Patents for G21K 5 - Irradiation devices (9,144)
12/2008
12/31/2008CN201174259Y Low-energy electronic accelerator beam device reactor
12/31/2008CN101336456A Method and apparatus for scanning a workpiece through an ion beam
12/31/2008CN100447671C Photoetching projector and reflector assembly for the same
12/31/2008CN100447289C Plasma-assisted nitrogen surface treatment
12/31/2008CA2691484A1 Higher pressure, modular target system for radioisotope production
12/30/2008US7471765 Cone beam computed tomography with a flat panel imager
12/30/2008US7470033 Reflection-type projection-optical systems, and exposure apparatus comprising same
12/25/2008US20080318345 Plasma ion implantation process control using reflectometry
12/25/2008US20080317207 Remote Communication Method and Device Unsing Nuclear Isomers
12/25/2008US20080315129 Ion planting while growing a III-nitride layer
12/25/2008US20080315126 Laser light source apparatus, exposure method, and exposure apparatus
12/25/2008US20080315121 Radiation detector, method of manufacturing a radiation detector and lithographic apparatus comprising a radiation detector
12/25/2008US20080315097 Charged particle beam apparatus and specimen holder
12/24/2008EP2006860A2 Electron beam generating apparatus
12/24/2008EP2005993A1 Charged particle irradiation system
12/24/2008EP2005444A2 Bench-top image-guided conformal irradiation system for laboratory animals
12/24/2008CN100446167C Plasma focus light source with impoved pulse power system
12/23/2008US7469058 Method and system for a maskless lithography rasterization technique based on global optimization
12/23/2008US7469040 X-ray tube for high dose rates, method of generating high dose rates with X-ray tubes and a method of producing corresponding X-ray devices
12/18/2008US20080311762 Semiconductor device surface roughness reduction
12/18/2008US20080308743 Charged particle beam application apparatus
12/18/2008US20080308731 Specimen Holder, Specimen Inspection Apparatus, Specimen Inspection Method, and Method of Fabricating Specimen Holder
12/17/2008EP1053551B1 Wavelength dispersive x-ray spectrometer with x-ray collimator optic for increased sensitivity over a wide x-ray energy range
12/16/2008US7466408 Measurement system
12/16/2008US7465944 Charged particle therapy apparatus and charged particle therapy system
12/16/2008US7465943 Controlling the flow through the collector during cleaning
12/11/2008WO2008149600A1 Radioisotope production system and radioisotope production method
12/11/2008WO2008149461A1 Charged particle beam inspection apparatus and method for inspecting charged particle beam
12/11/2008US20080302980 Extreme ultra-violet lithographic apparatus and device manufacturing method
12/11/2008US20080302974 Optical auto focusing system and method for electron beam inspection tool
12/11/2008US20080302955 Techniques for ion beam current measurement using a scanning beam current transformer
12/11/2008US20080302559 Flexible and elastic dielectric integrated circuit
12/10/2008EP1419514B1 Split double gap buncher and method for ion bunching in an ion implantation system
12/10/2008CN201163547Y Lower irradiation device for tube bundle
12/10/2008CN100441732C Plasma-assisted reinforced coating
12/09/2008US7462843 Apparatus and methods for ion beam implantation
12/09/2008US7462842 Device, EUV lithographic device and method for preventing and cleaning contamination on optical elements
12/04/2008WO2008146654A1 Electron beam sterilizer
12/04/2008US20080299490 Writing method and charged particle beam writing apparatus
12/04/2008US20080298553 Particle-Beam Treatment System
12/04/2008US20080298542 Image Producing Methods and Image Producing Devices
12/04/2008US20080296516 Method and apparatus for specimen fabrication
12/03/2008EP1998601A1 Apparatus and method for measuring profile of electronic beam and laser beam
12/02/2008US7460228 Fast particle generating apparatus
12/02/2008US7460212 Collector configured of mirror shells
12/02/2008US7459705 Charged particle beam exposure method of character projection system, charged particle beam exposure device of character projection system, program for use in charged particle beam exposure device, and manufacturing method of semiconductor device
12/02/2008US7459704 Ion source configuration for production of ionized clusters, ionized molecules and ionized mono-atoms
12/02/2008US7459703 Ion implant beam angle integrity monitoring and adjusting
12/02/2008US7459690 Lithographic apparatus, device manufacturing method, and device manufactured thereby
12/02/2008US7459681 Scanning electron microscope
12/02/2008CA2439330C Radiotherapeutic apparatus
12/02/2008CA2353980C Method for treating a target volume with a particle beam and device implementing same
11/2008
11/27/2008WO2008143242A1 Ion beam control apparatus and method
11/27/2008WO2008100330A9 Surface modification of polymer surface using ion beam irradiation
11/27/2008US20080292058 Device for Limiting Field on Which Radiation is Irradiated
11/27/2008US20080291417 Laser Beam Conditioning System Comprising Multiple Optical Paths Allowing for Dose Control
11/27/2008US20080290300 Crystallization apparatus and crystallization method
11/27/2008US20080290298 Method and system for treating an interior surface of a workpiece using a charged particle beam
11/27/2008DE102007024027A1 Verfahren und Vorrichtung zur kombinierten Behandlung einer Oberfläche mit einem Plasma und mit elektromagnetischer Strahlung Method and apparatus for the combined treatment of a surface with a plasma and electromagnetic radiation
11/26/2008CN101312749A Decontamination and sterilization system using large area x-ray source
11/26/2008CN100436763C Plasma-assisted engine exhausting process
11/25/2008US7458058 Verifying a process margin of a mask pattern using intermediate stage models
11/25/2008US7458057 Pattern correction method, pattern correction system, mask manufacturing method, semiconductor device manufacturing method, recording medium, and designed pattern
11/25/2008US7456408 Illumination system particularly for microlithography
11/25/2008CA2425057C Radiotherapy apparatus and collimator set therefor
11/20/2008US20080283777 In-situ high-resolution light-optical channel for optical viewing and surface processing in parallel with charged particle (fib and sem) techniques
11/20/2008US20080283776 Method and apparatus for EUV plasma source target delivery
11/20/2008US20080283768 Transfer mechanism for transferring a specimen
11/19/2008EP1991993A2 Electron beam emitter
11/18/2008US7453077 EUV light source
11/18/2008US7453074 Ion implanter with ionization chamber electrode design
11/18/2008US7452637 protecting a photomask from particle defects by heating the photomask to initiate a thermophoretic force
11/18/2008CA2328045C Device and method for treating water with ozone generated by water electrolysis
11/13/2008WO2008064155A3 Stencil design and method for cell projection particle beam lithography
11/13/2008US20080279331 X-ray imaging system and x-ray imaging method
11/13/2008US20080277598 Electron beam exposure apparatus
11/13/2008DE102004031079B4 Verfahren zur Herstellung einer Reflexionsmaske A method of manufacturing a reflection mask
11/12/2008CN101303538A Exposure apparatus
11/11/2008US7450301 Reflective projection lens for EUV-photolithography
11/11/2008US7449701 Particle beam irradiation equipment and particle beam irradiation method
11/11/2008US7449700 Electron beam exposure apparatus, electron beam exposure method and method of manufacturing semiconductor device
11/11/2008US7449699 Method and apparatus for creating a topography at a surface
11/06/2008US20080273661 Irradiation method and apparatus
11/06/2008US20080272315 Material Activating Device
11/06/2008DE202005021576U1 Vorrichtung zur Durchführung eines Verfahrens zur Modifizierung von Oberflächen strahlenhärtbarer Farben und Lacke durch photochemische Mikrofaltung mittels kurzwelliger monochromatischer UV-Strahlung unter stabilen Bestrahlungs- und Inertisierungsbedingungen Apparatus for performing a method for modifying surfaces of radiation-curable paints and varnishes by photochemical micropleat with shortwave monochromatic UV radiation under stable irradiation and Inertisierungsbedingungen
11/05/2008CN201145674Y Radiation imaging detector
11/05/2008CN101299901A Irradiation accelerator gathering magnetic iron and method for preparing the same
11/04/2008US7448018 System and method for employing patterning process statistics for ground rules waivers and optimization
11/04/2008US7446328 Patient alignment system with external measurement and object coordination for radiation therapy system
11/04/2008US7446326 Technique for improving ion implanter productivity
11/04/2008CA2450484C Apparatus and method for generating 18f-fluoride by ion beams
10/2008
10/30/2008WO2007133723A3 X-ray transparent bed and gurney extender for use with mobile computerized tomography (ct) imaging systems
10/29/2008CN201142238Y Liftable conveyer
10/29/2008CN101297376A Electron beam application method, electron beam application device, electron beam application device for opening-equipped vessel
10/29/2008CN100429749C Neutral particle beam lithography
10/29/2008CN100429123C Device and method for electron beam irradiation.
10/28/2008US7443953 Structured anode X-ray source for X-ray microscopy
10/28/2008US7443948 Illumination system particularly for microlithography
10/23/2008US20080260100 Radiochemical Sensor for Fluids
10/23/2008US20080258084 Charged-Particle Exposure Apparatus
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