| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 03/28/2002 | US20020037252 Gamma radiation emitted from a near-infrared fluorescent colorant injected in advance into the vicinity of a tumor is detected by use of a gamma-probe. |
| 03/27/2002 | EP1190472A1 Interferometer control and laser frequency locking |
| 03/26/2002 | US6362873 Method of improving the contrast of images obtained using the pulsed image-addition ESPI technique |
| 03/21/2002 | WO2001088467A3 Data age adjustments |
| 03/21/2002 | US20020035438 Fast chirp transform |
| 03/21/2002 | US20020034199 Ultrashort-pulse source with controllable multiple-wavelength output |
| 03/21/2002 | US20020033953 Differential interferometric scanning near-field confocal microscopy |
| 03/21/2002 | US20020033951 Dynamic angle measuring interferometer |
| 03/20/2002 | EP1092123A4 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification |
| 03/20/2002 | EP0786075B1 Interferometer |
| 03/19/2002 | US6359693 Double pass double etalon spectrometer |
| 03/14/2002 | WO2002021074A2 Optical amplification in coherence reflectometry |
| 03/14/2002 | DE10042751A1 System zur berührungslosen Vermessung der optischen Abbildungsqualität eines Auges System for the contactless measurement of the optical imaging quality of an eye |
| 03/13/2002 | EP1127252A4 Phase determination of a radiation wave field |
| 03/07/2002 | WO2002017775A1 System for measuring the optical image quality of an eye in a contactless manner |
| 03/07/2002 | US20020027662 Method and apparatus for optical system coherence testing |
| 03/07/2002 | DE10041041A1 Interferometer device e.g. for eye surgery has beam guide which directs superimposed beam onto surfaces |
| 03/06/2002 | EP0927332B1 Method and device for heterodyne interferometer error correction |
| 03/06/2002 | EP0862725A4 Rugged moving-mirror interferometer |
| 02/28/2002 | WO2001089373A3 Method and apparatus for measuring ocular alignment |
| 02/28/2002 | WO2001077773A3 Input configuration for shearing processor |
| 02/28/2002 | US20020026181 Method of evaluating surgical laser |
| 02/28/2002 | US20020024005 Interference system and semiconductor exposure apparatus having the same |
| 02/28/2002 | DE10040317A1 Determining absolute stripe order for speckle shearography, involves adjusting object state repeatedly in reproducible manner based on data measured and recorded under various shear amounts |
| 02/27/2002 | EP1182445A2 Integrated optic interferometric sensor |
| 02/27/2002 | EP1181500A1 Device for detecting or generating optical signals |
| 02/26/2002 | US6351312 Interference-type distance measuring device |
| 02/26/2002 | US6351307 Combined dispersive/interference spectroscopy for producing a vector spectrum |
| 02/21/2002 | WO2001092818A8 Method for correcting physical errors in measuring microscopic objects |
| 02/21/2002 | US20020021449 Data age adjustments |
| 02/21/2002 | US20020021448 Measuring instrument |
| 02/21/2002 | US20020021446 Modular interferometric recombination device and a beam splitter for use in it |
| 02/20/2002 | EP1180699A2 Jamin-type interferometers and components therefor |
| 02/19/2002 | US6347458 Displaceable X/Y coordinate measurement table |
| 02/14/2002 | WO2002012825A1 Frequency transform phase shifting interferometry |
| 02/14/2002 | WO2001095441A9 Gas laser and optical system |
| 02/14/2002 | WO2000065301A9 Helium-neon laser light source generating two harmonically related, single-frequency wavelengths for use in displacement and dispersion measuring interferometry |
| 02/14/2002 | US20020018215 Surface profile measurement apparatus |
| 02/14/2002 | US20020017619 Processing/observing instrument |
| 02/13/2002 | CN1335482A All-optical fiber and large range displacement measurer |
| 02/13/2002 | CN1079157C Interferometer and Fourier transform spectrometer |
| 02/07/2002 | WO2002010833A1 Fiber-coupled, high-speed, angled-dual-axis optical coherence scanning microscopes |
| 02/07/2002 | WO2002010831A2 Differential interferometric scanning near-field confocal microscopy |
| 02/07/2002 | WO2002010722A1 Light track observing device |
| 02/07/2002 | WO2001078261A3 Ofdm modem with an optical processor |
| 02/07/2002 | WO2001078012A3 Shear inducing beamsplitter for interferometric image processing |
| 02/07/2002 | US20020015156 Position detecting method and system for use in exposure apparatus |
| 02/07/2002 | US20020015155 Interferometer integrated on silicon-on-insulator chip |
| 02/07/2002 | US20020015153 Jamin-type interferometers and components therefor |
| 02/07/2002 | US20020015139 A stage control method using a temperature |
| 02/07/2002 | DE10035835A1 Interferometer measuring arrangement for superimposing two light waves, carries light waves within reference fiber conductor between two switching devices |
| 02/06/2002 | EP1178299A1 Superfine indentation tester |
| 02/06/2002 | CN1334916A Phase determination of radiation wave field |
| 02/03/2002 | CA2354752A1 Temperature insensitive mach-zehnder interferometers and devices |
| 02/03/2002 | CA2315006A1 Temperature insensitive mach-zehnder interferometer |
| 02/03/2002 | CA2314997A1 Temperature insensitive fiber based mach-zehnder interferometer filter devices |
| 01/31/2002 | US20020012124 Apparatus and methods for measuring surface profiles and wavefront aberrations, and lens systems comprising same |
| 01/30/2002 | EP1176387A1 Modular device of interferometric recombination and beam splitter for its construction |
| 01/23/2002 | EP1174679A2 Interferometer box |
| 01/23/2002 | EP1068486B1 Position measuring device |
| 01/22/2002 | US6341015 Compensation for measurement uncertainty due to atmospheric effects |
| 01/17/2002 | WO2002004925A1 Method and apparatus for determining one or more properties of a sample in optical coherence tomography |
| 01/17/2002 | WO2002004888A1 Interferometric, short coherent form-measuring device for several surfaces (valve seats) using multi-focal optics, optical segments or high depth of focus |
| 01/17/2002 | WO2002004884A1 Low-coherence interferometric device for depth scanning an object |
| 01/17/2002 | WO2001059402A3 Optical systems for measuring form and geometric dimensions of precision engineered parts |
| 01/17/2002 | DE10036227A1 Mikroskop und Verfahren zur quantitativen optischen Messung der Topographie einer Oberfläche Microscope and method for the quantitative optical measurement of the topography of a surface |
| 01/17/2002 | DE10031687A1 Linear motion device with laser measurement equipment e.g. glass dimension measuring scale, has inner bore on movable runner for accommodating laser beam reflector |
| 01/17/2002 | DE10025395C1 Optical measuring method for object velocity and/or distance uses Sagnac-interferometer with time offset propagation of partial beams along measuring path |
| 01/16/2002 | EP1172643A1 Instrument for measuring physical property of sample |
| 01/10/2002 | US20020003629 Positioning stage system and position measuring method |
| 01/10/2002 | US20020003628 Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry |
| 01/09/2002 | EP1169613A1 Systems and methods for characterizing and correcting cyclic errors in distance measuring and dispersion interferometry |
| 01/08/2002 | US6337488 Defect inspection apparatus and defect inspection method |
| 01/03/2002 | US20020001087 Apparatus and method for interferometric measurements of angular orientation and distance to a plane mirror object |
| 01/03/2002 | US20020001086 Method and apparatus for accurately compensating both long and short term fluctuations in the refractive index of air in an interferometer |
| 01/03/2002 | DE10029383A1 Interferometer for determining test sample dimensions has reference mirror and receiver, which are laterally offset relative to the interferometer's optical axis |
| 01/02/2002 | EP1066495A4 Apparatus and method for measuring the refractive index and optical path length effects of air using multiple-pass interferometry |
| 01/02/2002 | EP1058810A4 Apparatus and methods for measuring intrinsic optical properties of a gas |
| 01/02/2002 | CN1329711A Method for improving measurements by laser interferometer |
| 12/27/2001 | WO2001098839A2 Dynamic beam steering interferometer |
| 12/27/2001 | WO2001098732A1 Measuring device for detecting the dimensions of test samples |
| 12/27/2001 | US20010055438 Fiber optic displacement sensor |
| 12/27/2001 | US20010055147 Electrostatically-actuated tunable optical components using entropic materials |
| 12/27/2001 | US20010055119 Tunable fabry-perot interferometer, and associated methods |
| 12/26/2001 | CN1328637A Optical phase detector |
| 12/25/2001 | US6334011 Ultrashort-pulse source with controllable multiple-wavelength output |
| 12/20/2001 | WO2001096926A2 Microscope and method for measuring surface topography in a quantitative and optical manner |
| 12/19/2001 | EP1016849B1 Heterodyne interferometer with high resolution phase determination |
| 12/19/2001 | EP0807262B1 Electro-optical measuring device for absolute distances |
| 12/13/2001 | WO2001095441A1 Gas laser and optical system |
| 12/13/2001 | US20010050773 Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum |
| 12/12/2001 | EP1161654A1 Multiple layer confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation |
| 12/12/2001 | EP1161653A1 Methods and apparatus for high-speed longitudinal scanning in imaging systems |
| 12/12/2001 | CN2465176Y Laser diffraction measurer |
| 12/12/2001 | CA2350198A1 Method and apparatus for mounting and aligning a laser diode unit in a laser scanner module for use in a sawmill profile scanning |
| 12/11/2001 | US6330065 Gas insensitive interferometric apparatus and methods |
| 12/11/2001 | US6330063 Low coherence interferometer apparatus |
| 12/11/2001 | US6330057 Optical translation measurement |
| 12/06/2001 | WO2001092818A1 Method for correcting physical errors in measuring microscopic objects |
| 12/06/2001 | US20010049709 Fringe analysis method using fourier transform |