| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
|---|
| 06/08/2004 | US6747284 Position sensing device having a movable photosensing element |
| 06/08/2004 | US6747260 Method and apparatus for three-dimensional color scanning |
| 06/08/2004 | US6746319 Measuring apparatus |
| 06/08/2004 | US6745483 Vehicle wheel toe-in alignment apparatus and method |
| 06/03/2004 | WO2004046784A1 Method for improving the signal-to-noise ratio in confocal microscopes with multi-pinhole filtering |
| 06/03/2004 | WO2004046770A1 System for locating light sources |
| 06/03/2004 | WO2004046734A1 Method for exact three-dimensional micro-positioning of bodies with various shapes and/or dimensions in space |
| 06/03/2004 | WO2004046655A2 System and method for characterizing three-dimensional structures |
| 06/03/2004 | WO2004046645A2 Fast 3d height measurement method and system |
| 06/03/2004 | WO2004046644A2 Wheel profile inspection apparatus and method |
| 06/03/2004 | WO2004046642A2 Device and method for measuring surfaces on the internal walls of cylinders, using confocal microscopes |
| 06/03/2004 | WO2004046640A1 Device for substantially continuous measurement of diameter variations in a conduit inner wall |
| 06/03/2004 | WO2004001427A3 Common-path frequency-scanning interferometer |
| 06/03/2004 | WO2003069264A3 Characterization and compensation of non-cyclic errors in interferometry systems |
| 06/03/2004 | WO2003068058A9 Determining relative positional and rotational offsets |
| 06/03/2004 | US20040107073 Workpiece coordinate system origin setting method, workpiece coordinate system origin setting program and workpiece coordinate system origin setting device of a surface property measuring machine |
| 06/03/2004 | US20040107061 Electronic imaging and quality control method for a fast moving web |
| 06/03/2004 | US20040107018 Apparatus for generating three-dimensional model data |
| 06/03/2004 | US20040106357 Polishing pad for in-situ endpoint detection |
| 06/03/2004 | US20040105578 Pattern inspection apparatus |
| 06/03/2004 | US20040105101 Method of and apparatus for measuring thickness of thin film or thin layer |
| 06/03/2004 | US20040105100 Apparatus and methods for surface contour measurements |
| 06/03/2004 | US20040105099 System and method for characterizing three-dimensional structures |
| 06/03/2004 | US20040105097 Weighted least-square interferometric measurement of multiple surfaces |
| 06/03/2004 | US20040105094 Device for optically measuring boreholes |
| 06/03/2004 | US20040105093 Inspection method and inspection apparatus |
| 06/03/2004 | US20040105001 Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar |
| 06/03/2004 | US20040104360 Optical apparatus for measuring objects having a rectilinear profile |
| 06/03/2004 | US20040104338 Calibration and error correction method for an oscillating scanning device |
| 06/03/2004 | US20040104337 Optical fiber strain sensor device and strain detection method |
| 06/03/2004 | US20040103547 Portable coordinate measurement machine |
| 06/03/2004 | DE29825046U1 System and method for measuring layer thickness on substrates utilize the motion of the substrates relative to a measuring head during their transport along a given track |
| 06/03/2004 | DE10251295A1 Surface property determination method, e.g. for determining the roughness of metallic objects, e.g. for engineering applications, whereby a planar sensor is used to detect the reflection properties of areas of an object surface |
| 06/03/2004 | DE10223581B4 System zur interferometrischen Prüfung gekrümmter Oberflächen System for interferometric testing of curved surfaces |
| 06/02/2004 | EP1424656A2 Apparatus for generating three-dimensional model data for a machine tool |
| 06/02/2004 | EP1424597A2 Lithographic apparatus and device manufacturing method |
| 06/02/2004 | EP1424537A1 DISPLACEMENT DETECTING METHOD, DISPLACEMENT DETECTING DEVICE AND CALIBRATING METHOD THEREOF, AND RECORDING DEVICE OF INFORMATION RECORDING MEDIUM ORIGINAL DISK |
| 06/02/2004 | EP1423987A2 Amplified tree structure technology for fiber optic sensor arrays |
| 06/02/2004 | EP1423986A2 Apparauts and method for processing optical signals from two delay coils to increase the dynamic range of a sagnac-based fiber optic sensor array |
| 06/02/2004 | EP1423731A2 Method and device for recording a three-dimensional distance-measuring image |
| 06/02/2004 | EP1423658A1 Adjustment and measuring device and method and device for aligning the same |
| 06/02/2004 | EP1423657A1 Method and device for determining the radius, the sharpness or the shape of edges |
| 06/02/2004 | EP1023845B1 Bar-like specimen inspection device |
| 06/02/2004 | CN1502220A Method and an apparatus for measuring positions of contact elements of an electronic component |
| 06/02/2004 | CN1502034A Length sensor |
| 06/02/2004 | CN1501174A Method, inspection system, computer program and reference substrate for detecting mask defects |
| 06/02/2004 | CN1501171A 曝光装置 Exposure device |
| 06/02/2004 | CN1501049A Method for detecting optical and physical thickness of optical transparent body |
| 06/02/2004 | CN1500911A Lithographic apparatus and method to determine beam size and divergence |
| 06/01/2004 | US6744525 Optically-based system for processing banknotes based on security feature emissions |
| 06/01/2004 | US6744522 Interferometer for measuring the thickness profile of thin transparent substrates |
| 06/01/2004 | US6744521 Method for determining the thickness of a multi-thin-layer structure |
| 06/01/2004 | US6744520 Method for measuring two-dimensional displacement using conjugate optics |
| 06/01/2004 | US6744517 Combining interference fringe patterns to a moire fringe pattern |
| 06/01/2004 | US6744499 Calibration methods for placement machines incorporating on-head linescan sensing |
| 06/01/2004 | US6744497 Integrated circuit image sensor for wheel alignment systems |
| 06/01/2004 | US6744380 Apparatus for monitoring area adjacent to vehicle |
| 06/01/2004 | US6744228 High-speed precision positioning apparatus |
| 06/01/2004 | US6743338 Supporting moving web against measuring area on reference surface of reference part such that web stays supported against reference surface in measuring area, despite vibrations generated while it moves; accuracy in measurement |
| 05/27/2004 | WO2004044831A1 System and method for bump height measurement |
| 05/27/2004 | WO2004044566A1 Device and method for the recording of the surface characteristics of a fibrous structured long object |
| 05/27/2004 | WO2004044523A1 Structured light projector |
| 05/27/2004 | WO2004044522A1 Three-dimensional shape measuring method and its device |
| 05/27/2004 | WO2004043653A1 Device for correcting reference position for transfer mechanism, and correction method |
| 05/27/2004 | WO2004034041B1 Method and apparatus for the optical evaluation of a paper surface |
| 05/27/2004 | WO2004023783A3 Single-camera tracking of an object |
| 05/27/2004 | WO2004015455A9 Improved method and system for scanning apertureless fluorescence microscope |
| 05/27/2004 | WO2003076891A3 Moiré method and measuring system for measuring the distortion of an optical imaging system |
| 05/27/2004 | WO2002038474A8 Device for continuously unwinding objects with rotational symmetry, use for visual inspection and control |
| 05/27/2004 | WO2000066969A3 Interferometry system having a dynamic beam-steering assembly for measuring angle and distance |
| 05/27/2004 | US20040102764 Laser ablation |
| 05/27/2004 | US20040101255 Method and apparatus for analyzing the end face of a multifiber ferrule |
| 05/27/2004 | US20040101099 Surface inspection method and surface inspection apparatus |
| 05/27/2004 | US20040100639 Method and system for obtaining three-dimensional surface contours |
| 05/27/2004 | US20040100630 Particle size distribution analyzer |
| 05/27/2004 | US20040100217 Transmission detector for a window body in particular the windshield of a motor vehicle and a cleaning device for a viewing area of a window body |
| 05/27/2004 | US20040099823 Device for inspecting and testing a single glass pane, an insulating glass element or a laminated glass |
| 05/27/2004 | US20040099819 Position detection apparatus, position detection method, electronic part carrying apparatus, and electronic beam exposure apparatus |
| 05/27/2004 | US20040099807 Method of measuring thickness of an opaque coating using infrared absorbance |
| 05/27/2004 | US20040099799 Fine displacement detection device by sound or the like |
| 05/27/2004 | US20040099710 Optical ball height measurement of ball grid arrays |
| 05/27/2004 | DE19949044B4 Vorrichtung zur Feinfokussierung eines Objektives in einem optischen Sytstem und Koordinaten-Messgerät mit einer Vorrichtung zur Feinfokussierung eines Objektivs An apparatus for fine focusing of a lens in an optical coordinate measuring instrument Sytstem and with a device for fine focusing of a lens |
| 05/27/2004 | DE10351142A1 Interferometric measurement of thermally induced surface defects in optical components, by use of an interferometer with Fizeau and Twyman-Green arms the signals of which are superimposed to form a measurement signal |
| 05/27/2004 | DE10252647A1 Mobile robot container fork lift truck position coordinate measurement system uses optical sensors on arms fixed to a support to track single rotating light source |
| 05/27/2004 | DE10229246B4 Optoelektronische Winkelmessgerät sowie Verfahren zu dessen Herstellung Photoelectric angle measuring device and process for its preparation |
| 05/27/2004 | CA2511757A1 Structured light projector |
| 05/26/2004 | EP1422496A1 Calibration object |
| 05/26/2004 | EP1422495A1 Surface shape measurement apparatus, surface shape measurement method, surface state graphic apparatus |
| 05/26/2004 | EP1422494A1 Rapid fiber Bragg grating ( FBG ) strain sensor with reflecting/transmitting filter for acoustic emission detection |
| 05/26/2004 | EP1422491A2 Method, apparatus and program for setting a workpiece coordinate system origin in a surface property measuring machine |
| 05/26/2004 | EP1421568A1 Method for determining a model travel path |
| 05/26/2004 | EP1421409A1 Six dimensional laser tracking system and method |
| 05/26/2004 | EP1421341A1 Device for the optoelectronic detection of switching positions of a switching element |
| 05/26/2004 | EP1421340A1 Code (ring) with two pairs of periodic line patterns |
| 05/26/2004 | EP1421330A1 Method and device for measuring distances on bright metal strips |
| 05/26/2004 | EP1322937B1 Device for measuring colour, lustre and undulations on lacquered freeform surfaces |
| 05/26/2004 | EP1190209B1 Method and device for measuring the thickness of a layer |
| 05/26/2004 | CN1500290A Monitoring method of polishing state, monitor of polishing state, polishing appts, processed wafer, semiconductor device mfg. method, and semiconductor device |
| 05/26/2004 | CN1500200A Method to measure features with asymmetrical profile |
| 05/26/2004 | CN1500199A Illumination device and method for illuminating object |