Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/2004
02/10/2004US6688957 Substrate polishing article
02/10/2004US6688948 Wafer surface protection method
02/10/2004US6688923 Power-interface assembly of susceptor for use in semiconductor fabrication apparatus
02/10/2004US6688840 Transport apparatus and method
02/10/2004US6688662 Detection and handling of semiconductor wafers and wafer-like objects
02/10/2004US6688604 Sealing mechanism for sealing a vacuum chamber
02/10/2004US6688584 Compound structure for reduced contact resistance
02/10/2004US6688520 Authentication circuit, semiconductor device, process for operating the same, IC card, and process for operating the same
02/10/2004US6688472 Container for electric device
02/10/2004US6688453 Railing for a boat conveyor system
02/10/2004US6688375 Wall thermally isolates sections; vacuum deposition of t films; vacuum sealable passages
02/10/2004US6688344 Container flush and gas charge system and method
02/10/2004US6688300 Techniques for dicing substrates during integrated circuit fabrication
02/10/2004US6688189 Robot
02/10/2004US6688155 Calibration element for adjustable nozzle
02/10/2004US6688020 Substrate processing apparatus
02/10/2004US6687990 Sawing method employing multiple indexing techniques and semiconductor device structures fabricated thereby
02/10/2004US6687988 Method for forming pin-form wires and the like
02/10/2004US6687987 Electro-fluidic assembly process for integration of electronic devices onto a substrate
02/10/2004US6687983 Non leadframe clamping for matrix leadless leadframe package molding
02/10/2004US6687980 Apparatus for processing flexible tape for microelectronic assemblies
02/10/2004US6687973 Optimized metal fuse process
02/10/2004CA2196770C Method for directly depositing metal containing patterned films
02/10/2004CA2178389C Solid state array with supplementary crossover structure
02/05/2004WO2004012483A1 Inductively coupled plasma generator having lower aspect ratio
02/05/2004WO2004012301A2 Method of curing an anisotropic conductive compound
02/05/2004WO2004012300A2 Anisotropic conductive compound
02/05/2004WO2004012274A1 Semiconductor structure for imaging detectors
02/05/2004WO2004012272A1 Spin transistor using spin filter effect and nonvolatile memory using spin transistor
02/05/2004WO2004012271A1 Field effect transistor
02/05/2004WO2004012268A1 Soi wafer manufacturing method
02/05/2004WO2004012265A1 Method and apparatus for electronically aligning capacitively coupled chip pads
02/05/2004WO2004012259A1 Substrate processing container
02/05/2004WO2004012258A1 Method of monitoring defect occurring condition and device therefor
02/05/2004WO2004012257A1 Method and apparatus for manufacturing net shape semiconductor wafers
02/05/2004WO2004012256A1 Process for manufacturing mosfets using amorphous carbon replacement gate and structures formed in accordance therewith
02/05/2004WO2004012255A1 Method for forming a polysilicon gate in two dry-etching steps
02/05/2004WO2004012254A1 Semiconductor device manufacturing device
02/05/2004WO2004012253A1 Method and device for laser beam processing of silicon substrate, and method and device for laser beam cutting of silicon wiring
02/05/2004WO2004012252A1 Method for forming insulating layer
02/05/2004WO2004012250A1 Method for detecting defect of silicon wafer
02/05/2004WO2004012248A1 Polishing fluid and polishing method
02/05/2004WO2004012247A1 Method for manufacturing semiconductor device
02/05/2004WO2004012246A2 Method for reducing pattern deformation and photoresist poisoning in semiconductor device fabrication
02/05/2004WO2004012244A1 Light conducting device
02/05/2004WO2004012243A2 Selective placement of dislocation arrays
02/05/2004WO2004012242A1 Hydrophilic components for a spin-rinse-dryer
02/05/2004WO2004012241A2 Radiation hardened visible p-i-n detector
02/05/2004WO2004012240A2 Method for enhancing critical dimension uniformity after etch
02/05/2004WO2004012237A2 Methods of forming interfacial layers for high-k gates by ozone oxidation
02/05/2004WO2004012235A2 Atmospheric pressure plasma processing reactor
02/05/2004WO2004012234A2 Superlattice nanopatterning of wires and complex patterns
02/05/2004WO2004012232A2 Forming bilayer resist patterns
02/05/2004WO2004012230A2 Dynamic targeting for a process control system
02/05/2004WO2004012229A2 Reduced volume, high conductance process chamber
02/05/2004WO2004012227A2 Method for producing by vapour-phase epitaxy a gallium nitride film with low defect density
02/05/2004WO2004012226A2 Method for making an anisotropic conductive polymer film on a semiconductor wafer
02/05/2004WO2004012221A2 Method for adjusting voltage on a powered faraday shield
02/05/2004WO2004012220A2 Methods and apparatus for monitoring plasma parameters in plasma doping systems
02/05/2004WO2004012219A1 Adjustable implantation angle workpiece support structure for an ion beam implanter
02/05/2004WO2004012207A2 Optical device for high energy radiation
02/05/2004WO2004012197A2 Magnetoresistive random access memory with soft magnetic reference layer
02/05/2004WO2004012107A2 Integrated circuit devices and methods and apparatuses for designing integrated circuit devices
02/05/2004WO2004011953A1 Spiral chuck
02/05/2004WO2004011695A2 Sublimation system employing carrier gas
02/05/2004WO2004011693A1 Atomic deposition layer methods
02/05/2004WO2004011691A1 Copper sputtering targets and methods of forming copper sputtering targets
02/05/2004WO2004011509A1 Fluorinated polymers, photoresists and processes for microlithography
02/05/2004WO2004011258A2 Method of forming and repairing a lithographic template having a gap defect
02/05/2004WO2004011248A1 Carbon fiber composite transfer member with reflective surfaces
02/05/2004WO2004011177A2 Building a three-dimensional structure by manipulating individual particles
02/05/2004WO2003103056A3 Trench-gate semiconductor device,corresponding module and apparatus ,and method of operating the device
02/05/2004WO2003103032A3 A method for making a semiconductor device having a high-k gate dielectric
02/05/2004WO2003096357A3 Electrically resistant diamond-based component
02/05/2004WO2003093494A3 Apparatus including ion transport detecting structures and methods of use
02/05/2004WO2003092051A3 Barrier for capacitor over plug structures
02/05/2004WO2003092044A3 Method and apparatus for simplified system configuration
02/05/2004WO2003092012A3 Flexible redundancy for memories
02/05/2004WO2003090258A3 Laser machining
02/05/2004WO2003087233A3 Polymeric antireflective coatings deposited by plasma enhanced chemical vapor deposition
02/05/2004WO2003081337A3 Device for manipulation of the angular position of an object relative to a fixed structure
02/05/2004WO2003065457A3 Cluster packaging of light emitting diodes
02/05/2004WO2003062136A3 Method and system for locally connecting microstructures
02/05/2004WO2003060919A3 Resistive memory elements with reduced roughness
02/05/2004WO2003058693A3 Method for producing a capacitor
02/05/2004WO2003052511A3 Imaging device in a projection exposure facility
02/05/2004WO2003049120A3 Magnetoresistive memory cell comprising a dynamic reference layer
02/05/2004WO2003046951B1 Performance polymer film insert molding for fluid control devices
02/05/2004WO2003044858A3 Semiconductor device and method of enveloping an integrated circuit
02/05/2004WO2003032374A3 Workpiece carrier with adjustable pressure zones and barriers
02/05/2004WO2003025804A3 Structures and methods for selectively applying a well bias to portions of a programmable device
02/05/2004WO2002096632A3 Dual-cell soft programming for virtual-ground memory arrays
02/05/2004WO2002080274A3 Electrical discharge circuit
02/05/2004WO2002075780A3 Electronic device having dielectric material of high dielectric constant
02/05/2004US20040025139 Mask pattern and method for forming resist pattern using mask pattern thereof
02/05/2004US20040025138 Light intensity simulation method, program product, and designing method of photomask
02/05/2004US20040025135 Structures and methods for selectively applying a well bias to portions of a programmable device
02/05/2004US20040024557 Control method of an automatic integrated circuit full testing system
02/05/2004US20040024551 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture
02/05/2004US20040024489 Carrying system