Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/2007
10/24/2007CN101059843A Method of producing memory card
10/24/2007CN101059661A Lithographic apparatus and device manufacturing method
10/24/2007CN101059660A Method for producing aligning mark
10/24/2007CN101059659A Immersion photolithography system and method using inverted wafer-projection optics interface
10/24/2007CN101059658A A method for obtaining improved feedforward data, a lithographic apparatus for carrying out the method and a device manufacturing method
10/24/2007CN101059657A MIM capacitance material etching method
10/24/2007CN101059649A Mask pattern generating method
10/24/2007CN101059633A An array substrate for in-plane switching mode LCD and method of fabricating of the same
10/24/2007CN101059631A Array substrate for liquid crystal display device using organic semiconductor material and method of fabricating the same
10/24/2007CN101059546A System chip with multiple test mode and the test method
10/24/2007CN101059532A Holder for conductive contact
10/24/2007CN101058872A Gas distribution device for treating reactor by semiconductor technological element and reactor thereof
10/24/2007CN101058713A Polishing slurry and polishing method
10/24/2007CN101058712A Grinding fluid for metal and grinding method
10/24/2007CN101058711A Grinding fluid for metal and grinding method
10/24/2007CN101058710A Chemical machinery grinding composition
10/24/2007CN101058484A P-type nitrogen-doping cuprous oxide thin film material and preparation method thereof
10/24/2007CN101058481A Organic EL coating device and method
10/24/2007CN101058169A 抛光表面 Polished surface
10/24/2007CN100345314C Method for manufacturing gallium nitride transparent conductive oxide film ohmic electrode
10/24/2007CN100345310C Thin-film transistor and method for making same
10/24/2007CN100345309C Semiconductor film, mfg. method of same, semiconductor device and mfg. method of same
10/24/2007CN100345308C Semiconductor device its making method
10/24/2007CN100345307C Semiconductor device and its manufacturing method
10/24/2007CN100345306C Misfet
10/24/2007CN100345305C Double-gate substrate danamic RAM cell array
10/24/2007CN100345302C Structure and manufacture of complementary metal-semiconductor image sensor
10/24/2007CN100345301C Integrated transistor and its manufacture
10/24/2007CN100345300C Common bit/common source line high density 1T1RR-RAM array and operation method
10/24/2007CN100345299C Mask type ROM having diode and mfg method thereof
10/24/2007CN100345298C Semiconductor chips and semiconductor components and their forming methods
10/24/2007CN100345297C Embedded capacitor structure used for logic integrated cireuit
10/24/2007CN100345294C Fuse circuit
10/24/2007CN100345293C Semiconductor device and method for fabricating the same
10/24/2007CN100345291C Semiconductor device and electronic device, and methods for manufacturing thereof
10/24/2007CN100345286C 半导体装置 Semiconductor device
10/24/2007CN100345285C High-frequency device
10/24/2007CN100345284C Method of manufacturing bi ONO type SONOS storage using reverse direction self-aligning process
10/24/2007CN100345283C Method and system for self-convergent erase in charge trapping memory cells
10/24/2007CN100345282C Method for fabricating semiconductor device capable of decreasing critical dimension in peripheral region
10/24/2007CN100345281C Manufacturing method of semiconductor device
10/24/2007CN100345280C Deformed channel transistor structure with asymmetrical lattice area and its manufacture
10/24/2007CN100345279C Component built-in module and method of manufacturing the same
10/24/2007CN100345278C Process for forming metal damascene structure
10/24/2007CN100345277C Formation of low resistance via contacts in interconnect structures
10/24/2007CN100345276C Method for reducing leakage current between copper double inlaying processing lines
10/24/2007CN100345275C Interconnection method of forming through lining
10/24/2007CN100345274C Method of producing electrostatic suction cup
10/24/2007CN100345273C Collimator
10/24/2007CN100345272C Method and device for analyzing defects of an integrated circuit wafer
10/24/2007CN100345271C Device and method for nondestructive inspection on semiconductor device
10/24/2007CN100345270C Method and apparatus for controlling a fabrication process based on a measured electrical characteristic
10/24/2007CN100345269C Apparatus for testing semiconductor device
10/24/2007CN100345268C 半导体装置 Semiconductor device
10/24/2007CN100345267C Integrated circuit chip encapsulation and encapsulation method therefor
10/24/2007CN100345266C Optical mechanism and its package method
10/24/2007CN100345265C Structure and method for silicided metal gate transistors
10/24/2007CN100345264C Method for improving surface quality of gallium arsenide chip
10/24/2007CN100345262C Method for eliminating static electricity of metal conducting layer to complete etching
10/24/2007CN100345261C Method for producing semiconductor integrated circuit device
10/24/2007CN100345260C Method for mitigating chemical vapor deposition phosphorus doping oxide surface induced defects
10/24/2007CN100345259C Improved method for etching vias
10/24/2007CN100345258C Manufacturing method for semiconductor device
10/24/2007CN100345257C 等离子体处理装置 Plasma processing apparatus
10/24/2007CN100345256C Method for mfg. semiconductor circuit element
10/24/2007CN100345255C Vapor phase growth method for Al-containing III-V group compound semiconductor, and method and device for producing Al-containing III-V group compound semiconductor
10/24/2007CN100345254C Formation of high-mobility silicon-germanium structures by low-energy plasma enhanced chemical vapor deposition
10/24/2007CN100345253C Optic micro distance correcting method
10/24/2007CN100345252C Image formation state adjustment system, exposure method, exposure apparatus, program, and information recording medium
10/24/2007CN100345251C Method for mfg. silicon film on silicon base substrate with deep slot pattern
10/24/2007CN100345250C Growing method of indium arsenide nano-ring prepared by indium arsenide-indium alluminum arsenide laminate point
10/24/2007CN100345249C Method for producing silicon nano-line diode structual field emitting device
10/24/2007CN100345248C Preparing method and application of heterobonded wafer
10/24/2007CN100345247C Hydrogen induced uncoupled heteroepitaxial flexible substrate
10/24/2007CN100345246C Method for producing silicon-germanium backing material on insulator and said substrate
10/24/2007CN100345228C Capacitor having improved electrodes
10/24/2007CN100345214C Magnetic yoke structure capable of reducing programming energy consumption for MRAM apparatus and producing method thereof
10/24/2007CN100345059C Patterning of solid state features by direct write nanolithographic printing
10/24/2007CN100345053C Thin film transistor substrate using a horizontal electric field and fabricating method thereof
10/24/2007CN100345052C Liquid crystal display panel
10/24/2007CN100345033C Susceptor for deposition process equipment and method of fabricating a heater therein
10/24/2007CN100345015C Regulatable optical appliance based on micro electromechanical system technology
10/24/2007CN100344982C Test fixture in high frequency measuring chip of laser in structure of monocoplanar electrode
10/24/2007CN100344976C Connection unit, board mounting device to be measured, probe card, and device interface unit
10/24/2007CN100344793C Quantitative monitoring method and structure for plasma etching
10/24/2007CN100344790C Method for depositing silicon nitride films and silicon oxynitride films by chemical vapor deposition technology
10/24/2007CN100344531C Process of preparing monodisperse nanometer semiconductor selenide particle
10/24/2007CN100344513C Base plate transport frame
10/24/2007CN100344385C Megasonic probe energy director
10/23/2007USRE39895 Semiconductor integrated circuit arrangement fabrication method
10/23/2007US7287239 Performance in model-based OPC engine utilizing efficient polygon pinning method
10/23/2007US7286585 Low temperature grown layers with migration enhanced epitaxy adjacent to an InGaAsN(Sb) based active region
10/23/2007US7286431 Memory device capable of performing high speed reading while realizing redundancy replacement
10/23/2007US7286404 Non-volatile semiconductor memory adapted to store a multi-valued data in a single memory cell
10/23/2007US7286401 Nonvolatile semiconductor memory device
10/23/2007US7286278 Methods for depositing, releasing and packaging micro-electromechanical devices on wafer substrates
10/23/2007US7286216 Exposure apparatus inspection method and exposure apparatus
10/23/2007US7286206 Exposure apparatus
10/23/2007US7286204 Spacers for display devices
10/23/2007US7286195 Interconnect structure for TFT-array substrate and method for fabricating the same
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