Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
07/2002
07/16/2002US6419484 Optical coherence tomography guided dental drill
07/16/2002CA2128645C Multiport optical waveguide interferometer and method of making the same
07/11/2002WO2000055573A9 Systems and methods for characterizing and correcting cyclic errors in distance measuring and dispersion interferometry
07/11/2002US20020089741 Wavelength multiplexed quantitative differential interference contrast microscopy
07/11/2002US20020089671 Interferometric servo control system for stage metrology
07/11/2002DE10059040A1 Optical sensor system for analysing relative movement between measurement rod and light source
07/10/2002EP1221581A1 Interferometer
07/10/2002EP1221043A1 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
07/09/2002US6417927 Method and apparatus for accurately compensating both long and short term fluctuations in the refractive index of air in an interferometer
07/04/2002US20020085208 Interferometer system and interferometric method
07/04/2002US20020085207 Hyper-resolution, topographic, holographic imaging apparatus and method
07/04/2002US20020085206 Phase-compensated, coherence-detection interferometer
07/04/2002US20020085205 Projected phase mask, multi-phase interferometer
07/04/2002DE10162216A1 Verfahren zur Analyse eines getrennte Bereiche aufweisenden Überlagerungs-Streifenbildes A method for analyzing a separate regions having overlay streak image
07/03/2002EP1219938A2 Light wavelength measuring apparatus and method using a two-beam interferometer
07/03/2002EP1066507B1 Detection of a substance by refractive index change
07/02/2002US6414782 Luminous intensity sensor element and light beam modulating method and device employing such a sensor element
06/2002
06/26/2002CN1355418A 2D concentric lens rotator for optical measurement
06/20/2002WO2001084124A3 Methods and systems using field-based light scattering spectroscopy
06/20/2002US20020076104 Method of analyzing fringe image having separate regions
06/19/2002EP1214762A1 Method and apparatus for filtering an optical beam
06/18/2002US6407816 Interferometer and method for measuring the refractive index and optical path length effects of air
06/18/2002US6407799 Stage control method using a temperature
06/13/2002WO2002046691A1 Monolithic corrector plate
06/12/2002EP0938643B1 Integrated interferometer
06/12/2002EP0737299B1 Scanning force microscope with detector probe
06/11/2002US6404544 Wavelength multiplexed quantitative differential interference contrast microscopy
06/11/2002US6404505 Positioning stage system and position measuring method
06/11/2002US6403966 Measurement method and apparatus
06/06/2002US20020067885 Unbalanced fiber optic michelson interferometer as an optical pick-off
06/06/2002DE10113070A1 Apparatus for tomography- and topography measurement of the eye, employs short-coherence interferometer measurement beam with focusing- and scanning optics
06/06/2002DE10057540A1 Interferometrische Messvorrichtung Interferometric measurement device
06/05/2002EP1210637A1 Achromatic phase shift device and interferometer using achromatic phase shift device
06/05/2002EP1210621A1 Polarization preserving optical systems
06/05/2002EP1210564A1 Interferometric, short coherent form-measuring device for several surfaces (valve seats) using multi-focal optics, optical segments or high depth of focus
06/05/2002EP1169613A4 Systems and methods for characterizing and correcting cyclic errors in distance measuring and dispersion interferometry
05/2002
05/30/2002US20020063867 Method for the interferometric measurement of non-rotationally symmetric wavefront errors
05/29/2002EP1208350A1 Interferometer having reduced ghost beam effects
05/29/2002EP1208349A1 Interferometers utilizing polarization preserving optical systems
05/29/2002DE10058650A1 Verfahren zur interferometrischen Messung von nichtrotationssymmetrischen Wellenfrontfehlern Method for interferometric measurement of non-rotationally symmetric wavefront errors
05/29/2002CN1351705A Multiple layer confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation
05/28/2002US6396587 Method for recording depth profiles in a specimen and apparatus therefor
05/28/2002US6396069 Topographer for real time ablation feedback having synthetic wavelength generators
05/23/2002WO2002040938A2 Height scanning interferometry method and apparatus including phase gap analysis
05/23/2002WO2002040937A1 Method and device for high-speed interferential microscopic imaging of an object
05/23/2002WO2002040936A1 Interferometric measuring device
05/23/2002DE10145912A1 Faseroptischer interferometrischer Sensor, Signalverarbeitungssystem eines faseroptischen interferometrischen Sensors und Speichermedium A fiber-optic interferometric sensor signal processing system of a fiber optic interferometric sensor, and storage medium
05/23/2002DE10057539A1 Interferometer type measurement device employs single optical fibre to illuminate and receive reflected light from surface measured
05/22/2002EP1206675A1 Fabrication of fabry-perot polymer film sensing interferometers
05/21/2002US6393167 Fast, environmentally-stable fiber switches using a Sagnac interferometer
05/16/2002WO2001096926A3 Microscope and method for measuring surface topography in a quantitative and optical manner
05/16/2002WO2001036901A9 Systems and methods for quantifying nonlinearities in interferometry systems
05/16/2002US20020057495 Measuring system for performance of imaging optical system
05/15/2002EP1204366A1 Closed loop optical coherence topography
05/15/2002CN1349085A Optical fiber F-P interferometer of metal-ceramic structure
05/15/2002CN1349083A Wide-range polarized-light linear displacement sensor
05/10/2002WO2002037411A1 Optical input device for measuring finger movement
05/10/2002WO2002037410A1 Method of measuring the movement of an input device.
05/10/2002WO2002037124A1 Method of measuring the movement of a material sheet and optical sensor for performing the method
05/10/2002WO2002037075A2 Optical amplification in coherent optical frequency modulated continuous wave reflectometry
05/10/2002WO2002035996A1 Retinal tracking assisted optical coherence tomography
05/09/2002US20020054294 Temperature insensitive mach-zehnder interferometers and devices
05/08/2002EP1203257A2 Scanning interferometric near-field confocal microscopy
05/08/2002EP1203222A1 Optical inspection system based on spatial filtering using a refractive-index-grating
05/08/2002DE10053154A1 Optische Kohärenz-Interferometrie und Kohärenz-Tomographie mit räumlich teilhärenten Lichtquellen Optical coherence interferometry and coherence tomography with spatially teilhärenten light sources
05/08/2002DE10053024A1 Interferometric measurements, such as used in holographic, shear and speckle interferometry, made using liquid crystal polymers to provide shutter effects by changing their properties to vary the light that can pass through them
05/02/2002WO2002035180A1 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects
05/02/2002WO2002035179A1 Optical coherence interferometry and coherence tomography with spatially partially coherent light sources
05/02/2002WO2002035177A2 Dynamic angle measuring interferometer
05/02/2002WO2002034321A1 Interferometer
05/02/2002US20020051134 Fringe analysis error detection method and fringe analysis error correction method
05/02/2002EP1200797A1 Apparatus and method for the non-destructive testing of articles using optical metrology
05/02/2002EP1200796A1 Birefringement interferometer
05/02/2002EP0852715B1 Integrated optic interferometric sensor
04/2002
04/30/2002US6381023 Confocal heterodyne interference microscopy
04/30/2002CA2048337C Optical waveguide amplifier source gyroscope
04/25/2002WO2002033346A1 Interferometric sensor and method to detect optical fields
04/25/2002WO2001078011A3 An optical transform method and system
04/25/2002DE10138656A1 Oberflächenprofilmesseinrichtung Surface profile measuring device
04/24/2002EP0850397B1 Methods for detecting striae
04/23/2002US6377349 Arrangement for spectral interferometric optical tomography and surface profile measurement
04/18/2002WO2000066969A9 Interferometry system having a dynamic beam-steering assembly for measuring angle and distance
04/18/2002US20020044287 Point diffraction interferometer, manufacturing method for reflecting mirror, and projection exposure apparatus
04/18/2002DE10027221A1 Verfahren zur Korrektur physikalisch bedingter Fehler bei der Messung mikroskopischer Objekte A method of correcting physically conditioned errors in the measurement of microscopic objects
04/11/2002DE10047836A1 Verfahren und Vorrichtung zur Regelung des Foliendickenprofils in Folienblasanlagen Method and apparatus for controlling the film thickness profile in blown film processing
04/10/2002EP1194732A1 Gas insensitive interferometric apparatus and methods
04/10/2002EP1194731A1 Interferometric apparatus and method that compensate refractive index fluctuations
04/10/2002EP0804712B1 Interferometric measurement of surfaces with diffractive optics at grazing incidence
04/09/2002US6369951 Beam splitter assembly and interferometer having a beam splitter assembly
04/09/2002US6369898 Method and apparatus for surface profiling of materials and calibration of ablation lasers
04/09/2002CA2251666C Method for analyzing a separation in a deformable structure
04/04/2002WO2001098839A3 Dynamic beam steering interferometer
04/03/2002EP1193466A2 Interferometric device to superpose at least two lightwaves
04/03/2002EP1193041A2 Method and apparatus for controlling film thickness in a film blowing apparatus
04/03/2002EP1192411A1 Monolithic optical assembly
04/03/2002EP1192410A1 Helium-neon laser light source generating two harmonically related, single-frequency wavelengths for use in displacement and dispersion measuring interferometry
04/03/2002EP1159582A4 Coupled etalon interferometers
04/03/2002EP1018044A4 Stable nonlinear mach-zehnder fiber switch
04/03/2002CN1342897A Surface plasma wave microscope with phase shift interference
03/2002
03/28/2002WO2001090685A3 Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum