Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2013
05/29/2013CN202957223U Sunken standard mechanical interface device
05/29/2013CN202957222U V-shaped arm correcting tool
05/29/2013CN202957221U Charging mechanism for packaging and stamping
05/29/2013CN202956584U Photomask positioning structure and photomask box
05/29/2013CN1960001B 半导体器件及其制造方法 Semiconductor device and manufacturing method thereof
05/29/2013CN1925138B Organic EL element manufacturing method, organic EL element and organic EL panel
05/29/2013CN1825565B Method for manufacturing an electro-optical device
05/29/2013CN103125023A Semiconductor device and method for manufacturing same
05/29/2013CN103125018A Method for manufacturing semiconductor device and electrical equipment
05/29/2013CN103125017A Etching fluid composition and etching method
05/29/2013CN103125016A Silicon substrate having textured surface, solar cell having same, and method for producing same
05/29/2013CN103125015A 蚀刻方法 Etching method
05/29/2013CN103125014A Semiconductor device with a gate stack
05/29/2013CN103125013A Systems and methods for selective tungsten deposition in vias
05/29/2013CN103125012A Substrate treatment system
05/29/2013CN103124999A Conductive particles, anisotropic conductive material and connection structure
05/29/2013CN103124929A Pattern forming method, substrate manufacturing method, and mold manufacturing method
05/29/2013CN103124928A Pattern forming method
05/29/2013CN103124811A Method for growing GaN crystal and GaN crystal substrate
05/29/2013CN103124805A Sputtering target, method for manufacturing sputtering target, and method for forming thin film
05/29/2013CN103124734A Hydrosilane derivative, method for producing same, and method for producing silicon-containing thin film
05/29/2013CN103124691A Directionally recrystallized graphene growth substrates
05/29/2013CN103124617A 工业用机器人 Industrial robot
05/29/2013CN103124615A Cerium-based abrasive
05/29/2013CN103123948A Low-bending silicon-based III-nitride epitaxial wafer and growth method thereof
05/29/2013CN103123936A Semiconductor element, method for manufacturing semiconductor element, and semiconductor device including semiconductor element
05/29/2013CN103123935A NLDMOS (N-type laterally diffused metal oxide semiconductor) device and manufacturing method thereof
05/29/2013CN103123934A Gallium-nitride-based high electronic mobility transistor structure with barrier layer and manufacture method thereof
05/29/2013CN103123931A Parasitic N-I-P type PIN device structure in BiCMOS (bipolar complementary metal oxide semiconductor) process and manufacturing method of structure
05/29/2013CN103123928A Germanium-silicon heterojunction bipolar transistor (HBT) single tube structure, manufacture method thereof and germanium-silicon HBT multi-finger structure
05/29/2013CN103123920A Electronic assembly apparatus and associated methods
05/29/2013CN103123917A Conductive structure and method for forming the same
05/29/2013CN103123916A Semiconductor device, electronic device, and semiconductor device manufacturing method
05/29/2013CN103123915A Adjusting sizes of connectors of package components
05/29/2013CN103123913A Process method for reducing failure rate of split flash unit by thinning wafer
05/29/2013CN103123912A Method for manufacturing top gate TFT (thin film transistor) array substrate
05/29/2013CN103123911A Pixel structure and method for manufacturing the same
05/29/2013CN103123910A Array substrate, manufacture method of array substrate and display device
05/29/2013CN103123909A Aluminum interconnecting wire and preparation method thereof
05/29/2013CN103123908A Manufacture method of dielectric layers before being metalized
05/29/2013CN103123907A Heat treated substrate load-bearing device
05/29/2013CN103123906A Reaction device for processing wafer, electrostatic chuck and wafer temperature control method
05/29/2013CN103123905A Rapid heat processing device and method
05/29/2013CN103123904A Pretreatment method for measuring metal impurities on surface of silicon slice
05/29/2013CN103123903A Bridge rectifier DIP (Double In-line Package) brush coating process
05/29/2013CN103123902A Semiconductor layer structure, polysilicon thin film transistor, manufacturing method and display device
05/29/2013CN103123901A N/p boundary effect reduction for metal gate transistors
05/29/2013CN103123900A FinFET (field effect transistor) device manufacturing method
05/29/2013CN103123899A FinFET (field effect transistor) device manufacturing method
05/29/2013CN103123898A Manufacturing method for super junction double diffusion metal-oxide semiconductor device
05/29/2013CN103123897A Method for fabricating schottky device
05/29/2013CN103123896A Preparation method of non-photosensitive polyimide passivation layer
05/29/2013CN103123895A Relaxation of strained layers
05/29/2013CN103123894A Method for forming P-type semi-conductor thin layers and N-type semi-conductor thin layers arranged alternatively
05/29/2013CN103123893A Process method for improving super junction product yield
05/29/2013CN103123429A Array substrate for fringe field switching mode liquid crystal display device and method for fabricating the same
05/29/2013CN103123428A Thin film transistor (TFT)-liquid crystal display (LCD) array substrate and production method thereof
05/29/2013CN103123328A Impurity analysis method of hydrofluoric acid solution used in semiconductor wafer technology and management method of replacement period of the hydrofluoric acid solution
05/29/2013CN103122485A 氮化物半导体晶片 The nitride semiconductor wafer
05/29/2013CN103121799A Sputtering target, transparent conductive film and transparent conductive glass substrate
05/29/2013CN103121012A Semiconductor test apparatus
05/29/2013CN102386079B Manufacturing method of high K grid dielectric layer and method for forming MOS (Metal Oxide Semiconductor) transistor
05/29/2013CN102386073B Method for preparing InAsSb quantum dots
05/29/2013CN102376601B Detection method and structure for deviation of contact hole
05/29/2013CN102376600B Evaluation method for failure of contact hole
05/29/2013CN102341899B Leadless array plastic package with various IC packaging configurations
05/29/2013CN102339760B Method for manufacturing packaged structures
05/29/2013CN102332434B Semiconductor structure and method of forming devices
05/29/2013CN102280465B Resistive random access memory device and manufacturing method thereof
05/29/2013CN102214624B Semiconductor structure with through holes and manufacturing method thereof
05/29/2013CN102214567B Method for forming grooves
05/29/2013CN102208393B Semiconductor element and forming method thereof
05/29/2013CN102208359B Method and apparatus of patterning semiconductor device
05/29/2013CN102201324B Method and system for manufacturing semiconductor
05/29/2013CN102194722B Organic electroluminescent display and detection method thereof
05/29/2013CN102176238B Limiter and semiconductor device using the same
05/29/2013CN102163618B Field effect transistor and production method of spacer structure
05/29/2013CN102160143B Method for producing semiconductor substrate
05/29/2013CN102157496B Contact hole test device and method for testing leakage current of grid by active area contact hole
05/29/2013CN102142357B Plasma processing apparatus
05/29/2013CN102132393B Substrate-processing apparatus and method of transferring substrate in same
05/29/2013CN102122632B Method for forming dielectric film with low k-value
05/29/2013CN102097384B Method for manufacturing storage device
05/29/2013CN102097380B Method for forming CMOS (Complementary Metal Oxide Semiconductor) structure
05/29/2013CN102084482B Method of fabricating a semiconductor package or circuit assembly using a fluxing underfill composition applied to solder contact points in a dip process
05/29/2013CN102082072B Gas injection device and processing chamber equipped with the gas injection device
05/29/2013CN102074561B Groove metal-oxide semiconductor field effect transistor and manufacture method thereof
05/29/2013CN102074534B Micro PCB radio frequency module and packaging method thereof
05/29/2013CN102074459B Method for fabricating semiconductor device
05/29/2013CN102067340B Semiconductor light-emitting device with passivation in p-type layer
05/29/2013CN102064109B Thin film transistor and manufacturing method thereof
05/29/2013CN102057482B Wiring board and liquid crystal display device
05/29/2013CN102054777B Method for manufacturing semiconductor device
05/29/2013CN102054770B Method for manufacturing complementary metal-oxide semiconductor (CMOS) image sensor
05/29/2013CN102054761B Semiconductor structure and method for forming dual-damascene structure
05/29/2013CN102034834B Semiconductor device, electronic apparatus, and manufacturing methods thereof
05/29/2013CN102033423B Device and method for calibrating photoetching tool
05/29/2013CN102024759B 半导体装置及其制造方法 Semiconductor device and manufacturing method
05/29/2013CN102015127B Methods of manufacturing capacitive electromechanical transducer and capacitive electromechanical transducers
05/29/2013CN102007585B Thin film transistor and method for manufacturing the same