Patents for B24B 57 - Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents (2,579)
05/2002
05/15/2002CN1349446A Method of conditioning wafer polishing pads
05/14/2002US6387812 Ultrasonic processing of chemical mechanical polishing slurries
05/14/2002US6387289 Planarizing machines and methods for mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies
05/14/2002US6386960 Chemical-mechanical polishing method and apparatus
05/09/2002US20020055323 Methods, apparatus and slurries for chemical mechanical planarization
05/07/2002US6383060 Method of polishing silicon wafer
05/07/2002CA2220820C Barrel polishing apparatus
05/02/2002US20020052175 Pressurized delivery method for abrasive particulate material
05/02/2002US20020052174 Polishing apparatus, cleaning apparatus to be used for such a polishing apparatus and polishing/cleaning method as well as method of making a wiring section
05/02/2002US20020052115 Method of eliminating agglomerate particles in a polishing slurry
04/2002
04/30/2002US6379538 Apparatus for separation and recovery of liquid and slurry abrasives used for polishing
04/30/2002US6379406 Water polish mixture, abrasive particles of metal oxide for ions
04/30/2002US6379235 Wafer support for chemical mechanical planarization
04/25/2002US20020049025 Method of abrading silicon substrate
04/25/2002US20020048214 Slurry dilution system with an ultrasonic vibrator capable of in-situ adjustment of slurry concentration
04/23/2002US6375551 Angstrom polishing of calcium fluoride optical VUV microlithography lens elements and preforms
04/23/2002US6375550 Method and apparatus for enhancing uniformity during polishing of a semiconductor wafer
04/23/2002CA2248910C Dispensing system and method for dispensing an aqueous solution
04/18/2002WO2002030618A1 Activated slurry cmp system and methods for implementing the same
04/18/2002US20020045412 Method for supplying slurry to polishing apparatus
04/18/2002US20020045405 Method of forming ink fill slot of ink-jet printhead
04/18/2002US20020045349 Method for chemical-mechanical-polishing a substrate
04/17/2002EP1197293A1 Polishing device and method
04/09/2002US6368512 Process for the filtration and drying of solid particles out of liquids
04/09/2002US6368194 Apparatus for controlling PH during planarization and cleaning of microelectronic substrates
04/04/2002WO2002026444A1 Wafer carrier for cmp system
04/04/2002US20020039878 Apparatus and method for feeding slurry
04/04/2002DE10045258A1 Rollenkäfig für eine Festwalzrolle Roll cage for a fixed roller
04/02/2002US6364744 CMP system and slurry for polishing semiconductor wafers and related method
03/2002
03/28/2002US20020037692 Clogging-free drain system installed in a cutting apparatus
03/28/2002US20020037682 Polishing or grinding method, processing method of optical element, processing method of fluorite, polishing or grinding apparatus, polishing and/or grinding apparatus for optical element, apparatus for processing surface of optical element, and lens
03/27/2002EP1190455A2 Dual cmp pad conditioner
03/26/2002US6361409 Polymeric polishing pad having improved surface layer and method of making same
03/26/2002US6361202 Static mixer for a viscous liquid
03/21/2002WO2002022284A1 Roller cage for a hard-rolling roller
03/21/2002US20020034922 System for real-time control of semiconductor wafer polishing
03/21/2002US20020034122 Conductivity feedback control system for slurry blending
03/19/2002US6358125 Polishing liquid supply apparatus
03/14/2002US20020029600 Roller cage for a deep rolling work roller
03/12/2002US6355184 Method of eliminating agglomerate particles in a polishing slurry
03/12/2002US6354921 System for cross stream regassifier for improved chemical mechanical polishing in the manufacture of semiconductors
03/12/2002US6354917 Method of processing a wafer utilizing a processing slurry
03/07/2002WO2002018101A2 Chemical mechanical polishing (cmp) head, apparatus, and method and planarized semiconductor wafer produced thereby
03/07/2002US20020028628 Machining center and method of changing tools thereof
03/06/2002EP1184134A2 Machining center with dressing tool
03/05/2002US6352469 Polishing apparatus with slurry screening
02/2002
02/27/2002CN1337898A Fluid dispensing fixed abrasive polishing pad
02/26/2002US6350393 Use of CsOH in a dielectric CMP slurry
02/21/2002WO2002014015A1 Retaining ring for chemical-mechanical polishing head, polishing apparatus, slurry cycle system, and method
02/21/2002US20020022441 Slurry supply apparatus and method
02/21/2002US20020022440 Supply of controlled amount of polishing slurry to semiconductor wafers
02/21/2002US20020020714 Precision liquid mixing apparatus and method
02/21/2002US20020020690 Dewatered CMP polishing compostions and methods for using same
02/21/2002US20020020495 Apparatus and methods for chemical-mechanical polishing of semiconductor wafers
02/20/2002EP1180068A2 Method and device for rounding edges
02/14/2002WO2001064354A3 Method for repairing and lustering defects on hydrophilic coat surface
02/14/2002US20020019197 Method and apparatus for controlling pH during planarization and cleaning of microelectronic substrates
02/14/2002US20020017063 Polycrystalline diamond powder and at least one additive of: oxidizing agents, complex-forming agents, surfactants and organic bases; planarizing precious metals for use as electrode and barrier material in intergrated circuits
02/12/2002US6346032 Fluid dispensing fixed abrasive polishing pad
02/12/2002US6346031 Method of metering fluid polishing agents and metering apparatus for same
02/07/2002US20020016131 System for real-time control of semiconductor wafer polishing
02/07/2002US20020016066 Method and apparatus for detecting polishing endpoint with optical monitoring
02/07/2002US20020014448 Grinding slurry recycling apparatus
02/06/2002CN1078835C Buffing method and buffing apparatus
01/2002
01/30/2002EP1175964A2 Polishing surface temperature conditioning system for a chemical mechanical planarization process
01/22/2002US6340327 Wafer polishing apparatus and process
01/17/2002WO2000060645A3 Dual cmp pad conditioner
01/17/2002US20020005504 Ta barrier slurry containing an organic additive
01/16/2002EP1171264A1 Method of conditioning wafer polishing pads
01/15/2002US6338671 Apparatus for supplying polishing liquid
01/15/2002US6338670 Method and system of manufacturing slurry for polishing, and method and system of manufacturing semiconductor devices
01/15/2002US6338669 Polishing device
01/15/2002US6338667 System for real-time control of semiconductor wafer polishing
01/10/2002US20020002798 CMP polishing slurry dewatering and reconstitution
01/08/2002US6336850 Slurry dispenser and polishing apparatus
01/03/2002WO2002001618A1 Slurry recycling system and method for cmp apparatus
01/03/2002WO2001041973A3 Chemical-mechanical polishing method
01/03/2002US20020001956 Method for supplying slurry to a semiconductor processing machine
01/03/2002US20020000322 Flow completion system
01/03/2002US20020000315 Flow completion apparatus
12/2001
12/27/2001WO2000062977A9 Method of conditioning wafer polishing pads
12/27/2001US20010055942 Polishing method using a reconstituted dry particulate polishing composition
12/25/2001US6332835 Polishing apparatus with transfer arm for moving polished object without drying it
12/20/2001DE10027303A1 Verfahren und Vorrichtung zum Schleifen der Kanten von plattenförmigen Werkstücken Method and apparatus for grinding the edges of plate-shaped workpieces
12/18/2001US6331136 CMP pad conditioner arrangement and method therefor
12/13/2001US20010051433 Chemical mechanical polishing using cesium hydroxide
12/13/2001US20010050142 Chemical-mechanical polishing apparatus with megasonic energy slurry supply system
12/12/2001EP1162033A1 Edge grinding method and apparatus
12/06/2001WO2001091974A1 Method and apparatus for conditioning a polish pad and for dispensing slurry
12/06/2001WO2001091973A1 Method and apparatus for dispensing slurry at the point of polish
12/06/2001US20010047978 Using plates which rotate in opposite directions and are covered with polishing cloth, so that at least 2 mu m of semiconductor material is removed; accuracy
12/05/2001CN1324906A Polishing liquid for structurizing treatment of metal and metal oxide and method thereof
11/2001
11/29/2001WO2001089767A2 A chemical-mechanical polishing system for the manufacture of semiconductor devices
11/29/2001DE10024874A1 Polierflüssigkeit und Verfahren zur Strukturierung von Metallen und Metalloxiden Polishing liquid and method for patterning of metals and metal oxides
11/29/2001DE10023002A1 Verfahren zur beidseitigen Politur von Halbleiterscheiben und Läuferscheiben zur Durchführung des Verfahrens Method for two-sided polishing of semiconductor wafers and rotor disks for performing the method
11/27/2001US6322710 Slurry managing system and slurry managing method
11/22/2001WO2001032358A3 Method and device for rounding edges
11/22/2001US20010044265 Method and apparatus for supplying chemical-mechanical polishing slurries
11/22/2001US20010044264 Polishing composition
11/22/2001US20010044260 CMP polishing slurry dewatering and reconstitution
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