Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
05/2004
05/26/2004CN1499600A Checking method and checker for thin film loading band for encasulating electronic part
05/26/2004CN1499493A Displacement detection, displacement detector and recorder
05/26/2004CN1499185A Optical characteristic measurer and optical displacement gage
05/26/2004CN1499011A Method for non-contact measuring track cross section or track space
05/26/2004CN1151498C Slope detector
05/26/2004CN1151472C Distance measuring device and three-dinensional image measuring apparauts
05/26/2004CN1151358C Methods and apparatus for measuring thickness of a film, particularly of photoresist film on semiconductor sbustrate
05/25/2004US6742168 Method and structure for calibrating scatterometry-based metrology tool used to measure dimensions of features on a semiconductor device
05/25/2004US6741948 Method and apparatus for fixing a location
05/25/2004US6741731 Side surface inspecting apparatus for tablet, front and back surface inspecting apparatus for tablet, and tablet appearance inspecting apparatus using the same
05/25/2004US6741726 System and method for electronically evaluating predicted fabric qualities
05/25/2004US6741409 Precision alignment of optical devices
05/25/2004US6741364 Apparatus for determining relative positioning of objects and related methods
05/25/2004US6741363 Method and an apparatus for the optical detection of a contrast line
05/25/2004US6741361 Multi-stage data processing for frequency-scanning interferometer
05/25/2004US6741358 Exposure apparatus and device production method in which position of reference plate provided on substrate stage is measured
05/25/2004US6741357 Quadrature phase shift interferometer with unwrapping of phase
05/25/2004US6741343 Level with angle and distance measurement apparatus
05/25/2004US6741340 Optical axis adjustment method, and storage medium recorded with a program that executes said adjustment method
05/25/2004US6741279 System and method for capturing document orientation information with a digital camera
05/25/2004US6741275 Lumber grading system
05/25/2004US6740896 Sensitivity adjusting method for pattern inspection apparatus
05/25/2004US6739516 Distance information acquisition apparatus or system, pattern projector, and distance information acquisition method
05/25/2004US6739446 Method for measuring the surface height of a material bed conducted on a conveyor belt to thermal treatment
05/21/2004WO2004042548A1 Movement detection device
05/21/2004WO2004042320A1 Planar and wafer level packaging of semiconductor lasers and photo detectors for transmitter optical sub-assemblies
05/21/2004WO2004041381A2 Control systems for use with flying craft and other remote elements
05/21/2004WO2004025947A3 A navigational control system for a robotic device
05/21/2004WO2004025218A3 Diagnostic method and system for a multiple-link steering system
05/21/2004WO2004017707A3 Apparatus and method of processing materials
05/21/2004WO2003044505B1 Device for the detection of surface defects on cylinders
05/20/2004US20040098221 Size measuring method and device
05/20/2004US20040096092 Extracting method of pattern contour, image processing method, searching method of pattern edge, scanning method of probe, manufacturing method of semiconductor device, pattern inspection apparatus, and program
05/20/2004US20040095585 Wheel profile inspection apparatus and method
05/20/2004US20040095584 Process and device for measuring distances on strips of bright metal strip
05/20/2004US20040095564 Exposure device
05/20/2004US20040095484 Object segmentation from images acquired by handheld cameras
05/20/2004US20040093960 Device for measuring universal joint operating angles in a drive train system
05/20/2004US20040093747 Arrangement and process for determining the relative alignment of two bodies
05/19/2004EP1420360A1 Apparatus, method and program for acquiring organism characteristic data, and corresponding authentication apparatus
05/19/2004EP1420264A1 Method and device for calibrating a measurement system
05/19/2004EP1420243A1 Surface inspection method and apparatus
05/19/2004EP1419853A1 Apparatus and method for in-situ endpoint detection and monitoring for chemical mechanical polishing operations
05/19/2004EP1419363A2 Method and apparatus for production line screening
05/19/2004EP1419362A1 In-situ mirror characterization
05/19/2004EP1330628B1 Method for correcting physical errors in measuring microscopic objects
05/19/2004DE19848067B4 Einrichtung zur Erfassung der räumlichen Verlagerung von Konstruktionsteilen und/oder Strukturen Means for detecting the spatial displacement of builders and / or structures
05/19/2004DE10341322A1 Optisches Messsystem und Verfahren An optical measurement system and method
05/19/2004DE10251412A1 Anordnung zur Messung der Geometrie bzw. Struktur eines Objektes An arrangement for measurement of the geometry or structure of an object
05/19/2004DE10244554A1 Verfahren und Vorrichtung zur Messung der Wanddicke eines Rohres in einem Rohrwalzwerk Method and device for measuring the wall thickness of a tube in a tube rolling mill
05/19/2004DE10217068A1 Surface coordinate measurement method in which free form surfaces are measured by projection of patterns onto them and detecting the resultant scattered or reflected image pattern
05/19/2004CN1497696A Method and device for testing chip surface
05/19/2004CN1497695A Graphic measuring method, manufacturing method of semiconductor device using it and graphic measuring device
05/19/2004CN1497672A Producing method of graphic and manufacturing method of semiconductor device
05/19/2004CN1497495A Optical image detector and navigation device using the detector
05/19/2004CN1497420A 光学光标控制装置 Optical cursor control device
05/19/2004CN1497244A Information processing method and information processing deivce
05/19/2004CN1496766A Method and device for measuring wall thickness of pipe in pipe mill
05/19/2004CN1149956C Dianostic tomographic laser imaging apparatus
05/18/2004US6738511 Reduced noise sensitivity method and apparatus for converting an interferogram phase map to a surface profile map
05/18/2004US6738505 Method and apparatus for detecting solder paste deposits on substrates
05/18/2004US6738503 Notch inspection apparatus and method based on shading pattern matching
05/18/2004US6738148 Upper stem diameter measurement and basal area determination device and method for utilization in timber cruising applications
05/18/2004US6738137 Measurement of waveplate retardation using a photoelastic modulator
05/18/2004US6738131 Distance measuring method and image input device with distance measuring function
05/18/2004US6738128 Exposure apparatus
05/18/2004US6737638 Gear-reduction device, particularly for measuring and transmitting rotary and swivel movements
05/18/2004US6736508 Tracking assisted optical procedure
05/18/2004US6735879 Laser line generating device
05/13/2004WO2004040351A1 Plasma microscopy using ultra-short laser pulses
05/13/2004WO2004040241A1 Distributed optical fiber sensor system
05/13/2004WO2004040235A2 Device for the contact-free, three-dimensional digitising of an object
05/13/2004WO2004040234A2 Arrangement for measuring the geometry or structure of an object
05/13/2004WO2004040233A1 A coordinate measuring device with a vibration damping system
05/13/2004WO2004040232A1 A coordinate measuring device and a method for measuring the position of an object
05/13/2004WO2004040231A2 Calibration for 3d measurement system
05/13/2004WO2003067183A3 Wireless substrate-like sensor
05/13/2004US20040091997 Using immobilized chemoselective biopolymers contained in nutrient and osmotic protective medium to analyze surface of an object
05/13/2004US20040090686 Displacement/quantity of light converter
05/13/2004US20040090638 Imaging a three-dimensional structure by confocal focussing an array of light beams
05/13/2004US20040090636 Position measuring arrangement
05/13/2004US20040090635 Measuring device for detecting the dimensions of test samples
05/13/2004US20040090634 System and method for inspection using white light intererometry
05/13/2004US20040090633 Low-coherence interferometric device for depth scanning an object
05/13/2004US20040090629 Diffraction order selection for optical metrology simulation
05/13/2004US20040090619 Apparatus and method for detecting tilted disc, and apparatus and method for reproducing data recorded on the disc
05/13/2004US20040090618 Process for reading fractions of intervals between contiguous photo-sensitive elements in a linear optical sensor
05/13/2004US20040090617 Method for optimising the image properties of at least two optical elements as well as methods for optimising the image properties of at least three optical elements
05/13/2004US20040090444 Image processing device and method therefor and program codes, storing medium
05/13/2004US20040089907 Position sensitive photo detector
05/13/2004US20040089824 Hardware configuration for parallel data processing without cross communication
05/13/2004US20040089816 Method and system for scanning apertureless fluorescence microscope
05/13/2004DE3912406B4 Verfahren und Vorrichtung zum Abtasten mehrerer optischer Meßreflektoren Method and device for scanning several optical measuring reflectors
05/13/2004DE202004003893U1 Coordinate measurement instrument has an optical or tactile measurement element mounted on a portal frame above a transparent measurement table that has a through, band-shaped lighting source
05/13/2004DE19922102B4 Faser-Bragg-Gitter-Sensoranordnung zur Ermittlung physikalischer Größen Fiber Bragg grating sensor arrangement for determining physical quantities
05/13/2004DE10250012A1 Plasmamikroskopie mit ultrakurzen Laserpulsen Plasma microscopy with ultrashort laser pulses
05/13/2004DE10162270B4 Optische Sensorvorrichtung An optical sensor device
05/13/2004DE10158776B4 Anordnung zum Erfassen von Relativbewegungen oder Relativpositionen zweier Objekte Arrangement for detecting relative movements or relative positions of two objects
05/12/2004EP1418545A2 Method for error analysis of trifocal transfer
05/12/2004EP1418400A2 Flatness measuring system for a metal sheet