Patents
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
05/2011
05/04/2011CN201819928U Fixing bracket for arrestor test
05/04/2011CN201819927U Compression tooling for communication power amplification module
05/04/2011CN201819926U Automobile window control function switch on-off detection fixture
05/04/2011CN201819925U Positioning fixture for detecting automobile window control function switch
05/04/2011CN201819924U Fixture for detecting OLED (organic light emitting diode) modules
05/04/2011CN201819923U Universal clamp for parameter tests of multiple types of armatures
05/04/2011CN201819922U Novel armature fixture convenient for test
05/04/2011CN201819921U Anti-interference single board testing tool equipment
05/04/2011CN201819920U Complex patchboard of full-automatic transformer-ratio bridge
05/04/2011CN201819919U Device for preventing accidental bruising for electric PCB (printed circuit board) testing machine
05/04/2011CN1682118B Die carrier
05/04/2011CN102043263A Screen detection device
05/04/2011CN102043117A Test apparatus for electronic device package and method for testing electronic device package
05/04/2011CN102043112A Two-in-one audio line detector
05/04/2011CN102043111A Microneedle jig and combination jig
05/04/2011CN102043102A Device for detecting electrical property of insulator
05/04/2011CN102043100A 老化测试系统 Aging Test System
05/04/2011CN102043080A Current sampling method and current sampling circuit of high-frequency charger
05/04/2011CN102043074A High-frequency probe card
05/04/2011CN102043073A Conductive test bar
05/04/2011CN102043072A Cis circuit test probe card
05/04/2011CN102043071A Inspection fixture and contact
05/04/2011CN101587172B Secondary battery testing system
05/04/2011CN101447482B Calibration technique for measuring gate resistance of power mos gate device at wafer level
05/04/2011CN101398443B Intelligent impulsator
05/04/2011CN101377534B Method for setting signal source amplitude initial value in electromagnetic compatible sensitivity test
05/04/2011CN101047148B Manufacturing method of semiconductor device corresponding to loop back test
05/03/2011US7936178 Test probe
05/03/2011US7936165 Current sensor
05/03/2011US7936164 Folding current sensor
05/03/2011US7936163 Method and system for detecting electricity theft
04/2011
04/28/2011WO2011048890A1 Contact probe and socket
04/28/2011US20110095774 Testing a nonvolatile circuit element having multiple intermediate states
04/28/2011US20110095750 Method for measuring current in an electric power distribution system
04/28/2011US20110095749 Optical sensor assembly for installation on a current carrying cable
04/28/2011DE102009050606A1 Electronic electricity meter for use by electronic installations of building, has retaining slot and connection terminal provided at insulated housing for electrically and mechanically coupling auxiliary device at electricity meter
04/27/2011EP2118671B1 Battery output housing comprising a shunt or measuring element
04/27/2011CN201812111U Probe frame and base plate test device with same
04/27/2011CN201812008U Detection circuit for relay protection device
04/27/2011CN201812006U Insulator electric property detection device
04/27/2011CN201812003U Electronic component testing device
04/27/2011CN201811982U Liquid crystal television main plate detection fixture
04/27/2011CN201811981U Probe testing support
04/27/2011CN201811980U Measuring terminal and isolating switch
04/27/2011CN201811979U High-voltage box structure of high-voltage motor static insulating monitor
04/27/2011CN201811978U Conducting rod for testing
04/27/2011CN201811977U Ageing channel
04/27/2011CN201811976U Draw bar abnormal sliding prevention device of zero resistance tester for high temperature superconducting materials
04/27/2011CN102037370A Method for manufacturing and testing an integrated electronic circuit
04/27/2011CN102036464A System for testing electronic components
04/27/2011CN102033208A Battery detection protection chip
04/27/2011CN102033193A Method and system for measuring the electricity behavior of a circuit
04/27/2011CN102033184A Voltage distribution wireless measurement system of lightning arrester
04/27/2011CN102033165A Rogowski coil, medium voltage electrical apparatus including the same, and method of providing electrostatic shielding for a rogowski coil
04/27/2011CN102033146A Electronic load with light emitting diode simulation characteristic and light emitting diode characteristic simulation method
04/27/2011CN102033145A Cantilever probe structure for providing heavy current and voltage potential measurement
04/27/2011CN102033144A Electric contact member
04/27/2011CN102033143A Probe head control mechanism for probe card component
04/27/2011CN102033142A Method for automatically positioning probe clamp
04/27/2011CN101261296B Semiconductor element test structure
04/26/2011US7932714 Method to communicate with multivalved sensor on loop power
04/26/2011US7932713 Method and apparatus for amplifying a signal and test device using same
04/26/2011CA2488518C Dry-type high-voltage load system apparatus and method of preventing chain breaking and arc discharge for use therewith
04/21/2011WO2011046290A2 Slidable pogo pin
04/21/2011WO2010124752A8 Measuring device and measuring method for measuring differential signals
04/21/2011US20110089965 Probe card analysis system and method
04/21/2011US20110089962 Testing of electronic devices through capacitive interface
04/21/2011US20110089961 Interface test device and method
04/21/2011US20110089957 Multi-channel potentiostat for biosensor arrays
04/21/2011US20110089932 Systems and Methods for Monitoring Voltage
04/21/2011US20110089931 Temperature-compensated shunt current measurement
04/21/2011DE10023379B4 Membranmeßfühler und Membranmessfühleraufbauten, Verfahren zu ihrer Herstellung und mit ihnen angewandte Testverfahren Membranmeßfühler and membrane probe structures, processes for their preparation and applied them test method
04/20/2011CN201805636U Printed circuit board (PCB) track clamping edge
04/20/2011CN201804062U Testing device for flexible flat cable honing tin
04/20/2011CN201804060U High-voltage insulation resistance tester of chip piezoelectric ceramic transformer
04/20/2011CN201804028U Probe cladding structure for test prod
04/20/2011CN201804027U Short circuit detecting clamp for automobile window control functional switch
04/20/2011CN201804026U Retractable pincer-like galvanometer
04/20/2011CN201804025U 50kV high-voltage fixture for tests of electrical strength of insulating materials
04/20/2011CN201804024U Locating pin for circuit board tester jig
04/20/2011CN201804023U Current-carrying and voltage-sharing aluminium pipe
04/20/2011CN1808130B Probe board for semiconductor chip detection and its producing method
04/20/2011CN102027380A Test system with high frequency interposer
04/20/2011CN102023282A Positioning method and equipment for detecting solar cell plate
04/20/2011CN102023273A Portable domestic photo voltaic power station performance tester
04/20/2011CN102023266A Ballast detector
04/20/2011CN102023242A Current source for test of high voltage direct current transmission commutation valve and synthesis test method of current source
04/20/2011CN102023241A Contact probe pin for semiconductor test apparatus
04/20/2011CN102023240A Active type non-contact probe card
04/20/2011CN102023239A Device for protecting probe in process of carrying probe card
04/20/2011CN102023238A Clamp used for SiC MESFET (Metal Semiconductor Field Effect Transistor) direct current test
04/20/2011CN102023237A Device for leveling head plate and probe apparatus
04/20/2011CN102023236A Test structure and test method
04/20/2011CN102023235A Contrapuntal detection equipment and contrapuntal detection method of solar cell panel detection system
04/20/2011CN102022403A Clamping mechanism for probe card and test device
04/20/2011CN101661817B High-value Hamon resistor
04/20/2011CN101562301B Electric connector with functions of locking, preventing misplug recognition and testing
04/20/2011CN101562300B Easily-tested misplug-proof locking electric connector
04/20/2011CN101447483B Calibration technique for measuring power device at wafer level and semiconductor wafer
04/20/2011CN101446598B Variable-cross-section current lead wire
1 ... 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 ... 273