Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2007
08/14/2007US7257021 Non-volatile ferromagnetic memory having sensor circuitry shared with its state change circuitry
08/14/2007US7257017 SRAM cell for soft-error rate reduction and cell stability improvement
08/14/2007US7257015 Semiconductor memory device having a floating storage bulk region
08/14/2007US7257001 Device and method for fastener-free connection via a heat-shrinkable insert
08/14/2007US7256980 Thin film capacitors on ceramic
08/14/2007US7256976 Electrostatic discharge protective circuit and semiconductor integrated circuit using the same
08/14/2007US7256884 Particle detecting system and method of detecting particles using the same
08/14/2007US7256873 Enhanced lithographic resolution through double exposure
08/14/2007US7256869 Exposure apparatus and an exposure method
08/14/2007US7256868 Projection exposure apparatus, device manufacturing method, and sensor unit
08/14/2007US7256863 Sealing assembly, a lithographic projection apparatus, and a device manufacturing method
08/14/2007US7256760 Semiconductor device
08/14/2007US7256599 Protection circuit for semiconductor device and semiconductor device including the same
08/14/2007US7256592 Probe with trapezoidal contractor and device based on application thereof, and method of producing them
08/14/2007US7256504 Circuit support for a semiconductor chip and component
08/14/2007US7256502 Metal interconnections for semiconductor devices including a buffer layer on a trench sidewall
08/14/2007US7256500 Semiconductor device using metal nitride as insulating film
08/14/2007US7256498 Resistance-reduced semiconductor device and methods for fabricating the same
08/14/2007US7256497 Semiconductor device with a barrier layer and a metal layer
08/14/2007US7256496 Semiconductor device having adhesion increasing film to prevent peeling
08/14/2007US7256495 Package substrate manufactured using electrolytic leadless plating process, and method for manufacturing the same
08/14/2007US7256491 Thermal interconnect systems methods of production and uses thereof
08/14/2007US7256490 Test carrier for semiconductor components having conductors defined by grooves
08/14/2007US7256484 Memory expansion and chip scale stacking system and method
08/14/2007US7256478 Notched compound semiconductor wafer
08/14/2007US7256477 Notched compound semiconductor wafer
08/14/2007US7256476 Notched compound semiconductor wafer
08/14/2007US7256474 Semiconductor device having a guard ring
08/14/2007US7256473 Composite structure with high heat dissipation
08/14/2007US7256472 Bipolar transistor
08/14/2007US7256467 Materials and methods for forming hybrid organic-inorganic anti-stiction materials for micro-electromechanical systems
08/14/2007US7256465 Ultra-shallow metal oxide surface channel MOS transistor
08/14/2007US7256463 Semiconductor device having SOI structure including a load resistor of an sram memory cell
08/14/2007US7256458 Doubly asymmetric double gate transistor structure
08/14/2007US7256457 Thin-film transistor device, utilizing different types of thin film transistors
08/14/2007US7256456 SOI substrate and semiconductor integrated circuit device
08/14/2007US7256455 Double gate semiconductor device having a metal gate
08/14/2007US7256453 Semiconductor device
08/14/2007US7256452 NROM memory device with a high-permittivity gate dielectric formed by the low temperature oxidation of metals
08/14/2007US7256451 NROM memory device with a high-permittivity gate dielectric formed by the low temperature oxidation of metals
08/14/2007US7256450 NROM memory device with a high-permittivity gate dielectric formed by the low temperature oxidation of metals
08/14/2007US7256449 EEPROM device for increasing a coupling ratio and fabrication method thereof
08/14/2007US7256448 Split gate type nonvolatile semiconductor memory device, and method of fabricating the same
08/14/2007US7256445 Fabrication of an EEPROM cell with emitter-polysilicon source/drain regions
08/14/2007US7256444 Local SONOS-type nonvolatile memory device and method of manufacturing the same
08/14/2007US7256443 Semiconductor memory and method of manufacturing the same
08/14/2007US7256442 Three-layer lower capacitor electrode
08/14/2007US7256440 Semiconductor memory cell having a trench and a planar selection transistor and method for producing the same
08/14/2007US7256438 MOS capacitor with reduced parasitic capacitance
08/14/2007US7256437 Semiconductor storage device which includes a hydrogen diffusion inhibiting layer
08/14/2007US7256436 Thin-film field-effect transistors and making method
08/14/2007US7256435 Multilevel imprint lithography
08/14/2007US7256434 Heterojunction bipolar transistor and method for manufacturing the same, and power amplifier using the same
08/14/2007US7256433 Bipolar transistor and a method of manufacturing the same
08/14/2007US7256432 Field-effect transistor
08/14/2007US7256429 Memory cell with buffered-layer
08/14/2007US7256426 Rare earth element-doped silicon/silicon dioxide lattice structure
08/14/2007US7256423 Thin film semiconductor device
08/14/2007US7256419 Composition for forming organic insulating film and organic insulating film formed from the same
08/14/2007US7256417 Type II quantum well mid-infrared optoelectronic devices
08/14/2007US7256416 Semiconductor light emitting device
08/14/2007US7256410 Solid state relay
08/14/2007US7256408 Gas supply unit, gas supply method and exposure system
08/14/2007US7256407 Lithographic projection apparatus and reflector assembly for use therein
08/14/2007US7256406 Emitter for electron-beam projection lithography system, and method of manufacturing and operating the emitter
08/14/2007US7256405 Sample repairing apparatus, a sample repairing method and a device manufacturing method using the same method
08/14/2007US7256400 Electron beam inspection apparatus
08/14/2007US7256386 Fabrication of low leakage-current backside illuminated photodiodes
08/14/2007US7256375 Susceptor plate for high temperature heat treatment
08/14/2007US7256370 Vacuum thermal annealer
08/14/2007US7256259 Methods for ligation of molecules to surfaces
08/14/2007US7256148 Method for treating a wafer edge
08/14/2007US7256147 Porous body and manufacturing method therefor
08/14/2007US7256146 Method of forming a ceramic diffusion barrier layer
08/14/2007US7256145 Manufacture of semiconductor device having insulation film of high dielectric constant
08/14/2007US7256144 Method for forming a metal oxide film
08/14/2007US7256143 Semiconductor device having self-aligned contact plug and method for fabricating the same
08/14/2007US7256142 Relaxed SiGe platform for high speed CMOS electronics and high speed analog circuits
08/14/2007US7256141 Interface layer between dual polycrystalline silicon layers
08/14/2007US7256140 Higher selectivity, method for passivating short circuit current paths in semiconductor devices
08/14/2007US7256139 Methods and apparatus for e-beam treatment used to fabricate integrated circuit devices
08/14/2007US7256138 Method and composition for selectively etching against cobalt silicide
08/14/2007US7256137 Method of forming contact plug on silicide structure
08/14/2007US7256136 Self-patterning of photo-active dielectric materials for interconnect isolation
08/14/2007US7256135 Etching method and computer storage medium storing program for controlling same
08/14/2007US7256134 Selective etching of carbon-doped low-k dielectrics
08/14/2007US7256133 Method of manufacturing a semiconductor device
08/14/2007US7256132 Substrate centering apparatus and method
08/14/2007US7256130 Process for defining a chalcogenide material layer, in particular in a process for manufacturing phase change memory cells
08/14/2007US7256129 Method for fabricating semiconductor device
08/14/2007US7256128 Method of double-sided etching
08/14/2007US7256127 Air gap formation
08/14/2007US7256126 Pitch reduction integrating formation of memory array and peripheral circuitry
08/14/2007US7256125 Method of manufacturing a semiconductor device
08/14/2007US7256124 Method of fabricating semiconductor device
08/14/2007US7256123 Method of forming an interface for a semiconductor device
08/14/2007US7256122 Method of fabricating semiconductor device
08/14/2007US7256121 Contact resistance reduction by new barrier stack process
08/14/2007US7256120 Method to eliminate plating copper defect
08/14/2007US7256119 Semiconductor device having trench structures and method
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