Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/2004
10/13/2004CN1536669A Semiconductor equipemnt with capacitor and its mfg. method
10/13/2004CN1536668A Complementary metal oxide semiconductor phase reverser
10/13/2004CN1536667A 半导体装置 Semiconductor device
10/13/2004CN1536665A 半导体集成电路器件 The semiconductor integrated circuit device
10/13/2004CN1536662A 集成电路 IC
10/13/2004CN1536661A Semiconductor device
10/13/2004CN1536660A Semiconductor device and its mfg. method
10/13/2004CN1536658A Semiconductor device and its mfg. method
10/13/2004CN1536650A Method for making semiconductor integrated circuit and semiconductor integrated circuit madefrom
10/13/2004CN1536649A Method for making semiconductor device
10/13/2004CN1536648A Storage mfg. method and storage
10/13/2004CN1536647A Method for increasing capacitance of channel capacitor
10/13/2004CN1536646A Method for mfg. semiconductor device
10/13/2004CN1536645A Surface treatment method capable of improving copper metal layer structure
10/13/2004CN1536644A Method for forming metal wire of semiconductor device
10/13/2004CN1536643A Making method for multilayer semiconductor integrated circuit structure, and its circuit structure
10/13/2004CN1536642A Method for making tungsten plug
10/13/2004CN1536641A Semiconductor integrated circuit device and its mfg. method
10/13/2004CN1536640A Method for positioning substratge relatively to supporting table and its equipment
10/13/2004CN1536639A Open wafer box before prevetion of outgassing pollution and method for preventing outgassing pollution
10/13/2004CN1536638A Method for defining substrate position prelatively to supporting table and equipment
10/13/2004CN1536637A Antistatic IC element testing system
10/13/2004CN1536636A Wafer surface ion sampling system and its method
10/13/2004CN1536635A Detection card for testing semiconductor
10/13/2004CN1536634A Semiconductor chip manufacturing method
10/13/2004CN1536633A Resin sealed semiconductor, resin sealing method and forming die
10/13/2004CN1536631A Electrically-connecting pad electroplated metal layer structrure of semiconductor package base plate and its making metod
10/13/2004CN1536630A Method for mfg. vertical MOS transistor
10/13/2004CN1536629A Method for making auto-alignment contact plug
10/13/2004CN1536628A Method for mfg. semiconductor device
10/13/2004CN1536627A Method for mfg. semiconductor device, and semiconductor device
10/13/2004CN1536626A Clamping chuck equipment
10/13/2004CN1536625A Plasma etching method and equipment for making semiconductor device
10/13/2004CN1536624A Stripping device and method for protective layer
10/13/2004CN1536623A Method and device for cleaning electronic element or its mfg. equipment element
10/13/2004CN1536622A Method for preparing silicon structure on insulating body
10/13/2004CN1536621A Method for preparaing Al epitaxial layer contained semiconductor material grown on GaAs substrate
10/13/2004CN1536620A Low-temp. polycrystalline silicon film transistor and its polycrystalline silicon layer making method
10/13/2004CN1536619A Method for making low-temp. polycrstalline silicon film
10/13/2004CN1536618A Method for mfg. semiconductor device
10/13/2004CN1536617A Manufacturing device and mfg. method
10/13/2004CN1536616A Method for mfg. semiconductor, integrated circuit electro-optic device and electronic instrument
10/13/2004CN1536615A System and method for conveying small batch of substrate carrier between processing tools
10/13/2004CN1536614A Cleaning of electronic device
10/13/2004CN1536613A Substrate element and soft substrate
10/13/2004CN1536612A Gas supply device
10/13/2004CN1536611A GaAs base semiconductor-oxide insulating substrate and its preparation method
10/13/2004CN1536610A Semiconductor material with ALAs oxide layer
10/13/2004CN1536542A Panel display with thin film transistor
10/13/2004CN1536447A Photoresist removing composite
10/13/2004CN1536446A Baking system
10/13/2004CN1536445A Photoetching equipment, device mfg. method and computer program
10/13/2004CN1536440A Gray mask defect checking method
10/13/2004CN1536439A Gray mask defect correction method
10/13/2004CN1536438A Method for eliminating key size deviation of dense pattern and single pattern
10/13/2004CN1536437A Corrosion-proof film forming method and photomask making method
10/13/2004CN1536420A 有源矩阵型液晶显示器 The active matrix type liquid crystal display
10/13/2004CN1536417A Method for making liquid crystal display panel
10/13/2004CN1536101A Electric plating equipment for wafer
10/13/2004CN1536024A Porous mebrane shaping composition, porous membrane manufacturing method, porous membrane, intercalation insulating film and semiconductor device
10/13/2004CN1536023A Porous membrane shaping composition, preparation method of porous membrane, porous membrane intercalation insulating film and semiconductor device
10/13/2004CN1535935A Coating method for ceramic material and ceramic film
10/13/2004CN1535823A Working table device, film-forming device, optical element, semiconductor element and electronic device
10/13/2004CN1535765A 探针洗净装置 Probe cleaning device
10/13/2004CN1535763A Base plate processing device, coating device and coading method
10/13/2004CN1171518C Method and apparatus for processing ceramic inner piece
10/13/2004CN1171323C Magnetic element with double magnetic state
10/13/2004CN1171318C High voltage power MOSFET with low flow resistance
10/13/2004CN1171314C Semiconductor device and method for fabricating the same
10/13/2004CN1171313C Storage assembly comprised of plurality of resistive ferroelectric storage cells
10/13/2004CN1171310C 球栅阵列半导体封装 A ball grid array semiconductor package
10/13/2004CN1171307C Semiconductor apparatus and base plate
10/13/2004CN1171304C Semiconductor storage device and process for manufacturing the same
10/13/2004CN1171303C Method for making opening on bimetal inlaid structure
10/13/2004CN1171302C Device for loading and unloading substrates
10/13/2004CN1171301C Method for generating electrical conducting or semiconducting structures method for erasing same structures and electric field generator/modulator
10/13/2004CN1171299C Semiconductor device and manufacture thereof, substrate, electronic device
10/13/2004CN1171298C 半导体器件 Semiconductor devices
10/13/2004CN1171297C Apparatus for mounting semiconductor chip onto substrate
10/13/2004CN1171296C Process line for underfilling controlled collapse chip connection (C4) integrated circuit package
10/13/2004CN1171295C Assembling method for monolithic electronic member and monolithic electronic member
10/13/2004CN1171294C Manufacturing method of thin spherical grid array integrated circuit package
10/13/2004CN1171293C Method of producing a non-volatile semiconductor memory cell with a separate tunnel winidow
10/13/2004CN1171292C Method for making base region and developing emitter window in fabrication of silicon bipoly tr5ansistor, and silicon bipolay transistor
10/13/2004CN1171291C Method for forming channel insulation on semiconductor substrate
10/13/2004CN1171290C Porous insulating material and method for making same
10/13/2004CN1171289C Device structure with layer for facilitating passivation of surface states
10/13/2004CN1171288C Removal of photoresist and residue from substrate using supercritical carbon dioxide process
10/13/2004CN1171287C Trench-open on semiconductor substrate, method for making deep slot and opening contact hole
10/13/2004CN1171286C Formation of bottle shaped trench
10/13/2004CN1171285C Semiconductor structure and mfg. method therefor storage unit array and mfg. method
10/13/2004CN1171284C Manufacture of grid electrode conductor layer cavity fuse
10/13/2004CN1171257C Method for mfg. ceramic capacitor and ceramic capacitor
10/13/2004CN1171238C Memory array with reduced charging current
10/13/2004CN1171178C Flip-chip mounted integrated circuit card element
10/13/2004CN1171168C Improved method for simulating silicon device on insulator
10/13/2004CN1171124C Radiation-sensitive resin composition
10/13/2004CN1171123C A process for making photoactive compound and photoresist therefrom
10/13/2004CN1171093C Ic测试装置 Ic test device
10/13/2004CN1170957C Processing chamber for atomic layer deposition processes