| Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719) |
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| 02/06/1996 | US5489774 Combined atomic force and near field scanning optical microscope with photosensitive cantilever |
| 01/30/1996 | US5488602 Information record/reproducing apparatus and information recording medium |
| 01/30/1996 | US5488305 System and method for high-speed potentiometry using scanning probe microscope |
| 01/16/1996 | US5485536 Fiber optic probe for near field optical microscopy |
| 01/09/1996 | US5483064 Positioning mechanism and method for providing coaxial alignment of a probe and a scanning means in scanning tunneling and scanning force microscopy |
| 01/02/1996 | US5479930 Ultrasonic transesophageal probe with articulation control for the imaging and diagnosis of multiple scan planes |
| 12/26/1995 | US5479013 For examining a surface of a sample |
| 11/28/1995 | US5471458 Multi-probe information recording/reproducing apparatus including a probe displacement control circuit |
| 11/21/1995 | US5468959 Scanning probe microscope and method for measuring surfaces by using this microscope |
| 11/14/1995 | US5466935 Programmable, scanned-probe microscope system and method |
| 11/14/1995 | US5466548 Method for producing nanometer order dot pattern by electron holography and drawing apparatus for the same |
| 11/07/1995 | US5464977 Scanning optical detection apparatus and method, and photoelectric conversion medium applied thereto |
| 10/24/1995 | US5461605 Information recording/reproducing method, recording carrier and apparatus for recording and/or reproducing information on information recording carrier by use of probe electrode |
| 10/11/1995 | EP0676749A2 Information reproducing device and method |
| 10/03/1995 | US5455420 Scanning probe microscope apparatus for use in a scanning electron |
| 09/27/1995 | EP0674170A1 Inter-atomic measurement techniques |
| 09/26/1995 | US5453616 Probe microscope having error correction piezoelectric scanner |
| 09/20/1995 | EP0672332A1 Industrial material processing electron linear accelerator |
| 09/19/1995 | US5451794 Electron beam current measuring device |
| 09/19/1995 | US5450746 Constant force stylus profiling apparatus and method |
| 09/05/1995 | US5448399 Optical system for scanning microscope |
| 08/29/1995 | CA2046474C Information detection apparatus and displacement information measurement apparatus |
| 08/22/1995 | US5444191 Information processing apparatus and device for use in same |
| 08/15/1995 | US5442174 Measurement of trace element concentration distribution, and evaluation of carriers, in semiconductors, and preparation of standard samples |
| 08/08/1995 | US5440121 Scanning probe microscope |
| 08/01/1995 | US5438206 Positioning device |
| 07/26/1995 | EP0664448A2 Tunnel unit and scanning head for scanning tunneling microscope |
| 07/25/1995 | US5436452 Uncooled tunneling infrared sensor |
| 07/25/1995 | US5436448 Surface observing apparatus and method |
| 07/18/1995 | US5434420 Industrial material processing electron linear accelerator |
| 07/11/1995 | US5432346 Relative position change amount detecting apparatus having bi-directional probe with compensated movement |
| 07/11/1995 | US5431055 Surface measuring apparatus using a probe microscope |
| 06/22/1995 | DE4405292C1 Raster scanning microscope adjusting device |
| 06/20/1995 | US5425616 Micromotion stage |
| 06/13/1995 | US5423514 Alignment assembly for aligning a spring element with a laser beam in a probe microscope |
| 05/24/1995 | EP0654245A1 Ultrasonic transesophageal probe for the imaging and diagnosis of multiple scan planes |
| 05/23/1995 | US5418771 Information processing apparatus provided with surface aligning mechanism between probe head substrate and recording medium substrate |
| 05/23/1995 | US5418363 In an atomic force microscope |
| 05/20/1995 | CA2135692A1 Ultrasonic transesophageal probe for the imaging and diagnosis of multiple scan planes |
| 05/17/1995 | EP0653628A1 Sample stage for scanning probe microscope head |
| 05/09/1995 | US5414690 Moving apparatus, a moving method and an information detection and/or input apparatus using the same |
| 05/09/1995 | US5414260 Scanning probe microscope and method of observing samples by using the same |
| 05/02/1995 | US5412641 Information recording/reproducing apparatus for recording/reproducing information with probes |
| 04/19/1995 | EP0648469A1 System and method for displaying 3-dimensional echographic data |
| 04/18/1995 | US5406832 Synchronous sampling scanning force microscope |
| 04/13/1995 | WO1995010021A1 High precision scale and position sensor |
| 04/05/1995 | EP0646913A2 Encoder using the tunnel current effect |
| 04/04/1995 | US5402793 Ultrasonic transesophageal probe for the imaging and diagnosis of multiple scan planes |
| 03/28/1995 | US5401973 Industrial material processing electron linear accelerator |
| 03/28/1995 | US5400647 Methods of operating atomic force microscopes to measure friction |
| 03/14/1995 | US5398229 Method of manufacturing cantilever drive mechanism, method of manufacturing probe drive mechanism, cantilever drive mechanism, probe drive mechanism and electronic device which uses the same |
| 03/07/1995 | US5394741 Atomic probe microscope |
| 03/01/1995 | EP0407460B1 An integrated mass storage device |
| 02/28/1995 | US5393985 Apparatus for focusing an ion beam |
| 02/21/1995 | US5392275 Information recording unit and method for information recording/reproduction |
| 02/21/1995 | US5391871 For measuring surface status of a sample by scanning with a probe |
| 02/14/1995 | US5389475 Optical recording media |
| 02/14/1995 | US5388452 Detection system for atomic force microscopes |
| 01/17/1995 | US5382795 Ultrafine silicon tips for AFM/STM profilometry |
| 01/11/1995 | EP0633450A2 Method for detecting and examining slightly irregular surface states, and scanning probe microscope therefor |
| 01/10/1995 | US5381101 System and method of measuring high-speed electrical waveforms using force microscopy and offset sampling frequencies |
| 12/27/1994 | US5376790 Scanning probe microscope |
| 12/06/1994 | US5371727 Scanning tunnel microscopy information processing system with noise detection to correct the tracking mechanism |
| 12/06/1994 | US5371365 Scanning probe microscopy |
| 11/29/1994 | US5369359 Particle beam testing method with countervoltage or retarding voltage follow-up or feedback |
| 11/01/1994 | US5360974 Dual quad flexure scanner |
| 10/25/1994 | CA1332761C Distance-controlled tunneling transducer and direct access storage unit employing the transducer |
| 10/18/1994 | US5357108 Cantilever type displacement element, and scanning tunneling microscope or information processing apparatus using same |
| 09/27/1994 | US5349735 Information detection apparatus and displacement information measurement apparatus |
| 09/21/1994 | EP0616192A1 Scanning probe microscope and method for measuring surfaces by using this microscope |
| 09/21/1994 | EP0432189B1 Process and device for measuring states and variations over time of a signal |
| 09/20/1994 | US5347854 Method of two dimensional profiling of a sample surface |
| 09/08/1994 | DE4306603A1 Acoustic microscope |
| 09/07/1994 | EP0614177A2 Information recording and reproducing apparatus using probe |
| 09/07/1994 | EP0404799B1 Integrated scanning tunneling microscope |
| 08/31/1994 | EP0397799B1 A piezoelectric motion transducer and an integrated scanning tunneling microscope using the same |
| 08/30/1994 | USRE34708 Scanning ion conductance microscope |
| 08/30/1994 | US5343460 Information processing device and information processing method |
| 08/24/1994 | EP0611485A1 Electromechanical positioning device. |
| 08/16/1994 | US5338932 Method and apparatus for measuring the topography of a semiconductor device |
| 08/09/1994 | US5336887 Scanning probe microscope |
| 08/02/1994 | US5334835 Probe drive mechanism and electronic device which uses the same |
| 08/02/1994 | US5333495 Method and apparatus for processing a minute portion of a specimen |
| 07/12/1994 | US5329513 Angular relationship detection device and method |
| 07/12/1994 | US5329122 Information processing apparatus and scanning tunnel microscope |
| 06/28/1994 | US5325010 For imparting microscopic/macroscopic movements to an object |
| 06/28/1994 | US5324935 Scanning probe microscope having a directional coupler and a Z-direction distance adjusting piezoelectric element |
| 06/28/1994 | CA1330452C Oscillating quartz atomic force microscope |
| 06/23/1994 | WO1994014304A1 Industrial material processing electron linear accelerator |
| 06/22/1994 | EP0523042B1 Ultrafast electro-dynamic x, y and theta positioning stage |
| 06/21/1994 | US5323003 Scanning probe microscope and method of observing sample by using such a microscope |
| 06/14/1994 | US5321685 Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same |
| 06/14/1994 | US5319977 Near field acoustic ultrasonic microscope system and method |
| 06/14/1994 | US5319960 For examining surface contours of a specimen |
| 06/08/1994 | EP0600452A1 Scanning probe instrument using stored topographical data |
| 05/31/1994 | US5317533 Integrated mass storage device |
| 05/31/1994 | US5317152 Cantilever type probe, and scanning tunnel microscope and information processing apparatus employing the same |
| 05/03/1994 | US5308974 Scanning probe microscope using stored data for vertical probe positioning |
| 04/27/1994 | EP0594362A1 Carriage assembly and positioning device for a scanning probe |
| 04/21/1994 | CA2098041A1 Dual quad flexure scanner |