| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
|---|
| 12/15/2009 | US7631549 Method and apparatus for micromachines, microstructures, nanomachines and nanostructures |
| 12/09/2009 | CN100568478C Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semico |
| 12/08/2009 | US7628972 Ion flux is directed to a carbon nanotube to permanently shape, straighten and/or bend the carbon nanotube into a desired configuration; use as a probe in an atomic force microscope; Ion Flux Molding |
| 12/03/2009 | US20090300806 Atomic force microscope |
| 12/03/2009 | US20090295372 Nanoscopic electrode molecular probes |
| 12/02/2009 | EP2125616A2 Method for growing a carbon nanotube on a nanometric tip |
| 11/26/2009 | US20090293162 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth |
| 11/25/2009 | CN100562674C Apparatus for reducing sensitivity of an article to mechanical shock |
| 11/25/2009 | CN100562582C Controlled alignment of nano-barcodes encoding specific information for scanning probe microscopy (SPM) reading |
| 11/24/2009 | US7622735 Wafer for electrically characterizing tunnel junction film stacks with little or no processing |
| 11/18/2009 | EP2120037A1 Measuring probe for a scanning microscope and method of operation thereof |
| 11/18/2009 | EP2120036A1 Measuring probe having one or more support elements for a measuring instrument |
| 11/18/2009 | EP2118637A2 Carbon nanotube device and process for manufacturing same |
| 11/18/2009 | EP0847590B1 A scanning probe microscope having automatic probe exchange and alignment |
| 11/17/2009 | US7618708 organic layer formed on a board and having a surface state in which small sections having a different adsorption property from that of a periphery due to a partial difference in molecular structure; and a particle layer having at least one or more nanoparticles arranged on each of the small sections |
| 11/17/2009 | US7618465 Near-field antenna |
| 11/12/2009 | US20090280497 Multiplex Detection Compositions, Methods, and Kits |
| 11/10/2009 | US7615738 Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements |
| 11/10/2009 | US7614287 Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same |
| 11/05/2009 | US20090276924 Scanning probe microscope and active damping drive control device |
| 11/03/2009 | US7610797 Carbon nanotube detection system |
| 10/29/2009 | US20090267597 Techniques for Electrically Characterizing Tunnel Junction Film Stacks with Little or no Processing |
| 10/27/2009 | US7609048 Probe microscope and measuring method using probe microscope |
| 10/22/2009 | WO2009128500A1 Carbon nanofiber probe cantilever |
| 10/22/2009 | US20090261820 Wafer for electrically characterizing tunnel junction film stacks with little or no processing |
| 10/20/2009 | US7605368 Vibration-type cantilever holder and scanning probe microscope |
| 10/08/2009 | US20090253211 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
| 10/01/2009 | US20090246400 Ion flux is directed to a carbon nanotube to permanently shape, straighten and/or bend the carbon nanotube into a desired configuration; use as a probe in an atomic force microscope; Ion Flux Molding |
| 10/01/2009 | US20090243637 Measuring apparatus having nanotube probe |
| 09/30/2009 | CN100545985C Preparation of field emission array comprising nanostructures |
| 09/22/2009 | US7591171 Atomic force microscope |
| 09/16/2009 | EP1844475B1 Near-field probe |
| 09/15/2009 | CA2454963C Parallel, individually addressable probes for nanolithography |
| 09/10/2009 | US20090229020 Chemical sensor with oscillating cantilevered probe |
| 09/09/2009 | CN100538913C Sensor with suspending arm and optical resonator |
| 09/09/2009 | CN100538877C Multi-probe for writing and reading data and method of operating the same |
| 09/08/2009 | US7586166 Electronic and optoelectronic devices having nanoparticles configured by patterned ferroelectric material |
| 09/08/2009 | US7584653 System for wide frequency dynamic nanomechanical analysis |
| 09/03/2009 | WO2009107696A1 Carbon nanotube support and process for producing the carbon nanotube support |
| 09/03/2009 | US20090219647 Dielectrophoretic Tweezers Apparatus and Methods |
| 09/01/2009 | US7581438 Surface texture measuring probe and microscope utilizing the same |
| 08/27/2009 | DE102008007707A1 Scanning probe microscope device operating method, involves changing loading condition of measuring probe section of measuring probe, while loading or separating measuring probe section with or from particular probe substance, respectively |
| 08/26/2009 | EP1651948B1 Scanning probe inspection apparatus |
| 08/25/2009 | US7578853 Scanning probe microscope system |
| 08/19/2009 | EP2090877A2 Microlever containing a magneto-impedance stress sensor |
| 08/13/2009 | US20090205092 Method of fabricating a probe device for a metrology instrument and a probe device produced thereby |
| 08/12/2009 | EP2088420A1 Metallic probe, method of forming the same and metallic probe forming apparatus |
| 08/12/2009 | EP1179185B1 A method of detecting an analyte using semiconductor nanocrystals |
| 08/11/2009 | US7572300 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 08/06/2009 | WO2009001220A4 Functionalization of microscopy probe tips |
| 08/04/2009 | US7569252 Lithography; capillary transportation; pen for writing patterns |
| 07/30/2009 | US20090191567 Semiconductor nanocrystal probes for biological applications and process for making and using such probes |
| 07/23/2009 | US20090188011 Tweezers system for scanning probe microscope, scanning probe microscope apparatus and method of removing dust |
| 07/21/2009 | US7564034 Terahertz sensing apparatus using a transmission line |
| 07/16/2009 | WO2009086915A1 A method for making a 3d nanostructure having a nanosubstructure, and an insulating pyramid having a metallic tip, a pyramid having nano-apertures and horizontal and/or vertical nanowires obtainable by this method |
| 07/16/2009 | WO2009052338A3 Dual-tipped probe for atomic force microscopy |
| 07/09/2009 | WO2009086534A1 Method of fabricating a probe device for a metrology instrument and probe device produced thereby |
| 07/09/2009 | WO2009085184A1 Protected metallic tip or metallized scanning probe microscopy tip for optical applications |
| 07/09/2009 | US20090178168 Information memory apparatus using probe |
| 07/09/2009 | US20090178167 Information memory apparatus using probe |
| 07/09/2009 | US20090176221 Method of detecting an analyte in a sample using semiconductor nanocrystals as detectable label |
| 07/08/2009 | EP2077249A1 A method for making a 3D nanostructure having a nanosubstructure, and an insulating pyramid having a metallic tip, a pyramid having a nano-apertures and horizontal and/or vertical nanowires obtainable by this method |
| 07/07/2009 | US7555941 Scanner for probe microscopy |
| 07/02/2009 | US20090172846 Nanometric emitter/receiver guides |
| 07/02/2009 | US20090169463 Array of fullerene nanotubes |
| 06/30/2009 | US7553335 Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometer |
| 06/25/2009 | WO2009077388A1 Method for collective production of carbon nanofibres at the surface of micro-patterns formed on a substrate surface and structure including nanofibres on the micro-pattern surface |
| 06/18/2009 | WO2009036365A3 Method and apparatus of automatic scanning probe imaging |
| 06/11/2009 | US20090151030 Dual tip atomic force microscopy probe and method for producing such a probe |
| 06/11/2009 | US20090148652 Diamond Film Deposition and Probes |
| 06/09/2009 | US7545508 Interferometric apparatus utilizing a cantilever array to measure a surface |
| 06/09/2009 | US7543482 Carbon thin line probe |
| 06/04/2009 | WO2009001220A3 Functionalization of microscopy probe tips |
| 06/04/2009 | US20090140685 Method and Device for Positioning a Movable Part in a Test System |
| 06/04/2009 | US20090140142 Scanning probe microscope and measuring method thereby |
| 05/28/2009 | US20090138996 Microtips and nanotips, and method for their production |
| 05/28/2009 | US20090138995 Atom probe component treatments |
| 05/28/2009 | US20090138994 Optical measuring head positioned to correspond to the cantilever array for measuring movement of the cantilever, whereby measuring variations in vibration frequency and/or amplitude of the cantilevers according to the rotation the disk-like base plate:biological sampling; medical diagnosis; MERSA |
| 05/28/2009 | US20090134025 Scanning device with a probe having an organic material |
| 05/28/2009 | DE102007056992A1 Sub micrometer structures producing method for structuring of e.g. scanning tips, for micro or nano-technology, involves selectively etching layer to be structured, and removing upper masking layer afterwards |
| 05/27/2009 | CN100491967C Micro mirror box for scan probe microscope |
| 05/26/2009 | US7536901 SPM sensor |
| 05/22/2009 | WO2009063217A1 Microprobe, measurement system and method |
| 05/21/2009 | US20090133171 Tapered probe structures and fabrication |
| 05/21/2009 | US20090133170 Optical Instruments Having Dynamic Focus |
| 05/21/2009 | US20090133169 Independently-addressable, self-correcting inking for cantilever arrays |
| 05/20/2009 | EP2060901A1 Scan type probe microscope and active damping drive control device |
| 05/20/2009 | EP1606598A4 Raman imaging and sensing apparatus employing nanoantennas |
| 05/20/2009 | DE102008042560A1 Sondenspitzen-Baugruppe für Raster-Sondenmikroskope Probe tip assembly for scanning probe microscopes |
| 05/20/2009 | CN101438355A Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 05/19/2009 | US7535817 Nanometer scale data storage device and associated positioning system |
| 05/14/2009 | WO2009060973A1 Needle diamond, cantilever using the diamond, and photomask-correcting or cell-operating probe |
| 05/12/2009 | US7531726 Controlled alignment of nanobarcodes encoding specific information for scanning probe microscopy (SPM) reading |
| 05/07/2009 | US20090114000 Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or fib techniques |
| 05/07/2009 | DE102007052610A1 Nanosondenspitze für fortschrittliche Rastersondenmikroskopie mit einem Schichtsondenmaterial, das durch Lithographie und/oder durch lonenstrahltechniken strukturiert ist Nano Probe Tip for advanced scanning probe microscopy with a layer of special material which is patterned by lithography and / or by lonenstrahltechniken |
| 05/05/2009 | US7528947 Nanoparticles functionalized probes and methods for preparing such probes |
| 05/05/2009 | US7526949 High resolution coherent dual-tip scanning probe microscope |
| 04/30/2009 | WO2009053419A1 Tip intended for a sensor for near-field microscope and associated method of manufacture |
| 04/30/2009 | WO2009036365A9 Method and apparatus of automatic scanning probe imaging |
| 04/30/2009 | US20090107266 Probe tip assembly for scanning probe microscopes |