| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/10/2009 | US7490271 Semiconductor device mounting chip having tracing function |
| 02/10/2009 | US7489782 Registry restore to original hardware |
| 02/10/2009 | US7489724 System and method for connecting a host and a target |
| 02/10/2009 | US7489639 Root-cause analysis of network performance problems |
| 02/10/2009 | US7489638 Scheduling with delayed graphs for communication networks |
| 02/10/2009 | US7489637 Method of enhancing the efficiency of data flow in communication systems |
| 02/10/2009 | US7489636 System and method for prioritizing packetized data from distributed control environment for transmission through a high bandwidth link |
| 02/10/2009 | US7489631 Method and device for quality management in communication networks |
| 02/10/2009 | US7489630 Method and apparatus for controlling connections in a communication network |
| 02/10/2009 | US7489628 Communication traffic management monitoring systems and methods |
| 02/10/2009 | US7489625 Multi-stage packet switching system with alternate traffic routing |
| 02/10/2009 | US7489157 System and method for automatically measuring carrier density distribution by using capacitance-voltage characteristics of a MOS transistor device |
| 02/10/2009 | US7489156 Method for testing micro SD devices using test circuits |
| 02/10/2009 | US7489155 Method for testing plurality of system-in-package devices using plurality of test circuits |
| 02/10/2009 | US7489154 Testing high frequency signals on a trace |
| 02/10/2009 | US7489153 Semiconductor memory device |
| 02/10/2009 | US7489152 Characterizing circuit performance by separating device and interconnect impact on signal delay |
| 02/10/2009 | US7489151 Layout for DUT arrays used in semiconductor wafer testing |
| 02/10/2009 | US7489150 Apparatus and methods for self-heating burn-in processes |
| 02/10/2009 | US7489148 Methods for access to a plurality of unsingulated integrated circuits of a wafer using single-sided edge-extended wafer translator |
| 02/10/2009 | US7489147 Inspection equipment of circuit board and inspection method of circuit board |
| 02/10/2009 | US7489146 V/I source and test system incorporating the same |
| 02/10/2009 | US7489140 Apparatus, method and system for spark testing an insulated cable |
| 02/10/2009 | US7489139 System and method for checking decoupling of power supply in printed wiring board |
| 02/10/2009 | US7489138 Differential arc fault detection |
| 02/10/2009 | US7489137 Power line induction of sheath test current to discover defective coaxial cable |
| 02/10/2009 | US7489136 Apparatus and method of detecting radiation |
| 02/10/2009 | US7489125 Calibrating a tester using ESD protection circuitry |
| 02/10/2009 | US7489123 Calibration control for pin electronics of automatic testing equipment |
| 02/10/2009 | US7489122 Method and device for measuring voltage |
| 02/10/2009 | US7488937 Method and apparatus for the improvement of material/voltage contrast |
| 02/10/2009 | CA2316937C Process and device for testing the operation of an electronic unit by simulation and test installation of unit to be mounted on railway rolling stock or an electric vehicle |
| 02/05/2009 | WO2009017465A2 Patterned wafer defect inspection system and method |
| 02/05/2009 | WO2009017120A1 Secondary battery deterioration deciding device |
| 02/05/2009 | WO2009017094A1 Device for determining deterioration of secondary battery |
| 02/05/2009 | WO2009017079A1 Socket and burn-in board provided with the socket |
| 02/05/2009 | WO2009016763A1 Tft panel substrate inspecting device |
| 02/05/2009 | WO2009016715A1 Testing apparatus, testing method, and manufacturing method of device |
| 02/05/2009 | WO2009016704A1 Variable delay circuit, variable delay circuit control method, and input and output circuit |
| 02/05/2009 | WO2009016303A2 Apparatus for locating an electronic device, especially on an airplane |
| 02/05/2009 | WO2009015925A1 Electronic monitoring circuit for monitoring the electric connection between at least two appliances |
| 02/05/2009 | WO2008152466A3 Insulation fault detection device |
| 02/05/2009 | WO2008089430A3 Probing structure with fine pitch probes |
| 02/05/2009 | WO2008089341A3 System for fault determinations for high frequency electronic circuits |
| 02/05/2009 | WO2008048706A3 Dynamic burn-in systems and apparatuses |
| 02/05/2009 | WO2007103551A3 Apparatus and method for testing semiconductor devices |
| 02/05/2009 | US20090037788 Shrink Test Mode to Identify Nth Order Speed Paths |
| 02/05/2009 | US20090037786 Method and apparatus for unifying self-test with scan-test during prototype debug and production test |
| 02/05/2009 | US20090037785 Low overhead input and output boundary scan cells |
| 02/05/2009 | US20090037133 Device for thorough testing of secure electronic components |
| 02/05/2009 | US20090037132 Parallel Test System |
| 02/05/2009 | US20090037125 System, method, and article of manufacture for determining an estimated battery state vector |
| 02/05/2009 | US20090037124 Battery status detecting method, battery status detecting apparatus, and expression deriving method |
| 02/05/2009 | US20090034665 Method, System and Apparatus for Quantifying the Contribution of Inter-Symbol Interference Jitter on Timing Skew Budget |
| 02/05/2009 | US20090034423 Automated detection of TCP anomalies |
| 02/05/2009 | US20090034411 Automated diagnostics and troubleshooting mechanism for end-users and technicians |
| 02/05/2009 | US20090033373 Circuit and Method for Trimming Integrated Circuits |
| 02/05/2009 | US20090033357 Winding fault detection system |
| 02/05/2009 | US20090033356 System and method for analyzing end to end testing |
| 02/05/2009 | US20090033355 Method And Apparatus To Measure Threshold Shifting Of A MOSFET Device And Voltage Difference Between Nodes |
| 02/05/2009 | US20090033354 Multi-purpose poly edge test structure |
| 02/05/2009 | US20090033353 Systems and methods for electrical characterization of inter-layer alignment |
| 02/05/2009 | US20090033352 Handler and process for testing a semiconductor chips using the handler |
| 02/05/2009 | US20090033351 Test structure for electromigration analysis and related method |
| 02/05/2009 | US20090033350 Element Substrate, Inspecting Method, and Manufacturing Method of Semiconductor Device |
| 02/05/2009 | US20090033336 Wireless remote detector systems and methods |
| 02/05/2009 | US20090033335 Method of digital extraction for accurate failure diagnosis |
| 02/05/2009 | US20090033334 Contact configuration for undertaking tests on circuit board |
| 02/05/2009 | US20090032938 Electronic Package With Direct Cooling Of Active Electronic Components |
| 02/05/2009 | US20090032813 Test Wafer, Manufacturing Method Thereof and Method for Measuring Plasma Damage |
| 02/05/2009 | US20090031816 Tray for handling devices to be tested |
| 02/05/2009 | US20090031810 Systems and methods for conducting simultaneous vibration and electrical testing |
| 02/05/2009 | DE112007000655T5 Thermisches Vorscannen elektrischer Schaltungen unter Verwendung thermisch trimmbarer Widerstände Thermal pre-scanning electrical circuits using thermally trimmable resistors |
| 02/05/2009 | DE112005003743T5 Elektrische Verbindungsvorrichtung Electrical connection device |
| 02/05/2009 | DE102008031671A1 Gerät zum Einschätzen des Ladezustandes einer wiederaufladbaren Batterie, die durch eine im Fahrzeug montierte Leistungs-Generierungsvorrichtung geladen wird Device for estimating the state of charge of a rechargeable battery that is charged by a vehicle-mounted power generation device |
| 02/05/2009 | DE102008031670A1 Gerät zum Schätzen des Ladezustandes einer wieder aufladbaren Batterie, die durch eine im Fahrzeug montierte Leistungs-Generatorvorrichtung geladen wird Apparatus for estimating the state of charge of a rechargeable battery which is charged by a vehicle-mounted power generator device |
| 02/05/2009 | DE102008022775A1 Vorrichtung, System und Verfahren zur Simulation von Resolverausgängen, um Motor-Resolver-Systeme zu testen Apparatus, system and method for simulating Resolverausgängen to test motor resolver systems |
| 02/05/2009 | DE102007036649A1 Contact element i.e. contact needle, for use in probe card, has two pointed contact surfaces for simultaneously contacting corresponding contact points of chip in wafer, where element provides signal to corresponding contact point |
| 02/05/2009 | DE102007036165A1 Battery charging condition i.e. charging time, determining method for battery-operated self-propelled dust collecting robot, involves activating level of total voltage activated as mail for actually available charging condition of battery |
| 02/05/2009 | DE102007036064A1 Battery cell monitoring method for motor vehicle, involves selecting N cells of battery by N plus 1 solid state relays, supplying voltage of cells to analog-to-digital converter, and carrying out selectivity of relays by digital processor |
| 02/05/2009 | DE102007035820A1 Electric machine function testing method for mounting drive device i.e. hybrid drive device, of motor vehicle, involves determining oscillating frequency of machine acoustically, and comparing frequency with reference oscillating frequency |
| 02/05/2009 | DE102007008191B4 Verfahren und Datenverarbeitungssystem zur Ermittlung der Anregebedingungen eines ortsfernen Reserveschutzsystems für Mittel- und Hochspannungsleitungen Procedures and data processing system for determining the excitation conditions of a location remote backup protection system for medium and high voltage cables |
| 02/04/2009 | EP2020724A1 Accumulator charge/discharge control device and charge/discharge control method |
| 02/04/2009 | EP2020070A1 A time alert device for use together with an earth leakage protection device |
| 02/04/2009 | EP2019969A2 User interface for monitoring a plurality of faulted circuit indicators |
| 02/04/2009 | EP1889133B1 Method and device for tempering electronic components |
| 02/04/2009 | EP1297425B1 Method and device for optimising a test programme |
| 02/04/2009 | EP1243915B1 Apparatus for evaluating electrical characteristics |
| 02/04/2009 | EP1208389B1 Method and apparatus for evaluating stored charge in an electrochemical cell or battery |
| 02/04/2009 | CN201191759Y Intelligence protecting monitor for electric motor |
| 02/04/2009 | CN201191496Y LED constant current driving chip having fault retransmission function |
| 02/04/2009 | CN201191450Y Electricity fault dynamic recording device |
| 02/04/2009 | CN201191316Y Detection device of induction type press-key switch |
| 02/04/2009 | CN201191315Y PCB multifunctional test system |
| 02/04/2009 | CN201191314Y Constant voltage split clamp of railway circuit split residue voltage determining tester |
| 02/04/2009 | CN201191313Y Bus system special for automatic test device |
| 02/04/2009 | CN201191312Y 远程线缆测试器 Remote Cable Tester |
| 02/04/2009 | CN201191311Y Transient characteristic experiment apparatus of ultra-high-voltage current transducer |
| 02/04/2009 | CN201191310Y Microwave leakage detection device |
| 02/04/2009 | CN201191307Y Measurement device of solid electrolyte film |