Patents
Patents for G01Q 10 - Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe (2,719)
04/1994
04/19/1994US5304535 Etching of nanoscale structures on high temperature superconductors
03/1994
03/30/1994EP0589815A2 Two dimensional profiling with a contact force atomic force microscope
03/29/1994US5298748 Uncooled tunneling infrared sensor
03/22/1994US5297130 Driving apparatus and a recording and/or reproducing apparatus using the same
03/22/1994US5296704 For investigating a surface of a sample
03/17/1994WO1994006160A1 Electromechanical positioning device
03/16/1994EP0587165A2 Information processing apparatus having multiprobe control circuit
03/15/1994US5294804 Cantilever displacement detection apparatus
03/08/1994US5293326 Ultrasonic inspection and imaging instrument
03/08/1994US5293042 Servo circuit of scanning probe microscope
03/08/1994US5291775 Scanning force microscope with integrated optics and cantilever mount
03/02/1994EP0584440A1 Atomic force microscope
02/1994
02/22/1994US5289408 Memory apparatus using tunnel current techniques
02/22/1994US5289004 Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light
02/15/1994US5286977 Positioning device
02/01/1994US5283442 Surface profiling using scanning force microscopy
02/01/1994US5283437 Pneumatically and electrostatically driven scanning tunneling microscope
01/1994
01/04/1994US5276672 Micro-displacement type information detection probe device and scanning tunneling microscope, atomic force microscope, information processing device by use thereof
12/1993
12/28/1993US5274230 Scanning probe microscope having first and second optical waveguides
12/15/1993EP0574234A1 Automatic tip approach method and apparatus for scanning probe microscope
11/1993
11/16/1993US5262643 Automatic tip approach method and apparatus for scanning probe microscope
11/16/1993US5262642 Scanning tunneling optical spectrometer
11/09/1993US5260648 Process and system for rapid analysis of the spectrum of a signal at one or several points of measuring
11/09/1993US5260572 Scanning probe microscope including height plus deflection method and apparatus to achieve both high resolution and high speed scanning
10/1993
10/26/1993US5256876 Scanning tunnel microscope equipped with scanning electron microscope
10/19/1993US5254854 Scanning microscope comprising force-sensing means and position-sensitive photodetector
10/13/1993EP0565227A1 Scanning force microscope
10/12/1993US5252835 Machining oxide thin-films with an atomic force microscope: pattern and object formation on the nanometer scale
10/06/1993EP0564088A1 Scanning force microscope with integrated optics and cantilever mount
09/1993
09/28/1993US5248912 Integrated scanning tunneling microscope
09/21/1993US5247186 Integrated optical displacement sensor
09/21/1993CA2002187C Probe unit, driving method thereof, and scanning device for detecting tunnel current having said probe unit
09/07/1993US5242541 Method of producing ultrafine silicon tips for the afm/stm profilometry
08/1993
08/24/1993US5237859 Atomic force microscope
08/11/1993EP0428663B1 Process and device for rapid spectral analysis of a signal at one or more measurement points
08/03/1993USRE34331 Feedback control for scanning tunnel microscopes
08/03/1993US5233191 Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process
07/1993
07/28/1993EP0478666A4 Microfabricated microscope assembly
07/22/1993DE3844821C2 Micromanipulator for raster tunnel microscope
07/21/1993EP0551814A1 Surface observing apparatus and method
07/20/1993US5229607 Combination apparatus having a scanning electron microscope therein
07/20/1993US5229606 Jumping probe microscope
06/1993
06/29/1993US5223713 Scanner for scanning tunneling microscope
06/29/1993US5222396 Tunnelling acoustic microscope
06/09/1993EP0545538A1 Scanning microscope comprising force-sensing means
06/08/1993CA1318980C Scanning tunnel-current-detecting device and method for detecting tunnel current and scanning tunnelling microscope and recording/reproducing device using thereof
05/1993
05/25/1993US5214282 Method and apparatus for processing a minute portion of a specimen
05/19/1993EP0542094A1 Corpuscular beam test method using voltage control
05/11/1993US5210410 Scanning probe microscope having scan correction
04/1993
04/21/1993EP0537642A2 Information processing apparatus with tracking mechanism
04/20/1993US5204531 Method of adjusting the size of the area scanned by a scanning probe
04/07/1993EP0535934A1 Method of manufacturing cantilever drive mechanism, method of manufacturing probe drive mechanism, cantilever drive mechanism, probe drive mechanism and electronic device which uses the same
04/06/1993US5200617 PMN translator and linearization system in scanning probe microscope
04/06/1993CA1315898C Scanning tunneling microscope and surface topographic observation method
03/1993
03/31/1993EP0534406A1 Parallel plane holding mechanism and apparatus using such a mechanism
03/30/1993US5198667 Method and apparatus for performing scanning tunneling optical absorption spectroscopy
03/23/1993US5196701 High-resolution detection of material property variations
03/17/1993EP0531779A1 X-ray mask containing a cantilevered tip for gap control and alignment
03/03/1993EP0529616A2 Information processing apparatus and scanning tunnel microscope
02/1993
02/09/1993US5185571 Process and system for the asynchronous measurement of signal courses
01/1993
01/20/1993EP0523676A2 Information recording/reproducing method for recording and/or reproducing information on information recording carrier by use of probe electrode, information recording/reproducing apparatus executing the method, and information recording carrier suitable for the method
01/20/1993EP0523042A1 Ultrafast electro-dynamic x, y and theta positioning stage.
01/13/1993EP0407460A4 An integrated mass storage device
12/1992
12/23/1992EP0519745A2 Recording medium, information processing apparatus using same, and information-erasing method
12/22/1992US5173605 Compact temperature-compensated tube-type scanning probe with large scan range and independent x, y, and z control
12/16/1992EP0518618A2 Scanning tunneling microscope with cantilever type displacement element
12/09/1992EP0517270A1 Scanning probe microscope
12/02/1992EP0516418A1 Probe-driving mechanism, production thereof, and apparatus and piezoelectric actuator employing the same
11/1992
11/24/1992US5166516 Scanning probe microscope with slant detection and compensation
11/17/1992US5164791 Minute displacement detector using optical interferometry
11/10/1992US5162653 Scanning tunneling microscope and surface topographic observation method
11/04/1992EP0511763A2 Cantilever type probe, and scanning tunnel microscope and information processing apparatus employing the same
10/1992
10/29/1992WO1992018853A1 Imaging beta tracer microscope
10/20/1992US5157256 System for exchanging samples and electrode tip units in a surface probe microscope
10/13/1992US5155715 Reproducing apparatus
10/06/1992US5153494 Ultrafast electro-dynamic x, y and theta positioning stage
09/1992
09/22/1992US5150392 For providing precise alignment
09/22/1992US5150035 Encoder having atomic or molecular structure reference scale
09/15/1992US5148026 Scanning probe microscopy
09/01/1992US5144128 Surface microscope and surface microscopy
08/1992
08/25/1992US5142145 Composite scanning tunneling microscope
08/19/1992EP0499149A1 Driving apparatus and a recording and/or reproducing apparatus using the same
08/11/1992US5138159 Scanning tunneling microscope
08/05/1992EP0497288A2 Probe scanning system
07/1992
07/21/1992US5132533 Method for forming probe and apparatus therefor
07/14/1992US5130539 Imaging beta tracer microscope
07/14/1992US5129132 Method of making an integrated scanning tunneling microscope
07/07/1992US5128544 Scanning probe microscope
07/01/1992EP0492915A1 Cantilever probe and apparatus using the same
07/01/1992EP0491973A1 Integrated pneumatically and electrostatically controlled scanning tunneling microscope and method of making the same
06/1992
06/16/1992US5122739 STM-like device and method for measuring node voltages on integrated circuits
05/1992
05/27/1992EP0487300A1 Scanning probe microscopy
05/26/1992US5117110 Composite scanning tunnelling microscope with a positioning function
05/14/1992WO1992008336A1 Etching of nanoscale structures on high temperature superconductors
04/1992
04/22/1992EP0481498A2 Information recording unit and apparatus and method for information recording/reproduction
04/21/1992US5107114 Fine scanning mechanism for atomic force microscope
04/21/1992US5107113 Method and apparatus for correcting distortions in scanning tunneling microscope images
04/21/1992US5107112 Scanning tunnel-current-detecting device and method for detecting tunnel current and scanning tunnelling microscope and recording/reproducing device using thereof
04/15/1992EP0480645A1 Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same
04/15/1992EP0480183A2 Method and apparatus for writing or etching narrow linewidth patterns on insulating materials
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