| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 12/20/2005 | US6977728 Projection exposure apparatus and aberration measurement method |
| 12/20/2005 | US6977716 Catadioptric lithography system and method with reticle stage orthogonal to wafer stage |
| 12/20/2005 | US6977714 Lithographic manufacturing process, lithographic projection apparatus, and device manufactured thereby |
| 12/20/2005 | US6977713 Lithographic apparatus and device manufacturing method |
| 12/20/2005 | US6977710 Display device with an adhesion layer and a thin glass layer on adhesion layer and method of manufacturing the same |
| 12/20/2005 | US6977707 Display device and wiring substrate including electric wiring formed of conductive film |
| 12/20/2005 | US6977705 Structure for reducing the diffraction effect in periodic electrode arrangements and liquid crystal device including the same |
| 12/20/2005 | US6977522 Interface device and information processing system |
| 12/20/2005 | US6977521 Field programmable gate array |
| 12/20/2005 | US6977515 Method for forming photo-defined micro electrical contacts |
| 12/20/2005 | US6977514 Probe structure |
| 12/20/2005 | US6977461 System and method for moving an object employing piezo actuators |
| 12/20/2005 | US6977442 a conductive layer with a plurality of wires; a bonding pad overlapping the wires, a protective film bridging adjacent wires in a region overlapping with the bonding pad so that a void is formed in the protective film between the adjacent wires |
| 12/20/2005 | US6977440 Stacked packages |
| 12/20/2005 | US6977438 Dual damascene circuit with upper wiring and interconnect line positioned in regions formed as two layers including organic polymer layer and low-permittivity layer |
| 12/20/2005 | US6977437 Method for forming a void free via |
| 12/20/2005 | US6977435 Thick metal layer integrated process flow to improve power delivery and mechanical buffering |
| 12/20/2005 | US6977432 Prefabricated semiconductor chip carrier |
| 12/20/2005 | US6977429 Manufacturing system and apparatus for balanced product flow with application to low-stress underfilling of flip-chip electronic devices |
| 12/20/2005 | US6977428 Semiconductor device adapted to remove noise from a signal |
| 12/20/2005 | US6977426 Semiconductor device including high speed transistors and high voltage transistors disposed on a single substrate |
| 12/20/2005 | US6977425 Semiconductor device having a lateral MOSFET and combined IC using the same |
| 12/20/2005 | US6977422 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern |
| 12/20/2005 | US6977421 Semiconductor constructions |
| 12/20/2005 | US6977419 MOSFETs including a dielectric plug to suppress short-channel effects |
| 12/20/2005 | US6977418 Low resistance semiconductor process and structures |
| 12/20/2005 | US6977417 Semiconductor device and method of fabricating the same |
| 12/20/2005 | US6977416 Semiconductor device and a method of manufacturing the same |
| 12/20/2005 | US6977415 Semiconductor device including a gate insulating film on a recess and source and drain extension regions |
| 12/20/2005 | US6977414 Semiconductor device |
| 12/20/2005 | US6977413 Bar-type field effect transistor and method for the production thereof |
| 12/20/2005 | US6977412 Trench corner effect bidirectional flash memory cell |
| 12/20/2005 | US6977411 Semiconductor device comprising transistors having control gates and floating gate electrodes |
| 12/20/2005 | US6977410 Test mode decoder in a flash memory |
| 12/20/2005 | US6977409 Flash memory having memory section and peripheral circuit section |
| 12/20/2005 | US6977408 High-performance non-volatile memory device and fabrication process |
| 12/20/2005 | US6977407 Even nucleation between silicon and oxide surfaces for thin silicon nitride film growth |
| 12/20/2005 | US6977406 Short channel insulated-gate static induction transistor and method of manufacturing the same |
| 12/20/2005 | US6977405 Semiconductor memory with memory cells comprising a vertical selection transistor and method for fabricating it |
| 12/20/2005 | US6977404 Trench DRAM with double-gated transistor and method of manufacturing the same |
| 12/20/2005 | US6977403 Semiconductor apparatus having a built-in-electric coil and a method of making the semiconductor apparatus |
| 12/20/2005 | US6977402 Memory device having storage part and thin-film part |
| 12/20/2005 | US6977401 Magnetic memory device having magnetic shield layer, and manufacturing method thereof |
| 12/20/2005 | US6977400 Silicon germanium CMOS channel |
| 12/20/2005 | US6977398 C implants for improved SiGe bipolar yield |
| 12/20/2005 | US6977397 Light emitting element and method of making same |
| 12/20/2005 | US6977394 Semiconductor device and manufacturing method therefor |
| 12/20/2005 | US6977393 Electro-optical device and manufacturing method thereof |
| 12/20/2005 | US6977392 Semiconductor display device |
| 12/20/2005 | US6977376 Method of prevention charging, and apparatus for charged particle beam using the same |
| 12/20/2005 | US6977364 System and method for compensating for dark current in photosensitive devices |
| 12/20/2005 | US6977363 Correlated double sampling circuit and CMOS image sensor including the same |
| 12/20/2005 | US6977359 controlling parameters for semiconductor wafer vacuum-processing, considering cleaning frequency of vessel; improved uniformity of thin film thickness on wafers |
| 12/20/2005 | US6977338 Underfill diffusion prevention layer of photosensitive polyimide between mounted electronic part and conductor cover layer; prevents underfill on highly wettable surface; allows high density circuit design |
| 12/20/2005 | US6977230 Methods of removing material from a semiconductor substrate |
| 12/20/2005 | US6977229 Manufacturing method for semiconductor devices |
| 12/20/2005 | US6977228 Semiconductor device using damascene technique and manufacturing method therefor |
| 12/20/2005 | US6977227 Method of etching bottle trench and fabricating capacitor with same |
| 12/20/2005 | US6977226 Semiconductor memory device and method for fabricating the same |
| 12/20/2005 | US6977225 Chemical vapor deposition of titanium from titanium tetrachloride and hydrocarbon reactants |
| 12/20/2005 | US6977224 Method of electroless introduction of interconnect structures |
| 12/20/2005 | US6977223 Three dimensional microfabrication |
| 12/20/2005 | US6977222 Pattern forming method and apparatus, and device fabrication method and device |
| 12/20/2005 | US6977221 Methods of forming an electrically conductive line |
| 12/20/2005 | US6977220 Copper alloys for interconnections having improved electromigration characteristics and methods of making same |
| 12/20/2005 | US6977219 Solvent vapor-assisted plasticization of photoresist films to achieve critical dimension reduction during temperature reflow |
| 12/20/2005 | US6977218 Method for fabricating copper interconnects |
| 12/20/2005 | US6977217 Aluminum-filled via structure with barrier layer |
| 12/20/2005 | US6977216 Method for forming metal wire in semiconductor device |
| 12/20/2005 | US6977215 Tungsten plug corrosion prevention method using gas sparged water |
| 12/20/2005 | US6977214 Die paddle clamping method for wire bond enhancement |
| 12/20/2005 | US6977213 IC chip solder bump structure and method of manufacturing same |
| 12/20/2005 | US6977212 Fabricating a semiconductor device using fully cured bisbenzocyclobutene |
| 12/20/2005 | US6977211 Selective consolidation processes for electrically connecting contacts of semiconductor device components |
| 12/20/2005 | US6977210 Method for forming bit line contact hole/contact structure |
| 12/20/2005 | US6977209 Method of manufacturing non-volatile semiconductor memory device and method for controlling same |
| 12/20/2005 | US6977208 Schottky with thick trench bottom and termination oxide and process for manufacture |
| 12/20/2005 | US6977207 Method for fabricating dual-gate semiconductor device |
| 12/20/2005 | US6977206 Heating plate crystallization method |
| 12/20/2005 | US6977205 Method for manufacturing SOI LOCOS MOSFET with metal oxide film or impurity-implanted field oxide |
| 12/20/2005 | US6977204 Method for forming contact plug having double doping distribution in semiconductor device |
| 12/20/2005 | US6977203 Method of forming narrow trenches in semiconductor substrates |
| 12/20/2005 | US6977202 Method of making a non-volatile semiconductor memory device |
| 12/20/2005 | US6977201 Method for fabricating flash memory device |
| 12/20/2005 | US6977200 Method of manufacturing split-gate memory |
| 12/20/2005 | US6977199 Method of fabricating semiconductor device |
| 12/20/2005 | US6977198 Metal-insulator-metal (MIM) capacitor and fabrication method for making the same |
| 12/20/2005 | US6977197 Semiconductor devices having DRAM cells and methods of fabricating the same |
| 12/20/2005 | US6977196 Micro-electromechanical switch fabricated by simultaneous formation of a resistor and bottom electrode |
| 12/20/2005 | US6977195 Test structure for characterizing junction leakage current |
| 12/20/2005 | US6977194 Structure and method to improve channel mobility by gate electrode stress modification |
| 12/20/2005 | US6977193 Thin film transistor manufacture method |
| 12/20/2005 | US6977192 Method of manufacturing thin film semiconductor device |
| 12/20/2005 | US6977191 Apparatus for and method of packaging semiconductor devices |
| 12/20/2005 | US6977189 Wafer scale caps located by molding |
| 12/20/2005 | US6977188 Resin encapsulation molding method of electronic part and resin encapsulation molding apparatus used therefor |
| 12/20/2005 | US6977187 Chip package sealing method |
| 12/20/2005 | US6977186 Method for manufacturing semiconductor laser optical device |
| 12/20/2005 | US6977184 Method and apparatus for nitride spacer etch process implementing in situ interferometry endpoint detection and non-interferometry endpoint monitoring |
| 12/20/2005 | US6977183 Process for locating, displaying, analyzing, and optionally monitoring potential transient defect sites in one or more integrated circuit chips of a semiconductor substrate |