Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2007
08/15/2007CN101017850A VDMOS and IGBT power unit using the PSG doping technology and its making process
08/15/2007CN101017849A A compound bar, bar source self-separating VDMOS, 1GBT power unit and its making technology
08/15/2007CN101017847A Semiconductor devices and methods for fabricating the same
08/15/2007CN101017846A Semiconductor device and its manufacturing method
08/15/2007CN101017845A Electro-optical device, method of manufacturing the same, and electronic apparatus
08/15/2007CN101017844A Electro-optical device, method of manufacturing the same, and electronic apparatus
08/15/2007CN101017843A Display device and manufacturing method of the same
08/15/2007CN101017840A 有机薄膜晶体管阵列板 The organic thin film transistor array panel
08/15/2007CN101017839A Monolithic RF circuit and method of fabricating the same
08/15/2007CN101017836A Semiconductor device and manufacturing method of the same
08/15/2007CN101017835A 薄膜晶体管面板及其制造方法 The thin film transistor panel and manufacturing method
08/15/2007CN101017834A SOI integrated circuit structure and its making method
08/15/2007CN101017832A Thin film transistors substrate, manufacture method therefore and display panel having same
08/15/2007CN101017829A Nd-doped Bi4Ti3O12 ferroelectric thin film for the ferroelectric memory and its low temperature preparation method
08/15/2007CN101017826A Dynamic random access memory structure and its making method
08/15/2007CN101017825A Semiconductor device having vertical channel and method of manufacturing the same
08/15/2007CN101017824A Semiconductor structure and method for forming same
08/15/2007CN101017823A Vertical self-align suspending drain MOS audion and its making method
08/15/2007CN101017817A UV blocking and crack protecting passivation layer
08/15/2007CN101017810A Semiconductor device, and testing method and device for the same
08/15/2007CN101017809A Dual-pole integrated circuit interconnection structure and its making method
08/15/2007CN101017808A Semiconductor device and method for manufacturing same
08/15/2007CN101017807A Semiconductor device and manufacture method thereof
08/15/2007CN101017804A Semiconductor device and manufacturing method for the same
08/15/2007CN101017803A Semiconductor end-electrode structure and its making method
08/15/2007CN101017801A Semiconductor device and manufacturing method for the same
08/15/2007CN101017800A Semiconductor device
08/15/2007CN101017799A Method of manufacturing a flash memory device
08/15/2007CN101017798A Method of manufacturing a flash memeory device
08/15/2007CN101017797A Light emitting device and manufacturing method thereof
08/15/2007CN101017796A Electro-optical device and electronic device
08/15/2007CN101017795A The method for making the organic electronic device
08/15/2007CN101017794A A method for sealing the small hole of the multi-hole low dielectric material in the Damascus structure
08/15/2007CN101017793A A making method for diffusing blocking layer
08/15/2007CN101017792A A making method of the contact hole plug and layer 1 metal
08/15/2007CN101017791A Method of manufacturing semiconductor device
08/15/2007CN101017790A Robot for transferring wafer and semiconductor manufacturing equipment used the same
08/15/2007CN101017789A Encapsulation mould with the static discharge protection
08/15/2007CN101017788A Semiconductor device manufacturing method and semiconductor device manufacturing apparatus
08/15/2007CN101017787A Dispensing device and mounting system
08/15/2007CN101017786A Manufacturing method of semiconductor package
08/15/2007CN101017785A Semiconductor stack structure and its making method
08/15/2007CN101017784A Method for making nano carbon tube field effect transistor
08/15/2007CN101017783A Method for making the separated dual-bar field effect transistor
08/15/2007CN101017782A Thin film transistor and organic electro-luminescent display unit and its making method
08/15/2007CN101017781A Improvement of the method for making heterogeneous dual-pole transistor T-type emission pole metal figure
08/15/2007CN101017780A Method of fabricating a semiconductor device including planarizing a conductive layer using parameters of pattern density and depth of trenches
08/15/2007CN101017779A Method for forming the hole on the InP base slice and semiconductor photoelectric unit
08/15/2007CN101017778A A method for preparing the nano-electrode with the negative electronic erosion-resisting agent
08/15/2007CN101017777A Metallic silicide forming method and method of manufacturing semiconductor device
08/15/2007CN101017776A Method for making the growth ZnO thin film material with the covariant underlay
08/15/2007CN101017775A Method for reducing the stress between the GaN single crystal film and heterogeneous substrate
08/15/2007CN101017774A Making method for the multi-crystal silicon film and thin film transistor
08/15/2007CN101017773A Processing method for the semiconductor pipe core assembly crystal surface
08/15/2007CN101017772A The cleaning method for removing the impure ion from the semiconductor pipe core assembly
08/15/2007CN101017771A Gas supply apparatus, substrate processing apparatus and gas supply method
08/15/2007CN101017770A Replacement method and replacement programfor for treatment mechanism in treatment apparatus
08/15/2007CN101017769A Plasma processing apparatus and plasma processing method
08/15/2007CN101017768A Substrate processing apparatus
08/15/2007CN101017767A Work bonding and supporting method and work bonding and supporting apparatus using the same
08/15/2007CN101017761A Metal gas mixing ion injector
08/15/2007CN101017760A A measurement method for plasma dynamic sheath layer diagnosis
08/15/2007CN101017751A High-performance semiconductor nanometer silicon field electronic emission material and its preparation method
08/15/2007CN101017726A Symmetric inductor
08/15/2007CN101017643A Light emitting device and method of driving the same
08/15/2007CN101017332A Developing apparatus and developing method
08/15/2007CN101017331A XYtheta moving stage
08/15/2007CN101017329A Substrate treatment system, substrate treatment method, and computer readable storage medium
08/15/2007CN101017301A Method for producing display base plate
08/15/2007CN101017300A Method for avoiding electric contact, display panel and its manufacture method, LCD
08/15/2007CN101017297A Liquid crystal display and manufacturing method thereof
08/15/2007CN101017291A Pixel structure of thin film transistor liquid crystal display
08/15/2007CN101017193A Testing method for irradiation of memory and device for implementing method thereof
08/15/2007CN101017185A Testing method of capacitance component mounted inside and testing system thereof
08/15/2007CN101017183A Electrical contact device and electrical contact method
08/15/2007CN101017182A Wafer-level burn-in and test
08/15/2007CN101016651A Annealed wafer and manufacturing method of annealed wafer
08/15/2007CN101016645A Plating apparatus, plating cup and cathode ring
08/15/2007CN101016638A Method for direct electroplating of copper onto a non-copper plateable layer
08/15/2007CN101016630A Plasma etching of tapered structures
08/15/2007CN101016618A Film forming apparatus, film forming method, and manufacturing method of light emitting element
08/15/2007CN101016445A Underfill encapsulant for wafer packaging and method for its application
08/15/2007CN101016440A Multi-component barrier polishing solution
08/15/2007CN101016414A Coloring composition for forming a silica film
08/15/2007CN101016191A Heat treatment apparatus
08/15/2007CN101016164A Method of preparing zinc oxide doped ambient temperature diluted magnetic semi-conducting material
08/15/2007CN101015899A 切削装置 Cutting device
08/14/2007US7257790 Layout structure of semiconductor integrated circuit and method for forming the same
08/14/2007US7257789 LSI design method
08/14/2007US7257787 Method for reducing an equivalent resistance in an IC layout
08/14/2007US7257785 Method and apparatus of evaluating layer matching deviation based on CAD information
08/14/2007US7257755 Driver IC and inspection method for driver IC and output device
08/14/2007US7257715 Semiconductor integrated circuit
08/14/2007US7257502 Determining metrology sampling decisions based on fabrication simulation
08/14/2007US7257494 Inter-process sensing of wafer outcome
08/14/2007US7257457 System and method for monitoring semiconductor production apparatus
08/14/2007US7257453 Exposure method and apparatus
08/14/2007US7257281 Method for fabricating thick film alumina structures used in high frequency, low loss applications and a structure resulting therefrom
08/14/2007US7257143 Multicomponent barrier layers in quantum well active regions to enhance confinement and speed
08/14/2007US7257141 Phase array oxide-confined VCSELs