Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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07/16/2002 | US6419484 Optical coherence tomography guided dental drill |
07/16/2002 | CA2128645C Multiport optical waveguide interferometer and method of making the same |
07/11/2002 | WO2000055573A9 Systems and methods for characterizing and correcting cyclic errors in distance measuring and dispersion interferometry |
07/11/2002 | US20020089741 Wavelength multiplexed quantitative differential interference contrast microscopy |
07/11/2002 | US20020089671 Interferometric servo control system for stage metrology |
07/11/2002 | DE10059040A1 Optical sensor system for analysing relative movement between measurement rod and light source |
07/10/2002 | EP1221581A1 Interferometer |
07/10/2002 | EP1221043A1 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification |
07/09/2002 | US6417927 Method and apparatus for accurately compensating both long and short term fluctuations in the refractive index of air in an interferometer |
07/04/2002 | US20020085208 Interferometer system and interferometric method |
07/04/2002 | US20020085207 Hyper-resolution, topographic, holographic imaging apparatus and method |
07/04/2002 | US20020085206 Phase-compensated, coherence-detection interferometer |
07/04/2002 | US20020085205 Projected phase mask, multi-phase interferometer |
07/04/2002 | DE10162216A1 Verfahren zur Analyse eines getrennte Bereiche aufweisenden Überlagerungs-Streifenbildes A method for analyzing a separate regions having overlay streak image |
07/03/2002 | EP1219938A2 Light wavelength measuring apparatus and method using a two-beam interferometer |
07/03/2002 | EP1066507B1 Detection of a substance by refractive index change |
07/02/2002 | US6414782 Luminous intensity sensor element and light beam modulating method and device employing such a sensor element |
06/26/2002 | CN1355418A 2D concentric lens rotator for optical measurement |
06/20/2002 | WO2001084124A3 Methods and systems using field-based light scattering spectroscopy |
06/20/2002 | US20020076104 Method of analyzing fringe image having separate regions |
06/19/2002 | EP1214762A1 Method and apparatus for filtering an optical beam |
06/18/2002 | US6407816 Interferometer and method for measuring the refractive index and optical path length effects of air |
06/18/2002 | US6407799 Stage control method using a temperature |
06/13/2002 | WO2002046691A1 Monolithic corrector plate |
06/12/2002 | EP0938643B1 Integrated interferometer |
06/12/2002 | EP0737299B1 Scanning force microscope with detector probe |
06/11/2002 | US6404544 Wavelength multiplexed quantitative differential interference contrast microscopy |
06/11/2002 | US6404505 Positioning stage system and position measuring method |
06/11/2002 | US6403966 Measurement method and apparatus |
06/06/2002 | US20020067885 Unbalanced fiber optic michelson interferometer as an optical pick-off |
06/06/2002 | DE10113070A1 Apparatus for tomography- and topography measurement of the eye, employs short-coherence interferometer measurement beam with focusing- and scanning optics |
06/06/2002 | DE10057540A1 Interferometrische Messvorrichtung Interferometric measurement device |
06/05/2002 | EP1210637A1 Achromatic phase shift device and interferometer using achromatic phase shift device |
06/05/2002 | EP1210621A1 Polarization preserving optical systems |
06/05/2002 | EP1210564A1 Interferometric, short coherent form-measuring device for several surfaces (valve seats) using multi-focal optics, optical segments or high depth of focus |
06/05/2002 | EP1169613A4 Systems and methods for characterizing and correcting cyclic errors in distance measuring and dispersion interferometry |
05/30/2002 | US20020063867 Method for the interferometric measurement of non-rotationally symmetric wavefront errors |
05/29/2002 | EP1208350A1 Interferometer having reduced ghost beam effects |
05/29/2002 | EP1208349A1 Interferometers utilizing polarization preserving optical systems |
05/29/2002 | DE10058650A1 Verfahren zur interferometrischen Messung von nichtrotationssymmetrischen Wellenfrontfehlern Method for interferometric measurement of non-rotationally symmetric wavefront errors |
05/29/2002 | CN1351705A Multiple layer confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation |
05/28/2002 | US6396587 Method for recording depth profiles in a specimen and apparatus therefor |
05/28/2002 | US6396069 Topographer for real time ablation feedback having synthetic wavelength generators |
05/23/2002 | WO2002040938A2 Height scanning interferometry method and apparatus including phase gap analysis |
05/23/2002 | WO2002040937A1 Method and device for high-speed interferential microscopic imaging of an object |
05/23/2002 | WO2002040936A1 Interferometric measuring device |
05/23/2002 | DE10145912A1 Faseroptischer interferometrischer Sensor, Signalverarbeitungssystem eines faseroptischen interferometrischen Sensors und Speichermedium A fiber-optic interferometric sensor signal processing system of a fiber optic interferometric sensor, and storage medium |
05/23/2002 | DE10057539A1 Interferometer type measurement device employs single optical fibre to illuminate and receive reflected light from surface measured |
05/22/2002 | EP1206675A1 Fabrication of fabry-perot polymer film sensing interferometers |
05/21/2002 | US6393167 Fast, environmentally-stable fiber switches using a Sagnac interferometer |
05/16/2002 | WO2001096926A3 Microscope and method for measuring surface topography in a quantitative and optical manner |
05/16/2002 | WO2001036901A9 Systems and methods for quantifying nonlinearities in interferometry systems |
05/16/2002 | US20020057495 Measuring system for performance of imaging optical system |
05/15/2002 | EP1204366A1 Closed loop optical coherence topography |
05/15/2002 | CN1349085A Optical fiber F-P interferometer of metal-ceramic structure |
05/15/2002 | CN1349083A Wide-range polarized-light linear displacement sensor |
05/10/2002 | WO2002037411A1 Optical input device for measuring finger movement |
05/10/2002 | WO2002037410A1 Method of measuring the movement of an input device. |
05/10/2002 | WO2002037124A1 Method of measuring the movement of a material sheet and optical sensor for performing the method |
05/10/2002 | WO2002037075A2 Optical amplification in coherent optical frequency modulated continuous wave reflectometry |
05/10/2002 | WO2002035996A1 Retinal tracking assisted optical coherence tomography |
05/09/2002 | US20020054294 Temperature insensitive mach-zehnder interferometers and devices |
05/08/2002 | EP1203257A2 Scanning interferometric near-field confocal microscopy |
05/08/2002 | EP1203222A1 Optical inspection system based on spatial filtering using a refractive-index-grating |
05/08/2002 | DE10053154A1 Optische Kohärenz-Interferometrie und Kohärenz-Tomographie mit räumlich teilhärenten Lichtquellen Optical coherence interferometry and coherence tomography with spatially teilhärenten light sources |
05/08/2002 | DE10053024A1 Interferometric measurements, such as used in holographic, shear and speckle interferometry, made using liquid crystal polymers to provide shutter effects by changing their properties to vary the light that can pass through them |
05/02/2002 | WO2002035180A1 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects |
05/02/2002 | WO2002035179A1 Optical coherence interferometry and coherence tomography with spatially partially coherent light sources |
05/02/2002 | WO2002035177A2 Dynamic angle measuring interferometer |
05/02/2002 | WO2002034321A1 Interferometer |
05/02/2002 | US20020051134 Fringe analysis error detection method and fringe analysis error correction method |
05/02/2002 | EP1200797A1 Apparatus and method for the non-destructive testing of articles using optical metrology |
05/02/2002 | EP1200796A1 Birefringement interferometer |
05/02/2002 | EP0852715B1 Integrated optic interferometric sensor |
04/30/2002 | US6381023 Confocal heterodyne interference microscopy |
04/30/2002 | CA2048337C Optical waveguide amplifier source gyroscope |
04/25/2002 | WO2002033346A1 Interferometric sensor and method to detect optical fields |
04/25/2002 | WO2001078011A3 An optical transform method and system |
04/25/2002 | DE10138656A1 Oberflächenprofilmesseinrichtung Surface profile measuring device |
04/24/2002 | EP0850397B1 Methods for detecting striae |
04/23/2002 | US6377349 Arrangement for spectral interferometric optical tomography and surface profile measurement |
04/18/2002 | WO2000066969A9 Interferometry system having a dynamic beam-steering assembly for measuring angle and distance |
04/18/2002 | US20020044287 Point diffraction interferometer, manufacturing method for reflecting mirror, and projection exposure apparatus |
04/18/2002 | DE10027221A1 Verfahren zur Korrektur physikalisch bedingter Fehler bei der Messung mikroskopischer Objekte A method of correcting physically conditioned errors in the measurement of microscopic objects |
04/11/2002 | DE10047836A1 Verfahren und Vorrichtung zur Regelung des Foliendickenprofils in Folienblasanlagen Method and apparatus for controlling the film thickness profile in blown film processing |
04/10/2002 | EP1194732A1 Gas insensitive interferometric apparatus and methods |
04/10/2002 | EP1194731A1 Interferometric apparatus and method that compensate refractive index fluctuations |
04/10/2002 | EP0804712B1 Interferometric measurement of surfaces with diffractive optics at grazing incidence |
04/09/2002 | US6369951 Beam splitter assembly and interferometer having a beam splitter assembly |
04/09/2002 | US6369898 Method and apparatus for surface profiling of materials and calibration of ablation lasers |
04/09/2002 | CA2251666C Method for analyzing a separation in a deformable structure |
04/04/2002 | WO2001098839A3 Dynamic beam steering interferometer |
04/03/2002 | EP1193466A2 Interferometric device to superpose at least two lightwaves |
04/03/2002 | EP1193041A2 Method and apparatus for controlling film thickness in a film blowing apparatus |
04/03/2002 | EP1192411A1 Monolithic optical assembly |
04/03/2002 | EP1192410A1 Helium-neon laser light source generating two harmonically related, single-frequency wavelengths for use in displacement and dispersion measuring interferometry |
04/03/2002 | EP1159582A4 Coupled etalon interferometers |
04/03/2002 | EP1018044A4 Stable nonlinear mach-zehnder fiber switch |
04/03/2002 | CN1342897A Surface plasma wave microscope with phase shift interference |
03/28/2002 | WO2001090685A3 Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum |