| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 09/09/2003 | US6615465 Method for producing an acceleration sensor |
| 09/04/2003 | WO2003073805A2 Improved patching methods and apparatus for fabricating memory modules |
| 09/04/2003 | WO2003073620A1 Floor planning for programmable gate array having embedded fixed logic circuitry |
| 09/04/2003 | WO2003073570A1 Quantum nano-composite semiconductor laser and quantum nano-composite array |
| 09/04/2003 | WO2003073565A2 Long wavelength vcsel comprising a tunnel junction with carbon doped gaassb |
| 09/04/2003 | WO2003073514A1 Group iii-v nitride semiconductor multilayer structure and its production process |
| 09/04/2003 | WO2003073511A1 Dual trench isolation for a phase-change memory cell and method of making same |
| 09/04/2003 | WO2003073509A1 Bipolar transistor structure |
| 09/04/2003 | WO2003073508A1 Circuit for generating a reference voltage having low temperature dependency |
| 09/04/2003 | WO2003073505A1 Integrated circuit device and method of manufacturing thereof |
| 09/04/2003 | WO2003073499A1 Floating gate memory cell, floating gate memory arrangement, switching circuit arrangement, and method for producing a floating gate memory cell |
| 09/04/2003 | WO2003073498A1 Process for producing semiconductor device |
| 09/04/2003 | WO2003073497A1 Treatment subject receiving vessel body, and treating system |
| 09/04/2003 | WO2003073496A1 Method of operating substrate processing device |
| 09/04/2003 | WO2003073495A1 Method of carrying substrate |
| 09/04/2003 | WO2003073494A2 Method of controlling metal etch processes, and system for accomplishing same |
| 09/04/2003 | WO2003073493A1 Probe area setting method and probe device |
| 09/04/2003 | WO2003073492A1 Method for processing substrate |
| 09/04/2003 | WO2003073491A1 Method of forming layers of oxide of different thicknesses on a surface of a substrate |
| 09/04/2003 | WO2003073490A1 Shower head structure for processing semiconductor |
| 09/04/2003 | WO2003073488A1 Method for dividing semiconductor wafer |
| 09/04/2003 | WO2003073487A1 Heat treatment system |
| 09/04/2003 | WO2003073486A1 Heat treatment device and heat treatment method |
| 09/04/2003 | WO2003073485A1 Cooling device and heat treating device using the same |
| 09/04/2003 | WO2003073484A1 Crystal manufacturing method |
| 09/04/2003 | WO2003073483A1 Heating device for manufacturing semiconductor |
| 09/04/2003 | WO2003073482A2 Process for forming isolated integrated inductive circuits |
| 09/04/2003 | WO2003073481A2 Feedforward and feedback control of semiconductor fabrication process using secondary electron microscopy and a focused ion beam system |
| 09/04/2003 | WO2003073479A1 Substrate support |
| 09/04/2003 | WO2003073478A2 Plasma-resistant, welded aluminum structures for use in semiconductor processing apparatus |
| 09/04/2003 | WO2003073477A2 Tiered structure having a multi-layered resist stack |
| 09/04/2003 | WO2003073471A2 POWER SiC DEVICES HAVING RAISED GUARD RINGS |
| 09/04/2003 | WO2003073468A2 Silicon carbide bipolar junction transistor with overgrown base region |
| 09/04/2003 | WO2003073460A1 Faraday shields and plasma wafer processing |
| 09/04/2003 | WO2003073448A2 Control of semiconductor fabrication process using scanning electron microscopy and a focused ion beam device |
| 09/04/2003 | WO2003073441A1 Process of producing multicrystalline silicon substrate and solar cell |
| 09/04/2003 | WO2003073357A1 Methods and apparatus for fabricating chip-on-board modules |
| 09/04/2003 | WO2003073356A1 Memory module assembly using partially defective chips |
| 09/04/2003 | WO2003073169A2 Fluorinated molecules and methods of making and using same |
| 09/04/2003 | WO2003073167A1 Photosensitive resin composition |
| 09/04/2003 | WO2003073166A1 Critical dimension control using full phase and trim masks |
| 09/04/2003 | WO2003073165A2 Self-aligned pattern formation using dual wavelengths |
| 09/04/2003 | WO2003073164A2 Novel planarization method for multi-layer lithography processing |
| 09/04/2003 | WO2003073085A1 Surface foreign matters inspecting device |
| 09/04/2003 | WO2003073055A1 Temperature measuring system, heating device using it and production method for semiconductor wafer, heat ray insulating translucent member, visible light reflection membner, exposure system-use reflection mirror and exposure system, and semiconductor device produced by using them and vetical heat treating device |
| 09/04/2003 | WO2003072856A1 Process for producing group iii nitride compound semiconductor |
| 09/04/2003 | WO2003072853A2 Apparatus with processing stations for manually and automatically processing microelectronic workpieces |
| 09/04/2003 | WO2003072850A1 Semiconductor or liquid crystal producing device |
| 09/04/2003 | WO2003072846A1 A method of depositing a barrier layer |
| 09/04/2003 | WO2003072683A1 Slurry and method for chemical mechanical polishing of metal structures including refractory metal based barrier layers |
| 09/04/2003 | WO2003072673A2 Adhesive compositions containing organic spacers and methods for use thereof |
| 09/04/2003 | WO2003072672A1 Method and composition for polishing a substrate |
| 09/04/2003 | WO2003072670A1 Improved chemical-mechanical polishing slurry for polishing of copper or silver films |
| 09/04/2003 | WO2003072669A2 Polishing composition |
| 09/04/2003 | WO2003072460A1 Wafer container cushion system |
| 09/04/2003 | WO2003072325A1 Ceramic multilayer substrate manufacturing method and unfired composite multilayer body |
| 09/04/2003 | WO2003072306A1 Polishing apparatus and method for detecting foreign matter on polishing surface |
| 09/04/2003 | WO2003072305A1 Method and system for controlling the chemical mechanical polishing of substrates by calculating an overpolishing time and/or a polishing time of a final polishing step |
| 09/04/2003 | WO2003072288A1 Connection comprising a diffusion soldered junction, and method for the production thereof |
| 09/04/2003 | WO2003065443A3 Probe station |
| 09/04/2003 | WO2003052890B1 Processing a memory link with a set of at least two laser pulses |
| 09/04/2003 | WO2003050868A3 Method for producing a layered assembly and a layered assembly |
| 09/04/2003 | WO2003041162A3 Method of forming reliable cu interconnects |
| 09/04/2003 | WO2003038487A3 Improvements in and relating to optoelectronic devices |
| 09/04/2003 | WO2003028091A3 Copper interconnect barrier layer structure and formation method |
| 09/04/2003 | WO2003023818A3 Electromechanical memory having cell selection circuitry constructed with nanotube technology |
| 09/04/2003 | WO2003022732A3 Method for the production of a membrane |
| 09/04/2003 | WO2003019618A3 Plasma treating apparatus and plasma treating method |
| 09/04/2003 | WO2003017336A3 Dram trench capacitor and method of making the same |
| 09/04/2003 | WO2003015896A3 Apparatus for and method of trapping products in exhaust gas |
| 09/04/2003 | WO2003007393A3 Semiconductor structures comprising a piezoelectric material and corresponding processes and systems |
| 09/04/2003 | WO2003005452A3 Power mosfet having a trench gate electrode and method of making the same |
| 09/04/2003 | WO2003001604A3 Double gated transistor and method of fabrication |
| 09/04/2003 | WO2002097864A3 Low temperature load and bake |
| 09/04/2003 | WO2002080263A3 Flip chip interconnection using no-clean flux |
| 09/04/2003 | WO2002061808A3 Heat treatment apparatus and wafer support ring |
| 09/04/2003 | WO2002059943A3 Chemical mechanical polishing of copper-oxide damascene structures |
| 09/04/2003 | WO2002058152A3 Electronic circuit device and method for manufacturing the same |
| 09/04/2003 | WO2002027782A3 Fault detection method and apparatus using multiple dimension measurements |
| 09/04/2003 | WO2002015236A3 Wafer area pressure control |
| 09/04/2003 | WO2002009153A3 Method of fabricating integrated circuits, providing improved so-called 'saw bow' conductive tracks |
| 09/04/2003 | WO2002005318A3 High density giant magnetoresistive memory cell |
| 09/04/2003 | US20030167452 Design system of semiconductor integrated circuit element, program, program product, design method of semiconductor integrated circuit element, and semiconductor integrated circuit element |
| 09/04/2003 | US20030167451 Method, apparatus and program for designing a semiconductor integrated circuit |
| 09/04/2003 | US20030167102 Valve/sensor assemblies |
| 09/04/2003 | US20030166990 Radiation delivery catheters and dosimetry methods |
| 09/04/2003 | US20030166828 Polyamic-imide polymer |
| 09/04/2003 | US20030166746 Organic component comprises long-chain cycloaliphatic epoxy resin, short-chain cycloaliphatic epoxy resin, cyanate ester, lewis acid catalyst; useful in die attach adhesives, underfills, encapsulants, via fills, prepreg binders |
| 09/04/2003 | US20030166482 Composition for stripping resists |
| 09/04/2003 | US20030166390 Pedestal |
| 09/04/2003 | US20030166384 Polisher for polishing end surface of semiconductor wafer |
| 09/04/2003 | US20030166382 Integrated system for processing semiconductor wafers |
| 09/04/2003 | US20030166381 Chemical mechanical polishing slurry and chemical mechanical polishing method using the same |
| 09/04/2003 | US20030166380 Chemical-mechanical polishing device, damascene wiring forming device, and dama-scene wiring forming method |
| 09/04/2003 | US20030166356 Method and apparatus for forming modular sockets using flexible interconnects and resulting structures |
| 09/04/2003 | US20030166346 Methods of fabricating capacitors including TA2O5 layers in a chamber including changing a TA2O5 layer to heater separation or chamber pressure |
| 09/04/2003 | US20030166345 Method of improving an etching profile in dual damascene etching |
| 09/04/2003 | US20030166344 Method for manufacturing a semiconductor device |
| 09/04/2003 | US20030166341 Semiconductor device manufacturing method |
| 09/04/2003 | US20030166339 CMP system for metal deposition |