| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 04/29/2004 | US20040080760 Confocal imaging system having a divided retroreflector |
| 04/29/2004 | US20040080759 Cornea characteristics measuring device |
| 04/29/2004 | US20040080758 Three-dimensional visual sensor |
| 04/29/2004 | US20040080757 Integrated surface metrology |
| 04/29/2004 | US20040080756 Surface profiler with vibration-damped horizontal reference surface |
| 04/29/2004 | US20040080755 Displacement pickup |
| 04/29/2004 | US20040080742 Device inspecting for defect on semiconductor wafer surface |
| 04/29/2004 | US20040080740 Wafer defect detection system with traveling lens multi-beam scanner |
| 04/29/2004 | US20040080737 Off-axis levelling in lithographic projection apparatus |
| 04/29/2004 | US20040080496 Optical cursor control device |
| 04/29/2004 | US20040079907 Space carving for measurement of high-curvature areas on a mechanical part |
| 04/29/2004 | US20040079882 Automatic backscatter gauge |
| 04/29/2004 | US20040079146 Method and device for measuring the thickness of a liquid layer |
| 04/29/2004 | DE19637682B4 Verfahren zur Bestimmung der räumlichen Koordinaten von Gegenständen und/oder deren zeitlicher Änderung und Vorrichtung zur Anwendung dieses Verfahrens Method for determining the spatial coordinates of objects and / or their temporal variation and device for applying this method |
| 04/29/2004 | DE10348898A1 Laser-based optical measurement device for thin-film measurement and for use with thin-film deposition devices, said device having a removable mounting for the device beam splitter and collimator |
| 04/29/2004 | DE10296461T5 Vorrichtung und Verfahren zum Isolieren und Messen einer Bewegung in einer messtechnischen Vorrichtung Apparatus and method for isolating and measuring a movement in a metrological device |
| 04/29/2004 | DE10248779A1 Two-dimensional object measurement method in which an object is moved within a measurement system and imaged using a digital camera during simultaneous position recording with the measurements processed in an evaluation unit |
| 04/29/2004 | DE10155834B4 Verfahren zur optischen Vermessung räumlicher Koordinaten von Objektpunkten Method for optical measurement of spatial coordinates of object points |
| 04/28/2004 | EP1413917A2 Finder, marker presentation member, and presentation method of positioning marker for calibration photography |
| 04/28/2004 | EP1413852A1 Composite optical sensor unit and optical disk inspection device using it |
| 04/28/2004 | EP1413851A1 Space carving for measurement of high-curvature areas on a mechanical part |
| 04/28/2004 | EP1413850A2 Optical sensor for measuring position and orientation of an object in three dimensions |
| 04/28/2004 | EP1412825A2 Method for measuring an object by means of a co-ordinate measuring device with an image processing sensor |
| 04/28/2004 | EP1412728A1 Apparatus for parallel detection of the behaviour of mechanical micro-oscillators |
| 04/28/2004 | EP1412696A1 Method and device for the detection of information on a tool |
| 04/28/2004 | EP1411831A1 Anterior chamber diameter measurement system from limbal ring measurements |
| 04/28/2004 | EP1269114B1 Apparatus and method for determining the dimensions of an object utilizing negative imaging |
| 04/28/2004 | EP1123138B1 Method and system for physiological gating of radiation therapy |
| 04/28/2004 | CN1492214A Laser aligner for realizing self collimator quick capturing and alignment method |
| 04/28/2004 | CN1492213A Method for measuring non-metal layer thickness in chemical and mechanical grinding process |
| 04/28/2004 | CN1147724C Current-displacement comparator with polarized light detection and Faraday magneto-optical effect |
| 04/28/2004 | CN1147709C Detection of irregularities in a convex surface, such as a tire sidewsall, using band-pass filtering |
| 04/28/2004 | CN1147707C Optic position sensor |
| 04/28/2004 | CN1147706C Angle changeable double reflection mirror dynamic liquid film thickness measuring instrument |
| 04/28/2004 | CN1147705C Method and device for measuring position and attitute in space |
| 04/28/2004 | CN1147704C Electronic holographic measurement method without direct transmission light and conjugate image |
| 04/28/2004 | CN1147703C Phase-conjugated interferometer for measuring surface shape of transparent plate |
| 04/28/2004 | CN1147702C All-optical fiber and large range displacement measurer |
| 04/27/2004 | US6728609 Diagnostic method and system for a multiple-link steering system |
| 04/27/2004 | US6728593 System for analysis of fabric surface |
| 04/27/2004 | US6728417 Measurement apparatus |
| 04/27/2004 | US6727995 Gate oxide thickness measurement and control using scatterometry |
| 04/27/2004 | US6727994 Z-axis monitoring apparatus for robot blade |
| 04/27/2004 | US6727993 Surface inspection instrument and surface inspection method |
| 04/27/2004 | US6727987 Image pickup apparatus and defect inspection system for photomask |
| 04/27/2004 | US6727986 Method and device for measuring a folding angle of a sheet in a folding machine |
| 04/27/2004 | US6727491 Sensor and method for detecting changes in distance |
| 04/27/2004 | US6726325 Tracking assisted optical coherence tomography |
| 04/22/2004 | WO2004034079A2 Inspection system calibration methods |
| 04/22/2004 | WO2004034041A1 Method and apparatus for the optical evaluation of a paper surface |
| 04/22/2004 | WO2004033990A1 Method and apparatus for measuring strain using a luminescent photoelastic coating |
| 04/22/2004 | WO2004033989A1 Determining the position of an object using a three-dimensional interference grid |
| 04/22/2004 | WO2004033985A2 Spatial reference system |
| 04/22/2004 | WO2004032810A2 Method and system for determining the position and alignment of a surface of an object in relation to a laser beam |
| 04/22/2004 | WO2004032722A2 Imaging systems |
| 04/22/2004 | US20040078031 Methods and systems for laser calibration and eye tracker camera alignment |
| 04/22/2004 | US20040076740 Light source of a light interference type optical thickness monitor (OTM) for film formation control is a variable wavelength light source, and formed by a laser light source which emits coherent light |
| 04/22/2004 | US20040076335 Method and apparatus for low depth of field image segmentation |
| 04/22/2004 | US20040076311 Method and apparatus of measuring rotational and flight characteristics of sphere |
| 04/22/2004 | US20040075847 Sensor arrangement to determine vehicle height |
| 04/22/2004 | US20040075846 Strike zone detector |
| 04/22/2004 | US20040075843 Interferometer system of compact configuration |
| 04/22/2004 | US20040075836 Apparatus for measuring film thickness formed on object, apparatus and method of measuring spectral reflectance of object, and apparatus and method of inspecting foreign material on object |
| 04/22/2004 | US20040075544 System and method for monitoring the surrounding area of a vehicle |
| 04/22/2004 | US20040075068 Wafer defect detection system with traveling lens multi-beam scanner |
| 04/22/2004 | US20040075061 Optical fiber based apparatus and sensor with enhanced signal for pressure measurements |
| 04/22/2004 | DE10246066A1 Calibrating image sensor system(s) in/on motor vehicle involves determining image sensor system alignment relative to vehicle geometric driving axis from images for 2 calibration object positions |
| 04/22/2004 | CA2541155A1 Method and apparatus for measuring strain using a luminescent photoelastic coating |
| 04/21/2004 | EP1411419A2 Information processing method and information processing apparatus |
| 04/21/2004 | EP1411341A1 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever |
| 04/21/2004 | EP1411323A1 Misalignment amount detection apparatus and alignment apparatus, and accuracy analysis apparatus with the alignment apparatus |
| 04/21/2004 | EP1411322A2 Optical sensor for measuring position and orientation of an object in three dimensions |
| 04/21/2004 | EP1411320A2 Method for evaluating of strains in an elongated element like a conduit |
| 04/21/2004 | EP1410507A1 Optoelectronic device for detecting position and movement and method associated therewith |
| 04/21/2004 | EP1410110A2 Real time analysis of periodic structures on semiconductors |
| 04/21/2004 | EP1410008A1 Method and apparatus for using a two-wave mixing ultrasonic detection in rapid scanning applications |
| 04/21/2004 | EP1409956A1 Common element confocal interferometer |
| 04/21/2004 | CN1490593A Inspection of parallelism of light axle of bending optical pipe |
| 04/21/2004 | CN1489949A Length/or diameter measuring method and device for cigarette filter tip lip |
| 04/21/2004 | CN1146721C Load measuring device |
| 04/21/2004 | CN1146718C Measuring system for determining pickup height |
| 04/21/2004 | CN1146717C Background compensation for confocal interference microscopy |
| 04/20/2004 | US6725082 System and method for ligament graft placement |
| 04/20/2004 | US6724930 Three-dimensional position and orientation sensing system |
| 04/20/2004 | US6724922 Verification of positions in camera images |
| 04/20/2004 | US6724491 Visual displacement sensor |
| 04/20/2004 | US6724490 Image capturing apparatus and distance measuring method |
| 04/20/2004 | US6724489 Three dimensional scanning camera |
| 04/20/2004 | US6724487 Apparatus and method for measuring digital imager, package and wafer bow and deviation from flatness |
| 04/20/2004 | US6724485 Interferometric measuring device for determining the profile or the pitch of especially rough surfaces |
| 04/20/2004 | US6724483 Method for three-dimensionally, optically measuring measuring objects |
| 04/20/2004 | US6724475 Apparatus for rapidly measuring angle-dependent diffraction effects on finely patterned surfaces |
| 04/20/2004 | US6724474 Wafer surface inspection method |
| 04/20/2004 | US6724215 Method of evaluating liquid crystal panel and evaluating device |
| 04/20/2004 | US6724005 Substrate defect inspection method and substrate defect inspection system |
| 04/20/2004 | US6723976 Optical detector with regulated emission |
| 04/20/2004 | US6723973 Lithographically formed on a semiconductor wafer, a liquid crystal panel, a mask |
| 04/20/2004 | US6723572 Method for monitoring the shape of the processed surfaces of semiconductor devices and equipment for manufacturing the semiconductor devices |
| 04/15/2004 | WO2004032046A2 Method and device for recognition of a load on a lifting gear |
| 04/15/2004 | WO2004031707A1 Phase distribution measuring instrument and phase distribution measuring method |