Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2006
04/05/2006CN1249817C Thin-film transistor and its mfg. method, semiconductor thin-film transistor array substrate
04/05/2006CN1249816C Semiconductor device and its mfg. method
04/05/2006CN1249815C Information memory and manufacturing method therefor
04/05/2006CN1249814C Strong dielectric capacitor and mfg. method and semiconductor storage device
04/05/2006CN1249813C Single supply HFET device and method for temp. compensation
04/05/2006CN1249812C Semiconductor device and method for manufacturing semiconductor device
04/05/2006CN1249808C Non-volatile memory cell and fabrication method
04/05/2006CN1249807C Method for making mask read-only memory
04/05/2006CN1249806C Method for raising S/N ratio of semiconductor IC
04/05/2006CN1249805C Method for mfg of lens built-in type image semsor
04/05/2006CN1249804C Microstructure production method and microstructure arrangement
04/05/2006CN1249803C Method for forming isolation film of semiconductor
04/05/2006CN1249802C Mask measuring method for automatic file input
04/05/2006CN1249801C Method of measuring zero-inclination angle of water
04/05/2006CN1249800C Method of monstoring real defect through eliminating duplicate defect which does not influence acceptance raet
04/05/2006CN1249799C Embeded reliability analysis system applied to production of semiconductor products
04/05/2006CN1249798C Method for manufacturing mixed integrated circuit device
04/05/2006CN1249797C Linear conductor with air bearing
04/05/2006CN1249796C Method for short-channel transistor of semiconductor element
04/05/2006CN1249795C Method for mfg. semiconductor device
04/05/2006CN1249794C Forming method for silicide film of semiconductor element
04/05/2006CN1249793C Forming method and device for barrier layer of semiconductor element
04/05/2006CN1249792C Method for fabricating a semiconductor device having an ono film
04/05/2006CN1249791C Manufacturing method of dielectric layer
04/05/2006CN1249790C Ray sensitive compasition for preparing insulation film and display
04/05/2006CN1249789C Plasma processing container internal parts
04/05/2006CN1249788C Etching method for insulating film
04/05/2006CN1249787C Method for avoiding silicon layer etching nonuniform
04/05/2006CN1249786C Method and apparatus for plasma cleaning of workpieces
04/05/2006CN1249785C Making process of stepped opening
04/05/2006CN1249784C Process for making plane floating grid
04/05/2006CN1249783C Semiconductor device and its mfg. method
04/05/2006CN1249782C Method for reducing conductor pattern interval and structure formed thereby
04/05/2006CN1249781C Litho process applying to mask ROM coding layout
04/05/2006CN1249780C Method for growing GaN crystal chip and GaN crystal chip
04/05/2006CN1249779C Method for mfg. crystal semiconductor material and method for mfg. semiconductor
04/05/2006CN1249778C Executing system of semiconductor crystal circle manufacture with special engineering requirement database
04/05/2006CN1249777C Device and method for plasma treatment
04/05/2006CN1249776C Lining treatment system
04/05/2006CN1249775C Boxing interface device for FIMS system
04/05/2006CN1249740C Manufacturing installation for multi-layered electronic parts
04/05/2006CN1249727C An analog functional module using magnetoresistive memory technology
04/05/2006CN1249650C Displaying device having nice properties
04/05/2006CN1249649C Wiring substrate and its manufacturing method
04/05/2006CN1249564C Block interface circuit and systemic large integrated circuit
04/05/2006CN1249545C System and method of operation of digital mass flow controller
04/05/2006CN1249529C Alkaline solution manufacturing method, alkaline solution and its application, solution applying apparatus and its application
04/05/2006CN1249527C Method and apparatus for exposure
04/05/2006CN1249526C Lithographic apparatus, apparatus cleaning method, device manufacturing method and device manufactured thereby
04/05/2006CN1249525C Negative-acting aqueous photoresist composition
04/05/2006CN1249524C Photoresist composition for etch-resistant agent flowing process and method for forming contact hole using the same
04/05/2006CN1249522C Method for heating wafer and baking photoetch-resist film on wafer and its equipment
04/05/2006CN1249506C 电子电路 Electronic circuit
04/05/2006CN1249492C Substrate processing devices
04/05/2006CN1249483C Optical system with laser beam uniform irradiation
04/05/2006CN1249445C Weighted random pattern test using pre-stored weights
04/05/2006CN1249407C Detecting and early-warning system for liquid and liquid level in pipe and its application
04/05/2006CN1249401C Method and apparatus for wall film monitoring
04/05/2006CN1249399C Surface installation chip package
04/05/2006CN1249272C Single crystal and melt solid-liquid interface shape and single crystal point defect distribution simulation method
04/05/2006CN1249185C Silane containing polishing composition for CMP
04/05/2006CN1249126C Polysiloxane, process for production thereof and radiation-sensitive resin composition
04/05/2006CN1248925C Chip holding tray
04/05/2006CN1248846C Pressure method and pressure device
04/05/2006CN1248839C Cut-off apparatus and cut-off method
04/05/2006CN1248827C High accuracy barrel finishing machine with full automatic adjustable pressure and dual stepless speed changing
04/05/2006CN1248791C Surface processing method
04/04/2006US7024645 Method for predicting performance of integrated circuit and method for designing the circuit
04/04/2006US7024642 Extraction method of defect density and size distributions
04/04/2006US7024640 Integrated circuit cell identification
04/04/2006US7024638 Method for creating patterns for producing integrated circuits
04/04/2006US7024636 Chip management system
04/04/2006US7024604 Process for manufacturing semiconductor device
04/04/2006US7024524 Semiconductor storage
04/04/2006US7024446 Circuitry for arithmetically accumulating a succession of arithmetic values
04/04/2006US7024440 Method and system for processing a discrete time input signal where the clock rate of a discrete time output signal is a multiple of the clock rate of input signal samples
04/04/2006US7024337 System and method for analyzing noise
04/04/2006US7024284 Anti-vibration technique
04/04/2006US7024275 Control method and system for an automated material handling system
04/04/2006US7024266 Substrate processing apparatus, method of controlling substrate, and exposure apparatus
04/04/2006US7024105 chemical vapor deposition chamber having ceramic substrate heater assembly disposed therein; for facilitating deposition of uniform material layers on substrates without depositing material along edge during fabrication of integrated circuits in semiconductor substrate processing system
04/04/2006US7024077 Method of and structure for fixing optical element
04/04/2006US7023955 X-ray fluorescence system with apertured mask for analyzing patterned surfaces
04/04/2006US7023953 Illumination system and exposure apparatus and method
04/04/2006US7023742 Semiconductor device and method for inputting/outputting data simultaneously through single pad
04/04/2006US7023732 Data erasing method, and memory apparatus having data erasing circuit using such method
04/04/2006US7023731 Semiconductor memory device and portable electronic apparatus
04/04/2006US7023730 Nonvolatile semiconductor memory device and writing method thereto
04/04/2006US7023727 Non-volatile ferromagnetic memory having sensor circuitry shared with its state change circuitry
04/04/2006US7023725 Magnetic memory
04/04/2006US7023720 Ferroelectric memory device
04/04/2006US7023685 Sheet capacitor, IC socket using the same, and manufacturing method of sheet capacitor
04/04/2006US7023627 Lithographic objective having a first lens group including only lenses having a positive refractive power
04/04/2006US7023561 Exposure apparatus with interferometer
04/04/2006US7023541 Device inspecting for defect on semiconductor wafer surface
04/04/2006US7023529 Method for overlay measurement in exposure process
04/04/2006US7023526 Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system utilizing overlap without an explicit attenuation
04/04/2006US7023525 Imaging apparatus
04/04/2006US7023524 Lithographic apparatus and device manufacturing method
04/04/2006US7023508 Reflection-transmission type liquid crystal display device and method for manufacturing the same