Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
11/2007
11/21/2007CN100350503C Method for reducing coupling effect between nonvolatile memory storage cell
11/21/2007CN100350499C Magnetic RAM
11/21/2007CN100350498C magneto-resistance effect element and magnetic memory
11/21/2007CN100350497C Thin film magnetic memory device suppressing resistance of transistors present in current path
11/21/2007CN100350495C Magneto-resistive device having magnetically soft reference
11/21/2007CN100350493C Storing means for memory
11/21/2007CN100350463C Method for filling concave portions in concave/convex pattern and magnetic recording medium manufacturing method
11/21/2007CN100350442C Display driver, display device, and portable electronic apparatus
11/21/2007CN100350414C System and method for statistical timing analysis of digital circuits
11/21/2007CN100350403C Method and apparatus for slope to threshold conversion for process state monitoring and endpoint detection
11/21/2007CN100350326C Reticle and optical characteristic measuring method
11/21/2007CN100350319C Liquid crystal display panel and fabricating method thereof
11/21/2007CN100350318C 半导体器件 Semiconductor devices
11/21/2007CN100350303C LCD device
11/21/2007CN100350259C 电子部件试验装置 Electronic component testing device
11/21/2007CN100350254C Contact structure having silicon finger contactor
11/21/2007CN100350079C Anodes for electroplating operations, and methods of forming materials over semiconductor substrates
11/21/2007CN100350073C Cu/Si nanometer porous array composite material preparation method
11/21/2007CN100349981C Porous mebrane shaping composition, porous membrane manufacturing method, porous membrane, intercalation insulating film and semiconductor device
11/21/2007CN100349932C Amorphous perfluorinated polymers
11/21/2007CN100349787C Stock transmitting systems
11/21/2007CN100349786C Immediate delivery package of semiconductor chip and method therefor
11/20/2007US7299443 Method for designing wiring connecting section and semiconductor device
11/20/2007US7299440 Semiconductor integrated circuit including standard cell, standard cell layout design method, and layout design software product stored in computer-readable recording medium
11/20/2007US7299392 Semiconductor integrated circuit device and method of design of semiconductor integrated circuit device
11/20/2007US7299389 Test circuit, integrated circuit, and test method
11/20/2007US7299367 Methods, systems and computer program products for developing resource monitoring systems from observational data
11/20/2007US7299147 Systems for managing production information
11/20/2007US7299105 Method and system for controlling a product parameter of a circuit element
11/20/2007US7299104 Substrate processing apparatus and substrate transferring method
11/20/2007US7298770 Laser spectral engineering for lithographic process
11/20/2007US7298662 Semiconductor device with power down arrangement for reduce power consumption
11/20/2007US7298656 Process monitoring by comparing delays proportional to test voltages and reference voltages
11/20/2007US7298652 Non-volatile memory and semiconductor device
11/20/2007US7298647 Operating techniques for reducing program and read disturbs of a non-volatile memory
11/20/2007US7298641 Configurable storage device
11/20/2007US7298600 Semiconductor integrated circuit device
11/20/2007US7298594 Electric-field-effect magnetoresistive devices and electronic devices using the magnetoresistive devices
11/20/2007US7298536 Fiber optic wafer probe
11/20/2007US7298500 Position sensor
11/20/2007US7298498 Optical property measuring apparatus and optical property measuring method, exposure apparatus and exposure method, and device manufacturing method
11/20/2007US7298482 Exposure apparatus and aligning method
11/20/2007US7298471 Surface inspection apparatus and surface inspection method
11/20/2007US7298459 Wafer handling method for use in lithography patterning
11/20/2007US7298452 Patterning apparatus and method for fabricating continuous pattern using the same
11/20/2007US7298431 Liquid crystal display device and fabricating method thereof
11/20/2007US7298355 Display device
11/20/2007US7298163 TFT array inspection device
11/20/2007US7298160 Method of measuring gate capacitance by correcting dissipation factor error
11/20/2007US7298156 Electronic part test apparatus
11/20/2007US7298050 Semiconductor device, method of manufacturing the same, capacitor structure, and method of manufacturing the same
11/20/2007US7298042 Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument
11/20/2007US7298040 Wire bonding method and apparatus for integrated circuit
11/20/2007US7298039 Electronic circuit device
11/20/2007US7298035 Semiconductor device and a method of assembling a semiconductor device
11/20/2007US7298032 Semiconductor multi-chip package and fabrication method
11/20/2007US7298030 Structure and method of making sealed capped chips
11/20/2007US7298029 Semiconductor devices and manufacturing method therefor
11/20/2007US7298026 Large die package and method for the fabrication thereof
11/20/2007US7298024 Transparent amorphous carbon structure in semiconductor devices
11/20/2007US7298023 Electronic device with organic insulator
11/20/2007US7298022 Semiconductor sensor
11/20/2007US7298021 Electronic device and method for manufacturing the same
11/20/2007US7298020 Semiconductor device and method of manufacturing the same
11/20/2007US7298016 Electromechanical memory array using nanotube ribbons and method for making same
11/20/2007US7298013 Compound used to form a self-assembled monolayer, layer structure, semiconductor component having a layer structure, and method for producing a layer structure
11/20/2007US7298007 SRAM formation using shadow implantation
11/20/2007US7298006 Nonvolatile semiconductor memory device including improved gate electrode
11/20/2007US7298003 Nonvolatile memory device having STI structure
11/20/2007US7298000 Conductive container structures having a dielectric cap
11/20/2007US7297998 Semiconductor devices having a buried and enlarged contact hole and methods of fabricating the same
11/20/2007US7297996 Semiconductor memory device for storing data in memory cells as complementary information
11/20/2007US7297994 Semiconductor device having a retrograde dopant profile in a channel region
11/20/2007US7297991 Bipolar junction transistor and fabricating method
11/20/2007US7297989 Diboride single crystal substrate, semiconductor device using this and its manufacturing method
11/20/2007US7297982 Semiconductor device including a TFT having large-grain polycrystalline active layer, LCD employing the same and method of fabricating them
11/20/2007US7297980 Flat panel display device with polycrystalline silicon thin film transistor
11/20/2007US7297978 Semiconductor thin film and semiconductor device
11/20/2007US7297971 Alignment systems and methods for lithographic systems
11/20/2007US7297944 Ion beam device and ion beam processing method, and holder member
11/20/2007US7297927 Fabrication of low leakage-current backside illuminated photodiodes
11/20/2007US7297876 Circuit board and method of manufacturing the same
11/20/2007US7297868 Preparation of CIGS-based solar cells using a buffered electrodeposition bath
11/20/2007US7297669 Copper chemical mechanical polishing solutions using sulfonated amphiprotic agents
11/20/2007US7297642 Sputter-deposited rare earth element-doped silicon oxide film with silicon nanocrystals for electroluminescence applications
11/20/2007US7297641 Method to form ultra high quality silicon-containing compound layers
11/20/2007US7297640 Method for reducing argon diffusion from high density plasma films
11/20/2007US7297639 Methods for etching doped oxides in the manufacture of microfeature devices
11/20/2007US7297638 Method for manufacturing a semiconductor device
11/20/2007US7297637 Use of pulsed grounding source in a plasma reactor
11/20/2007US7297636 Methods for fabricating device features having small dimensions
11/20/2007US7297635 Processing method
11/20/2007US7297634 Method and apparatus for semiconductor device and semiconductor memory device
11/20/2007US7297633 Compositions for chemical mechanical polishing silica and silicon nitride having improved endpoint detection
11/20/2007US7297632 Scratch reduction for chemical mechanical polishing
11/20/2007US7297631 Methods of forming electronic structures including conductive shunt layers and related structures
11/20/2007US7297630 Methods of fabricating via hole and trench
11/20/2007US7297629 Ultra-thick metal-copper dual damascene process
11/20/2007US7297628 Dynamically controllable reduction of vertical contact diameter through adjustment of etch mask stack for dielectric etch
11/20/2007US7297627 Multilayer substrate
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