| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 09/21/1999 | US5956145 System and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systems |
| 09/21/1999 | US5956144 Method and apparatus for use of polarized light vectors in identifying and evaluating constituent compounds in a specimen |
| 08/31/1999 | US5946098 Optical elements for use in spectroscopic ellipsometer and polarimeter systems |
| 08/26/1999 | WO1999042796A1 Birefringence measurement system |
| 08/26/1999 | CA2319729A1 Birefringence measurement system |
| 08/25/1999 | EP0937973A2 Wavelength dispersion measuring apparatus and polarization dispersion measuring apparatus |
| 08/18/1999 | EP0936764A2 Method and apparatus for calibration of digital down converters in a signal processing system |
| 08/12/1999 | WO1999040399A1 Polarimeter and corresponding measuring method |
| 08/11/1999 | EP0934515A1 Infrared spectroscopy and imaging of libraries |
| 08/10/1999 | US5936735 Apparatus and method for determining the optical retardation of a material |
| 08/10/1999 | CA2259671A1 Method and apparatus for calibration of digital down converters in a signal processing system |
| 08/04/1999 | EP0791170A4 A method and apparatus for viewing |
| 07/29/1999 | WO1999037980A1 Video imaging of superficial biological tissue layers using polarized light |
| 07/29/1999 | DE19803110A1 Analyzer for simultaneous and complete identification of polarization state of light beam |
| 07/27/1999 | US5929994 Intergrating sphere ellipsometer |
| 07/06/1999 | US5920393 Methods and apparatus for identifying and quantifying constituent compounds in a specimen using modulated polychromatic partially polarized light |
| 07/06/1999 | CA2100897C Polarization detector |
| 06/29/1999 | US5917594 Spectroscopic measurement system using an off-axis spherical mirror and refractive elements |
| 06/17/1999 | WO1999030119A1 Reflectance spectrophotometric apparatus with toroidal mirrors |
| 06/17/1999 | CA2312892A1 Reflectance spectrophotometric apparatus with toroidal mirrors |
| 06/09/1999 | CN1219236A Method and device for determining characteristic parameters by polarised light |
| 06/08/1999 | US5910841 Ellipsometer using an expanded beam |
| 05/27/1999 | DE19810231A1 Optoelektronische Vorrichtung Optoelectronic device |
| 05/20/1999 | WO1999024850A1 Optoelectronic device |
| 05/12/1999 | EP0914600A1 Broadband spectroscopic rotating compensator ellipsometer |
| 05/04/1999 | US5900939 Thin film optical measurement system and method with calibrating ellipsometer |
| 04/29/1999 | WO1999005488A8 Measurement of waveplate retardation using a photoelastic modulator |
| 04/28/1999 | EP0911619A2 Methods and apparatus for detecting liquid crystal display parameters using stokes parameters |
| 04/28/1999 | EP0672191A4 Quantitative detection of macromolecules with fluorescent oligonucleotides. |
| 04/27/1999 | US5898500 Device and method for three-dimensional measurements and observation in situ of a surface layer deposited on a thin-film stack |
| 04/20/1999 | US5894939 System for sorting post-consumer plastic containers for recycling |
| 04/15/1999 | DE19745607A1 Measurement of optical parameters of crystalline samples using reflected light |
| 03/31/1999 | EP0905522A2 Device for measuring a measurement value from a predetermined measuring range |
| 03/31/1999 | EP0905506A2 Method and apparatus for transferring a liquid specimen into an optical cuvette, and polarimeter using the same |
| 03/31/1999 | CN1212372A Method for transfusion of material to be tested for testing optical characteristics, and device and polarimeter thereof |
| 03/24/1999 | EP0903609A1 Method of producing a three-dimensional image from thermal images |
| 03/24/1999 | EP0902896A1 Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation |
| 03/17/1999 | EP0901615A1 Method and apparatus for monitoring the state of a liquid-crystal polarization modulator |
| 03/11/1999 | DE19734645A1 Ellipsometer measuring device for layer thickness measurement |
| 03/09/1999 | US5880831 Reflectance spectrophotometric apparatus with optical relay |
| 03/04/1999 | DE19734646A1 Ellipsometer-Meßvorrichtung Ellipsometer measurement device |
| 03/03/1999 | EP0708918B1 Multiple angle spectroscopic analyzer |
| 03/02/1999 | US5877859 Broadband spectroscopic rotating compensator ellipsometer |
| 02/18/1999 | WO1999008081A1 Micropolarimeter |
| 02/18/1999 | WO1999008068A1 Ellipsometer measuring instrument |
| 02/16/1999 | US5872630 Regression calibrated spectroscopic rotating compensator ellipsometer system with photo array detector |
| 02/04/1999 | WO1999005488A1 Measurement of waveplate retardation using a photoelastic modulator |
| 02/04/1999 | CA2297672A1 Measurement of waveplate retardation using a photoelastic modulator |
| 02/02/1999 | US5866935 Tunneling device |
| 01/28/1999 | WO1999004229A1 Measurement of brightness, flow velocity and temperature of radiant media |
| 01/26/1999 | US5864403 Method and apparatus for measurement of absolute biaxial birefringence in monolayer and multilayer films, sheets and shapes |
| 01/20/1999 | CN1205434A Light reflecting difference method and appts. for prospecting and monitoring film eptitaxial growth and heat annealing |
| 01/13/1999 | CN1205077A Five-axis/six-axis laser measuring system |
| 01/12/1999 | US5859424 Method for measuring a sample |
| 12/15/1998 | US5850284 Apparatus for detecting a polarization altering substance on a surface |
| 12/09/1998 | EP0882976A1 Multiple angle spectroscopic analyzer |
| 12/08/1998 | US5847872 Circumferentially isotropic phase plate, method of making the same, method of forming bundle of rays using the same, and polarization measuring apparatus and method using the same |
| 12/08/1998 | US5847831 Apparatus for monitoring the state of a liquid-crystal polarization |
| 11/25/1998 | EP0766812A4 Ellipsometric microscope |
| 11/24/1998 | US5841538 Apparatus for detecting a polarization altering substance on a surface |
| 11/19/1998 | WO1998052019A1 Ellipsometer with two lasers |
| 11/19/1998 | WO1998052006A1 Opto-mechanical device |
| 11/19/1998 | DE19721044A1 Arrangement for measuring polarisation dependent optical parameters of rotating specimens |
| 11/19/1998 | CA2288673A1 Ellipsometer with two lasers |
| 11/17/1998 | US5838444 Magneto-optic characteristic measuring apparatus |
| 11/12/1998 | DE19721046A1 Method of determining refractive indices of transparent and absorbent films |
| 11/11/1998 | EP0876590A1 Pvc and pet plastic article sorting apparatus and method |
| 11/11/1998 | CN1198377A Equipment for making film by stretching and double refraction test method |
| 11/10/1998 | US5835222 System, and mathematical regression-based method utilizing optical data, for identifying optical axis orientation in material systems such as optical compensators and retarders |
| 11/10/1998 | US5835220 Method and apparatus for detecting surface flaws |
| 11/04/1998 | EP0875359A2 Oriented film producing facility and birefringence measuring method |
| 10/15/1998 | WO1998045869A1 Apodizing filter system useful for reducing spot size in optical measurements and for other applications |
| 10/14/1998 | EP0870180A1 Optical component of polarizing modulation, and its use in a polarimeter or in an ellipsometer |
| 10/13/1998 | US5822063 Apparatus for measuring magneto-optical effect |
| 10/13/1998 | US5822035 For in-vivo measurement of optical characteristics of birefringent material |
| 09/30/1998 | EP0866954A1 Five-axis/six-axis laser measuring system |
| 09/29/1998 | US5815270 For measuring the state of polarization of a light beam |
| 09/29/1998 | US5815259 Quick change housing |
| 09/11/1998 | WO1998039633A1 Regression calibrated spectroscopic rotating compensator ellipsometer system with photo array detector |
| 09/10/1998 | DE19708036A1 Ellipsometric microscope for two=dimensional ellipsometry and integrated point ellipsometry |
| 09/08/1998 | US5805285 Multiple order dispersive optics system and method of use |
| 09/03/1998 | DE19707926A1 Imaging micro ellipsometer |
| 08/25/1998 | US5798837 Thin film optical measurement system and method with calibrating ellipsometer |
| 08/20/1998 | DE19705889A1 Absolute rotation or angle sensor for automation or robotic applications |
| 08/05/1998 | EP0566657B1 Simultaneous multiple angle/multiple wavelength ellipsometer and method |
| 08/04/1998 | US5790259 Reflection-type photoelectric sensing apparatus |
| 07/30/1998 | WO1998033055A1 Film measurement system with improved calibration |
| 06/25/1998 | WO1998015501A3 Systems and methods for characterization of materials and combinatorial libraries with mechanical oscillators |
| 06/23/1998 | US5771094 Method for measuring one or more films of a sample |
| 06/16/1998 | US5767507 Polarization sensitive photodetectors and detector arrays |
| 06/16/1998 | CA2121880C Optical signal detection apparatus and method for preventing polarization signal fading in optical fiber interferometric sensor systems |
| 05/26/1998 | US5757978 Method and system for detecting localized birefringence defects in a dynamic global birefringence field |
| 05/26/1998 | US5757671 Multi-detector ellipsometer and process of multi-detector ellipsometric measurement |
| 05/26/1998 | US5757494 System and method for improving data acquisition capability in spectroscopic ellipsometers |
| 05/26/1998 | US5756292 Quantitative detection of macromolecules with fluorescent oligonucleotides |
| 05/19/1998 | US5754296 Ellipsometric microscope |
| 05/14/1998 | DE19646947A1 Unit for determining absorption property of sample exposed to EM radiation by beam |
| 05/07/1998 | WO1998019142A1 Optical component of polarizing modulation, and its use in a polarimeter or in an ellipsometer |
| 04/30/1998 | DE19644885A1 Highly sensitive temperature measurement in areas with strong electromagnetic contamination |
| 04/16/1998 | WO1998015969A2 Mass spectrometers and methods for rapid screening of libraries of different materials |