Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2004
09/22/2004CN1530699A Continuous treater and treating method
09/22/2004CN1530664A Circuit analog method
09/22/2004CN1530657A Preparation of plastic micro-flow control chip with screen pores
09/22/2004CN1530471A Apparatus and utilizing method for preventing electroplating depositing copper thin membrane generating cavity
09/22/2004CN1530470A Tin-plating method
09/22/2004CN1530206A Cutter and cutting method
09/22/2004CN1530205A Reflective resistant layer for polsihig pad window
09/22/2004CN1168208C Making process and apparatus for high-frequency film bulk filter
09/22/2004CN1168148C Manufacturing method for semiconductor device and liquid crystal display device
09/22/2004CN1168147C Producing method semiconductor crystal
09/22/2004CN1168145C Semiconductor device and making method thereof
09/22/2004CN1168144C Capacitor of semiconductor storage element and its producing method
09/22/2004CN1168143C Thin wire of gold alloy and manufacture and use thereof
09/22/2004CN1168140C Semiconductor package and its making method
09/22/2004CN1168139C Thin semicondcutor device and its preparing process
09/22/2004CN1168138C Inverted packed sheet electronic packing piece and its producing method and electronic device therewith
09/22/2004CN1168137C Semiconductor device, method for manufacturing the same, circuit board and flexible substrate
09/22/2004CN1168134C Automatic allignment method of bit line contacting window and node conducting window
09/22/2004CN1168133C Semiconductor chip, semiconductor device and mfg. method therefor
09/22/2004CN1168132C Technology for producing semiconductor device
09/22/2004CN1168131C Method of forming copper wiring in semiconductor device
09/22/2004CN1168130C Method of forming copper wiring in semicoductor device
09/22/2004CN1168129C Carrier for testing chip
09/22/2004CN1168128C Structure of key size measuring strip
09/22/2004CN1168127C Abnormality detector for chemical and mechanical grinding
09/22/2004CN1168126C Electronic part and its manufacturing method
09/22/2004CN1168125C Copper deposit process
09/22/2004CN1168124C Technology for flatening organosilicon materials with low dielectric constant by chemicomechanical grinding
09/22/2004CN1168123C Correction of metal inlaid wiring form
09/22/2004CN1168122C Method for connecting wire structure for manufacturing capacitors and inductors simutaneously
09/22/2004CN1168121C Doping method for gas source molecular beam epitaxial growth Ge-Si heterojunction bipolar transistor material
09/22/2004CN1168120C Process for preparing Ge crystal film on non-crystal material by magnetically controlled sputtering
09/22/2004CN1168119C Electrostatic induction device and its manufacture
09/22/2004CN1168118C Film forming apparatus and method of forming crystalline silicon film
09/22/2004CN1168116C DC plasma ion implantation apparatus with grounded conducting net
09/22/2004CN1168111C Fuse circuit having zero powder draw for partially blown condition
09/22/2004CN1168097C Semiconductor device with test circuit capable of inhibiting enlargement of circuit scale
09/22/2004CN1168024C Process monitoring system for lithography lasers
09/22/2004CN1167982C 光刻胶组合物 Photoresist composition
09/22/2004CN1167518C Micro-environment reactor for processing microelectronic workpiece
09/22/2004CN1167497C Device and method for point of use treatment of effluent gas streams
09/21/2004US6795956 Semiconductor device, and method and program for designing the same
09/21/2004US6795952 System and method for product yield prediction using device and process neighborhood characterization vehicle
09/21/2004US6795948 Weighted random pattern test using pre-stored weights
09/21/2004US6795800 Simplified method for extracting model parameter sets and method for statistically simulating integrated circuit using the same
09/21/2004US6795745 Methods of operating vacuum processing equipment and methods of processing wafers
09/21/2004US6795480 Semiconductor laser device
09/21/2004US6795471 Group III nitride compound semiconductor laser and manufacturing method thereof
09/21/2004US6795470 Semiconductor laser light source with photocurrent feedback control for single mode operation
09/21/2004US6795469 Semiconductor laser element
09/21/2004US6795456 157 nm laser system and method for multi-layer semiconductor failure analysis
09/21/2004US6795358 Semiconductor integrated circuit device
09/21/2004US6795353 Generating high voltages in nonvolatile memory devices and data processing systems
09/21/2004US6795351 Memory having storage means
09/21/2004US6795348 Method and apparatus for erasing flash memory
09/21/2004US6795345 Non-volatile semiconductor memory device having an increased access speed while maintaining the production yield
09/21/2004US6795340 Non-volatile magnetic memory
09/21/2004US6795339 Thin film magnetic memory device having communication function, and distribution management system and manufacturing step management system each using thereof
09/21/2004US6795336 Magnetic random access memory
09/21/2004US6795335 Thin film magnetic memory device for conducting data write operation by application of a magnetic field
09/21/2004US6795332 Semiconductor memory device with memory cells operated by boosted voltage
09/21/2004US6795331 Ferroelectric memory wherein bit line capacitance can be maximized
09/21/2004US6795329 Memory integrated circuit
09/21/2004US6795328 Semiconductor memory device
09/21/2004US6795295 Multi-layer capacitor and method for producing the same
09/21/2004US6795292 Apparatus for regulating temperature of a process kit in a semiconductor wafer-processing chamber
09/21/2004US6795281 Magneto-resistive device including soft synthetic ferrimagnet reference layer
09/21/2004US6795202 Wafer processing apparatus having wafer mapping function
09/21/2004US6795170 Structure for attaching a pellicle to a photo-mask
09/21/2004US6795167 Projection exposure apparatus and device manufacturing method using the same
09/21/2004US6795166 Illuminator, exposure apparatus, and method for fabricating device using the same
09/21/2004US6795164 Lithographic apparatus, device manufacturing method, and device manufactured thereby
09/21/2004US6795163 Lithographic manufacturing process, lithographic projection apparatus, and device manufactured thereby
09/21/2004US6795162 Method for exposing a peripheral area of a wafer and apparatus for performing the same
09/21/2004US6795161 Exposure apparatus, method of manufacturing semiconductor devices and plant therefor
09/21/2004US6795154 Apparatus for cutting liquid crystal display panels and cutting method using the same
09/21/2004US6795133 Higher and lower definition patterning of an active plate
09/21/2004US6794921 Clamp circuit
09/21/2004US6794909 Output circuit of semiconductor device having adjustable driving capability
09/21/2004US6794898 Scan flip-flop circuit, scan flip-flop circuit array, and integrated circuit device
09/21/2004US6794891 Semiconductor integrated circuit
09/21/2004US6794890 Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested
09/21/2004US6794889 Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing
09/21/2004US6794888 Probe device
09/21/2004US6794764 Charge-trapping memory arrays resistant to damage from contact hole information
09/21/2004US6794763 Semiconductor device and method of manufacturing the same
09/21/2004US6794762 Electronic component and fabrication method thereof
09/21/2004US6794761 No-flow underfill material
09/21/2004US6794759 Semiconductor device, liquid crystal display device and method of manufacturing the semiconductor device
09/21/2004US6794758 Wiring with insulation pattern
09/21/2004US6794757 Structure and method of forming an enlarged head on a plug to eliminate the enclosure requirement
09/21/2004US6794756 Integrated circuit structure having low dielectric constant material and having silicon oxynitride caps over closely spaced apart metal lines
09/21/2004US6794755 Surface alteration of metal interconnect in integrated circuits for electromigration and adhesion improvement
09/21/2004US6794754 Semiconductor device with porous interlayer insulating film
09/21/2004US6794753 Diffusion barrier and method therefor
09/21/2004US6794752 Bonding pad structure
09/21/2004US6794751 Multi-purpose planarizing/back-grind/pre-underfill arrangements for bumped wafers and dies
09/21/2004US6794750 Semiconductor device
09/21/2004US6794749 Chip package with grease heat sink
09/21/2004US6794748 Substrate-less microelectronic package