array
04/29/2008US7366280 Integrated arc anode x-ray source for a computed tomography system
04/24/2008WO2008047529A1 Neutron moderator, neutron irradiation method, and hazardous substance detector
04/24/2008WO2006110253A8 Quantitative transmission/emission detector system and methods of detecting concealed radiation sources
04/24/2008US20080095319 Two-Stage X-Ray Concentrator
04/24/2008US20080093562 Beam Recording Method and Device
04/24/2008US20080093550 Method For Adhering Nanostructures to End of Probe of Microscope and Microscope Having Probe Made By the Same Method
04/24/2008DE202006019307U1 Bestrahlungsvorrichtung Irradiation apparatus
04/23/2008CN100382752C Exposure control in scanning-based detection of ionizing radiation
04/22/2008US7361915 Beam current stabilization utilizing gas feed control loop
04/22/2008US7361914 Means to establish orientation of ion beam to wafer and correct angle errors
04/22/2008US7361913 Methods and apparatus for glitch recovery in stationary-beam ion implantation process using fast ion beam control
04/22/2008US7361910 Movable stage apparatus
04/22/2008US7361457 Hardware and software for directing a beam through a mask onto a wafer surface to outline a circuit pattern; photolithography system including an exposure tool, a mask, array of micromechanical mirrors capable of real time configurable imaging, and addressing circuitry
04/17/2008WO2008044319A1 Euv light generating apparatus and euv exposure apparatus
04/17/2008WO2007095119A3 Methods and systems for simultaneous real-time monitoring of optical signals from multiple sources
04/17/2008US20080090396 Light exposure apparatus and method for making semiconductor device formed using the same
04/17/2008US20080089470 Alignment for contact lithography
04/17/2008US20080087845 Central dryer for electron beam curing
04/17/2008US20080087821 Electron Beam System and Method of Operating the Same
04/17/2008US20080087808 Method and system for controlling beam scanning in an ion implantation device
04/17/2008DE112006001346T5 Vorrichtung und Verfahren zum Bestrahlen mit einem Energiestrahl Apparatus and method for irradiating with an energy beam
04/16/2008EP1810299A4 Integrated sub-nanometer-scale electron beam systems
04/16/2008CN101164070A Locating sub-resolution assist features in semiconductor device fabrication
04/15/2008US7358511 Plasma doping method and plasma doping apparatus
04/15/2008US7358508 Ion implanter with contaminant collecting surface
04/10/2008WO2007146395A3 Ion beam apparatus and method employing magnetic scanning
04/10/2008US20080084963 Rotating carriage assembly for use in scanning cargo conveyances transported by a crane
04/10/2008US20080083885 Lithographic apparatus, and device manufacturing method
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